1、 IEC 61747-1-1 Edition 1.0 2014-08 INTERNATIONAL STANDARD Liquid crystal display devices Part 11: Generic Generic specification IEC 61747-1-1:2014-08(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this p
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10、sh to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 61747-1-1 Edition 1.0 2014-08 INTERNATIONAL STANDARD Liquid crystal display devices Part 11: Generic Generic specification INTERNATIONAL ELECTROTECHNICAL COMMISSION
11、U ICS 31.120 PRICE CODE ISBN 978-2-8322-1805-1 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. 2 IEC 61747-1-1:2014 IEC 2014 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms an
12、d definitions 7 4 Technical aspects 7 4.1 Order of precedence . 7 4.2 Standard environmental conditions . 7 4.3 Marking . 7 4.3.1 Device identification 7 4.3.2 Device traceability . 7 4.3.3 Packing . 7 4.4 Categories of assessed quality . 8 4.5 Screening . 8 4.6 Handling . 8 5 Quality assessment pro
13、cedures . 8 5.1 General . 8 5.2 Commercially confidential information . 9 5.3 Formation of inspection lots 9 5.4 Structurally similar devices . 9 5.5 Granting of qualification approval 9 5.6 Quality conformance inspection 10 5.6.1 General . 10 5.6.2 Division into groups and subgroups . 10 5.6.3 Insp
14、ection requirements 11 5.6.4 Supplementary procedure for reduced inspection 13 5.6.5 Sampling requirements for small lots . 13 5.6.6 Certified records of released lots (CRRL) 13 5.6.7 Delivery of devices subjected to destructive or non-destructive tests . 14 5.6.8 Delayed deliveries . 14 5.6.9 Suppl
15、ementary procedure for deliveries . 14 5.7 Statistical sampling procedures . 14 5.7.1 General . 14 5.7.2 AQL sampling plans . 14 5.7.3 LTPD sampling plans . 14 5.8 Endurance tests 14 5.9 Endurance tests where the failure rate is specified . 14 5.9.1 Overview . 14 5.9.2 General . 14 5.9.3 Selection o
16、f samples . 15 5.9.4 Failure . 15 5.9.5 Endurance test time and sample size . 15 5.9.6 Procedure to be used if the number of observed failures exceeds the acceptance number . 15 6 Test and measurement procedures 16 6.1 Standard atmospheric conditions for electrical and optical measurements 16 6.2 Ph
17、ysical examination 16 IEC 61747-1-1:2014 IEC 2014 3 6.2.1 Visual examination 16 6.2.2 Dimensions 16 6.3 Electrical and optical measurements . 17 6.3.1 Alternative methods . 17 6.3.2 Precision of measurements 17 6.3.3 General precautions 17 6.4 Environmental tests 17 6.5 Mechanical tests . 17 Annex A
18、 (informative) Examples of outline drawings of liquid crystal display cells 18 Annex B (normative) Orientation of LCD modules 21 Annex C (informative) Lot tolerance percentage defective (LTPD) sampling plans . 22 C.1 General . 22 C.1.1 Overview . 22 C.1.2 Selection of samples . 22 C.1.3 Failures . 2
19、2 C.2 Single-lot sampling method . 22 C.2.1 General . 22 C.2.2 Sample size . 22 C.2.3 Acceptance procedure . 22 C.3 Additional sample . 23 C.4 Multiple criteria . 23 C.5 100 % inspection 23 C.6 Tightened inspection . 23 Bibliography 28 Figure A.1 Example of outline drawings of liquid crystal display
20、 cells . 18 Figure A.2 Example of outline drawings of liquid crystal display cells . 19 Figure B.1 Orientation of LCD modules 21 Table A.1 Example of table for dimension of each element 19 Table C.1 LTPD sampling plans . 24 Table C.2 Hypergeometric sampling plans for small lot sizes of 200 or less .
21、 26 Table C.3 AQL and LTPD sampling plans 27 4 IEC 61747-1-1:2014 IEC 2014 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 11: Generic Generic specification FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization
22、 comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International
23、 Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this
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26、form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpr
27、etation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or
28、 regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried
29、 out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Commit
30、tees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to
31、the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be he
32、ld responsible for identifying any or all such patent rights. International Standard IEC 61747-1-1 was prepared by IEC technical committee 110: Electronic display devices. This Part 1-1 forms the generic specification for liquid crystal display devices. This first edition cancels and replaces the fi
33、rst edition of IEC 61747-1 published in 1998 and Amendment 1:2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) IEC 61747-1, has been divided into IEC 61747-1-1, Liquid crystal display device
34、s Part 1- 1: Generic Generic specification and IEC 61747-1-2, Liquid crystal display devices Part 1-2: Generic Terminology and letter symbols; b) the contents of the terminology have been transferred to IEC 61747-1-2; IEC 61747-1-1:2014 IEC 2014 5 c) Annex C has been changed from normative to inform
35、ative, because Tables C.1 and C.2 mismatch some of the large scale production practices of recent date; d) References cited have been updated. The text of this standard is based on the following documents: CDV Report on voting 110/527/CDV 110/563/RVC Full information on the voting for the approval o
36、f this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 61747 series, under the general title Liquid crystal display devices, can be found on the IEC web
37、site. NOTE The structure of the IEC 61747 series and the changes in the numbering are shown in Annex D of IEC 61747-30-1:2012. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in
38、 the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. 6 IEC 61747-1-1:2014 IEC 2014 LIQUID CRYSTAL DISPLAY DEVICES Part 11: Generic
39、 Generic specification 1 Scope This part of IEC 61747 is a generic specification for liquid crystal display devices. It defines general procedures for testing and gives general rules for the measuring methods of the electrical and optical characteristics, the rules for climatic and mechanical tests,
40、 and the rules for endurance tests. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the refe
41、renced document (including any amendments) applies. IEC 60410:1973, Sampling plans and procedures for inspection by attributes IEC 60747 (all parts), Semiconductor devices Discrete devices IEC 60747-1:2006, Semiconductor devices Part 1: General IEC 60747-10:1991, Semiconductor devices Part 10: Gener
42、ic specification for discrete devices and integrated circuits IEC 60748 (all parts), Semiconductor devices Integrated circuits IEC 60749, Semiconductor devices Mechanical and climatic test methods IEC 61747-1-2, Liquid crystal display devices Part 1-2: Terminology and letter symbols IEC 61747-5, Liq
43、uid crystal and solid-state display devices Part 5: Environmental, endurance and mechanical test methods IEC 61747-10-1, Liquid crystal display devices Part 10-1: Environmental, endurance and mechanical test methods Mechanical IEC 61747-10-2, Liquid crystal display devices Part 10-2: Environmental a
44、nd endurance measurements IEC 61747-20 (all parts), Liquid crystal display devices Visual inspection IEC 61747-30-1, Liquid crystal display devices Part 30-1: Measuring methods for liquid crystal display modules Transmissive type ISO 2859 (all parts), Sampling procedures for inspection by attributes
45、 ISO 2859-1, Sampling procedures for inspection by attributes Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection IEC 61747-1-1:2014 IEC 2014 7 ISO 2859-10, Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of stand
46、ards for sampling for inspection by attributes 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 61747-1-2 apply. 4 Technical aspects 4.1 Order of precedence Where there are conflicting requirements, documents shall rank in the following order of autho
47、rity: a) the detail specification; b) the blank detail specification; c) the family specification, if any; d) the sectional specification; e) the generic specification; f) the basic specification; g) international (e.g. IEC) documents to which reference is made; h) a national document. The same orde
48、r of precedence shall apply to equivalent national documents. 4.2 Standard environmental conditions The preferred values of temperature, humidity and pressure for the measurement of charac- teristics, for tests and for operating conditions, are a temperature of 25 C 5 C, a relative humidity of 45 %R
49、H to 75 %RH, and a pressure of 86 kPa to 106 kPa. 4.3 Marking 4.3.1 Device identification The marking on the device shall enable clear identification of the device. 4.3.2 Device traceability The device shall be provided with a traceability code which enables back-tracing of the device to a certain production or inspection lot. 4.3.3 Packing The marking on the packing shall state: a) the device identification code; b) the traceability code(s) of the e
