1、 Reference number ISO 5-4:2009(E) ISO 2009INTERNATIONAL STANDARD ISO 5-4 Third edition 2009-12-01 Photography and graphic technology Density measurements Part 4: Geometric conditions for reflection density Photographie et technologie graphique Mesurages de la densit Partie 4: Conditions gomtriques p
2、our la densit de rflexion ISO 5-4:2009(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performi
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5、etariat at the address given below. COPYRIGHT PROTECTED DOCUMENT ISO 2009 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writ
6、ing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2009 All rights reservedISO 5-4:20
7、09(E) ISO 2009 All rights reserved iiiContents Page Foreword iv Introduction.v 1 Scope1 2 Normative references1 3 Terms and definitions .2 4 Coordinate system, terminology and symbols 2 5 Distinction between ideal and realized parameters.3 6 Requirements.3 6.1 Influx and efflux geometry3 6.2 Samplin
8、g aperture.4 6.3 Annular distribution 4 6.4 Normal directional distribution5 6.5 Determination of illuminator radiance distribution5 6.6 Determination of receiver responsivity distribution5 6.7 Polarization efficiency.5 6.8 Scattered flux.5 6.9 Backing material6 6.10 Reference standard.6 6.11 Design
9、ation 7 6.12 Conformance testing.7 Annex A (normative) Determining conformance with tolerances8 Annex B (normative) Determination of accuracy and linearity of a densitometer.9 Annex C (normative) Certified reference materials for measuring instruments with polarizing means .10 Annex D (normative) Po
10、larization efficiency11 Annex E (informative) Backing materials .13 Annex F (informative) Reflectance density versus reflectance factor density.14 Bibliography15 ISO 5-4:2009(E) iv ISO 2009 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide federation
11、 of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee.
12、International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance wit
13、h the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approv
14、al by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 5-4 was prepared by ISO/TC 42, Photograp
15、hy, and ISO/TC 130, Graphic technology, in a Joint Working Group. This third edition cancels and replaces the second edition (ISO 5-4:1995), which has been technically revised. This technical revision introduces the concept of ideal and practical conditions. In the course of this technical revision,
16、 all parts of ISO 5 have been reviewed together, and the terminology, nomenclature and technical requirements have been made consistent across all parts. ISO 5 consists of the following parts, under the general title Photography and graphic technology Density measurements: Part 1: Geometry and funct
17、ional notation Part 2: Geometric conditions for transmittance density Part 3: Spectral conditions Part 4: Geometric conditions for reflection density ISO 5-4:2009(E) ISO 2009 All rights reserved vIntroduction This part of ISO 5 specifies the geometric conditions that are used to define ISO 5 standar
18、d reflection density and to make measurements of ISO 5 standard reflection density. These conditions correspond approximately to practical situations for viewing reflection-type photographs or graphic reproductions, which specifically requires illuminating the print at an angle of 45 to the normal t
19、o the surface and viewing along the normal. These conditions tend to reduce surface glare and maximize the density range of the image, which is sometimes referred to as annular 45:0 reflection densitometry. The geometric conditions specified in this part of ISO 5 are intended to simulate 45 illumina
20、tion for viewing or photographing a specimen. There might be some engineering advantages in designing a measuring instrument with normal illumination and 45 collection. Reversing the geometry in this way has no demonstrated effect on the measured values in most cases, so both geometric arrangements
21、are included in this part of ISO 5. However, work by Voglesong 11has demonstrated that there are times when measurements of the same printed sample with 0/45 b) to provide a reference to assist in resolving seemingly different measurement data between systems; and c) to aid in the calibration and ce
22、rtification of densitometers, or spectrophotometers used as densitometers, by allowing for the generation of certified reference materials (CRMs) with numerical values traceable to fundamental physical phenomena. For graphic arts applications, guidance in the use of densitometry is provided in ISO 1
23、3656. INTERNATIONAL STANDARD ISO 5-4:2009(E) ISO 2009 All rights reserved 1Photography and graphic technology Density measurements Part 4: Geometric conditions for reflection density 1 Scope This part of ISO 5 specifies the geometric conditions for the definition of ISO 5 standard reflection density
24、. It also recommends tolerances on geometric conditions that can be used in the design of instruments. The spectral conditions are specified in ISO 5-3. This part of ISO 5 also specifies the requirements for polarization (if that feature is included) and for backing material, and makes recommendatio
25、ns regarding accuracy and linearity. Although intended primarily for use in the measurement of the reflection characteristics of photographic and graphic arts materials, this part of ISO 5 is also applicable to the measurement of these characteristics for other materials. 2 Normative references The
26、following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 5-1, Photography and graphic technology Density m
27、easurements Part 1: Geometry and functional notation ISO 5-3, Photography and graphic technology Density measurements Part 3: Spectral conditions ISO 13655, Graphic technology Spectral measurement and colorimetric computation for graphic arts images IEC 60050-845:1987 1) , International Electrotechn
28、ical Vocabulary. Lighting 1) IEC 60050-845:1987 is a joint publication with the International Commission on Illumination (CIE). It is identical to CIE 17.4:1987, International Lighting Vocabulary. ISO 5-4:2009(E) 2 ISO 2009 All rights reserved3 Terms and definitions For the purposes of this document
29、, the terms and definitions given in ISO 5-1, IEC 60050-845:1987 CIE 17.4:1987 and the following apply. 3.1 certified reference material CRM reference material, accompanied by a certificate, one or more of whose property values are certified by a procedure which establishes traceability to an accura
30、te realization of the unit in which the property values are expressed, and for which each certified value is accompanied by an uncertainty at a stated level of confidence NOTE Adapted from ISO Guide 30. 3.2 gloss suppression factor P numerical expression of the polarization efficiency of a densitome
31、ter with polarizing means NOTE For a precise definition of P, see Annex D. 3.3 receiver portion of the densitometer that senses the efflux, including the collection optics and detector 3.4 reflection density D Rnegative logarithm to the base 10 of the reflectance factor NOTE The International Commis
32、sion on Illumination (CIE) designates the measurement referred to as “reflection density” in ISO 5 as “reflectance factor density”. (See IEC 60050-845:1987 CIE 17.4:1987.) ISO 5-1:2009, definition 3.19 3.5 reflectance factor R ratio of the reflected flux to the absolute reference reflected flux unde
33、r the same geometrical and spectral conditions of measurement ISO 5-1:2009, definition 3.17 3.6 screen ruling number of image elements, such as dots or lines, per unit of length in the direction which produces the highest value NOTE Adapted from ISO 12647-1. 3.7 screen width reciprocal of screen rul
34、ing NOTE Adapted from ISO 12647-1. 4 Coordinate system, terminology and symbols The coordinate system, terminology and symbols described in ISO 5-1 are used in this part of ISO 5 as a basis for specifying the geometric conditions for reflection density measurements. ISO 5-4:2009(E) ISO 2009 All righ
35、ts reserved 35 Distinction between ideal and realized parameters The unambiguous definition of density requires that geometric, as well as spectral, parameters be exactly specified. However, the practical design and manufacture of instruments require that reasonable tolerances be allowed for physica
36、l parameters. The definition of ISO 5 standard reflection density shall be based on the ideal value specified for each parameter. The tolerances shown for the realized parameter values represent allowable variations of these standard parameters, which for many applications have an effect of less tha
37、n 0,01 on the density values resulting from measurements made with instruments. A method for determining conformance of a realized parameter with the tolerances is given in Annex A. 6 Requirements 6.1 Influx and efflux geometry ISO 5 standard reflection measurements may be made with two equivalent m
38、easurement geometries. In the “annular influx mode”, the geometry of the illuminator is annular and the geometry of the receiver is directional. In the “annular efflux mode”, the geometry of the illuminator is directional and the geometry of the receiver is annular. The annular influx mode is illust
39、rated in Figure 1. The annular efflux mode would be illustrated by Figure 1 if the arrows showing the radiant flux direction were reversed and the labels were interchanged. The modes can be described in terms of specified annular and directional distributions of illumination radiance (subscript i) o
40、r receiver responsivity (subscript r), depending on the mode. The cone half- angle (lower case Greek kappa, ) is the angle between the angle of illumination or view (lower case Greek theta, ) and the marginal ray. The ideal angles of illumination and view and half-angles for the annular influx mode
41、are i= 45, r= 0, i= 5, and r= 5. The realized angles of illumination and view and half-angles for the annular influx mode are i= 45 2, r= 0 2, i= 5 1, and r= 5 1. For the annular efflux mode, the ideal angles of illumination and view and half-angles are i= 0, r= 45, i= 5, and r= 5. The realized angl
42、es of illumination and view and half-angles for the annular efflux mode are i= 0 2, r= 45 2, i= 5 1, and r= 5 1. Key 1 influx 2 efflux 3 specimen NOTE Angles indicated represent the practical tolerances for the half-angle of the cone. Figure 1 Geometry of the annular influx mode ISO 5-4:2009(E) 4 IS
43、O 2009 All rights reserved6.2 Sampling aperture The extent and shape of the area on which density is measured are the sampling aperture. Physically, the sampling aperture is realized by the optical systems of the illuminator and receiver. The size and shape of the sampling aperture are not critical
44、a) if no dimension is so large that the influx and efflux geometric conditions vary materially over the sampling aperture, or b) if no dimension is so small that the effects of granularity, specimen texture, diffraction, or half-tone dot structure become significant. For case b), the diameter of a c
45、ircular sampling aperture should not be less than 15 times the screen width; it shall not be less than 10 times the screen width that corresponds to the lower limit for the screen ruling for which the instrument is recommended by the manufacturer. The area of non-circular sampling apertures shall no
46、t be smaller than that required for circular sampling apertures. The sampling aperture is defined as the smaller of the illuminator region and the receiver region. Ideally, the larger shall be greater than the smaller to the extent that any increase in size of the larger region has no effect on the
47、measurement result. The specimen characteristics over the illuminator region should be the same as those over the receiver region. NOTE 1 This requirement prevents lateral diffusion error. The realized boundary of the larger of the illuminator region and the receiver region shall be outside the boun
48、dary of the smaller by at least 2 mm. Where small sampling apertures are required, this dimension shall be at least 0,5 mm. The magnitude of the resulting lateral diffusion error should be accepted as part of the overall measurement uncertainty, or a greater boundary differential should be used. NOT
49、E 2 These dimensions are an acceptable compromise between the need to measure small areas and a negligible uncertainty of measurement. Any physical aperture present in the reference plane that is not used to limit either the illuminator region or receiver region shall be kept well clear of both the influx and efflux beams. The ideal illuminator radiance and receiver responsivity distributions shall be uniform over the sampli
