1、 IEC 61000-4-23 Edition 2.0 2016-10 INTERNATIONAL STANDARD Electromagnetic compatibility (EMC) Part 4-23: Testing and measurement techniques Test methods for protective devices for HEMP and other radiated disturbances IEC 61000-4-23:2016-10(en) BASIC EMC PUBLICATION colour inside THIS PUBLICATION IS
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11、tromagnetic compatibility (EMC) Part 4-23: Testing and measurement techniques Test methods for protective devices for HEMP and other radiated disturbances INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 33.100.99 ISBN 978-2-8322-3687-1 BASIC EMC PUBLICATION Registered trademark of the International El
12、ectrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 61000-4-23:2016 IEC 2016 CONTENTS FOREWORD . 6 INTRODUCTION . 8 1 Scope 9 2 Normative references 9 3 Terms and definitions 10 4 HEMP test concepts 15 4.1 General . 15 4
13、.2 Testing of shielding enclosures . 16 4.2.1 General . 16 4.2.2 Buildings . 19 4.2.3 Shelters and shielded rooms 20 4.2.4 Cabinets, racks and boxes . 21 4.3 Testing of shielded cables and connectors 23 4.3.1 General . 23 4.3.2 Testing of cable shields . 23 4.3.3 Testing of cable connectors . 26 4.4
14、 Testing of shielding materials 27 4.4.1 General . 27 4.4.2 Conducting gaskets . 27 4.4.3 Conducting sheets and screens . 29 4.4.4 Cut-off waveguides and honeycombs . 32 4.5 Summary of test concepts . 33 5 Test methods for measuring the shielding effectiveness of HEMP protection facilities . 34 5.1
15、General . 34 5.2 Electromagnetic field testing . 34 5.2.1 General . 34 5.2.2 Pulse field testing 34 5.2.3 CW field testing . 40 5.3 Current injection test procedures 55 5.3.1 General . 55 5.3.2 Injection testing of enclosures . 55 5.3.3 Transfer impedance and admittance of cable shields and connecto
16、rs 57 5.3.4 Testing of gasket material 57 Annex A (informative) HEMP test concepts for electrical systems 60 A.1 Overview. 60 A.2 Types of HEMP tests 60 A.2.1 General . 60 A.2.2 System-level transient tests . 60 A.2.3 CW field illumination tests . 61 A.2.4 Current injection testing . 61 A.2.5 Partia
17、l illumination testing 62 A.2.6 Subsystem and component testing 62 A.3 Definition of the testing interface . 63 A.4 Use of test data 65 A.4.1 General . 65 IEC 61000-4-23:2016 IEC 2016 3 A.4.2 Acceptance of new systems . 65 A.4.3 System assessments . 65 A.4.4 Hardness surveillance monitoring 65 A.4.5
18、 System design . 65 A.5 Testing uncertainties . 66 Annex B (informative) Characterization of shielded cables . 67 B.1 Fundamentals of cable shielding . 67 B.2 Definitions of transfer impedance and transfer admittance 68 B.3 Relative significance of Z tand Y t. 71 Annex C (informative) Equipment for
19、HEMP pulse measurements 72 C.1 General . 72 C.2 Sensors for HEMP measurements . 72 C.2.1 B- and H-field sensors . 72 C.2.2 D- and E-field sensors . 74 C.2.3 Current sensors . 76 C.3 Signal transmission . 77 C.3.1 General . 77 C.3.2 Fibre optic links . 77 C.3.3 Fibre optic transducers 78 C.4 Signal d
20、etection and processing . 78 Annex D (informative) Equipment for CW testing . 80 D.1 General . 80 D.2 Antenna system 80 D.3 Power amplifier . 82 D.4 Receiver (network analyser) 83 D.5 Reference and response sensors 83 D.6 Fibre optic system . 85 D.7 Limitations of measurements 88 Annex E (informativ
21、e) Characterization of a planar shield for HEMP protection 89 E.1 General . 89 E.2 Problem geometry . 90 E.3 Equivalent circuit representation . 91 E.3.1 General . 91 E.3.2 Chain parameter representation of the shield . 92 E.3.3 Circuit responses . 93 Annex F (informative) Inside-to-out measurement
22、method . 97 F.1 Purpose 97 F.2 Comparison of existing SE test methods . 97 F.3 Inside-to-out SE test of shielded rooms . 98 F.3.1 Measurements of the inside-to-out SE . 98 F.3.2 Summary . 101 Bibliography 102 Figure 1 Example of measured magnitude and phase of the transfer function T( ) = H in /H ou
23、tfor a shielded enclosure 17 Figure 2 Electric field and magnetic field shielding effectiveness of a 0,5 mm thick aluminum enclosure 29 . 18 Figure 3 Measured magnetic field shielding effectiveness SE Hfor a building 19 4 IEC 61000-4-23:2016 IEC 2016 Figure 4 Conceptual illustration of the HEMP test
24、 of a building 19 Figure 5 Illustration of a shielded room or enclosure excited by HEMP fields . 21 Figure 6 Illustration of equipment racks, cabinets and box excited by internal HEMP disturbance . 21 Figure 7 A general shield excited by current injection 22 Figure 8 Basic configuration for transfer
25、 impedance measurement . 24 Figure 9 Measured transfer impedance magnitude and phase of transfer impedance per unit length for four braided shield cables with good shielding properties . 25 Figure 10 Basic configuration for transfer admittance measurement . 26 Figure 11 Test configuration for transf
26、er impedance measurement of a cable connector 26 Figure 12 Examples of conducting gaskets used as HEMP protection devices . 28 Figure 13 Circuit model representing the behaviour of a conducting gasket for HEMP protection . 28 Figure 14 Measurement configuration for the resistivity of a sample . 29 F
27、igure 15 Test concept for measuring the resistivity with surface probes . 30 Figure 16 Concepts for shielding effectiveness measurement of conducting sheets and screens 32 Figure 17 Example of the calculated plane-wave shielding effectiveness of a 0,01 mm thick plate of different material as a funct
28、ion of frequency 32 Figure 18 Cut-off waveguides and honeycomb used as protective elements . 33 Figure 19 Examples of full-scale, pulse-radiating HEMP simulators 37 Figure 20 Test procedure for the pulse test 39 Figure 21 Typical configuration of a CW test facility . 40 Figure 22 Example CW measurem
29、ent set-up . 41 Figure 23 Test and analysis procedures for conducting a CW test 42 Figure 24 Analysis flow diagram for extrapolating a measured CW spectrum to the HEMP response 43 Figure 25 Example scan from 9 kHz to 3 GHz for the ambient electromagnetic field from communication signals 44 Figure 26
30、 Test procedure for the ambient EM excitation test 45 Figure 27 Double-ended TEM cell for field illumination testing of small enclosures 46 Figure 28 Example test set-up for field illumination in the TEM cell 47 Figure 29 Illustration of the single-ended TEM cell and associated equipment . 48 Figure
31、 30 Test set-up for the plane-wave shielding effectiveness measurements . 50 Figure 31 Test set-up for the H-field shielding effectiveness measurements . 51 Figure 32 Example of antenna locations for the localized antenna tests for a hypothetical shielded enclosure or facility . 52 Figure 33 Test co
32、ncept and equipment configuration for current injection testing of a shielded enclosure or box . 56 Figure 34 Surface probe for volume resistivity measurement . 59 Figure A.1 Sample HEMP interaction diagram illustrating penetration mechanisms, system responses and generic test interface locations 64
33、 Figure B.1 Geometry of a shielded coaxial line with an internal circuit . 67 Figure B.2 Coaxial cable located over a conducting ground plane 68 Figure B.3 Two per-unit-length circuits formed by the sheath and its ground return, and the sheath and the internal conductor 69 IEC 61000-4-23:2016 IEC 20
34、16 5 Figure C.1 Magnetic field sensors 23 . 73 Figure C.2 Single-slot, cylindrical coil sensor 23 73 Figure C.3 Two- and four-slot cylindrical coil sensors 23 74 Figure C.4 Electrical configuration of an E-field sensor 23 . 74 Figure C.5 Biconical E-field sensor 75 Figure C.6 E-field sensor mounted
35、on a conducting ground plane 23 . 75 Figure C.7 Equipotential shapes for an optimally designed E-field sensor 23 . 75 Figure C.8 Rogowski coil used for current measurements 23 . 76 Figure C.9 Toroidal current sensor made of magnetic material 23 76 Figure C.10 Voltage pick-up points on the edges of t
36、he toroidal sensor 23 . 76 Figure C.11 Example of a single-channel fibre optic transmission system 23 . 77 Figure C.12 Attenuation of coaxial lines and fibre optic cables as a function of frequency 78 Figure D.1 Various antennas for CW testing. 81 Figure D.2 Relationship between the CW antenna and t
37、he incident HEMP field . 82 Figure D.3 Incident and ground-reflected field contributions to the reference sensor excitations 84 Figure D.4 Measured reference H-field spectrum and its inverse Fourier transform 85 Figure D.5 Measured sensor responses and calibration function 87 Figure D.6 Measured tra
38、nsfer function, corrected by calibration file . 87 Figure E.1 Example of a general shielding problem 89 Figure E.2 Behaviour of the impedance ratio EH as a function of distance from a source 29 90 Figure E.3 Conducting slab of thickness, d, and infinite extent serving as an electromagnetic barrier .
39、 91 Figure E.4 Equivalent circuit representation of the shielding problem . 92 Figure E.5 Two-port representation of a circuit . 93 Figure F.1 Test set-up for the outside-to-in and inside-to-out SE measurement 100 Table 1 Recommended test procedure for different test objects . 34 Table 2 Dimensions
40、and composition of distances d 1to d 3 , with reference to Figure 30 50 Table 3 Dimensions and composition of distances d 1to d 3 , with reference to Figure 31 51 Table 4 Measurement frequencies and antennas in plane-wave . 52 Table 5 Measurement frequencies and antennas in magnetic field . 54 Table
41、 E.1 Surface resistance and electrical parameters for selected materials . 95 Table F.1 Comparison with other standards . 98 Table F.2 Test shielded rooms . 99 Table F.3 Comparison of the SE measurement results . 101 6 IEC 61000-4-23:2016 IEC 2016 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROM
42、AGNETIC COMPATIBILITY (EMC) Part 4-23: Testing and measurement techniques Test methods for protective devices for HEMP and other radiated disturbances FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechni
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