1、 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device Sponsored by the Test Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Computer Society IEEE Std 1687-2014 IEEE Std 1687-2014 IEEE Standard for Access and Control of Inst
2、rumentation Embedded within a Semiconductor Device Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 3 November 2014 IEEE-SA Standards Board Abstract: A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments
3、or their features themselves, via the IEEE 1149.1 test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to descri
4、be this network, and a software language and protocol for communicating with the instruments via this network. Keywords: access network, built-in self-test (BIST), boundary scan, debug, design for testability (DFT), embedded instruments, IEEE 1149.1, IEEE 1687, Instrument Connectivity Language (ICL)
5、 internal JTAG (IJTAG), Joint Test Action Group (JTAG), on-chip instrumentation, Procedural Description Language (PDL), test, Tool Command Language (Tcl) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electr
6、ical and Electronics Engineers, Inc. All rights reserved. Published 5 December 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of mater
7、ial. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to pro
8、duce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments receiv
9、ed from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizi
10、ng any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LI
11、ABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIA
12、BILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves
13、the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Boar
14、d Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IE
15、EE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliati
16、on with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of
17、concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions
18、except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be s
19、ubmitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply complia
20、nce to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these docume
21、nts may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws an
22、d regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subj
23、ect to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearan
24、ce Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards
25、 documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document
26、together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value,
27、do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda,
28、or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all I
29、EEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subje
30、ct matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance,
31、 then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms
32、 and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may
33、 be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of t
34、his standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was comp
35、leted, the IEEE 1687 Working Group had the following membership: Kenneth Posse, Chair Alfred Crouch, Vice Chair Jeff Rearick, Editor Michael Laisne, Webmaster Paul Abelovski Alan Bair Bill Bruce Krishna Chakravadhanula C. J. Clark Mike Coldewey Jean-Francois Cote Bruce Cowan Adam Cron Romi Datta Sty
36、lianos Diamantidis Jason Doege Richard Dugan Theodore Eaton Heiko Ehrenberg William Eklow Brian Foutz Pradipta Ghosh Kevin Gorman Suresh Goyal J. J. Grealish Scott Hartranft Hong-Shin Jun Rohit Kapur Martin Keim Bruno Latulippe Andrew Levy Guoqing Li Ed Malloy Harrison Miles, Jr. Skip Meyers Jay Nej
37、edlo Thai-Minh Nguyen Hari Nookala Rick Nygaard Victor Orona John Parham Srinivas Patil Michele Portolan John Potter Jeff Remmers Paul Reuter Mike Ricchetti Ben Rice Thomas Rinderknecht Franciso Russi John Seibold Craig Stephan Anthony Suto Steven Terry Brian Turmelle William Tuthill Brad Van Treure
38、n Hans Martin von Staudt Hugh Wallace Brian Wang Mike Wiznerowicz Christian Zoellin Songlin Zuo Copyright 2014 IEEE. All rights reserved. vi The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Saman Ad
39、ham Gobinathan Athimolom John Braden Bill Brown Gunnar Carlsson Krishna Chakravadhanula Keith Chow C. J. Clark Jean-Francois Cote Adam Cron Alfred Crouch Russell Davis Frans G. De Jong Jason Doege Sourav Dutta Theodore Eaton Heiko Ehrenberg Peter Eijnden William Eklow Joshua Ferry Kevin Gorman Chris
40、 Gorringe J. J. Grealish Randall Groves Peter Harrod Kazumi Hatayama Werner Hoelzl Neil Glenn Jacobson Hong-Shin Jun Rohit Kapur Martin Keim Anzou Ken-Ichi Michael Laisne James Langlois Roland R. Latvala Philippe Lebourg Adam Ley Teresa Lopes Greg Luri Colin Maunder Ian Mcintosh Reinhard Meier Harri
41、son Miles, Jr. Jeffrey Moore Richard Morren Zainalabedin Navabi Ion Neag Jim OReilly Kim Petersen Ulrich Pohl Irith Pomeranz Michele Portolan Kenneth Posse John Potter Jeff Rearick Paul Reuter Mike Ricchetti Gordon Robinson Andrzej Rucinski Francisco Russi Bartien Sayogo John Seibold Kapil Sood Roge
42、r Sowada Thomas Starai Craig Stephan Michael Stora Walter Struppler Anthony Suto Efren Taboada David Thompson Brian Turmelle William Tuthill Louis Ungar Srinivasa Vemuru Tom Waayers Hugh Wallace Douglas Way Oren Yuen Janusz Zalewski Daidi Zhong Christian Zoellin Songlin Zuo Copyright 2014 IEEE. All
43、rights reserved. vii When the IEEE-SA Standards Board approved this standard on 3 November 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Steph
44、en Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following no
45、nvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Kathryn Bennett IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not par
46、t of IEEE Std 1687-2014, IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device. The development of this standard stemmed from two independent (and unaware of each other) efforts at the 2004 International Test Conference to address issues surrounding the use o
47、f the IEEE 1149.1 test access port (TAP) for purposes well beyond boundary scan testing. These efforts were merged, and the Internal JTAG (IJTAG) Working Group was born. The scope of the effort was refined in the following months as more members joined the group to focus on the access to design for
48、testability (DFT) features (more generally called instruments) inside devices. The development of the ideas comprising this standard can be traced by presentations at a series of conferences, workshops, and symposia, including ITC05, BAST06, ITSW06, VTS06, ETS06, ITC06, VTS07, ETS07, ITC07, ETS08, I
49、TC08, and IOLTS09, ITC11, ETS12, ITC12, and ITC13. Frequently asked questions The IEEE 1687 web site will include an FAQ.aaSee http:/grouper.ieee.org/groups/1687/. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Background 2 1.4 Organization 2 1.5 Context 3 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations 10 4. Technology 11 4.1 Introduction 11 4.2 Serial access networks 11 4.3 On-chip instruments .18 5. Hardware architecture .19
