1、 INTERNATIONAL STANDARD IEC CEINORME INTERNATIONALE 61290-10-4 First edition Premire dition 2007-05Optical amplifiers Test methods Part 10-4: Multichannel parameters Interpolated source subtraction method using an optical spectrum analyzer Amplificateurs optiques Mthodes dessais Partie 10-4: Paramtr
2、es canaux multiples Mthode par soustraction de la source interpole en utilisant un analyseur de spectre optique Reference number Numro de rfrence IEC/CEI 61290-10-4:2007 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, n
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15、rst edition Premire dition 2007-05Optical amplifiers Test methods Part 10-4: Multichannel parameters Interpolated source subtraction method using an optical spectrum analyzer Amplificateurs optiques Mthodes dessais Partie 10-4: Paramtres canaux multiples Mthode par soustraction de la source interpol
16、e en utilisant un analyseur de spectre optique Q Commission Electrotechnique Internationale International Electrotechnical Commission PRICE CODE CODE PRIX For price, see current catalogue Pour prix, voir catalogue en vigueur 2 61290-10-4 IEC:2007 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope and object
17、6 2 Normative references .6 3 Abbreviated terms 7 4 Apparatus.7 5 Test sample8 6 Procedure 9 6.1 Calibration.9 6.1.1 Calibration of optical bandwidth.9 6.1.2 Calibration of OSA power correction factor 10 6.2 Measurement 11 6.3 Calculation 12 7 Test results 12 Annex A (normative) Limitations of the i
18、nterpolated source subtraction technique due to source spontaneous emission.13 Bibliography17 Figure 1 Apparatus for gain and noise figure measurement7 Figure A.1 DI subtraction error as a function of source spontaneous emission level.14 Figure A.2 Spectral plot showing additive higher noise level f
19、rom spontaneous emission of individual laser sources and broadband multiplexer16 Figure A.3 Significantly reduced spontenous emmision using wavelength selective multiplexer16 61290-10-4 IEC:2007 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL AMPLIFIERS TEST METHODS Part 10-4: Multichannel par
20、ameters Interpolated source subtraction method using an optical spectrum analyzer FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to pro
21、mote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides
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23、so participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as poss
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28、g individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance
29、 upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the eleme
30、nts of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61290-10-4 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre
31、optics. This standard shall be used in conjunction with IEC 61291-1. It was established on the basis of the second (2006) edition of that standard. The text of this standard is based on the following documents: CDV Report on voting 86C/724/CDV 86C/742/RVC Full information on the voting for the appro
32、val of this standard can be found in the report on voting indicated in the above table. 4 61290-10-4 IEC:2007 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61290 series, published under the general title Optical amplifiers Test me
33、thods, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication w
34、ill be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61290-10-4 IEC:2007 5 INTRODUCTION This International Standard is devoted to the subject of optical amplifiers. The technology of optical amplifiers is still rapidly evolving, hence amendments and new additions to this standar
35、d can be expected. 6 61290-10-4 IEC:2007 OPTICAL AMPLIFIERS TEST METHODS Part 10-4: Multichannel parameters Interpolated source subtraction method using an optical spectrum analyzer 1 Scope and object This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) and optically
36、 amplified subsystems. It applies to OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor optical amplifiers (SOAs) and waveguides (POWA). The object of this standard is to establish uniform requirements for accurate and reliable meas
37、urements, by means of the interpolated source subtraction method using an optical spectrum analyzer. The following OA parameters, as defined in Clause 3 of IEC 61291-1, are determined: channel gain, and channel signal-spontaneous noise figure. This method is called interpolated source subtraction (I
38、SS) because the amplified spontaneous emission (ASE) at each channel is obtained by interpolating from measurements at a small wavelength offset around each channel. To minimize the effect of source spontaneous emission, the effect of source noise is subtracted from the measured noise. The accuracy
39、of the ISS technique degrades at high input power level due to the spontaneous emission from the laser source(s). Annex A provides guidance on the limits of this technique for high input power. An additional source of inaccuracy is due to interpolation error. Annex A provides guidance on the magnitu
40、de of interpolation error for a typical amplifier ASE versus wavelength characteristic. NOTE 1 All numerical values followed by () are suggested values for which the measurement is assured. Other values may be acceptable but should be verified. NOTE 2 General aspects of noise figure test methods are
41、 reported in IEC 61290-3. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
42、IEC 61291-1:2006, Optical amplifiers Part 1: Generic specification IEC 61291-4: Optical amplifiers Part 4: Multichannel applications Performance specification template 61290-10-4 IEC:2007 7 3 Abbreviated terms Each abbreviation introduced in this standard is explained in the text at least the first
43、time it appears. However, for an easier understanding of the whole text, the following is a list of all abbreviations used in this standard: ASE Amplified spontaneous emission DI Direct interpolation (technique) FWHM Full-width half-maximum ISS Interpolated source subtraction NF Noise figure RBW Res
44、olution bandwidth OA Optical amplifier OFA Optical fibre amplifier OSA Optical spectrum analyzer POWA Planar optical waveguide amplifier PCF Power correction factor SOA Semiconductor optical amplifier SSE Source spontaneous emission 4 Apparatus 4.1 Multichannel source This optical source consists of
45、 n laser sources where n is the number of channels for the test configuration. The full width at half maximum (FWHM) of the output spectrum of the laser sources shall be narrower than 0,1 nm () so as not to cause any interference to adjacent channels. The suppression ratio of the side modes of the s
46、ingle-line laser shall be higher than 35 dB (). The output power fluctuation shall be less than 0,05 dB (), which is more easily attainable with an optical isolator placed at the output port of each source. The wavelength accuracy shall be better than 0,1 nm () with stability better than 0,01 nm ().
47、 The spontaneous emission level must be less than -43 dB/nm with respect to the total input power for 0 dBm total input power and less than -48 dB/nm with respect to the total input power for 5 dBm total input power (). See Annex A for a discussion of the impact of the spontaneous emission level on
48、the accuracy of noise figure measurements. 1dB Polarization controller Variable optical attenuator OA under test Optical spectrum analyzer Multichannel source Calibration pathOptical combiner 2 nIEC 746/07 Figure 1 Apparatus for gain and noise figure measurement 8 61290-10-4 IEC:2007 4.2 Polarizatio
49、n controller This device shall be able to convert any state of polarization of a signal to any other state of polarization. The polarization controller may consist of an all-fibre polarization controller or a quarter-wave plate rotatable by a minimum of 90 followed by a half-wave plate rotatable by a minimum of 1
