IEC 60747-5-3-1997 Discrete semiconductor devices and integrated circuits - Part.5-3 Optoelectronic devices - Measuring methods《半导体分立器件和集成电路 第5-3部分 光电子器件 测试方法》.pdf

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IEC 60747-5-3-1997 Discrete semiconductor devices and integrated circuits - Part.5-3 Optoelectronic devices - Measuring methods《半导体分立器件和集成电路 第5-3部分 光电子器件 测试方法》.pdf_第1页
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1、NORME CE1 IEC INTERNATIONALE INTERNATIONAL STANDARD 60747153 1997 AMENDEMENT 1 AMENDMENT 1 2002-03 Amendement 1 Dispositifs discrets semiconducteurs et circuits intgrs - Partie 5-3: Dispositifs optolectroniques - Mthodes de mesure Amendment 1 Discrete semiconductor devices and integrated circuits -

2、Part 5-3: Optoelectronic devices - Measuring methods O IEC 2002 Droits de reproduction rservs - Copyright - all rights reserved International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-121 1 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 O0 E-mail: inrna

3、iliec.ch Web: www.iec.ch M CODE PRIX Commission Electrotechnique Internationale PRICE CODE International Electrotechnical Commission MeKayHapo supprime; amende. remplace par une dition rvise, ou Page 56 Ajouter les nouveaux paragraphes 5.8 et 5.15.2 suivants: 5.8 Courant de crte ltat bloque (iDRM) a

4、) Objet Mesurer le courant de fuite direct entre les bornes de sortie ltat bloqu dans des conditions spcifies. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-60747-5-3 Amend.

5、 1 O IEC:2002 47E121 O/FDIS -3- 47E12151RVD FOREWORD This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices, of IEC technical committee 47: Semiconductor devices. The text of this amendment is based on the following documents: I FDIS I Report on voting I Full informatio

6、n on the voting for the approval of this amendment can be found in the report on voting indicated in the above table. The committee has decided that the contents of the base publication and its amendments will remain unchanged until 2004. At this date, the publication will be reconfirmed; withdrawn;

7、 amended. replaced by a revised edition, or Page 57 Add the following new subclauses 5.8 to 5.15.2: 5.8 Peak off-state current (/,RM) a) Purpose To measure the forward leakage current between the output terminals in off-state under specified conditions. Copyright International Electrotechnical Commi

8、ssion Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4- 60747-5-3 Amend. 1 O CEI:2002 r T1 -+ -+ T2 b) Schma de circuit IEC 689/02 Mthode a courant alternatif TI _j -+ T2 IEC 690/02 W W - I R1 I I R, R, Rsistance limitation de

9、 courant Rsistance a dtection de courant Figure 26 - Circuit de mesure pour courant de crte ltat bloqu c) Procdure de mesure 1) Mthode courant continu Le courant de crte ltat bloqu (/DRM) est mesure avec la tension directe a ltat bloqu spcifie qui est applique entre les bornes de sortie ltat bloqu.

10、Le courant de crte ltat bloqu (/DRM) est mesur nouveau avec la polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication du courantlde la tension inverse entre les bornes. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduc

11、tion or networking permitted without license from IHS-,-,-60747-5-3 Amend. 1 O IEC:2002 b) Circuit diagram -5- DC method IEC 689/02 AC method IEC 690/02 Rs Current limiting resistor RI Current detecting resistor Figure 26 - Measurement circuit for peak off-state current c) Measurement procedure 1) D

12、C method The peak off-state current (IDRM) is measured with the specified forward off-state voltage which is applied between the output terminals in off-state. The peak off-state current (/DRM) is measured again with inverted polarity of the output terminals (TI, T2) by applying the reverse voltagec

13、urrent between the terminals. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-6- 60747-5-3 Amend. I O CEI:2002 2) Mthode courant alternatif Le courant de crte ltat bloqu (/DRM

14、) est mesure a la tension de crte a ltat bloqu spcifie avec la tension courant alternatif rectification simple alternance avec la frquence de ligne courant alternatif commerciale, qui est applique entre les bornes de sortie ltat bloqu. Le courant de crte ltat bloqu (IDRM) est mesure nouveau avec la

15、polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication du courantde la tension inverse entre les bornes. 1 Tension de crte a ltat bloqu i Courant Temps Courant de crte Temps IEC 691/02 Figure 27 - Formes dondes de la tension et du courant de crte a ltat bloqu d) Prescriptions 1) La m

16、thode de mesure du courant de crte ltat bloqu utilise deux polarits de tension force (TIjT2 et T2jT1). 2) Dans le cas de la mthode courant continu, il convient que le taux de balayage de la tension continue applique entre les bornes de sortie (TI, T2) ne dpasse pas le taux critique daugmentation de

17、la tension ltat bloqu (dV/dt). Dans le cas de la mthode courant alternatif, il convient que le taux de variation (dV/dt) de la tension sinusodale applique entre les bornes de sortie (TI, T2) ne dpasse pas le taux critique daugmentation de la tension ltat bloqu (dV/dt). e) Conditions spcifies 1 ) Ten

18、sion de crte ltat bloqu ( VD,) 2) Temprature ambiante ( Tamb). 5.9 Tension de crte a ltat passant (VTM) a) Objet Mesurer la tension de crte ltat passant entre les bornes de sortie ltat passant dans des conditions spcifies, lorsque le courant spcifi a ltat passant est appliqu entre les bornes de sort

19、ie ltat passant. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-60747-5-3 Amend. 1 O IEC:2002 -7- Voltage 2) AC method The peak off-state current (/DRM) is measured at the sp

20、ecified peak off-state voltage with the half-wave-rectified a.c. voltage with commercial a.c. line frequency, which is applied between the output terminals in off-state. The peak off-state current (IDRM) is measured again with inverted polarity of the output terminals (TI, T2) by applying the revers

21、e voltage/current between the terminals. - Specified peak off-state voltage b Time IEC 691/02 Figure 27 -Waveforms of the peak off-state voltage and current d) Requirements The measurement method of the peak off-state current uses two forced-voltage polarities (TI+T2 and TZ+Tl). In the case of the d

22、.c. method, the slew rate of the applied d.c. voltage between the output terminals (TI, T2) should not exceed the critical rate of rise of the off-state voltage (dV/dt). In the case of the a.c. method, the rate of change (dV/dt) of the applied sine-wave- voltage between the output terminals (TI, T2)

23、 should not exceed the critical rate of rise of the off-state voltage (dVldt). e) Specified conditions 1) Peak off-state voltage (VD,) 2) Ambient temperature ( Tamb). 5.9 Peak on-state voltage (VTM) a) Purpose To measure the peak on-state voltage between the output terminals in on-state under specif

24、ied conditions, when the specified on-state current is applied between the output terminals in on-state. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-8- 60747-5-3 Amend. 1

25、O CEI:2002 b) Schma de circuit Mthode courant continu RSl IF TI + -+ T2 IEC 69U02 Mthode courant alternatif IEC 693/02 Rsl, Rs Rsistances limitation de courant R1 Rsistance dtection de courant R2 Rsistance destine empcher le phototriaque dtre hors tension D1 Diode destine a diminuer la partie du cou

26、rant continu dans la ligne lectrique NOTE qui est cause par le courant de fuite travers DI, presque zro volt. II convient que R2 soit slectionne de faon approximative pour rgler la tension entre les bornes, Figure 28 - Circuit de mesure pour courant de crte ltat passant c) Procdure de mesure Mthode

27、courant continu Le courant direct dentre spcifi (IF) est appliqu pour ltablissement de la sortie. Par la suite, le courant spcifi ltat passant est appliqu entre les bornes de sortie. On mesure la tension entre les bornes de sortie (tension de crte ltat passant (VTM). La tension entre les bornes de s

28、ortie est mesure nouveau avec la polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication de la tensionldu courant inverse entre les bornes. Une source de courant constante peut tre utilise la place dune source de tension constante du ct de lentre. Mthode courant alternatif Le courant

29、direct dentre spcifi (IF) est appliqu pour ltablissement de la sortie. Par la suite, la tension courant alternatif rectification simple alternance avec la frquence de ligne courant alternatif commerciale est applique entre les bornes de sortie. On mesure la tension entre les bornes de sortie (tensio

30、n de crte ltat passant ( VTM) au courant de crte ltat passant spcifi. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I Rs1 IF -+ -+ - 60747-5-3 Amend. 1 O IEC:2002 b) Circuit

31、 diagram TI -ID T2 -9- AC method IEC 693/02 R, , Rs2 Current limiting resistors RI Current detecting resistor R2 Resistor to prevent the phototriac from being off-voltage Dl NOTE R, should be selected approximately to adjust the voltage between the terminals, which is caused by the leakage current t

32、hrough D, to nearly zero volt. Diode for decreasing d.c. current part in power line Figure 28 - Measurement circuit for peak on-state voltage c) Measurement procedure 1) DC method The specified input forward current (IF) is applied to turn on the output, after which the specified on-state current is

33、 applied between the output terminals. The voltage between the output terminals (peak on-state voltage (VTM) is measured. The voltage between the output terminals is measured again with inverted polarity of the output terminals (TI, T2) by applying the reverse voltage/current between the terminals.

34、A constant current source may be used instead of a constant voltage source on the input side. 2) AC method The specified input forward current (IF) is applied to turn on the output, after which the half-wave-rectified a.c. voltage with commercial a.c. line frequency is applied between the output ter

35、minals. The voltage between the output terminals (peak on- state voltage (VTM) is measured at the specified peak on-state current. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-

36、,-,- 10- 60747-5-3 Amend. I O CEI:2002 La tension entre les bornes de sortie est mesure nouveau avec la polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication de la tension/du courant inverse entre les bornes. Une source de courant constant peut tre utilise la place dune source de te

37、nsion constante du ct de lentre. Tension f I ltat passant Courant f Temps I Courant spcifi de crte Temps IEC 694102 Figure 29 - Formes dondes de la tension et du courant de crte a ltat passant d) Prescriptions La mthode de mesure de la tension de crte ltat passant utilise deux polarits de tension fo

38、rce (TI+T2 et T2+T1). 1) Courant de crte ltat passant (ITM) 2) Courant direct dentre (IF) 3) Temprature ambiante ( Tamb). e) Conditions spcifies 5.10 Courant continu ltat bloque (IsD) a) Objet Mesurer le courant de fuite entre les bornes de sortie ltat bloqu dans des conditions spcifies. b) Schma de

39、 circuit + T2 IEC 695/02 Rs Rsistance limitation de courant Figure 30 - Circuit de mesure pour courant continu ltat bloque Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-6074

40、7-5-3 Amend. 1 O IEC:2002 - 11 - + The voltage between the output terminals is measured again with inverted polarity of the output terminals (TI, T2) by applying the reverse voltage/current between the terminals. A constant current source may be used instead of a constant voltage source on the input

41、 side. RS TI - 7- -ID T2 77 1 Voltage Current t Time I Specified peak on-state Time IEC 694102 Figure 29 - Waveforms of the peak on-state voltage and current d) Requirements The measurement method of the peak on-state voltage uses two forced-voltage polarities (TI+T2 and T2+T1). 1) Peak on-state cur

42、rent (ITM) 2) Input forward current (IF) 3) Ambient temperature ( Tamb). e) Specified conditions 5.10 DC off-state current (IBD) a) Purpose To measure the leakage current between the output terminals in off-state under specified conditions. b) Circuit diagram RS Figure 30 - Measurement circuit for d

43、.c. off-state current Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 12- 60747-5-3 Amend. 1 O CEI:2002 c) Procdure de mesure La tension continue ltat bloqu spcifie est appli

44、que entre les bornes de sortie a ltat bloqu. Le courant de fuite est mesur nouveau avec la polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication du courant/de la tension inverse entre les bornes. d) Prescriptions 1) La mthode de mesure du courant continu ltat bloqu utilise deux pola

45、rits de tension force (TI+T2 et T2+T1). 2) II convient que le taux de balayage de la tension continue applique entre les bornes de sortie (TI, T2) ne dpasse pas le taux critique daugmentation de tension ltat bloqu (dVldt). 1) Tension continue ltat bloqu (VBD) 2) Temprature ambiante (Tam,). e) Condit

46、ions spcifies 5.11 a) Objet Tension continue ltat passant (VT) Mesurer la tension continue entre les bornes de sortie ltat passant dans des conditions spcifies, lorsque le courant direct spcifi est appliqu entre les bornes de sortie ltat passant. b) Schma de circuit Rsi, Rs Rsistances limitation de

47、courant Figure 31 - Circuit de mesure pour courant continu a ltat passant c) Procdure de mesure Le courant direct dentre spcifi (IF) est appliqu pour ltablissement de la sortie. Par la suite, le courant continu spcifi ltat passant est appliqu entre les bornes de sortie. On mesure la tension entre les bornes de sortie (tension continue ltat passant (VT). La tension entre les bornes de sortie est mesure nouveau avec la polarit inverse des bornes de sortie (TI, T2) au moyen de lapplication de la tension/du courant inverse

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