1、 IEC 62493 Edition 2.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Assessment of lighting equipment related to human exposure to electromagnetic field valuation dun quipement dclairage relativement lexposition humaine aux champs lectromagntiques IEC 62493:2015-03(en-fr) colour inside THIS PU
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20、airage relativement lexposition humaine aux champs lectromagntiques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 29.020, 29.140 ISBN 978-2-8322-2348-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Elect
21、rotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 62493:2015 IEC 2015 CONTENTS FOREWORD . 6 INTRODUCTION . 8 1 Scope 9 2
22、 Normative references 9 3 Terms, definitions, physical quantities, units and abbreviations . 10 3.1 Terms and definitions 10 3.2 Physical quantities and units . 12 3.3 Abbreviations 13 4 Limits 13 4.1 General . 13 4.2 Unintentional radiating part of lighting equipment 14 General . 14 4.2.1Lighting e
23、quipment deemed to comply with the Van der Hoofden test 4.2.2 without testing . 14 Application of limits 14 4.2.3 4.3 Intentional radiating part of lighting equipment 14 5 General requirements Van der Hoofden test 15 5.1 Measurand 15 5.2 Supply voltage and frequency . 15 5.3 Measurement frequency ra
24、nge 16 5.4 Ambient temperature. 16 5.5 Measurement equipment requirements 16 5.6 Measurement instrumentation uncertainty . 17 5.7 Test report 17 5.8 Evaluation of results . 18 6 Measurement procedure for the Van der Hoofden test . 18 6.1 General . 18 6.2 Operating conditions . 18 Operating condition
25、s for lighting equipment . 18 6.2.1Operating conditions for specific lighting equipment 18 6.2.2Operating conditions for lighting equipment with intentional radiators 19 6.2.3 6.3 Measurement distance 19 6.4 Measurement set-up . 19 General . 19 6.4.1Measurement set-up for specific lighting equipment
26、 . 20 6.4.2 6.5 Location of measurement test head 20 6.6 Calculation of the results 20 7 Assessment procedure intentional radiators. 20 7.1 General . 20 7.2 Low-power exclusion method 20 General . 20 7.2.1Determination of the total radiated power 21 7.2.2Determination of the low-power exclusion leve
27、l 21 7.2.3Summation of multiple transmitters 21 7.2.4 7.3 Application of the EMF product standard for body worn-equipment . 21 7.4 Application of the EMF product standard for base stations 21 IEC 62493:2015 IEC 2015 3 7.5 Application of another EMF standard 21 Annex A (normative) Measurement distanc
28、es 23 Annex B (informative) Location of measurement test head . 24 Annex C (informative) Exposure limits . 29 C.1 General . 29 C.2 ICNIRP . 29 C.2.1 ICNIRP 1998 . 29 C.2.2 ICNIRP 2010 . 29 C.3 IEEE . 29 Annex D (informative) Rationale measurement and assessment method 31 D.1 General . 31 D.2 Induced
29、 internal electric field 31 D.2.1 General . 31 D.2.2 Induced electric field due to the magnetic field; E eddy (f i ,d loop ) . 33 D.2.3 Induced electric field due to the electric field; E cap (f i ,d) . 38 D.3 Thermal effects from 100 kHz to 300 GHz . 41 D.3.1 General . 41 D.3.2 The 100 kHz to 30 MH
30、z contribution to the thermal effects 42 D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects . 43 D.3.4 Overall conclusion for the contribution to thermal effects . 44 Annex E (normative) Practical internal electric-field measurement and assessment method . 45 E.1 Measurement of induced
31、internal electric field. 45 E.2 Calculation program 45 E.3 Compliance criterion for the Van der Hoofden head test 46 Annex F (normative) Protection network 47 F.1 Calibration of the protection network . 47 F.2 Calculation of the theoretical characteristic of the protection network 48 Annex G (inform
32、ative) Measurement instrumentation uncertainty . 50 Annex H (informative) Equipment deemed to comply . 52 Annex I (informative) Intentional radiators 54 I.1 General . 54 I.2 Intentional radiators in lighting equipment . 54 I.3 Properties of antennas in lighting applications 54 I.4 Exposure assessmen
33、t approach 60 I.4.1 General . 60 I.4.2 Determination of average total radiated power P int,rad60 I.4.3 Determination of the low-power exclusion level P max61 I.5 Multiple transmitters in a luminaire 61 I.6 Exposure to multiple luminaires 62 I.7 References in Annex I . 62 Bibliography 64 Figure 1 Com
34、pliance routes and pass/fail criteria for lighting equipment 15 Figure 2 The Van der Hoofden test head 16 Figure 3 Example of a protection circuit . 17 4 IEC 62493:2015 IEC 2015 Figure 4 Measurement set-up 19 Figure 5 Compliance demonstration procedure for the intentional-transmitter part of the lig
35、hting equipment . 22 Figure B.1 Location of measurement point in the transverse direction of lighting equipment side view 24 Figure B.2 Location of measurement points in the longitude direction of lighting equipment side view 24 Figure B.3 Location of measurement points in the longitude direction of
36、 lighting equipment; in the direction of illumination . 25 Figure B.4 Location of measurement point for lighting equipment with rotationally symmetrical dimensions 25 Figure B.5 Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumin
37、ation 26 Figure B.6 Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis 26 Figure B.7 Location of measurement point(s) for lighting equipment with single capped lamp (360 illumination) 27 Figure B.8 Location of measurement points for lighting equipment
38、 with a remote controlgear . 27 Figure B.9 Location of measurement point for an independent electronic converter 28 Figure B.10 Location of measurement point(s) for an uplighter (floor standing/suspended) . 28 Figure D.1 Overview measurement and assessment method 31 Figure D.2 Distances of the head,
39、 loop and measurement set-up . 33 Figure D.3 Maximum current in the 2 m LLA as function of the frequency 35 Figure D.4 Induced internal electric field and associated limit levels 37 Figure D.5 Example of magnetic-field test result using the LLA 38 Figure D.6 Distances of the head and measurement set
40、-up . 39 Figure D.7 Plot of Equation (D.20) . 39 Figure D.8 Example of the CM-current measured using a conducted emission test 43 Figure F.1 Test set-up for normalization of the network analyser 47 Figure F.2 Test set-up for measurement of the voltage division factor using a network analyser . 48 Fi
41、gure F.3 Calculated theoretical characteristic for the calibration of the protection network . 49 Figure H.1 Flow chart to determine applicability deemed to comply without F factor measurement 53 Figure I.1 Luminaire with a transmitting antenna in a room. 56 Figure I.2 Impact of a conducting ceiling
42、/plane 57 Figure I.3 Electric field of a small electrical dipole: analytical formula vs far-field approximation . 58 Figure I.4 Electric field as a function of distance, antenna gain and input power (far- field approximation) 59 Figure I.5 Impact of pulsed signals on the average exposure . 60 Table
43、1 Physical quantities and units . 13 Table 2 Receiver or spectrum analyser settings . 16 Table A.1 Lighting equipment and measurement distances 23 IEC 62493:2015 IEC 2015 5 Table C.1 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 1
44、00 kHz and 10 GHz 29 Table C.2 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz 29 Table C.3 IEEE basic restrictions (BR) for the general public . 30 Table C.4 IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the gener
45、al public 30 Table D.1 Induced internal electric field calculations 34 Table D.2 Calculation main contributions . 40 Table D.3 Frequency steps for the amplitude addition that equals 1,11 times B 641 Table D.4 Frequency steps for the power addition that equals 0,833 times B 6. 42 Table D.5 Field stre
46、ngth limits according to CISPR 15 . 43 Table E.1 Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007) . 46 Table G.1 Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz . 50 Table G.2 Comments and informati
47、on to Table G.1 51 Table I.1 Overview of wireless radio technologies that might be applied in lighting systems 55 6 IEC 62493:2015 IEC 2015 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ASSESSMENT OF LIGHTING EQUIPMENT RELATED TO HUMAN EXPOSURE TO ELECTROMAGNETIC FIELDS FOREWORD 1) The International E
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