1、IEEE Std 495-2007(Revision ofIEEE Std 495-1986)IEEE Guide for Testing Faulted CircuitIndicatorsIEEE3 Park Avenue New York, NY 10016-5997, USA28 December 2007IEEE Power Engineering SocietySponsored by theInsulated Conductors Committee495TMIEEE Std 495-2007 (Revision of IEEE Std 495-1986) IEEE Guide f
2、or Testing Faulted Circuit Indicators Sponsor Insulated Conductors Committee of the IEEE Power Engineering Society Approved 27 September 2007 IEEE-SA Standards Board Abstract: Definitions, service conditions, test procedures, and test conditions for faulted circuit indicators for use on power distri
3、bution systems are established in this test code. Keywords: cable fault locator, fault indicators, faulted circuit indicator, FCI The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engi
4、neers, Inc. All rights reserved. Published 28 December 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyrigh
5、t Clearance Center. Introduction This introduction is not part of IEEE Std 495-2007, IEEE Guide for Testing Faulted Circuit Indicators. This guide is intended as a supplement to the training in the use of high-voltage electrical equipment, established safe operating procedures, and the manufacturers
6、 instructions for the application of faulted circuit indicators (FCIs). Installers and operators of FCIs require formal training in the use of high-voltage electrical equipment. It is the responsibility of the users to establish safe operating procedures and provide training. The manufacturers are r
7、equired to provide installation and operating instructions for their products. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for er
8、rata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By p
9、ublication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of
10、 Patents Claims, or determining whether any licensing terms or conditions are reasonable or non-discriminatory. Further information may be obtained from the IEEE Standards Association. Participants At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Faulted Circuit
11、Indicators Working Group had the following membership: John Banting, Chair Fran Angerer, Vice Chair Jim Braun Thomas Champion Frank DiGuglielmo Dave Donovan Larry Feight John Hans Harry Hayes Gael R. Kennedy Fred Koch Dale Metzinger Mike Pehosh Tim Robeson Wes Spencer Tim Taylor iv Copyright 2007 IE
12、EE. All rights reserved. The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman S. K. Aggarwal Fran Angerer Ali Al Awazi John Banting Stuart H. Borlase Harvey L. Bowles Steven R. Brocksch
13、ink Weijen Chen Michael D. Clodfelder Tommy P. Cooper Randall L. Dotson Gary R. Engmann Michael D. Faulkenberry Larry Feight Marcel Fortin R. B. Gear, Jr. Randall C. Groves Frank DiGuglielmo Richard L. Harp Jeffrey L. Hartenberger Wolfgang B. Haverkamp Lawrence P. Herman Gary A. Heuston David A. Hor
14、vath Dennis Horwitz Edward M. Jankowich A. S. Jones Gael R. Kennedy Joseph L. Koepfinger Jim Kulchisky Saumen K. Kundu William Lumpkins Glenn J. Luzzi Gary L. Michel Frank J. Muench Jerry R. Murphy Michael S. Newman Donald M. Parker Bansi R. Patel Ulrich Pohl Iulian E. Profir Robert A. Resuali Tim R
15、obeson Bartien Sayogo Gil Shultz Michael J. Smalley Cameron L. Smallwood Jerry W. Smith James W. Wilson Oren Yuen When the IEEE-SA Standards Board approved this guide on 27 September 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith
16、 Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Ro
17、bby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Jennie Steinhagen
18、 IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development v Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Definitions 1 3. Service conditions 2 3.1 Usual service conditions 2
19、 3.2 Unusual service conditions 2 4. Testing 2 4.1 Design tests 2 4.2 Production tests 2 4.3 General test conditions 3 4.4 Specific design tests. 3 Annex A (informative) Other considerations . 7 Annex B (informative) Glossary 8 Annex C (informative) Bibliography 9 vi Copyright 2007 IEEE. All rights
20、reserved. IEEE Guide for Testing Faulted Circuit Indicators 1. 1.11.22.Overview Faulted circuit indicators (FCIs) used by the electric utility industry are applied to overhead and underground power distribution circuits. This guide describes the general test requirements applied to FCIs. Scope This
21、test code establishes definitions, service conditions, test procedures, and test conditions for FCIs for use on power distribution systems. Purpose FCIs are commonly used by electric utilities to aid in service restoration. The purpose of this guide is to identify the various tests and test conditio
22、ns that FCIs must meet to validate their performance. Definitions For the purposes of this guide, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standards Terms B51should be referenced for terms not defined in this clause. 2.1 reset condition: The state of or the act
23、 of change of a faulted circuit indicator (FCI) indicating an unfaulted state. 2.2 reset device: A tool for manually resetting a faulted circuit indicator (FCI) from a faulted condition to an unfaulted condition. 1The numbers in brackets correspond to those of the bibliography in Annex C. 1 Copyrigh
24、t 2007 IEEE. All rights reserved. IEEE Std 495-2007 IEEE Guide for Testing Faulted Circuit Indicators 3.3.13.24.4.14.24.2.14.2.2Service conditions Usual service conditions The FCI should be suitable for use under one or more of the following intended service conditions when: Exposed to direct sunlig
25、ht, salt spray, or normal expected pad mount conditions Not exposed to direct sunlight or salt spray Buried in earth (sensor only) Submerged in water intermittently or continuously to a depth of 4.5 m (15 ft) Exposed to rain, snow, hail Operating temperature range of 40 C to +85 C Applied on systems
26、 up to 46 kV phase-to-phase Unusual service conditions Service conditions other than those listed in 3.1 are considered to be unusual. Consult the manufacturer for recommendations. Testing Design tests All applicable tests specified in 4.4 should be performed by the manufacturer to demonstrate that
27、FCIs meet their ratings and are suitable for operation under the intended service conditions. In addition, the manufacturer should periodically test a sufficient number of production FCIs to ensure continuing compliance with design tests. Production tests The production tests of 4.2.1 and 4.2.2 shou
28、ld be performed on every FCI. Trip current rating verification test The trip current rating verification test should be performed by passing current through the conductor(s) to which the FCI is applied. The results should demonstrate compliance with the manufacturers specified trip current rating an
29、d tolerances. This test should be performed at least one time at a temperature between 18 C and 30 C. Reset verification test The reset verification test should be performed to ensure that the FCI returns to a normal state, demonstrating compliance with the manufacturers specified reset rating. 2 Co
30、pyright 2007 IEEE. All rights reserved. IEEE Std 495-2007 IEEE Guide for Testing Faulted Circuit Indicators One of the following tests should be performed at least one time at a temperature between 18 C and 30 C: Current reset: For FCIs that require a current flow through the cable conductor in orde
31、r to change from an indication of FAULT to an indication of NORMAL, the following should apply: the indicator should change to an indication of NORMAL when the current specified by the manufacturer flows through the cable conductor for not more than 10 min. a) b) c) d) 4.3a) b) c) d) e) 4.44.4.1a) b
32、) c) d) e) Voltage reset: For FCIs that require a potential to be restored to the cable conductor in order to change the indicator from an indication of FAULT to an indication of NORMAL, the following shall apply: the indicator should move to an indication of NORMAL when the minimum reset voltage is
33、 applied to the cable conductor for not more than 10 min. Time reset: For FCIs requiring only elapsed time to reset, the FCI should reset within its rated time and tolerances. The reset time tolerance is 20% of the manufacturers stated value. Since these times may be extremely long, it is not practi
34、cal to perform this test in normal production. The manufacturer should demonstrate compliance during design testing. Manual reset: For FCIs that require a manual operation to change from an indication of FAULT to an indication of NORMAL, the following shall apply: the indicator should move from the
35、FAULT to NORMAL indication when reset by the means specified by the manufacturer. General test conditions The following test conditions should apply unless otherwise specified under specific tests: Three samples should be tested unless otherwise agreed upon by the customer and the manufacturer of th
36、e device. FCIs should be properly assembled with production grade components. All parts, which are grounded in a normal installation, shall be connected to the ground of the test circuit. Test temperatures should be selected by the manufacturer to verify that the FCI meets its rating under the devic
37、es usual service conditions. All ac voltages should be in accordance with IEEE Std 4-1978 B6. The specific tests should be performed in the order as shown. Specific design tests Temperature cycling The purpose of temperature cycling test is to ensure that the FCI operates after aging. The FCI should
38、 be subjected to five sequential thermal cycles at temperatures of 40 C, +25 C, and +85 C. The following criteria shall be met unless otherwise agreed upon by the customer and the manufacturer: The temperature tolerance allowed in each case is 5 C. The humidity in the chamber should be between 0% an
39、d 90%, non-condensing. The temperature ramp rate should be no faster than 10 C per hour. The sequence should be +25 C, +85 C, +25 C, 40 C, +25 C, and so on. The dwell time at each temperature should be a minimum of 2 h. Following these exposures, the FCI should pass all of the other applicable desig
40、n tests. 3 Copyright 2007 IEEE. All rights reserved. IEEE Std 495-2007 IEEE Guide for Testing Faulted Circuit Indicators 4.4.24.4.2.1a) b) c) d) e) 4.4.2.24.4.2.34.4.34.4.4Water submersion test The purpose of the water submersion test is to verify that submersion cycling does not adversely affect th
41、e ability of the submersible FCI to prevent the entrance of moisture at all interfaces that could immediately or eventually render the device inoperable. Submersion cycling The following procedure shall be followed unless another procedure is agreed upon by the customer and manufacturer. The ramp ra
42、te for the thermal changes should be no faster than 10 C per hour. The FCI should be placed under water with an equivalent pressure head of 4.5 m (15 ft) 0.5 m (1.64 ft) of water or approximately 45 kPa (6.5 psi) at a temperature of +25 C 5 C for a minimum of 48 h. The equivalent pressure head of 4.
43、5 m (15 ft) 0.5 m of water or approximately 45 kPa (6.5 psi) should then be maintained as the water temperature is raised to +70 C 5 C and held for a minimum of 48 h. The equivalent pressure head of 4.5 m (15 ft) 0.5 m of water or approximately 45 kPa (6.5 psi) should then be maintained as the water
44、 temperature is allowed to return naturally to +25 C 5 C and held for a minimum of 2 h. The equivalent pressure head of 4.5 m (15 ft) 0.5 m of water or approximately 45 kPa (6.5 psi) should then be maintained as the water temperature is lowered to a maximum of +5 C and held for a minimum of 48 h. Th
45、e equivalent pressure head of 4.5 m (15 ft) 0.5 m of water or approximately 45 kPa (6.5 psi) should then be maintained as the water temperature is allowed to return naturally to +25 C 5 C and held for a minimum of 2 h. Visual inspection Following the submersion cycling tests of 4.4.2.1, the FCI shou
46、ld be removed from the water, cloth dried, and visually examined for moisture entrance at interfaces. Post submersion cycling operation verification test A normal production TRIP and RESET test as indicated in 4.2.1 and 4.2.2 may be performed to ensure that the submersion testing did not have an adv
47、erse affect on the device. It may be desirable to perform this test prior to proceeding with the remaining tests. Outdoor weathering of plastics test A suitable test should be performed to demonstrate that FCIs installed in direct sunlight perform satisfactorily for their anticipated service life. S
48、alt spray test A suitable test should be performed to demonstrate that FCIs installed where exposed to salt spray perform satisfactorily for their anticipated service life. 4 Copyright 2007 IEEE. All rights reserved. IEEE Std 495-2007 IEEE Guide for Testing Faulted Circuit Indicators 4.4.5a) b) 4.4.
49、64.4.7Table 1Electric cord pull-out test The purpose of the electric cord pull-out test is to ensure that electric cord strain relief used for auxiliary contacts, multiple part FCIs, or any other purpose can be accomplished so that a force exerted on the flexible cable is not transmitted to wiring connections. The assembly of a cord to an FCI should be capable of withstanding a steady-state straight pull equivalent to 13.6 kg (30 lb). The FCI should be secured in place with no less than a 13.6 kg (30
