IEC 61189-5-3-2015 Test methods for electrical materials printed boards and other interconnection structures and assemblies - Part 5-3 General test methods for materials and assemb.pdf

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1、 IEC 61189-5-3 Edition 1.0 2015-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 5-3: General test methods for materials and assemblies Soldering paste for printed board assemblies Mthodes de

2、ssai pour les matriaux lectriques, les cartes imprimes et autres structures dinterconnexion et ensembles Partie 5-3: Mthodes dessai gnrales pour les matriaux et les assemblages Pte de brasage pour les assemblages de cartes imprimes IEC 61189-5-3:2015-01(en-fr) colour inside THIS PUBLICATION IS COPYR

3、IGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC

4、 or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de

5、reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays d

6、u demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax

7、: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publicati

8、ons The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliogra

9、phical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of criteria (refere

10、nce number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available online and also once a

11、month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in 15 additional languages. Also known as the International Electrotechnical Voca

12、bulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 a

13、nd CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mon

14、diale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corr

15、igendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour PC, Mac OS, tabl

16、ettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires.

17、IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne de termes lect

18、roniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary Plus de 60 000 entres termi

19、nologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner

20、 des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61189-5-3 Edition 1.0 2015-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 5-3: General t

21、est methods for materials and assemblies Soldering paste for printed board assemblies Mthodes dessai pour les matriaux lectriques, les cartes imprimes et autres structures dinterconnexion et ensembles Partie 5-3: Mthodes dessai gnrales pour les matriaux et les assemblages Pte de brasage pour les ass

22、emblages de cartes imprimes INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 31.180 ISBN 978-2-8322-1998-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure th

23、at you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 61189-5-3:2015 IEC 2015 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope 8 2 Normative references 8 3 Accuracy, precisio

24、n and resolution 8 3.1 General . 8 3.2 Accuracy . 9 3.3 Precision . 9 3.4 Resolution 10 3.5 Report. 10 3.6 Students t distribution 10 3.7 Suggested uncertainty limits . 11 4 X: Miscellaneous test methods 12 4.1 Test 5-3X01: Paste flux viscosity T-Bar spindle method . 12 Object 12 4.1.1Test specimen

25、. 12 4.1.2Apparatus and reagents . 12 4.1.3Procedure 12 4.1.4Safety notes 12 4.1.5 4.2 Test 5-3X02: Spread test, extracted solder flux, paste flux and solder paste . 12 Object 12 4.2.1Method A . 13 4.2.2Method B . 14 4.2.3Additional information 15 4.2.4 4.3 Test 5-3X03: Solder paste viscosity T-Bar

26、spin spindle method (applicable for 300 Pas to 1 600 Pas) . 15 Object 15 4.3.1Test specimen . 15 4.3.2Equipment/apparatus . 15 4.3.3Procedure 16 4.3.4Evaluation . 16 4.3.5Additional information 16 4.3.6 4.4 Test 5-3X04: Solder paste viscosity T-Bar spindle method (applicable to 300 Pas) 16 Object 16

27、 4.4.1Test specimen . 17 4.4.2Equipment/apparatus . 17 4.4.3Procedure 17 4.4.4Evaluation . 17 4.4.5Additional information 17 4.4.6 4.5 Test 5-3X05: Solder paste viscosity Spiral pump method (applicable for 300 Pas to 1 600 Pas) 18 Object 18 4.5.1Test specimen . 18 4.5.2Equipment/apparatus . 18 4.5.3

28、Procedure 18 4.5.4IEC 61189-5-3:2015 IEC 2015 3 Evaluation . 18 4.5.5Additional information 18 4.5.6 4.6 Test 5-3X06: Solder paste viscosity Spiral pump method (applicable to 300 Pas) . 19 Object 19 4.6.1Test specimen . 19 4.6.2Equipment/apparatus . 19 4.6.3Procedure 19 4.6.4Evaluation . 19 4.6.5Add

29、itional information 19 4.6.6 4.7 Test 5-3X07: Solder paste Slump test 20 Object 20 4.7.1Test specimen . 20 4.7.2Equipment/apparatus . 20 4.7.3Procedure 20 4.7.4Evaluation . 22 4.7.5 4.8 Test 5-3X08: Solder paste Solder ball test . 22 Object 22 4.8.1Test specimen . 23 4.8.2Equipment/apparatus . 23 4.

30、8.3Procedure 23 4.8.4Evaluation . 24 4.8.5 4.9 Test 5-3X09: Solder paste Tack test 25 Object 25 4.9.1Method A . 25 4.9.2Method B . 26 4.9.3Test equipment sources . 27 4.9.4 4.10 Test 5-3X10: Solder paste Wetting test 27 Object 27 4.10.1Test specimen . 27 4.10.2Equipment/materials/apparatus 27 4.10.3

31、Procedure 27 4.10.4Evaluation . 28 4.10.5 4.11 Test 5-3X11: Determination of solder powder particle size distribution Screen method for types 1-4 . 28 Object 28 4.11.1Test specimen . 28 4.11.2Equipment/apparatus . 28 4.11.3Procedure 28 4.11.4 4.12 Test 5-3X12: Solder powder particle size distributio

32、n Measuring microscope method . 30 Object 30 4.12.1Test specimen . 30 4.12.2Equipment/apparatus . 30 4.12.3Procedure 30 4.12.4 4.13 Test 5-3X13: Solder powder particle size distribution Optical image analyser method . 31 Object 31 4.13.1Test specimen . 31 4.13.2Equipment/apparatus . 31 4.13.3 4 IEC

33、61189-5-3:2015 IEC 2015 Procedure 32 4.13.4 4.14 Test 5-3X14: Solder powder particle size distribution Measuring laser diffraction method . 33 Object 33 4.14.1Test specimen . 33 4.14.2Equipment/apparatus . 33 4.14.3Preparation 34 4.14.4Test procedure 34 4.14.5Test . 34 4.14.6Evaluation . 34 4.14.7 4

34、.15 Test 5-3X15: Determination of maximum solder powder particle size 35 Object 35 4.15.1Test specimen . 35 4.15.2Evaluation . 35 4.15.3 4.16 Test 5-3X16: Solder paste metal content by weight . 36 Object 36 4.16.1Test specimen . 36 4.16.2Equipment/apparatus . 36 4.16.3Procedure 36 4.16.4 Annex A (in

35、formative) Typical comparison of particle size distributions between laser diffraction method and screen method 38 Bibliography 39 Figure 1 Slump test stencil thickness, 0,20 mm 21 Figure 2 Slump test stencil thickness, 0,10 mm 21 Figure 3 Solder-ball test evaluation 24 Figure 4 Solder wetting examp

36、les 28 Figure A.1 Typical comparison between laser diffraction and sieving . 38 Table 1 Students t distribution . 11 Table 2 Typical spread areas defined in mm 213 Table 3 Example of a test report Stencil thickness, 0,2 mm . 22 Table 4 Example of a test report Stencil thickness, 0,1 mm . 22 Table 5

37、Screen opening . 29 Table 6 Portions of particle sizes by weight % nominal values 30 Table 7 Powder particle size distribution record . 30 Table 8 Powder particle size distribution record . 31 Table 9 Powder particle size distribution record (optical analysis) 33 Table 10 Powder particle size distri

38、bution record . 34 Table 11 Acceptance of powders by particle sizes . 36 Table 12 Example of a test report on solder paste . 37 IEC 61189-5-3:2015 IEC 2015 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASS

39、EMBLIES Part 5-3: General test methods for materials and assemblies Soldering paste for printed board assemblies FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committee

40、s). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available

41、Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organiz

42、ations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical mat

43、ters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC Nation

44、al Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IE

45、C National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itsel

46、f does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that th

47、ey have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature

48、whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced pu

49、blications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61189-5-3 has been prepared by IEC technic

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