1、raising standards worldwide NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BSI Standards Publication BS ISO/IEC 24789-2:2011 Identification cards Card service life Part 2: Methods of evaluationBS ISO/IEC 24789-2:2011 BRITISH STANDARD National foreword This British Standard is
2、 the UK implementation of ISO/IEC 24789-2:2011. The UK participation in its preparation was entrusted to T e c h n i c a l C o m m i t t e e I S T / 1 7 , C a r d s a n d p e r s o n a l i d e n t i f i c a t i o n . A list of organizations represented on this committee can be obtained on request to
3、 its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. BSI 2011 ISBN 978 0 580 63154 2 ICS 35.240.15 Compliance with a British Standard cannot confer immunity from legal obligations. This British Sta
4、ndard was published under the authority of the Standards Policy and Strategy Committee on 30 November 2011. Amendments issued since publication Date T e x t a f f e c t e dBS ISO/IEC 24789-2:2011Reference number ISO/IEC 24789-2:2011(E) ISO/IEC 2011INTERNATIONAL STANDARD ISO/IEC 24789-2 First edition
5、 2011-11-15 Identification cards Card service life Part 2: Methods of evaluation Cartes didentification Dure de vie des cartes Partie 2: Mthodes dvaluation BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2011 All rights reserved. Unless otherwise specified, no pa
6、rt of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale
7、56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2011 All rights reservedBS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) ISO/IEC 2011 All rights reserved iiiContents Page Foreword iv Introduction . v 1 Scope
8、 1 2 Normative references 1 3 Terms, definitions and abbreviated terms 2 3.1 Terms and definitions . 2 3.2 Abbreviated terms . 2 4 Default items applicable to the evaluation methods . 2 4.1 Test environment . 2 4.2 Pre-conditioning 2 4.3 Selection of evaluation methods . 2 4.4 Default tolerance . 2
9、4.5 Total measurement uncertainty . 2 5 Methods of evaluation for card service life (CSL) 3 5.1 Xenon arc light exposure . 3 5.2 Surface abrasion . 4 5.3 Magnetic stripe abrasion 5 5.4 ICM adhesion . 8 5.5 Plasticised vinyl storage. 9 5.6 Wear and soil test 10 5.7 Temperature and humidity aging . 13
10、 5.8 Temperature shock . 13 5.9 Temperature and humidity cycling 14 5.10 ID-1 card flexure 16 5.11 Temperature and humidity aging followed by peel strength testing . 17 5.12 Cross-cut test 18 Annex A (informative) Shortened bendings method . 21 Bibliography 23 BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2
11、:2011(E) iv ISO/IEC 2011 All rights reservedForeword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the developme
12、nt of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental,
13、 in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the jo
14、int technical committee is to prepare International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Atten
15、tion is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. ISO/IEC 24789-2 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, S
16、ubcommittee SC 17, Cards and personal identification. ISO/IEC 24789 consists of the following parts, under the general title Identification cards Card service life: Part 1: Application profiles and requirements Part 2: Methods of evaluation BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) ISO/IEC 201
17、1 All rights reserved vIntroduction This part of ISO/IEC 24789 comprises methods of evaluation of identification (ID) card service life. These methods of evaluation complement the application profiles and requirements defined in ISO/IEC 24789-1, which are intended to be used by card issuers, card ma
18、nufacturers and card component suppliers to represent the comparative rigour of various ID card service life applications. They provide a means for ranking and comparing the main factors affecting ID card service life in a manner that is amenable to evaluation using the methods defined or referenced
19、 in this part of ISO/IEC 24789. BS ISO/IEC 24789-2:2011BS ISO/IEC 24789-2:2011 INTERNATIONAL STANDARD ISO/IEC 24789-2:2011(E) ISO/IEC 2011 All rights reserved 1Identification cards Card service life Part 2: Methods of evaluation 1 Scope This part of ISO/IEC 24789 specifies methods of evaluation for
20、ID-1 identification card service life in the applications referred to in ISO/IEC 24789-1. It contains no additional or changed requirements for the ID-1 card properties defined in other applicable standards. NOTE 1 At the time of publishing this first edition, there is limited data to show direct eq
21、uivalence to any measure of actual field use conditions. It will not be possible to establish any such equivalence until and unless a degree of quantitative correlation has been established for the ID card construction in question. NOTE 2 For the convenience of certain users, non-S.I. equivalents ar
22、e given for some quantity values where these are in common use in the ID card industry. These equivalents appear in parentheses and are for information only. 2 Normative references The following referenced documents are indispensible for the application of this document. For dated references, only t
23、he edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 24789-1, Identification cards Card service life Part 1: Application profiles and requirements ISO/IEC 7810, Identification cards Physical characteristics ISO/IE
24、C 7811-2, Identification cards Recording technique Part 2: Magnetic stripe Low coercivity ISO/IEC 7811-6, Identification cards Recording technique Part 6: Magnetic stripe High coercivity ISO/IEC 7811-8, Identification cards Recording technique Part 8: Magnetic stripe Coercivity of 51,7 kA/m (650 Oe)
25、 ISO/IEC 10373-1, Identification cards Test methods Part 1: General characteristics ISO/IEC 10373-2, Identification cards Test methods Part 2: Cards with magnetic stripes ISO/IEC 14443-1, Identification cards Contactless integrated circuit cards Proximity cards Part 1: Physical characteristics ISO 1
26、05-B02, Textiles Tests for colour fastness Part B02: Colour fastness to artificial light: Xenon arc fading lamp test ISO 3310-1, Test sieves Technical requirements and testing Part 1: Test sieves of metal wire cloth IEC 60068-2-78, Environmental testing Part 2-78: Tests Test Cab: Damp heat, steady s
27、tate BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) 2 ISO/IEC 2011 All rights reservedIEC 60454-2, Pressure-sensitive adhesive tapes for electrical purposes Part 2: Methods of test CIE Publication 116-1995, Industrial Colour-Difference Evaluation 3 Terms, definitions and abbreviated terms 3.1 Terms
28、 and definitions For the purposes of this document, the terms, definitions, symbols and abbreviations given in ISO/IEC 7810, ISO/IEC 10373-1, ISO/IEC 10373-2, ISO/IEC 24789-1 and the following apply. 3.1.1 card fracture crack or break in a card whose depth is at least one third of the card thickness
29、 3.2 Abbreviated terms ICM integrated circuit(s) module ICC integrated circuit(s) card 4 Default items applicable to the evaluation methods 4.1 Test environment Unless otherwise specified, evaluation shall take place in an environment having a temperature 23 C 3 C (73 F 5 F) and relative humidity of
30、 40 % to 60 %. 4.2 Pre-conditioning Where pre-conditioning is required by the evaluation method, the identification cards to be evaluated shall be conditioned to the default test environment for a period of 24 h before evaluation. 4.3 Selection of evaluation methods Methods of evaluation shall be ap
31、plied as required by the application profile of the card defined in ISO/IEC 24789-1. 4.4 Default tolerance Unless otherwise specified, a default tolerance of 5 % shall be applied to the quantity values given to specify the characteristics of the equipment (e.g. linear dimensions) and the evaluation
32、procedures (e.g. equipment adjustments). 4.5 Total measurement uncertainty The total measurement uncertainty for each quantity determined by these evaluation methods shall be stated in the test report. BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) ISO/IEC 2011 All rights reserved 35 Methods of eva
33、luation for card service life (CSL) 5.1 Xenon arc light exposure The purpose of this test is two-fold: a) The procedure can be used as a preconditioning step before, or as a test step in, a sequential test. Cards will be exposed to Xenon arc to accelerate aging of the plastic materials. This aging t
34、ypically causes plastics to lose ductility and become more susceptible to mechanical failures. b) The test can also be used as a means for determining discoloration of card materials due to UV degradation. The test will allow for simulation of outdoor exposure (no window glass filter) and indoor exp
35、osure (use of window glass filter). 5.1.1 Apparatus Xenon Arc Test Chamber conforming to ISO 105-B02 and constructed with: Xenon arc lamp; IR (daylight) filter to cut out wavelengths greater than 800 nm; window glass filter (when applicable); black body temperature control. 5.1.2 Procedure Mount the
36、 cards in the test chamber with the card surface of interest exposed. Close the chamber to prevent leakage. Expose the cards to the Xenon arc for 24 h under the following test conditions: a) black-standard temperature of 50 C 5 C (122 F 9 F) as measured with a black-standard thermometer as defined i
37、n ISO 105-B02; b) illumination intensity: without window filter “Outdoor” exposure 0,65 w/m 2using a control point 1)of 420 nm 550 w/m 2using a control point 2)of 290 nm to 800 nm; with window filter “Indoor” exposure 0,65 w/m 2using a control point of 420 nm 550 w/m 2using a control point of 290 nm
38、 to 800 nm. Allow the cards to cool to room temperature and remove them from the test chamber. If used as a preconditioning test, continue with the remaining test procedures. 1) Test equipment using a 420 nm control point is made by QSun (models Xe-1 and Xe-3). This information is given for the conv
39、enience of users of this document and does not constitute an endorsement by ISO or IEC of these products. Other manufacturers using this control point may be used as long as they meet the requirements of ISO 105-B02. 2) Test equipment using a 290 nm to 800 nm control point is made by Atlas (all Sunt
40、est models). This information is given for the convenience of users of this document and does not constitute an endorsement by ISO or IEC of these products. Other manufacturers using this control point may be used as long as they meet the requirements of ISO 105-B02. BS ISO/IEC 24789-2:2011 ISO/IEC
41、24789-2:2011(E) 4 ISO/IEC 2011 All rights reserved5.1.3 Evaluation report Unless specified otherwise by the base standard: a) record the number of hours of Xenon arc light exposure, the illumination intensity and any filters used; b) record any colour change observations and method of evaluation: vi
42、sual; colour difference E* Labor E* Lchmeasured using CIE 1994 as defined in CIE Publication 116-1995 (or later version) L*a*b* or L*C*h* with standard illuminant D65 and 10 observer; (optionally) reflection density changes (ISO 5-3 and ISO 5-4). c) record whether or not the cards remain testably fu
43、nctional following application of the procedure and report the version of the colour difference measurement method used. 5.2 Surface abrasion The purpose of this method is to provide controlled abrasion of the card surface. 5.2.1 Apparatus Abraser with vacuum pick up or equivalent 3) ; 2 abrasive Wh
44、eels (Taber CS -10F or equivalent); resurfacing disks (Taber S-11 or equivalent); dry soft cleaning cloth; hole punch or equivalent; 500 g total load per wheel (250 g additional - no counter weight wheels). 5.2.2 Procedure Prepare two sample cards that have all the desired information and features b
45、y punching or cutting a notch in the card as shown in Figure 1. Resurface the abrasive wheels for 50 cycles before beginning the procedure and then again after every 250 cycles. Clean the cards and turntable thoroughly, using a dry soft cloth, to remove all debris. Avoid direct finger contact with t
46、he test cards and abrasion wheels. Mount the two cards side by side on the turntable without any compliant pad so that the abrasive wheels pass over the desired areas. The abrasive wheels must not bounce during the procedure. Place the abrasive wheels on the card and the vacuum nozzle 6,4 mm (0.25 i
47、n) above the cards. 3) The abraser apparatus and abrasive wheels may be obtained from Taber Industries, 455 Bryant Street, North Tonawanda, New York 14120. This information is given for the convenience of users of this document and does not constitute an endorsement by ISO or IEC of these products.
48、Equivalent products may be used if they can be shown to lead to the same results. BS ISO/IEC 24789-2:2011 ISO/IEC 24789-2:2011(E) ISO/IEC 2011 All rights reserved 5Preset the specified number of cycles and start the abraser and vacuum. Stop the procedure after the specified number of cycles or until
49、 wear through of the card feature is observed. The procedure may be stopped after 5,000 cycles have occurred without wear through. Stopping the procedure periodically to observe the point of wear-through is recommended. Dimensions in millimetres (inches) not to scale 3,2 0,5 (0.13 0.02) 6,4 0,25 (0.25 0.01) 42,9 0,5 (1.69 0.02)Figure 1 Test card notch location 5.2.3 Evaluation report Unless specified othe
