1、 INTERNATIONAL STANDARD IEC 61788-7Second edition 2006-10Superconductivity Part 7: Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies Reference number IEC 61788-7:2006(E) Publication numbering As from 1 January 1997 all IEC publications are issued w
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7、er Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 INTERNATIONAL STANDARD IEC 617
8、88-7Second edition 2006-10Superconductivity Part 7: Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies IEC 2006 Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mech
9、anical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch V For pri
10、ce, see current catalogue PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission 2 61788-7 IEC:2006(E) CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references .7 3 Terms and definitions .7 4 Requirements.7 5 Apparatus.8 5.1 Measurement system 8 5.
11、2 Measurement apparatus for R s 9 5.3 Dielectric rods .11 6 Measurement procedure.12 6.1 Specimen preparation .12 6.2 Set-up .12 6.3 Measurement of reference level 12 6.4 Measurement of the frequency response of resonators13 6.5 Determination of surface resistance of the superconductor and and tan o
12、f the standard sapphire rods15 7 Precision and accuracy of the test method16 7.1 Surface resistance 16 7.2 Temperature17 7.3 Specimen and holder support structure .17 7.4 Specimen protection18 8 Test report18 8.1 Identification of test specimen .18 8.2 Report of R svalues .18 8.3 Report of test cond
13、itions18 Annex A (informative) Additional information relating to Clauses 1 to 819 Bibliography32 Figure 1 Schematic diagram of measurement system for temperature dependence of R susing a cryocooler .8 Figure 2 Typical measurement apparatus for R s 10 Figure 3 Insertion attenuation IA, resonant freq
14、uency f 0and half power bandwidth f, measured at T Kelvin13 Figure 4 Reflection scattering parameters (S 11and S 22 )15 Figure 5 Term definitions in Table 4.17 Figure A.1 Schematic configuration of several measurement methods for the surface resistance.20 Figure A.2 Configuration of a cylindrical di
15、electric rod resonator short-circuited at both ends by two parallel superconductor films deposited on dielectric substrates 22 Figure A.3 Computed results of the u-v and W-v relations for TE 01pmode.23 Figure A.4 Configuration of standard dielectric rods for measurement of R sand tan .24 61788-7 IEC
16、:2006(E) 3 Figure A.5 Three types of dielectric resonators 24 Figure A.6 Mode chart to design TE 011resonator short-circuited at both ends by parallel superconductor films 11 .27 Figure A.7 Mode chart to design TE 013resonator short-circuited at both ends by parallel superconductor films 11 .28 Figu
17、re A.8 Mode chart for TE 011closed-type resonator29 Figure A.9 Mode chart for TE 013closed-type resonator30 Table 1 Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHz and 22 GHz 11 Table 2 Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz12 Table 3 Specifications
18、 on vector network analyzer .16 Table 4 Specifications on sapphire rods.16 4 61788-7 IEC:2006(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SUPERCONDUCTIVITY Part 7: Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies FOREWORD 1) The International E
19、lectrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fiel
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27、 property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cite
28、d in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifyin
29、g any or all such patent rights. International Standard IEC 61788-7 has been prepared by IEC technical committee 90: Superconductivity. This second edition cancels and replaces the first edition, published in 2002, of which it constitutes a technical revision. Examples of technical changes made are:
30、 1) closed type resonators are recommended from the viewpoint of the stable measurements, 2) uniaxial- anisotropic characteristics of sapphire rods are taken into consideration for designing the size of the sapphire rods, and 3) recommended measurement frequency of 18 GHz and 22 GHz are added to 12
31、GHz described in the first edition. The text of this standard is based on the following documents: FDIS Report on voting 90/193/FDIS 90/198/RVD 61788-7 IEC:2006(E) 5 Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Th
32、is publication has been drafted in accordance with the ISO/IEC Directives, Part 2. IEC 61788 consists of the following parts, under the general title Superconductivity: Part 1: Critical current measurement DC critical current of Cu/Nb-Ti composite super- conductors Part 2: Critical current measureme
33、nt DC critical current of Nb 3 Sn composite super- conductors Part 3: Critical current measurement DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors Part 4: Residual resistance ratio measurement Residual resistance ratio of Nb-Ti composite superconductors
34、Part 5: Matrix to superconductor volume ratio measurement Copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors Part 6: Mechanical properties measurement Room temperature tensile test of Cu/Nb-Ti composite superconductors Part 7: Electronic characteristic measurements Surface r
35、esistance of superconductors at microwave frequencies Part 8: AC loss measurements Total AC loss measurement of Cu/Nb-Ti composite superconducting wires exposed to a transverse alternating magnetic field by a pickup coil method Part 9: Measurements for bulk high temperature superconductors Trapped f
36、lux density of large grain oxide superconductors Part 10: Critical temperature measurement Critical temperature of Nb-Ti, Nb 3 Sn, and Bi-system oxide composite superconductors by a resistance method Part 11: Residual resistance ratio measurement Residual resistance ratio of Nb 3 Sn composite superc
37、onductors Part 12: Matrix to superconductor volume ratio measurement Copper to non-copper volume ratio of Nb 3 Sn composite superconducting wires Part 13: AC loss measurements Magnetometer methods for hysteresis loss in Cu/Nb-Ti multifilamentary composites The committee has decided that the contents
38、 of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. A bilingu
39、al version of this publication may be issued at a later date. 6 61788-7 IEC:2006(E) INTRODUCTION Since the discovery of some Perovskite-type Cu-containing oxides, extensive research and development (R requires no sample preparation; does not damage or change the film; is highly repeatable; has great
40、 sensitivity (down to 1/1 000 ththe R sof copper); has great dynamic range (up to the R sof copper); can reach high internal powers with only modest input powers; and has broad temperature coverage (4,2 K to 150 K). The dielectric resonator method is selected among several methods 5,6,7 to determine
41、 the surface resistance at microwave frequencies because it is considered to be the most popular and practical at present. Especially, the sapphire resonator is an excellent tool for measuring the R sof HTS materials 8,9. The test method given in this standard can be also applied to other supercondu
42、ctor bulk plates including low Tc material. This standard is intended to provide an appropriate and agreeable technical base for the time being to engineers working in the fields of electronics and superconductivity technology. The test method covered in this standard is based on the VAMAS (Versaill
43、es Project on Advanced Materials and Standards) pre-standardization work on the thin film properties of superconductors. _ 1)Figures in square brackets refer to the Bibliography. 61788-7 IEC:2006(E) 7 SUPERCONDUCTIVITY Part 7: Electronic characteristic measurements Surface resistance of superconduct
44、ors at microwave frequencies 1 Scope This part of IEC 61788 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of R sat the resonant frequency. The applicable measur
45、ement range of surface resistances for this method is as follows: Frequency: 8 GHz f 30 GHz Measurement resolution: 0,01 m at 10 GHz The surface resistance data at the measured frequency, and that scaled to 10 GHz, assuming the f2rule for comparison, are reported. 2 Normative references The followin
46、g referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-815, International Electrotechnical Vocabulary (IEV
47、) Part 815: Superconductivity 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60050-815 apply. In general, surface impedance Z sfor conductors, including superconductors, is defined as the ratio of the electric field E tto the magnetic field H t , ta
48、ngential to a conductor surface: Z s= E t /H t =R s+ jX swhere R sis the surface resistance and X sis the surface reactance. 4 Requirements The surface resistance R sof a superconductor film shall be measured by applying a microwave signal to a dielectric resonator with the superconductor film speci
49、men and then measuring the attenuation of the resonator at each frequency. The frequency shall be swept around the resonant frequency as the centre, and the attenuationfrequency characteristics shall be recorded to obtain Q-value, which corresponds to the loss. The target precision of this method is a coefficient of variation (standard deviation divided by the av
