1、IEEE Std 475-2000(R2012)(Revision of IEEE Std 475-1983) IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 30 March 2000 Reaffirmed 8 June 2012 IEEE-SA Standards Board
2、Abstract: Test procedures for microwave field disturbance sensors to measure radio frequency (RF) radiated field strength of the fundamental frequency, harmonic frequencies, near field power flux density, and nonharmonic spurious emissions of sensors operating within the frequency range of 300 MHz t
3、o 40 GHz are defined. Keywords: field disturbance sensors, field strength measurements, measurement instrumentation, spurious emissions, test sites, test reports The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2000 by the Institute of
4、 Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2000. Printed in the United States of America. Print: ISBN 0-7381-2492-3 SH94855 PDF: ISBN 0-7381-2493-1 SS94855 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise
5、 without the prior written permission of the publisher. IEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinating Com-mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees servevoluntarily and without compensation. They a
6、re not necessarily members of the Institute. The standardsdeveloped within IEEE represent a consensus of the broad expertise on the subject within the Institute aswell as those activities outside of IEEE that have expressed an interest in participating in the development ofthe standard.Use of an IEE
7、E Standard is wholly voluntary. The existence of an IEEE Standard does not imply that thereare no other ways to produce, test, measure, purchase, market, or provide other goods and services related tothe scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is appro
8、ved andissued is subject to change brought about through developments in the state of the art and commentsreceived from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation. When a document is more than five years old and has not be
9、en reaffirmed, it is rea-sonable to conclude that its contents, although still of some value, do not wholly reflect the present state ofthe art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from a
10、ny interested party, regardless of membershipaffiliation with IEEE. Suggestions for changes in documents should be in the form of a proposed change oftext, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards a
11、s theyrelate to specific applications. When the need for interpretations is brought to the attention of IEEE, theInstitute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus ofall concerned interests, it is important to ensure that any interpretation ha
12、s also received the concurrence of abalance of interests. For this reason, IEEE and the members of its societies and Standards CoordinatingCommittees are not able to provide an instant response to interpretation requests except in those cases wherethe matter has previously received formal considerat
13、ion. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIEEE is the sole entity that may authorize the use of certification marks, trademarks, or other designations toindicate complianc
14、e with the materials set forth herein.Authorization to photocopy portions of any individual standard for internal or personal use is granted by theInstitute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment o
15、f licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopyportions of any individual standard for educational classroom use can also be obtained through the Copy-right Clearance Center.Note: Attent
16、ion is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsib
17、le for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 2000 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std 475-2000
18、 IEEE Standard Measurement Procedure for Field Disturbance Sen-sors 300 MHz to 40 GHz.)This standard describes a test procedure for measurement of radio frequency (RF) emissions from micro-wave field disturbance sensors to assist manufacturers, standard laboratories, and test engineers in determin-
19、ing compliance with established technical specifications.The IEEE Standards Association (IEEE-SA) Standards Board authorized the IEEE Electromagnetic Com-patibility Society Standards Committee to update IEEE Std 475-1983 for consistency with other standardsand regulatory requirements.This revision w
20、as prepared by an appointed subcommittee of the Standards Development Committee of theElectromagnetic Compatibility Society. The members of this subcommittee were:Hugh W. Denny,ChairThe following members of the balloting committee voted on this standard:When the IEEE-SA Standards Board approved this
21、 standard on 30 March 2000, it had the followingmembership:Donald N. Heirman,ChairJames T. Carlo,Vice ChairJudith Gorman,Secretary*Member emeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Alan Cookson, NIST RepresentativeDonald R. Volzka, TAB RepresentativeNoelle D.
22、HumenickIEEE Standards Project EditorEdwin L. BronaughJoseph E. ButlerFranz GisinDonald N. HeirmanJohn D. OsburnArt WallH. Stephen BergerEdwin L. BronaughJoseph E. ButlerHugh W. DennyAndrew DrozdDonald N. HeirmanDaniel D. HoolihanJohn G. KraemerRisaburo SatoRalph M. ShowersDonald L. SweeneyDavid L.
23、TraverSatish K. AggarwalMark D. BowmanGary R. EngmannHarold E. EpsteinH. Landis FloydJay Forster*Howard M. FrazierRuben D. GarzonJames H. GurneyRichard J. HollemanLowell G. JohnsonRobert J. KennellyJoseph L. Koepfinger*Peter H. LipsL. Bruce McClungDaleep C. MohlaJames W. MooreRobert F. MunznerRonald
24、 C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoDonald W. ZipseivCopyright 2000 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Applications . 11.3 Description. 12. References 23. Definitions 34. Measurement instrumentation 34.1 General. 34.2 Receiver monitoring. 44
25、3 Calibration of measuring equipment 44.4 Measurement uncertainty. 55. Test facilities 55.1 General requirements. 55.2 Test-site requirements 56. General equipment configuration and operating conditions 56.1 Field disturbance sensor operating condition 56.2 Grounding 66.3 Shock and vibration isolat
26、ors. 66.4 Temperature . 66.5 Humidity 67. Radiated emission testing 67.1 Measurement requirements 67.2 Measurement procedure. 68. Conducted emissions . 78.1 Applicability 78.2 Measurement procedure. 79. Test report 79.1 Field disturbance sensor description 89.2 Measuring equipment. 89.3 Test-site pa
27、rameters . 89.4 Test procedure description. 89.5 Test data summary . 89.6 Test data. 9Annex A (informative)Bibliography 10Copyright 2000 IEEE. All rights reserved.1IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz1. Overview1.1 Scope This standard defines test proce
28、dures for microwave field disturbance sensors to measure radio frequency(RF) radiated field strength of the fundamental frequency, harmonic frequencies, near field power flux den-sity, and nonharmonic spurious emissions of sensors operating within the frequency range of 300 MHz to40 GHz.Field distur
29、bance perimeter protection systems that employ a balanced transmission line around the propertybeing protected are not covered by this standard.1.2 ApplicationsSpecific types of field disturbance sensors to which this standard applies are as follows: a) RF intrusion detectorb) Production line counte
30、r detectorc) Anti-shoplifting detectord) Level sensor1.3 Description1.3.1 Field disturbance sensorA field disturbance sensor is a device that employs a highly localized source of RF energy to detect themotion or presence of an object in the vicinity of the source, and in which the emitter and receiv
31、er (or detec-tor) are essentially at the same point, that is, a space-protected system.IEEEStd 475-2000 IEEE STANDARD MEASUREMENT PROCEDURE FOR2Copyright 2000 IEEE. All rights reserved.1.3.2 CharacteristicsA typical single channel microwave field disturbance sensor operates at a nominal radiated cen
32、ter frequencyof 0.915 GHz, 2.450 GHz, 5.800 GHz, 10.525 GHz, or 24.125 GHz. It commonly employs a Gunn-typediode as a microwave oscillator, which is mounted in a waveguide cavity and coupled to a horn antenna orother directional radiator. It establishes an RF field which, when perturbed by the motio
33、n of an intruder orreflecting object in this field, causes a change (doppler shift) in the frequency of the microwave signal. Thesensors receiver accepts a signal coupled directly from the internal oscillator and the external signalsreflected from the illuminated area. If the microwave frequency of
34、the reflected signal differs from that of theinternal oscillator, this small difference in frequency is detected, amplified, and used to activate an alarm orindicator.Since area coverage requirements vary in different installations, some field disturbance sensors are providedwith optional antennas o
35、ffering a selection of different radiation beam widths. Some sensors emit a signalwithout intentional modulation, while others employ frequency, amplitude, or pulse modulation. Fielddisturbance sensors that contain digital processing circuitry may be classed as unintentional radiating orcomputing de
36、vices by the regulatory authority.2. ReferencesThis standard shall be used in conjunction with the following publications.ANSI C63.2-1987, American National Standard for Electromagnetic Noise and Field Strength, 10 kHz to40 GHzSpecifications.1ANSI C63.4-1992, American National Standard for Methods o
37、f Measurement of Radio-Noise Emissionsfrom Low-Voltage Electrical and Electronics Equipment in the Range of 9 kHz to 40 GHz.ANSI C63.14-1992, American National Standard Dictionary for Technologies of Electromagnetic Compati-bility (EMC), Electromagnetic Pulse (EMP), and Electrostatic Discharge (ESD)
38、ANSI/NCSL Z540.1-1994, American National Standard for CalibrationCalibration Laboratories in Mea-suring Test EquipmentGeneral Requirements.ANSI/NCSL Z540.2-1997, American Nation Standard for Expressing UncertaintyUS Guide to theExpression of Uncertainty in Measurement.CISPR 22:1993, Limits and Meth
39、ods of Measurement of Radio Disturbance Characteristics of InformationTechnology Equipment, Second edition.2IEEE Std 149-1979 (Reaff 1990), IEEE Standard Test Procedures for Antennas.3IEEE Std 474-1973, IEEE Standard Specifications and Test Methods for Fixed and Variable Attenuators, DCto 40 GHz.41A
40、NSI publications are available from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor,New York, NY 10036, USA (http:/www.ansi.org/).2CISPR documents are available from the International Electrotechnical Commission, 3, rue de Varemb, Case Postale 131, CH 121
41、1,Genve 20, Switzerland/Suisse (http:/www.iec.ch/). They are also available in the United States from the Sales Department, AmericanNational Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA.3IEEE publications are available from the Institute of Electrical and Electronics
42、 Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA (http:/standards.ieee.org/).4IEEE Std 474-1973 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Engle-wood, CO 80112-5704, USA, tel. (303) 792-2181 (http:/ DISTURBANCE SENSORS 3
43、00 MHZ TO 40 GHZ Std 475-2000Copyright 2000 IEEE. All rights reserved.3IEEE Std C95.1-1991, 1999 Edition, IEEE Standard for Safety Levels with Respect to Human Exposure toRadio Frequency Electromagnetic Fields, 3 kHz to 300 GHz.IEEE Std C95.3-1991, IEEE Recommended Practice for the Measurement of Po
44、tentially HazardousElectromagnetic FieldsRF and Microwave.3. Definitions For definitions of terms used, see ANSI C63.14-1992 and The IEEE Standard Dictionary of Electrical andElectronic Terms B5.4. Measurement instrumentation4.1 General Use of proper measurement instrumentation is critical to obtain
45、ing accurate, reproducible results. 4.1.1 Measuring instrumentsThe measurement instrument chosen for each required measurement shall satisfy the minimum specifica-tions herein.4.1.1.1 Power flux density The instrument used to measure power flux density shall comply with IEEE Std C95.3-1991.4.1.1.2 F
46、requencyThe fundamental transmitter frequency (fo) shall be measured. A spectrum analyzer, receiver, microwave fre-quency counter, or commercial frequency meter may be used, provided the frequency of the measurementinstrument is accurate enough to ensure that the device is operating within the speci
47、fied frequency band.4.1.1.3 Field strengthThe field strength shall be measured using a calibrated receiver or spectrum analyzer with an expandedamplitude uncertainty of 2 dB and a minimum dynamic range of 50 dB coupled to a suitable antenna (see4.1.2).4.1.1.3.1 Detector functionThe detector function
48、 shall conform to the requirements of ANSI C63.2-1987. Unless otherwise specified bythe procuring authority or regulatory authority, the detector function for frequencies at or below 1 GHz shallbe quasi-peak, and for frequencies above 1 GHz, shall be average. When the field disturbance sensoremploys
49、 pulse modulation techniques, measurements shall also be made using a peak detector.4.1.1.3.2 BandwidthAt frequencies of 1 GHz and below, the 6 dB measurement bandwidth shall be 120 kHz. Above 1 GHz the6 dB bandwidth shall be 1 MHz 20%. When using a peak detector, the 6 dB bandwidth shall be not lessthan 1/twhere tequals the minimum pulse width being measured.IEEEStd 475-2000 IEEE STANDARD MEASUREMENT PROCEDURE FOR4Copyright 2000 IEEE. All rights reserved.4.1.2 AntennasCalibrated linearly polarized log periodic or horn antennas shall be
