IEEE 592-2018 en Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors.pdf

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1、IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors IEEE Std 592-2018 (Revision of IEEE Std 592-2007) IEEE Power and Energy Society Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std 592-2018

2、 (Revision of IEEE Std 592-2007) IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors Sponsor Insulated Conductors Committee of the IEEE Power and Energy Society Approved 14 June 2018 IEEE-SA Standards BoardAbstract: Design tests for shield res

3、istance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, speci cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard. Keywords: IEEE Std 592-2018, insulation shields, joints, separab

4、le connectors The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 29 June 2018. Printed in the United States of America. IEEE is a register

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28、ttp:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard,

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30、ards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair di

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32、ity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of th

33、e validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2018 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Expos

34、ed Semi-con Test Working Group had the following membership: Sherif Kamel, Chair William Taylor, Vice Chair Brian Ayres Thomas Campbell David E. Crotty Michael Dyer David Hughes Ganpathy Iyer Mike Jackson Ken Lee Glenn J. Luzzi Je Madden John Makal Aaron Norris Thomas J. Parker Michael Smalley Stanl

35、ey S. Szyszko Bastiaan van Besouw The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. John Ainscough Roy Alexander Saleman Alibhay Thomas Barnes Earle Bascom III Kenneth Bow Demetrio Bucaneg Jr William Byrd Rober

36、t Christman Gary Donner Michael Dyer Nadim Giotis Randall Groves Steven Hensley Lauri Hiivala Werner Hoelzl Richard Jackson Peter Kelly Yuri Khersonsky Boris Kogan Jim Kulchisky Michael Lauxman Glenn J. Luzzi Je Madden Arturo Maldonado William McBride Rachel Mosier Jerry Murphy Arthur Neubauer Joe N

37、ims Aaron Norris Lorraine Padden Christopher Petrola Iulian Pro r Lakshman Raut Ryandi Ryandi Bartien Sayogo Michael Smalley Jerry Smith Gary Smullin Gary Stoedter Stanley S. Szyszko David Tepen Bastiaan van Besouw John Vergis Martin V on Herrmann Haifei Wang Daniel Ward When the IEEE-SA Standards B

38、oard approved this standard on 14 June 2018, it had the following membership: Jean-Phillipe Faure, Chair Gary Ho man, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Ted Burse Guido R. Hiertz Christel Hunter Joseph L. Koep nger* Thomas Koshy Hung Ling Dong Liu Xiaohui Liu K

39、evin Lu Daleep Mohla Andrew Myles Paul Nikolich Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Mehmet Ulema Phil Wennblom Philip Winston Howard Wolfman Jingyi Zhou *Member Emeritus7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 59

40、2-2018, IEEE Standard for Insulation Shields on Medium-V oltage (15 kV - 35 kV) Cable Joints and Separable Connectors. This standard covers design tests for shield resistance, simulated touch current and a simulated fault-current initiation for insulation shields used on cable accessories, specifica

41、lly 15 kV through 35 kV class joints and separable insulated connectors.8 Copyright 2018 IEEE. All rights reserved. Contents 1. Scope . 9 2. Normative references 9 3. Definitions . 9 4. Performance requirements 10 5. Test procedures 10 5.1 Test specimens 10 5.2 Shield resistance test . 10 5.3 Simulated touch current measurement 11 5.4 Fault-current initiation test . 12 5.5 Performance limitation . 15 Annex A (informative) Background information . 16 Annex B (informative) Bibliography . 19

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