1、 IEC 60512-7-1 Edition 1.0 2010-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 7-1: Impact tests (free connectors) Test 7a: Free fall (repeated) Connecteurs pour quipements lectroniques Essais et mesures Partie 7-1: Essais dimpact (fich
2、es) Essai 7a: Chute libre (essai rpt) IEC 60512-7-1:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, i
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16、i vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-7-1 Edition 1.0 2010-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 7-1: Impact tests
17、 (free connectors) Test 7a: Free fall (repeated) Connecteurs pour quipements lectroniques Essais et mesures Partie 7-1: Essais dimpact (fiches) Essai 7a: Chute libre (essai rpt) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE G ICS 31.220.01 PRICE CODE CODE PRIX
18、ISBN 2-8318-1085-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-7-1 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 7-1: Impact tests (f
19、ree connectors) Test 7a: Free fall (repeated) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on a
20、ll questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publ
21、ication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation.
22、IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of
23、opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made
24、to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transpare
25、ntly to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certi
26、fication bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability sha
27、ll attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including leg
28、al fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this pub
29、lication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-7-1 has been prepared by subcommittee 48B: Conne
30、ctors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 7a of IEC 60512-5, issued in 1992. The structure of IEC 60512 series is explained in IEC 60512-1-100. The text of this standard is based on t
31、he following documents: CDV Report on voting 48B/2016/CDV 48B/2107/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-7-1 IEC:2010 3 This publication has been drafted in accordance with the ISO/IEC Directives,
32、 Part 3. A list of all parts of IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC w
33、eb site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-7-1 IEC:2010 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 7-1: Impact tests (free
34、 connectors) Test 7a: Free fall (repeated) 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of
35、this standard is to define a standard test method to assess the ability of a connector to withstand the impacts it would receive when dropped repeatedly. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the e
36、dition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination, Test 1a: Visual examination ISO 48:2007, Rubber, vulcanized or ther
37、moplastic Determination of hardness (hardness between 10 IRHD and 100 IRHD) 3 Preparation of the specimen Unless otherwise specified, the specimen shall not be mounted or wired, but shall be fitted with normal accessories (e.g. hoods, cable glands) according to the detail specification. 4 Test metho
38、d The test shall be executed by means of a rotating barrel as described in Clause 5. During a test not more than one sample shall be present in the barrel. The barrel turns at a rate of approximately 5 rev/min. The total number of revolutions (the number of falls is twice the number of revolutions)
39、shall be according to the detail specification. NOTE (Detail) specifications may define different numbers of revolutions for specimens with a different mass. 5 Test equipment The specimen shall be tested in a tumbling barrel as shown in Figure 1. Where a large number of specimens has to be tested, t
40、he barrel may contain a number of sections, one specimen being placed in each section, so that simultaneous testing may be carried out. 60512-7-1 IEC:2010 5 The width of each section, W, is not specified but should preferably be between 200 mm and 300 mm, depending on the size of the specimen. Each
41、compartment in which the specimen rests between falls is backed by a wedge-shaped piece made of chip resistant rubber with a hardness of 80 20 IRHD, as defined in ISO 48, and the sliding surfaces of that same compartment are made of smooth, hard plastics laminated sheet. The rotating barrel is desig
42、ned so that the shaft does not protrude into the interior. The rotating barrel is provided with an aperture with a lid which may be made of transparent acrylic material. 6 60512-7-1 IEC:2010 For fastening of ends 20 3 4 1 2 Section A-A 10-19 3 a 75 100 500 45 275 375 50 A A 20 W* W* IEC 535/10 Dimen
43、sions in millimetres Key 1 Block of wood 2 Steel 3 Rubber 4 Plastics lamineted sheet aThe body of the rotating barrel is of steel sheet of 1,5 mm thickness * For the value of W, see 4.1 Figure 1 Tumbling barrel 60512-7-1 IEC:2010 7 6 Final examination The specimen shall be visually examined accordin
44、g to IEC 60512-1-1. If required by the detail specification, the operation shall be checked. 7 Requirements There shall be no broken parts or damage that would impair normal operation. 8 Details to be specified When this test is required by the detail specification, the following details shall be sp
45、ecified: a) preparation of the specimen; b) accessories to be installed, when appropriate; c) wiring and wire length, when appropriate; d) total number of revolutions (the number of falls is twice the number of revolutions); e) operational requirements, if any; f) any deviation from the standard tes
46、t method. _ 8 60512-7-1 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 7-1: Essais dimpact (fiches) Essai 7a: Chute libre (essai rpt) AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondi
47、ale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres
48、activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress p
49、ar le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux
