IEEE 1453 1-2012 en Guide-Adoption of IEC TR 61000-3-7 2008 Electromagnetic compatibility (EMC)-Limits-Assessment of emission limits for the connection of fluct.pdf

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1、 Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 6 July 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copy

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8、 or the IEEE standards development process, visit the IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for

9、errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in con

10、nection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is wi

11、lling or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2012 IEEE. All rights reserved. vEssential P

12、atent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing ter

13、ms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such ri

14、ghts, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Important Notice This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriat

15、e safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “I

16、mportant Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this adoption was completed, the Voltage

17、Flicker Task Force had the following membership: Kenneth Sedziol, Chair Randy Horton, Secretary Richard Bingham Jim Burke Soma Depuru Andrew Dettloff Steve Fischer Dave Gilmer Erich Gunther Daryl Hallmark Mark Halpin Dennis Hansen Dallas Jacobsen Roberto Langella Theo Laughner Cristian Lazaroiu Kevi

18、n Little Alex McEachern Bill Moncrief Dave Mueller Matt Norwalk Marty Page Igor Papic Ben Pedersen Sarath Perera Al Powers Robert Rusch Daniel Sabin Bob Saint Matthew Seeley Harish Sharma Eena Singh Isabelle Snyder Mike Swearingen Steve Tatum Alfredo Testa Tony Thomas Grazia Todeschini Tim Unruh Dan

19、 Ward Charlie Williams Robert F. Worden Francisco Zavoda The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Saleman Alibhay Wallace Binder Richard Bingham Michael Bio Gustavo Brunello Ma

20、rk Bushnell Thomas Callsen Robert Christman James Cleary Larry Conrad Andrew Dettloff Gary Donner Randall Dotson Michael Edds Gary Engmann Dan Evans Fredric Friend David Garrett David Gilmer Mietek Glinkowski Edwin Goodwin Thomas Grebe Randall Groves Erich Gunther Daryl Hallmark Dennis Hansen Richar

21、d Harp Jeffrey Helzer Werner Hoelzl Gary Hoffman Randy Horton Geza Joos Yuri Khersonsky Joseph L. Koepfinger Jim Kulchisky Senthil Asok Kumar Chung-Yiu Lam Theo Laughner Michael Lauxman Kevin Little Greg Luri Jinxi Ma William McBride Thomas McDermott John Merando Bill Moncrief David Mueller Arun Nar

22、ang Michael S. Newman Gary Nissen Gearold Oheidhin Marty Page Mirko Palazzo Donald Parker Bansi Patel David Phillips Iulian Profir Reynaldo Ramos Michael Roberts Daniel Sabin Bob Saint Bartien Sayogo Kenneth Sedziol Gil Shultz Hyeong Sim David Singleton Jerry Smith Zareh Soghomonian Gary Stoedter Wa

23、lter Struppler Michael Swearingen Steve Tatum David Tepen John Toth Eric Udren Tim Unruh John Vergis Dan Ward Kenneth White Jian Yu Francisco Zavoda Ahmed Zobaa Copyright 2012 IEEE. All rights reserved. viiWhen the IEEE-SA Standards Board approved this guide on 8 June 2012, it had the following memb

24、ership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee H

25、ung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan* Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEE

26、E Standards Senior Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development Copyright 2012 IEEE. All rights reserved. viiiIEEE Introduction This introduction is not part of IEEE Std 1453.1-2012, IEEE GuideAdoption of IEC/TR 61000-3-7:2008, Elec

27、tromagnetic compatibility (EMC)LimitsAssessment of emission limits for the connection of fluctuating installations to MV, HV and EHV power systems. IEEE Std 1453.1 is the adoption of IEC 61000-3-7. The primary objective of IEC 61000-3-7 is to provide guidance to system operators, owners, and enginee

28、rs that are responsible for providing electrical service to loads that cause voltage fluctuations. IEC 61000-3-7 provides guidance on the principles and methodology that can be used to determine requirements for connecting fluctuating loads to both radial and network systems. Methods for determining

29、 appropriate flicker planning levels and emission limits for fluctuating loads as well as those that create rapid voltage changes are also provided. IEC 61000-3-7 is a companion document to IEC 61000-4-15 in that it uses the flicker measuring methodology specified therein to perform customer perform

30、ance assessments. IEEE Std 1453 is the adoption of IEC 61000-4-15. IEC/TR 61000-3-7Edition 2.0 2008-02TECHNICAL REPORT Electromagnetic compatibility (EMC) Part 3-7: Limits Assessment of emission limits for the connection of fluctuating installations to MV, HV and EHV power systems INTERNATIONAL ELEC

31、TROTECHNICAL COMMISSION XBICS 33.100.10 PRICE CODECODE PRIXISBN 2-8318-9606-1BASIC EMC PUBLICATION 2 TR 61000-3-7 IEC:2008(E) CONTENTS FOREWORD.5 INTRODUCTION.7 ACKNOWLEDGMENT.8 1 Scope.9 2 Normative references .10 3 Terms and definitions .10 4 Basic EMC concepts related to voltage fluctuations13 4.

32、1 Compatibility levels .14 4.2 Planning levels14 4.2.1 Indicative values of planning levels14 4.2.2 Assessment procedure for evaluation against planning levels15 4.3 Illustration of EMC concepts16 4.4 Emission levels .17 5 General principles 18 5.1 Stage 1: simplified evaluation of disturbance emiss

33、ion 18 5.2 Stage 2: emission limits relative to actual system characteristics.18 5.3 Stage 3: acceptance of higher emission levels on a conditional basis19 5.4 Responsibilities .19 6 General guidelines for the assessment of emission levels 19 6.1 Point of evaluation.19 6.2 Definition of flicker emis

34、sion level .20 6.3 Assessment of flicker emission levels20 6.4 Declared system short circuit power or impedance 21 6.4.1 Short-circuit power or impedance for pre-connection assessment of emission levels21 6.4.2 Short-circuit power or impedance for assessing actual emission levels.21 6.5 General guid

35、elines for assessing the declared system impedance.21 7 General summation law 21 8 Emission limits for fluctuating installations connected to MV systems .22 8.1 Stage 1: simplified evaluation of disturbance emission 22 8.2 Stage 2: emission limits relative to actual system characteristics.23 8.2.1 G

36、lobal emission to be shared between the customers23 8.2.2 Individual emission limits.24 8.3 Stage 3: acceptance of higher emission levels on a conditional basis25 8.4 Summary diagram of the evaluation procedure26 9 Emission limits for fluctuating installations connected to HV or EHV systems .28 9.1

37、Stage 1: simplified evaluation of disturbance emission 28 9.2 Stage 2: emission limits relative to actual system characteristics.28 9.2.1 Assessment of the total available power 28 9.2.2 Individual emission limits.29 9.3 Stage 3: acceptance of higher emission levels on a conditional basis30 10 Rapid

38、 voltage changes .31 10.1 General considerations31 10.2 Compatibility level .32 TR 61000-3-7 IEC:2008(E) 3 10.3 Planning levels32 10.4 Emission limits 33 10.5 Assessment procedure for evaluation against planning levels any IEC National Committee interested in the subject dealt with may participate i

39、n this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the

40、 two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have

41、 the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misin

42、terpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding nation

43、al or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition o

44、f this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct o

45、r indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable

46、for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees

47、is to prepare International Standards. However, a technical committee may propose the publication of a technical report when it has collected data of a different kind from that which is normally published as an International Standard, for example “state of the art“. IEC/TR 61000-3-7, which is a tech

48、nical report, has been prepared by subcommittee 77A: Low frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This Technical Report forms Part 3-7 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107 17.1This second edition cancels

49、 and replaces the first edition published in 1996 and constitutes a technical revision. _ 1Figures in square brackets refer to the bibliography. 6 TR 61000-3-7 IEC:2008(E) This new edition is significantly more streamlined than the original technical report (Edition 1), and reflects the experiences gained in the application of the first edition. This technical report has also been harmonised with IEC/TR 61000-3-6 18 and IEC/TR 61000-3-13 19. The text of this technical report is based on the following documents: Enquiry draft Report

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