1、 IEEE Trial-Use Standard for Optical AC Current and Voltage Sensing Systems Sponsored by the Power System Instrumentation and Measurements Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 17 December 2010 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard
2、 for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1601-2010, IEEE Trial-Use Standard for Optical AC Current and Voltage Sensing Systems. This standard is inte
3、nded for use with optical voltage and current sensor systems (OVCSS) for high-voltage (HV) electric energy systems. Since various proprietary technologies have been used in implementing OVCSS, this standard intends to avoid technology-specific requirements; rather, it intends to treat the OVCSS as a
4、 “black box” and specify requirements (and tests) that have to be met (regardless of particular technology or implementation used) for a user to be able to use the OVCSS on HV networks. In producing this document, focus has been on requirements and specifications that are particularly new or unique
5、to OVCSS. Other relevant requirements and information that have been available in other standards have been incorporated by reference. It has been the intention of the working group to minimize repetition of requirements that have been adequately documented in other standards, particularly those giv
6、en for conventional instrument transformers in IEEE Std C57.13 and IEEE Std C57.13.5, and those given for electronic voltage and current transforms in IEC 60044-7 and IEC 60044-8, respectively. For users convenience, certain key requirements, such as HV dielectric requirements from IEEE Std C57.13 a
7、nd IEEE Std C57.13.5, have been reproduced in an informative annex. In case of any update to IEEE Std C57.13 and Std C57.13.5, the latest version of those standards shall be used. The content of this first version of this standard has been limited to minimum set of requirements for effective use and
8、 testing of OVCSS. It is envisioned that future revisions of this standard will incorporate lessons learned from manufacturing and field experiences with this relatively new technology. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations.
9、Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge a
10、ction that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and
11、 use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users
12、 of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, v Copyright 2010 IEEE. All rights reserved. corrigenda, or errata. An official IEEE document at any point in t
13、ime consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Stan
14、dards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata,
15、 if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standar
16、ds.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this trial-use standard may require use of subject matter covered by patent rights. By publication of this trial-use standard, no position is taken with respect to the existence or vali
17、dity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in
18、 connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this trial-use standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely
19、their own responsibility. Further information may be obtained from the IEEE Standards Association. Publication of this trial-use standard for comment and criticism has been approved by the IEEE. Trial-Use standards are effective for 24 months from the date of publication. Comments for revision will
20、be accepted for 18 months after publication. Suggestions for revision should be directed to the Secretary, IEEE-SA Standards Board, 445 Hoes Lane, Piscataway, NJ 08854, and should be received no later than 18 months from publication date. It is expected that following the 24-month period, this trial
21、-use standard, revised and balloted as necessary, shall be submitted to the IEEE-SA Standards Board for approval as a full-use standard. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this trial-use standard was submitted to the IEEE-SA Standards Board for approval, the Power
22、System Instrumentation and Measurements Working Group had the following membership: Farnoosh Rahmatian, Chair Harley Gilleland, Vice Chair Clayton Burns T. W. Cease Larry Davis Bill Dickerson Aftab Kahn Vladimir Khalin Harold Kirkham Michael Haas Jim McBride Ross McTaggart Paul Millward Vuong Nguyen
23、 Jim Smith Eddy So Chris Tenhaagen Peter Zhao The following members of the individual balloting committee voted on this trial-use standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Samuel Aguirre Steven Alexanderson Ali Al Awazi Paul Barnhart G. Bartok W
24、illiam Bloethe James A. Braun Chris Brooks Gustavo Brunello Clayton Burns Yunxiang Chen Keith Chow Tommy Cooper Luis Coronado Gearold O. H. Eidhin Fred Elliott Gary Engmann Harley Gilleland Jalal Gohari Edwin Goodwin James Graham Randall Groves Bal Gupta Ajit Gwal Michael Haas William Henning Gary H
25、euston Scott Hietpas Raymond Hill Werner Hoelzl C. Huntley Innocent Kamwa John Kay Gael Kennedy Vladimir Khalin Harold Kirkham Hermann Koch Josepeph L. Koepfinger Jim Kulchisky Saumen Kundu Chung-Yiu Lam G. Luri Faramarz Maghsoodlou Keith Malmedal Omar Mazzoni James Mcbride Gary Michel Georges Monti
26、llet Charles Morse Randolph Mullikin Michael S. Newman David Nichols T. Olsen Bansi Patel Ulrich Pohl Alvaro Portillo Iulian Profir Farnoosh Rahmatian Michael Roberts Charles Rogers Joseph R. Rostron Thomas Rozek Steven Sano Bartien Sayogo Devki Sharma James Smith Jerry Smith John Spare John Tengdin
27、 S. Thamilarasan Eric Udren John Vergis Loren Wagenaar Scott Weikel Kenneth White Thomas Wier James Wilsonvii Copyright 2010 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this trial-use standard on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H.
28、 Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon W
29、alter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle D. Turner IEEE Standards
30、Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 1 3. Definitions 2 4. General requirements 4 4.1 Insulation
31、requirements . 4 4.2 Mineral oil requirements 5 4.3 Requirements for accuracy and accuracy verification systems 5 4.4 Mechanical performance requirements 8 4.5 Thermal performance requirements. 9 4.6 Electromagnetic compliance for sensor electronics. 9 4.7 Dissolved gas and water content requirement
32、s for new oil-immersed transformers 9 4.8 Performance of internal arc protection 9 4.9 Seismic performance requirements 9 5. Test conditions . 10 6. Classification of tests 10 6.1 Routine tests and test sequences 10 6.2 Type tests and test sequence 12 6.3 Special tests . 15 7. Routine test procedure
33、s (applicable to optical instrument transformers) 15 7.1 Verification of terminal markings and polarity 15 7.2 Capacitance and dissipation factor test 15 7.3 Power frequency voltage withstand test 15 7.4 Partial discharge test 15 7.5 Sealing test. 16 8. Routine test procedures applicable to optical
34、current transformers 16 8.1 Accuracy test for metering rated current transformers 16 8.2 Performance characteristics of relaying rated optical current transformers. 17 9. Routine test procedures applicable to optical voltage transformers 17 9.1 Accuracy test . 17 9.2 Resistance measurement of optica
35、l transformers. 17 10. Type test procedures. 18 10.1 Mechanical test 18 10.2 Lightning impulse voltage test on the optical transformer. 18 10.3 Switching impulse voltage test on the optical transformer wet 18 10.4 External Radio influence voltage (RIV) test 19 10.5 Power frequency voltage withstand
36、test wet. 19 10.6 Power frequency voltage withstand / partial discharge test dry 19 10.7 Temperature rise test 20 10.8 Short-time mechanical rating test 20 10.9 Accuracy performance test 21 ix Copyright 2010 IEEE. All rights reserved. 10.10 Creepage distance measurement 21 10.11 Sealing system test
37、for gas-filled instrument transformers 21 10.12 EMC Tests . 22 11. Special test procedures . 22 11.1 Internal arc test 22 11.2 Seismic qualification . 22 Annex A (normative) Test code . 23 Annex B (informative) Insulation requirements. 24 Annex C (informative) Rated voltage factor 28 Annex D (inform
38、ative) Bibliography . 29 1 Copyright 2010 IEEE. All rights reserved. IEEE Trial-Use Standard for Optical AC Current and Voltage Sensing Systems IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsibl
39、e for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may b
40、e found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard is intended for use as a basis for performance
41、 and interchangeability of equipment covered, and to assist in the proper selection of such equipment. This standard covers certain electrical, dimensional, and mechanical characteristics of optical current and voltage sensing systems used in the measurement of electricity and the control of equipme
42、nt associated with the generation, transmission and distribution of alternating current. 1.2 Purpose To provide a standard for current and voltage sensing systems which use optical techniques as shown in 1.1. 2. Normative references The following referenced documents are indispensable for the applic
43、ation of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any
44、 amendments or corrigenda) applies. ANSI Z540.1-1994, Calibration Laboratories and Measuring and Test Equipment General Requirements.1IEC 60044-7, Instrument TransformersPart 7: Electronic Voltage Transformers.21ANSI publications are available from the Sales Department, American National Standards I
45、nstitute, 25 West 43rdStreet, 4thFloor, New York, NY 10036 USA (http:/www.ansi.org). 2IEC publications are available from the Sales Department of the International Electrotechnical Commission, Case Portale 131, 3, rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publicat
46、ions are also available in the United States from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA. IEEE Std 1601-2010 IEEE Trial-Use Standard for Optical AC Current and Voltage Sensing Systems 2 Copyright 2010 IEEE. All rights rese
47、rved. IEC 60044-8, Instrument TransformersPart 8, Electronic Current Transformers. IEC 60270: 2001, High-Voltage Test TechniquesPartial Discharge Measurements. IEC 61850-9-2, Communication networks and systems in substations Part 9-2: Specific Communication Service Mapping (SCSM) Sampled Values over
48、 ISO/IEC 8802-3. IEEE Std 693, IEEE Recommended Practices for Seismic Design for Substations.3, 4IEEE Std C57.13, IEEE Standard Requirements for Instrument Transformers. IEEE Std C57.13.5, IEEE Standard of Performance and Test Requirements for Instrument Transformers of a Nominal System Voltage of 1
49、15 kV and Above. IEEE Std C57.13.6, IEEE Standard for High Accuracy Instrument Transformers. IEEE Std C37.92-2005, IEEE Standard for Analog Inputs to Protective Relaying from Electronic Voltage and Current Transformers. NEMA, CC 1-2009, Methods of Measurement of Radio Influence Voltage (RIV) of High Voltage Apparatus. 3. Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary: Glossary of Terms hence, there are no general requirements regarding capacitance and dissipation fact
