1、IEEE Standard for Sensor Performance Parameter Definitions IEEE Std 2700-2017 (Revision of IEEE Std 2700-2014) IEEE Electron Devices Society Sponsored by the Microelectromechanical Systems Standards Development Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std 2700-2017 (Revision of I
2、EEE Std 2700-2014) IEEE Standard for Sensor Performance Parameter Definitions Sponsor Microelectromechanical Systems Standards Development Committee of the IEEE Electron Devices Society Approved 15 June 2017 IEEE-SA Standards BoardAbstract: A common framework for sensor performance specification ter
3、minology, units, conditions, and limits is provided. Specifically, the accelerometer, magnetometer, gyrometer/ gyroscope, accelerometer/magnetometer/gyroscope combination sensors, barometer/pressure sensors, hygrometer/humidity sensors, temperature sensors, light sensors (ambient and RGB), and proxi
4、mity sensors are discussed. Keywords: accelerometer, ambient light, barometer, combination sensor, gyroscope, humidity, IEEE 2700, magnetometer, MEMS, microelectromechanical, pressure, proximity, sensors systems, temperature, terminology The Institute of Electrical and Electronics Engineers, Inc. 3
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34、ch rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2018 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA for approval, the P2700 Working Group had the following membership:
35、 Kenneth P. Foust, Chair Carlos Puig, Vice Chair Michael Gaitan, Secretary Marc Holbein Karen Lightman Rob OReilly Mike Stanley Len Sheynblat Steve Whalley The P2700 Working Group gratefully acknowledges the contribution of the following entities. Without their assistance and dedication, this standa
36、rd would not have been completed. Analog Devices, Inc. Bosch Sensortec Freescale Semiconductor Hillcrest Laboratories, Inc. InvenSense, Inc. Kionix, Inc. Maxim Integrated Movea, Inc. NIST PNI Corporation STMicroelectronics Xsens Technologies B.V . The following members of the entity balloting commit
37、tee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Honeywell International Inc. Intel Corporation National Institute of Standards and Technology (NIST) National Ocean Technology Center NXP Semiconductor Siemens Corporation When the IEEE-SA Standards Board
38、approved this standard on 15 June 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Kos
39、hy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of
40、 IEEE Std 2700-2017, IEEE Standard for Sensor Performance Parameter Definitions. Microelectromechanical systems (MEMS) have become a key enabling technology for many of todays high-technology products, including automotive sensors, smart phones, and the new consumer market of wearable fitness device
41、s. MEMS are also supporting new breakthroughs in areas such as green energy and portable medical diagnostic and treatment technologies. These factors make them a keystone for advanced manufacturing, jobs, and technology innovation. The MEMS & Sensors Industry Group (MSIG) and its member companies, l
42、arge and small, have recognized standardized MEMS device performance definitions as an industrial need and a pre-competitive place in the value chain where cooperation would benefit all competitors and customers. MSIG has documented that the lack of performance definitions and testing standards cont
43、ributes to increasing costs of MEMS device manufacturing. Furthermore, the most advanced devices have the highest performance testing requirements. This standard addresses the issue of non-uniformity in MEMS sensor data sheets, by defining the sensor performance parameters that are used in typical M
44、EMS sensor technologies. Potential customers use data sheets to compare the performance of devices from multiple manufacturers and select the devices that they will design into their systems. Data sheets contain specifications of the device performance, the package design, operating temperature, inp
45、ut and output signals, etc. Even though the data sheets may not reflect the type of testing that goes into qualification or production test, they should not conflict with those measurements. This standard is expected to be the first in many that will follow. The performance parameters defined in this standard will each need standard testing protocols to help ensure that device performance data measured by any party (buyer or seller) is in agreement and within a determined uncertainty.
