IEC 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2 Noise figure parameters - Electrical spectrum analyzer method《光纤放大器.试验方法.第3-2部分 噪音图形参数.电气光谱分析法》.pdf

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1、 IEC 61290-3-2Edition 2.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEOptical amplifiers Test methods Part 3-2: Noise figure parameters Electrical spectrum analyzer method Amplificateurs optiques Mthodes dessais - Partie 3-2: Paramtres du facteur de bruit Mthode de lanalyseur spectral lectriqu

2、e IEC61290-3-2:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm,

3、without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National

4、Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit d

5、e la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Centr

6、al Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologie

7、s. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enabl

8、es you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month a

9、ll new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also k

10、nown as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11

11、 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le conten

12、u technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer

13、 des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published

14、 dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi qu

15、e les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le

16、 FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61290-3-2Edition 2.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEOptical amplifiers Test methods Part 3-2: Noise figure parameters Electrical spectrum analyzer method Amplificateurs opti

17、ques Mthodes dessais - Partie 3-2: Paramtres du facteur de bruit Mthode de lanalyseur spectral lectrique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE QICS 33.180.30 PRICE CODECODE PRIXISBN 2-8318-9898-6 Registered trademark of the International Electrotechnica

18、l Commission Marque dpose de la Commission Electrotechnique Internationale 2 61290-3-2 IEC:2008 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope and object6 2 Normative references .6 3 Symbols, acronyms and abbreviations7 4 Apparatus.8 5 Test specimen 10 6 Procedure 10 6.1 Frequency-scanning technique: ca

19、libration11 6.2 Frequency-scanning technique: measurement.12 6.3 Selected-frequency technique: calibration and measurement 13 6.4 Measurement accuracy limitations.13 7 Calculation .14 7.1 Calculation of calibration results14 7.2 Calculation of test results for the frequency-scanning technique15 7.3

20、Calculation of test results for the selected-frequency technique.15 8 Test results 16 Bibliography17 Figure 1 Scheme of a measurement set-up 9 61290-3-2 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL AMPLIFIERS TEST METHODS Part 3-2: Noise figure parameters Electrical spectrum analyz

21、er method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardizat

22、ion in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is e

23、ntrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Int

24、ernational Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects sinc

25、e each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content

26、of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible i

27、n their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment d

28、eclared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Nati

29、onal Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention i

30、s drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shal

31、l not be held responsible for identifying any or all such patent rights. International Standard IEC 61290-3-2 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre optics. This second edition cancels and replaces the first edition publish

32、ed in 2003 and constitutes a technical revision. It includes updates to specifically address all types of optical amplifiers not just optical fibre amplifiers. This standard should be read in conjunction with IEC 61290-3 and IEC 61291-1. 4 61290-3-2 IEC:2008 The text of this standard is based on the

33、 following documents: CDV Report on voting 86C/784/CDV 86C/828/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all pa

34、rts of IEC 61290 series, published under the general title Optical amplifiers Test methods, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec

35、.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61290-3-2 IEC:2008 5 INTRODUCTION This part of IEC 61290 is devoted to the subject of optical amplifiers. The technology of optical amplifier

36、s is still rapidly evolving, hence amendments and new additions to this standard can be expected. Each symbol and abbreviation introduced in this standard is generally explained in the text the first time it appears. However, for an easier understanding of the whole text, a list of all symbols and a

37、bbreviations used in this standard is given in Clause 3. 6 61290-3-2 IEC:2008 OPTICAL AMPLIFIERS TEST METHODS Part 3-2: Noise figure parameters Electrical spectrum analyzer method 1 Scope and object This part of IEC 61290 applies to all commercially available optical amplifiers (OAs), including OAs

38、using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor optical amplifiers (SOAs) and planar waveguide optical amplifiers (PWOAs). The object of this standard is to establish uniform requirements for accurate and reliable measurements, by me

39、ans of the electrical spectrum analyzer (ESA) method, of the noise figure, as defined in IEC 61291-1. The present test method is based on direct electrical noise measurement and it is directly related to its definition including all relevant noise contributions. Therefore, this method can be used fo

40、r all types of optical amplifiers, including SOA and Raman amplifiers which can have significant contributions besides amplified spontaneous emission, because it measures the total noise figure. For further details of applicability, see IEC 61290-3. An alternative test method based on the optical sp

41、ectrum analyzer can be used, particularly for different noise parameters (such as the signal-spontaneous noise factor) but it is not included in the object of this standard. NOTE 1 All numerical values followed by () are suggested values for which the measurement is assured. Other values may be acce

42、ptable but should be verified. NOTE 2 A measurement accuracy for the average noise factor of 20 %(), respectively 1 dB, should be attainable with this method (see Clause 6). NOTE 3 General aspects of noise figure test methods are reported in IEC 61290-3. 2 Normative references The following referenc

43、ed documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60728-6, Cable networks for television signals, sound signals and i

44、nteractive services Part 6: Optical equipment IEC 61290-3: Optical fibre amplifiers Basic specification Part 3: Test methods for noise figure parameters1IEC 61291-1, Optical amplifiers Part 1: Generic specification NOTE A list of informative references is given in the bibliography. _ 1The first edit

45、ions of some of these parts were published under the general title Optical fibre amplifiers Basic specification or Optical amplifiers Test methods. Future editions of these parts will appear under the new general title listed above. The individual titles of Parts 1-1, 3-1, 5-2, 10-1, 10-2, 10-3, 11-

46、1 and 11-2 will be updated in future editions of these parts to reflect the overall structure of the series. 61290-3-2 IEC:2008 7 3 Symbols, acronyms and abbreviations For the purposes of this document, the following symbols, acronyms and abbreviations apply. Becalibrated, noise equivalent ESA elect

47、rical bandwidth (not necessarily the resolution bandwidth) c speed of light in vacuum e electron charge f baseband frequency F (total) noise factor Fnon-mpi, frequency-independent contribution to total noise factor Fmpinoise factor contribution from multiple path interference noise (OA internal refl

48、ections) G OA optical signal gain h Plancks constant k optical power reduction factor (default k = 0,5); it can be obtained by taking the square root of the electrical power reduction factor optical frequency = c/ source FWHM linewidth with modulation on H0, H0(f) Sesa/Pin2= transfer function of rec

49、eiver in watts1Impimulti-path interference figure of merit, the noise factor contribution caused by multiple path interference integrated over all baseband frequencies (0 to infinity); Ipdphotodetector current wavelength in vacuum m relative modulation amplitude (the ratio of RMS optical power modulation amplitude to average optical power) NF(f) (total) noise f

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