1、 IEC 60512-8-2 Edition 1.0 2011-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 8-2: Static load tests (fixed connectors) Test 8b: Static load, axial Connecteurs pour quipements lectroniques Essais et mesures Partie 8-2: Essais de charge
2、 statique (embases) Essai 8b: Charge statique axiale IEC 60512-8-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic o
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16、ublication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-8-2 Edition 1.0 2011-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 8-
17、2: Static load tests (fixed connectors) Test 8b: Static load, axial Connecteurs pour quipements lectroniques Essais et mesures Partie 8-2: Essais de charge statique (embases) Essai 8b: Charge statique axiale INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE G ICS 3
18、1.220.01 PRICE CODE CODE PRIX ISBN 978-2-88912-444-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-8-2 IEC:2011 CONTENTS FOREWORD . 3 1 Scope and object 5 2 Normative references . 5 3 Preparation 5 Preparat
19、ion of the specimen 5 3.1Equipment . 5 3.2Mounting . 5 3.3 4 Test method . 6 5 Final measurements . 6 6 Requirements . 6 7 Details to be specified 6 Bibliography 7 60512-8-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 8-2: St
20、atic load tests (fixed connectors) Test 8b: Static load, axial FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
21、co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referre
22、d to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in t
23、his preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an internatio
24、nal consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable
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27、Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7)
28、 No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for cos
29、ts (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct applic
30、ation of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-8-2 has been prepared by subcom
31、mittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 8b of IEC 60512-5, issued in 1992, and constitutes a technical revision. This standard is to be read in conjunction with IEC
32、 60512-1 and IEC 60512-1-100, which explains the structure of the IEC 60512 series. 4 60512-8-2 IEC:2011 The text of this standard is based on the following documents: CDV Report on voting 48B/2120/CDV 48B/2213/RVC Full information on the voting for the approval of this standard can be found in the
33、report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The co
34、mmittee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised ed
35、ition, or amended. 60512-8-2 IEC:2011 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 8-2: Static load tests (fixed connectors) Test 8b: Static load, axial 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within th
36、e scope of IEC technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the ability of a fixed connector to withstand a steady axial force which might occur during normal use
37、. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1, Connectors
38、for electronic equipment Tests and measurements Part 1: General IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-1-100, Connectors for electronic equipment Tests and measurements Part 1-100: General Applicab
39、le publications 3 Preparation Preparation of the specimen 3.1 The specimen shall not be wired but shall be fitted with such accessories as may be required by the detail specification. Equipment 3.2 A suitable test tool (e.g. a universal materials testing machine) and appropriate adapters shall be us
40、ed. Mounting 3.3 Unless otherwise specified, the specimen shall be mounted in the normal manner, using the normal panel or chassis cut-out as laid down in the detail specification. NOTE The plate should be strong enough to sustain the applied forces. The length and width of the plate should be such
41、that the contour of the specimen is exceeded. 6 60512-8-2 IEC:2011 4 Test method A specified force shall be applied to the specimen at the point and in the direction(s) as specified in the detail specification. This force shall be steadily increased up to the specified value and maintained for 1 min
42、. Unless otherwise specified in the detail specification, the force shall be perpendicular to the mounting plate. 5 Final measurements a) Visual examination (IEC 60512-1-1, Test 1a). b) Applicable operational characteristics. NOTE if applicable, the detail specification may require a sealing test fr
43、om the IEC 60512-14 series or an ingress protection test according to IEC 60529. 6 Requirements There shall be no damage which would impair normal operation. 7 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) mounting of the
44、 specimen, including dimensions of the panel cut-out; b) type of accessories, if required; c) value of the force, and the rate of increase; d) location, direction of the axis and duration of the application of the force, e) shape of the fixture or tool used for applying the force; f) requirements fo
45、r final measurements; g) any deviation from the standard test method. 60512-8-2 IEC:2011 7 Bibliography IEC 60512-14 (all parts), Connectors for electronic equipment Tests and measurements Part 14: Sealing tests IEC 60529, Degrees of protection provided by enclosures (IP Code) _ 8 60512-8-2 CEI:2011
46、 SOMMAIRE AVANT-PROPOS 9 1 Domaine dapplication et objet 11 2 Rfrences normatives . 11 3 Prparation 11 3.1 Prparation du spcimen . 11 3.2 Equipement . 11 3.3 Montage 11 4 Mthode dessai . 12 5 Mesures finales 12 6 Exigences 12 7 Dtails spcifier . 12 Bibliographie . 13 60512-8-2 CEI:2011 9 COMMISSION
47、LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 8-2: Essais de charge statique (embases) Essai 8b: Charge statique axiale AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de l
48、ensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes intern
49、ationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. L
