1、 The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1999 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 24 June 1999. Printed in the United States of America.Print:ISBN 0-7381-1545-2 SH9
2、4721PDF:ISBN 0-7381-1546-0 SS94721No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1226-1998(Revision ofIEEE Std 1226-1993)IEEE ABBETIEEE Trial-Use Standard for A Broad-Based Envi
3、ronment for Test (ABBET)Overview and ArchitectureSponsorIEEE Standards Coordinating Committee 20Abbreviated Test Language for All Systems (ATLAS)Approved 8 December 1998IEEE-SA Standards BoardAbstract:The overall concept of A Broad-Based Environment for Test (ABBET)TMis defined, andmandatory require
4、ments for implementation of ABBET are specified. The elements of ABBET andtheir interrelationships are described. Guidelines and requirements governing the elements of theABBET set of standards and guides are established, and common terms to be used throughout theset are defined.Keywords:ABBETTM, pr
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17、s attention.Copyright 1999 IEEE. All rights reserved.iiiIntroductionThis introduction is not part of IEEE Std 1226-1998, IEEE Trial-Use Standard for A Broad-Based Environment for Test(ABBET), Overview and Architecture.The benefits of using standards in test-related applications have long been recogn
18、ized. The scope for stan-dardization extends from low-level standards associated with test instrument control to high-level standardsassociated with specifying tests in an implementation-independent manner.In the 1960s, Aeronautical Radio, Incorporated (ARINC) started the development of the Abbrevia
19、ted TestLanguage for Avionics Systems (ATLAS). In 1976, management of the ATLAS standard was passed to theIEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect itsbroader field of applications.Within the IEEE, development of ATLAS and ATLAS-related standards
20、 was vested in an ad hoc committee,which later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid-1980s, SCC20broadened the scope of its activities to embrace other standards projects related to test and diagnosis, includ-ing Automatic Test Program Generation (ATPG), Test Equipm
21、ent Description Language (TEDL), ArtificialIntelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), and A Broad Based Environ-ment for Test (ABBET).This standard provides the framework for a family of standards providing software interface specificationsfor test-related applicatio
22、ns and environments. This family incorporates object-oriented technology andinformation modeling to specify programming language-independent interfaces between elements within awide variety of test environments, including built-in test systems (BIT), automatic test systems (ATS), andmanual test envi
23、ronments. These interfaces are specified using the ISO 10303-11:1994 EXPRESS informa-tion modeling language and the Object Management Group (OMG) Interface Definition Language (IDL).This standard defines the ABBET architecture primarily through the definition of a Core Test InformationModel (CTIM) a
24、nd a test foundation framework (TFF). The CTIM defines the basic information entitiesrequired in any test application and provides a vehicle for formally modeling behavior within a test environ-ment. The TFF defines a class hierarchy corresponding to these basic information entities and provides sev
25、-eral methods within each class to enable basic operations to be performed on these entities. Componentstandards within the ABBET architecture define subclasses from the TFF specific to particular requirementswithin the test environment.ivCopyright 1999 IEEE. All rights reserved.At the time this sta
26、ndard was completed, the ABBET Subcommittee had the following membership.Gary L. Hardenburg,ChairGayle Matysek,SecretaryKirk Thompson,Architecture Working Group ChairIn addition, the following persons made significant contributions to this standard:Guy AdamJames D. BakerBrad BalfourJean-Yves Barbier
27、Darrel BartzAnne BautistaAldo BernalMichael BlairStephen M. BowenGreg BowmanAlan L. BridgesDavid M. BrooksRon BrooksDale BrownTheodor CalinLarry CarpenterE. Elaine CasharRichard D. ChurcherGeorge ClariusChristopher ConnellyJames CottrellBob CramKent CrossRobert J. CurryDavid DahlbackaBernard DathyDa
28、nny C. DavisJake DawsonJeff DeanSomnath DebGerald DePasqualeBernd DinklageKeith EllisMichael T. EllisHorst EyRob FletcherStephen FortierKen FoxWilliam Brit FrankJoe GileRoger GoldbergJerry GrassoArnold M. GreenspanGreg GriffesJohn HalperArthur HannRobert G. HayesLeonard HaynesBob HillmanAshley M. B.
29、 HulmeUlla JacobssonAndrew M. JoskowskiFrank X. KearnsDavid KiddLars-Olov LarssonHans LecluyseRobert LeifJames L. LewisTerry LindemannAlfred LowensteinRichard J. MaguireMichael MalesichMichael MartinHarry McGuckinDoug McNabbMartin MethJames M. MillsJames MooreCharlie MorrisDavid S. MorrisWilliam P.
30、NeblettTom NewtonDavid L. NicholsNick NicholsonHans ObermeierChuck OliverioLeslie A. OrlidgeDave PawsonEdward G. PerkinsJean PouillyJohn PowellWilliam PritchettJeffrey RajhelNarayanan RamachanranWilliam E. ReevesJohn RileyWilliam RodriguezDavid RoggendorffRobert RolfeEric SacherEric SaenzHoward Sava
31、geMichael ScaliseHelmut ScheibenzuberRickey SchippangMichael L. SeaveyJohn W. SheppardLee A. ShombertRandy SimpsonPhilip T. SmithButch SneadeJoseph J. StancoJoseph L. StautbergRichard TarzaiskiJack TaylorJ. Richard WegerDaniel H. WeissWilliam A. WhitakerDavid WilliamsonWill W. YoungTak YuenJehuda Zi
32、eglerDan ZimmermannMaria BosticTerry CampbellDez CassJack CrossChristine FisherAl GilmanJohn GoddardSharon GoodallChris GorringeT. Winston GriffinJames HannaGary L. HinkleGlenn LaflinJohn LeuthePeter LordJohn OdakRoy OishiCatherine OzenfantRichard PatrickJames ReederWilliam RusselDavid SmithMark Thu
33、llenRoger L. WilliamsCopyright 1999 IEEE. All rights reserved.vThe following members of the balloting committee voted on this standard:When the IEEE-SA Standards Board approved this standard on 8 December 1998, it had the followingmembership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudit
34、h Gorman,Secretary*Member EmeritusKim BreitfelderIEEE Standards Project EditorGuy AdamJames D. BakerJean-Yves BarbierJeffrey S. BarkleyAldo BernalStephen M. BowenGreg BowmanAlan L. BridgesDavid M. BrooksE. Elaine CasharRichard D. ChurcherWilliam ColmerRobert J. CurryDavid DahlbackaBernard DathyDanny
35、 C. DavisJames Allen DawsonSomnath DebBernd DinklageMichael T. EllisAnthony FitzpatrickWilliam Brit FrankArnold M. GreenspanGary L. HardenburgVance HarwoodRaymond L. HasenstabRobert G. HayesMike HeilmanJohn E. HeiserWesley HigakiGary L. HinkleCatherine HogansAshley M. B. HulmeGary M. JenkinsAndrew M
36、. JoskowskiFrank X. KearnsPaul B. KneseJames L. LewisAlfred LowensteinRichard J. MaguireMichael A. MalesichGayle MatysekRobert L. McGarveyJames M. MillsMukund U. ModiDavid S. MorrisWilliam P. NeblettRichard E. NeeseDavid L. NicholsHans ObermeierRoy OishiLeslie A. OrlidgeEdward G. PerkinsDennis C. Pe
37、tersonAlain PlassartJeffrey RajhelWilliam E. ReevesWilliam RodriguezDavid RoggendorffDavid E. RolinceEric SacherHelmut ScheibenzuberWarren M. ScheininMichael L. SeaveyJohn W. SheppardLee A. ShombertWilliam R. SimpsonPhilip T. SmithJoseph J. StancoRobert StasonisJoseph L. StautbergKirk D. ThompsonRon
38、ald WaxmanJ. Richard WegerDaniel H. WeissLynn WheelwrightWilliam A. WhitakerRoger L. WilliamsWill W. YoungSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Thomas F. GarrityRuben D. GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. “Al” Kie
39、nerJoseph L. Koepfinger*Stephen R. LambertJim LogothetisDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. ZipseviCopyright 1999 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 11.3 Appli
40、cation. 22. References 23. Definitions, acronyms, and abbreviations 33.1 Definitions 33.2 Acronyms. 84. ABBET overview. 84.1 Background 84.2 Purpose. 94.3 ABBET and the product life cycle. 94.4 ABBET framework 144.5 Specification techniques 154.6 ABBET component standards175. ABBET architecture. 175
41、.1 Scope 175.2 Fundamental concepts 185.3 Architecture levels . 195.4 Relation to other ABBET standards 216. Conformance 226.1 Interfaces 226.2 Implementation 237. CTIM 237.1 CTIM scope . 237.2 Overview 247.3 CTIM outline . 257.4 Applying the CTIM 257.5 CTIM and the ABBET domain 277.6 Relationship t
42、o the TFF . 287.7 EXPRESS source. 288. TFF. 298.1 Overview 298.2 TFF structure 308.3 TFF architecture. 328.4 TestObject management. 36Copyright 1999 IEEE. All rights reserved.viiAnnex A (normative) TFF interface definition file listings 38Annex B (normative) CTIM schema. 41Annex C (informative) Bibl
43、iography 50Copyright 1999 IEEE. All rights reserved.1IEEE ABBETIEEE Trial-Use Standard for A Broad-Based Environment for Test (ABBET)Overview and Architecture1. OverviewThe set of A Broad-Based Environment for Test (ABBET) standards and guides was developed by theABBET Subcommittee of the IEEE Stand
44、ards Coordinating Committee 20 (SCC20) to serve as standardsfor product test. ABBET specifies a comprehensive environment for integrating design data, test strategiesand requirements, test procedures, test results management, and test system implementations. The ABBETstandards consist of this base s
45、tandard and a series of component standards. A number of guides are associ-ated with the ABBET standards.1.1 ScopeThis standard defines the overall concept of ABBET and specifies mandatory requirements for its implemen-tation. This standard is the base document for the set of standards and guides th
46、at together comprise ABBET,and, as such, spans its complete capability.The scope includes various test-related activities over a products total life cycle and the key information thatis produced and used by these activities. ABBET supports a general test methodology that can be applied tovarious typ
47、es of products (electronic, mechanical, etc.), various levels of integration (system, subsystem,module, etc.), and various test applications (design verification test, manufacturing test, maintenance test,etc.).1.2 PurposeABBET is a set of software interface standards for the product test domain tha
48、t are intended to facilitate thetransition of test information and test implementation. These software interface standards are defined toIEEEStd 1226-1998 IEEE TRIAL-USE STANDARD FOR A BROAD-BASED ENVIRONMENT2Copyright 1999 IEEE. All rights reserved.support software component portability, reusabilit
49、y, exchangeability, and interoperability, and to serve astargets for test-related software development tools. This standard describes the elements of ABBET and their interrelationships and defines common terms to beused throughout the set. The purpose of this standard is to ensure that the elements in the ABBET set ofstandards and guides fit together as a cohesive whole.1.3 ApplicationThis standard provides an overview of the ABBET set of standards and guides for developing the following: ABBET-conformant test systems ABBET-based test program sets (TPSs) and test object
