1、 IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20 IEEE Std 1671.3-20
2、17 (Revision of IEEE Std 1671.3-2007) IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis of Electronic Systems of the IEEE Standards B
3、oard Approved 6 December 2017 IEEE-SA Standards Board 2 Abstract: An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard. Keywords: automatic test equi
4、pment (ATE), Automatic Test Markup Language (ATML), ATML Instance Document, automatic test system (ATS), IEEE 1671.3, unit under test (UUT), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrica
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34、EEE standard was completed, the 1671.3 Working Group had the following membership: Ion A. Neag, Chair Malcom Brown Chris Gorringe Anand Jain Teresa Lopes Mukund Modi Leslie Orlidge Mike Seavey John Stabler Joseph Stanco Ronald Taylor The following members of the individual balloting committee voted
35、on this standard. Balloters may have voted for approval, disapproval, or abstention. W. Larry Adams Jr. Malcom Brown Juan Carreon Chris Gorringe Randall Groves Werner Hoelzl Bernard Homes Noriyuki Ikeuchi Anand Jain Teresa Lopes Mukund Modi Ion A. Neag Leslie Orlidge Mike Seavey Robert Spinner Josep
36、h Stanco Michael Stora Walter Struppler Marcy Stutzman Ronald Taylor Louis Ungar John Vergis Oren Yuen Daidi Zhong When the IEEE-SA Standards Board approved this standard on 6 December 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Cha
37、ir Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet
38、 Ulema Phil Wennblom Howard Wolfman Yu Yuan *Member Emeritus 7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1671.3-2017, IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description. This child, or “dot,” standard, also
39、 known as an ATML component standard, provides for the definition of the unit under test XML schemas, and contains references to XML instance document examples, both of which accompany this standard. The XML schemas defined by this standard provide for the identification and definition of a unit und
40、er test (UUT). Where appropriate, the XML schemas utilize and reference components of the ATML for Exchanging Automatic Test Equipment and Test Information via XML Standard (IEEE Std 1671) schema set. ATMLs XML schemas define the basic information required within any test application and provide a v
41、ehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the partic
42、ular requirements within the test environment. 8 Copyright 2018 IEEE. All rights reserved. Contents 1. Overview 9 1.1 Scope . 9 1.2 Application 9 1.3 Conventions used within this document 10 2. Normative references 11 3. Definitions, acronyms, and abbreviations 12 3.1 Definitions . 12 3.2 Acronyms a
43、nd abbreviations . 13 4. UUTDescription schema 14 4.1 Applicability 14 4.2 Describing UUT hierarchy 14 4.3 Using the hc:HardwareItemDescription type in the UUTDescription schema . 14 4.4 Describing UUT digital serial buses 22 5. UUTInstance schema 22 5.1 Applicability 22 5.2 Describing UUT instance
44、hierarchy 23 6. ATML UUT Description XML schema names and locations 23 7. ATML XML schema extensibility . 24 8. Conformance 25 Annex A (normative) XML schemas . 26 A.1 UUTDescription XML schema . 26 A.2 UUTInstance XML schema 79 Annex B (informative) IEEE download website material associated with th
45、is document . 88 Annex C (informative) Describing UUT serial digital buses . 89 C.1 Describing serial buses 90 C.2 Describing serial bus nodes . 92 C.3 Describing serial bus messages . 94 Annex D (informative) User information and examples 99 D.1 Line-replaceable unit UUT . 99 D.2 Circuit card assem
46、bly UUT .100 D.3 UUTInstance 101 D.4 Description of digital serial buses 101 Annex E (informative) Bibliography .102 9 Copyright 2018 IEEE. All rights reserved. IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description 1. Overview Automatic Test Markup Language (ATML)
47、 is a collection of IEEE standards and associated Extensible Markup Language (XML) schemas that allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the XML specifications. The ATML framework and the ATML family of standards have been developed and a
48、re maintained under the guidance of the IEEE Standards Coordinating Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test strategies, test requirements, test procedures, test results management, and test system implementations, while allowing test program, te
49、st asset interoperability, and unit under test (UUT) data to be interchanged between heterogeneous systems. This standard (as well as the XML schemas and XML instance document examples that accompany this standard) is intended to be used in identifying and documenting a UUT. 1.1 Scope This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information. 1.2 Application 1.2.1 Of this document This standard provides for the identification of static characteristic
