1、IEEE Std 829-2008(Revision ofIEEE Std 829-1998)IEEE Standard for Software andSystem Test DocumentationIEEE3 Park AvenueNew York, NY 10016-5997, USA18 July 2008IEEE Computer SocietySponsored by theSoftware +1 978 750 8400. Permission to photocopy portions of any individual standard for educational cl
2、assroom use can also be obtained through the Copyright Clearance Center.iv Copyright 2008 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 829-2008, IEEE Standard for Software and System Test Documentation. Software and software-based systems testing is a technical d
3、iscipline of systems engineering. The purpose of software and software-based systems testing is to help the development organization build quality into the software and system during the life cycle processes and to validate that the quality was achieved. The test process determines whether the produ
4、cts of a given life cycle activity conform to the requirements of that activity, and whether the product satisfies its intended use and user needs. This determination can include inspection, demonstration, analysis, and testing of software and software-based system products. Test activities are perf
5、ormed in parallel with software and system development, not just at the conclusion of the development effort. The test activities provide objective data and conclusions about software and system quality. This feedback can include anomaly identification, performance measurement, and identification of
6、 potential quality improvements for expected operating conditions across the full spectrum of the software-based systems and their interfaces. Early feedback allows the development organization to modify the products in a timely fashion and thereby reduce overall project and schedule impacts. Withou
7、t a proactive approach, anomalies and associated changes are typically delayed to later in the schedule, resulting in greater costs and schedule delays. This revision of the standard makes significant changes from the prior version. The following is a summary of the changes: Changed focus from being
8、 document-focused to being process-focused in keeping with IEEE/EIA Std 12207.0TM-1996awhile retaining information on test documentation. Added the concept of an integrity level to assist organizations in determining a recommended minimum set of testing tasks and concurrent selection of test documen
9、tation needed to support the tasks. Identified minimum recommended tasks for the sample integrity level scheme. Added an activity for choosing appropriate documents and contents. Added a Master Test Plan (MTP) for documenting the actual management of the total test effort. Added a Level Interim Test
10、 Status Report to be issued during the test execution activity. Added a Master Test Report for when there are multiple Level Test Reports that need consolidation. The Master Test Report may also summarize the results of the tasks identified in the Master Test Plan. Identified sample metrics in Annex
11、 E. Added the concept of independence in Annex F. The following key concepts are emphasized in this standard: Integrity levels. Defines four integrity levels (ranging from high integrity to low integrity) to describe the importance of the software and the software-based system to the user. aIEEE pub
12、lications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards/ieee.org/). v Copyright 2008 IEEE. All rights reserved. Recommended minimum testing tasks for each integrity level. Defines the recommended minimum testing ta
13、sks required for each of the four integrity levels. Includes a table of optional testing tasks for tailoring the test effort to meet project needs and application specific characteristics. Intensity and rigor applied to testing tasks. Introduces the notion that the intensity and rigor applied to the
14、 testing tasks vary according to the integrity level. Higher integrity levels require the application of greater intensity and rigor to the testing tasks. Intensity includes greater scope of testing across all normal and abnormal system operating conditions. Rigor includes more formal techniques and
15、 recording procedures. Detailed criteria for testing tasks. Defines specific criteria for each testing task, including recommended minimum criteria for correctness, consistency, completeness, accuracy, readability, and testability. The testing task descriptions include a list of the required task in
16、puts and outputs. Systems viewpoint. Includes recommended minimum testing tasks to respond to system issues. Selection of test documentation. Both the types of test documentation and the content topics within each documentation type need to be selected based on the testing tasks associated with the
17、identified integrity level. Compliance with International and IEEE Standards. Defines the test processes to be compliant with life cycle process standards such as ISO/IEC 12207:1995,bIEEE Std 1074TM-2006 and IEEE/EIA Std 12207.0-1996 as well as the entire family of IEEE software and systems engineer
18、ing standards. This standard supports the full software life cycle processes, including acquisition, supply, development, operation, and maintenance. The standard is compatible with all life cycle models; however, not all life cycle models use all of the life cycle processes described in this standa
19、rd. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or ref
20、erring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available
21、for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities
22、 and private users, the IEEE does not waive any rights in copyright to this document. bISO/IEC publications are available from the ISO Central Secretariat, Case Postale 56, 1 rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iso.ch/). ISO/IEC publications are also available in the Unit
23、ed States from Global Engineering Documents, 15 Inverness Way East, Englewood, Colorado 80112, USA (http:/ Electronic copies are available in the United States from the American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). vi Copyright
24、2008 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE docume
25、nt at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata,
26、 visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee
27、.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: htt
28、p:/standards.ieee.org/reading/ieee/interp/. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent ri
29、ghts in connection therewith. A patent holder or patent applicant has filed a statement of assurance that it will grant licenses under these rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applican
30、ts desiring to obtain such licenses. Other Essential Patent Claims may exist for which a statement of assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of
31、 Patents Claims, or determining whether any licensing terms or conditions are reasonable or non-discriminatory. Further information may be obtained from the IEEE Standards Association. vii Copyright 2008 IEEE. All rights reserved. Participants At the time this standard was completed, the Working Gro
32、up for the Revision of IEEE Std 829-1998 had the following membership: Claire Lohr, Chair Eva Freund, Co-Chair Sue Carroll, Editor Gretchen Henrick, Registrar In Memoriam, Dr. William Stephen Turner III Ted Ahmanson Steve Allott F. Scot Anderson Steve Arbuckle John Franklin Arce Mark Ashford James B
33、ach Mary Baggett William Bail Richard Bender Robyn Brilliant Charlotte Burns Rick Craig Scott P. Duncan Elfriede Dustin Butch Ewing Denise Flynn Dorothy Graham Robin Goldsmith Sam Guckenheimer Hans-Ludwig Hausen Sherry Heinze Gary Hild Bernard Homs Manish Ingle Heather King Ed Kit Danuta Kuc Pamela
34、Langford Don Mills Dan Misch Robert Moeller Carol Nibblett Joseph B. Nutt Ursula T. Parker Dale Perry Erik Petersen Hans Schaefer Arthur Skuja Kathy Spurr Keith Stobie Teri Stokes Ray Stone Danielle Teague William Stephen Turner III* Nicole Wenzler Jennifer Yohe *Deceased The following members of th
35、e individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. T. Scott Ankrum Chris Bagge Bakul Banerjee Juris Borzovs Pieter Botman Juan Carreon Norbert N. Carte Lawrence Catchpole Keith Chow Raul Colcher Paul Croll William Cuthbertson G
36、eoffrey Darnton Thomas Dineen Antonio Doria Scott P. Duncan Sourav Dutta Kenneth D. Echeberry Carla Ewart Harriet Feldman Andrew Fieldsend Eva Freund David Friscia Gregg Giesler Lewis Gray Randall Groves John Harauz Michelle R. Herman Rutger A. Heunks Werner Hoelzl Robert Holibaugh Bernard Homes Pet
37、er Hung Mark Jaeger James St. Clair Michael C. Jett Cem Kaner Robert B. Kelsey Mark Knight Dwayne Knirk Thomas Kurihara George Kyle Marc Lacroix David J. Leciston Claire Lohr Carol Long William Lumpkins Yury Makedonov Edward Mccall Keith Middleton James Moore Michael S. Newman Miroslav Pavlovic Robe
38、rt Peterson William Petit Ulrich Pohl Cam Posani Robert Robinson Randall Safier James Sanders Helmut H. Sandmayr Robert Schaaf Hans Schaefer Richard Schrenker David J. Schultz Carl Singer James Sivak Luca Spotorno Thomas Starai Walter Struppler K Subrahmanyam R. Thayer Thomas Tullia Vincent J. Tume
39、John Walz Oren Yuen Janusz Zalewski Alexandru Zamfirescuviii Copyright 2008 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this trial-use standard on 27 March 2008, it had the following membership: Robert M. Grow, Chair Thomas A. Prevost, Vice Chair Steve M. Mills, Past Chair J
40、udith Gorman, SecretaryVictor Berman Richard DeBlasio Andrew Drozd Mark Epstein Alex Gelman William R. Goldbach Arnold M. Greenspan Kenneth S. Hanus James Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Narayanan Ramachandran Jo
41、n Rosdahl Anne-Marie Sahazizian Malcolm V. Thaden Howard L. Wolfman Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Michelle D. Turner IEEE Standards Program Manager,
42、 Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Developmentix Copyright 2008 IEEE. All rights reserved. CONTENTS 1. Overview .1 1.1 Scope .1 1.2 Purpose 2 1.3 Test objectives.2 1.4 Organization of the standard3 1.5 Audience6 1.6 Conformance .7 1.7 Disclaimer .7 1.
43、8 Limitations.7 2. Normative references.7 3. Definitions and abbreviations8 3.1 Definitions.8 3.2 Abbreviations 12 4. Software and system integrity levels .12 4.1 Integrity levels.13 5. Test processes14 5.1 Process management 17 5.2 Process acquisition .17 5.3 Process supply 18 5.4 Processdevelopmen
44、t 18 5.5 Processoperation21 5.6 Processmaintenance.22 6. Test documentation content selection process.30 6.1 Provide a reference to information documented elsewhere.30 6.2 Eliminate content topics covered by the process.31 x Copyright 2008 IEEE. All rights reserved. 6.3 Eliminate content topics cove
45、red by automated tools31 6.4 Choose to combine or eliminate documents31 6.5 Choose to combine or eliminate documentation content topics 32 7. Test documentation content topics to be addressed.32 8. Master Test Plan35 8.1 (MTP Section 1) Introduction36 8.2 (MTP Section 2) Details of the Master Test P
46、lan38 8.3 (MTP Section 3) General.41 9. Level Test Plan(s)42 9.1 (LTP Section 1) Introduction.44 9.2 (LTP Section 2) Details for this level of test plan .45 9.3 (LTP Section 3) Test management 47 9.4 (LTP Section 4) General49 10. Level Test Design50 10.1 (LTD Section 1) Introduction 50 10.2 (LTD Sec
47、tion 2) Details of the Level Test Design 51 10.3 (LTD Section 3) General52 11. Level Test Case .52 11.1 (LTC Section 1) Introduction 53 11.2 (LTC Section 2) Details of the Level Test Case54 11.3 (LTC Section 3) General .55 12. Level Test Procedure.55 12.1 (LTPr Section 1) Introduction .56 12.2 (LTPr
48、 Section 2) Details of the Level Test Procedure.57 12.3 (LTPr Section 3) General.57 13. Level Test Log.58 13.1 (LTL Section 1) Introduction 58 13.2 (LTL Section 2) Details of the Level Test Log .58 xi Copyright 2008 IEEE. All rights reserved. 13.3 (LTL Section 3) General59 14. Anomaly Report 60 14.1
49、 (AR Section 1) Introduction 60 14.2 (AR Section 2) Details of the Anomaly Report.61 14.3 (AR Section 3) General .62 15. Level Interim Test Status Report.63 15.1 (LITSR Section 1) Introduction.63 15.2 (LITSR Section 2) Details of the Level Interim Test Status Report64 15.3 (LITSR Section 3) General64 16. Level Test Report (LTR) .64 16.1 (LTR Section 1) Introduction 65 16.2 (LTR Section 2) Details of the Level Test Report.65 16.3 (LTR Section 3) General .66 17. Master Test Report 66 17.1 (MTR Section 1) Introducti
