1、 IEC/TS 62500 Edition 1.0 2008-07 TECHNICAL SPECIFICATIONProcess management for avionics Defining and performing highly accelerated tests in aerospace systems Application guide IEC/TS 62500:2008(E) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. U
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9、NProcess management for avionics Defining and performing highly accelerated tests in aerospace systems Application guide INTERNATIONAL ELECTROTECHNICAL COMMISSION W ICS 03.100.50; 31.020; 49.060 PRICE CODE ISBN 2-8318-9933-8 Registered trademark of the International Electrotechnical Commission 2 TS
10、62500 IEC:2008(E) CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Terms and definitions .7 3 Acronyms .9 4 Highly accelerated test goals and principles .10 4.1 General characteristics10 4.2 General principles of highly accelerated tests11 4.3 Example of the limitations of highly accelerated tests13 5
11、 Industrial technical domains covered by highly accelerated tests14 6 Highly accelerated tests in the lifecycle and associated assembly levels 14 7 Planning and management of highly accelerated tests16 7.1 General .16 7.2 Validation and verification .16 7.3 Planning of highly accelerated tests 17 7.
12、4 Management of highly accelerated tests18 8 General methodology for implementing highly accelerated tests .18 8.1 Structure of the approach18 8.2 Analysis of product sensitive points.19 8.3 Selection of applicable stresses 20 8.4 Producing a test plan.21 8.5 Performing tests23 8.6 Analysis of test
13、results, corrective action and resumption of testing.24 9 Building on and using experience .24 9.1 General .24 9.2 Creating the database .25 9.3 Inclusion in the company reference system .25 9.4 Use of results for environmental stress screening25 9.5 Correlation with feedback26 9.6 Synthesis and imp
14、act on company culture .26 10 Customer/supplier relations26 10.1 Prime contractor/supplier relations 26 10.1.1 Responsibilities .26 10.1.2 Contract procedures 27 10.1.3 Tests synthesis27 10.2 Supplier/test laboratory relations .27 11 Costs and savings 28 11.1 General .28 11.2 “Non-reliability“ costs
15、 28 11.2.1 Cost in delayed time to market 28 11.2.2 Cost of an in-service failure.29 11.2.3 Cost of a recovery operation30 11.2.4 Impact on brand image 30 11.3 Expenses generated by the highly accelerated tests30 11.3.1 Engineering upstream of testing 30 TS 62500 IEC:2008(E) 3 11.3.2 Test resources
16、used 31 11.3.3 Manpower dedicated to highly accelerated tests31 11.3.4 The cost of damaged or destroyed products 31 Annex A (informative) Comparative characteristics of highly accelerated tests and reliability tests 32 Annex B (informative) Example of potential effectiveness table for stresses or lo
17、adings according to the nature of the product sensitive point .33 Annex C (normative) Highly accelerated tests implementation logic .34 Annex D (informative) Margin-related statistical considerations Example: telecommunications circuit boards or board assembly.36 Bibliography38 Figure 1 Exploration
18、of margins using a highly accelerated test .13 Figure 2 Financial losses generated by a delay in time to market.29 Figure C.1 General logical flowchart 34 Figure C.2 Details of test performance.35 Figure D.1 Examples of the margin options open to the designer .37 Table A.1 Comparative characteristic
19、s of highly accelerated tests and reliability tests .32 Table B.1 Example of potential effectiveness table for stresses or loadings according to the nature of the product sensitive point .33 4 TS 62500 IEC:2008(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PROCESS MANAGEMENT FOR AVIONICS DEFINING A
20、ND PERFORMING HIGHLY ACCELERATED TESTS IN AEROSPACE SYSTEMS APPLICATION GUIDE FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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31、on of a technical specification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical development or where, for any other reason, there is the future but no immediate possibility of an agreemen
32、t on an International Standard. Technical specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC 62500, which is a technical specification, has been prepared by IEC technical committee 107: Process management
33、 for avionics. TS 62500 IEC:2008(E) 5 This technical specification cancels and replaces IEC/PAS 62500 published in 2006. This first edition constitutes a technical revision. The text of this technical specification is based on the following documents: Enquiry draft Report on voting 107/79/DTS 107/90
34、/RVC Full information on the voting for the approval of this technical specification can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication
35、 will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be transformed into an International standard, reconfirmed, withdrawn, replaced by a revised editio
36、n, or amended. A bilingual version of this publication may be issued at a later date. 6 TS 62500 IEC:2008(E) INTRODUCTION In an increasingly harsh economic context (tighter performance requirements, shorter development cycles, reduced cost of ownership, etc.), it is essential to ensure product matur
37、ity rapidly and, in any case, by the time of commissioning. It is with a view to remedying shortcomings in traditional development methods that “highly accelerated“ tests have been developed. The main underlying principle behind this new type of test strategy is as follows: rather than reasoning in
38、terms of conformity with a specification and simply performing conventional tests, it is on the contrary attempted to push the product to its limits by applying environmental stresses and/or stimuli of levels higher than the specification. The aim is thus to take full advantage of current technologi
39、es, by eliminating defects which generate potential failures, as of the first prototypes. A well-conducted accelerated test process should, in a relatively short time, lead to a significant increase in the robustness of a product, as early as the initial prototypes stage at the beginning of the deve
40、lopment phase, thus accelerating early maturity of this product. Furthermore, identification of the margins available on a “mature“ product helps to design and size its future environmental stress screening profile more accurately, by increasing the severity of the loadings applied to just what is n
41、eeded, leading to a particularly significant boost in the efficiency of this environmental stress screening process. TS 62500 IEC:2008(E) 7 PROCESS MANAGEMENT FOR AVIONICS DEFINING AND PERFORMING HIGHLY ACCELERATED TESTS IN AEROSPACE SYSTEMS APPLICATION GUIDE 1 Scope This technical specification spe
42、cifies the targets assigned to highly accelerated tests, their basic principles, their scope of application and their implementation procedures. It is primarily intended for programme managers, designers, test managers, and RAMS experts to facilitate the draft of the specification and execution of h
43、ighly accelerated tests. This guide is applicable to all programmes and is of primary interest to the industrial firms in charge of designing, developing and producing equipment built for these programmes, and also their customers who, in drafting contractual clauses, may require that their supplier
44、s implement highly accelerated tests. NOTE This technical specification applies to all types of equipment used in systems developed in these programmes, whatever their nature (electronic, electromechanical, mechanical, electro-hydraulic, electro- pneumatic, etc.) and whatever their size, from “low-l
45、evel“ subassemblies (PCBs, mechanical assemblies, connectors, etc.), up to system level groups of equipment. 2 Terms and definitions For the purposes of this document, the following terms and definitions apply. NOTE Most of the terminology used in this technical specification conforms to that used i
46、n Recommendation RG.Aro 000 27. For the other terms, it relies on those used in other documents, such as ET 99.04 (see Bibliography). 2.1 step stressing gradual step-wise increase in the level of stress applied to a product 2.2 hard failure failure which does not disappear on returning to a lower st
47、ress level and which can only be eliminated by repair 2.3 soft failure failure appearing after a certain given stress level, which disappears when the stress falls back below this level 2.4 extrinsic defect fault or weakness inherent in the design of a product or its manufacturing processes and the
48、elimination of which, presumed to be economically feasible, leads to an improvement in its operating and/or destruction margins NOTE This type of defect, which is always the result of a deviation from standard best practices, is not by definition related to the intrinsic limit imposed by the technol
49、ogies used. 2.5 intrinsic defect defect related to the component design, materials, processing, assembly or packaging and provoked under circumstances within the components design specifications 8 TS 62500 IEC:2008(E) 2.6 latent defect defect which originally exists in the equipment but has not yet been precipitated and is thus as yet undetectable by conventional performance checks on this equipment 2.7 patent defect defect in a component which, after being precipitated,
