1、Specific absorption rate (SAR) measurement procedure for long term evolution (LTE) devices PD IEC/PAS 63083:2017 BSI Standards Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National foreword This Published Document is the UK implementation of IEC/PAS 63083:2017. The UK particip
2、ation in its preparation was entrusted to Technical Committee GEL/106, Human exposure to low frequency and high frequency electromagnetic radiation. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the
3、 necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017. Published by BSI Standards Limited 2017 ISBN 978 0 580 95888 5 ICS 17.220.20; 17.240 Compliance with a British Standard cannot confer immunity from legal obligations. This
4、Published Document was published under the authority of the Standards Policy and Strategy Committee on 28 February 2017. Amendments/corrigenda issued since publication Date Text affected PUBLISHED DOCUMENT PD IEC/PAS 63083:2017 IEC PAS 63083 Edition 1.0 2017-01 PUBLICLY AVAILABLE SPECIFICATION Speci
5、fic absorption rate (SAR) measurement procedure for long term evolution (LTE) devices INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 17.220.20; 17.240 ISBN 978-2-8322-3764-9 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication fro
6、m an authorized distributor. colour inside PD IEC/PAS 63083:2017 2 IEC PAS 63083:2017 IEC 2017 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Symbols and abbreviated terms . 7 5 Protocol for SAR assessment 7 5.1 General LTE SAR testing considera
7、tions 7 5.1.1 Description of LTE Mode selection . 7 5.2 Power and SAR Measurement Protocol . 10 6 Uncertainty estimation . 12 7 Measurement report 12 Annex A (informative) Supporting information 13 Annex B (informative) Maximum Power Reduction (MPR) 18 Annex C (informative) Power test conditions 19
8、Annex D (normative) RF Conducted Output Power Measurement . 20 Annex E (informative) RF Conducted LTE Modes to be tested for Band 3, 7 and 20 . 21 Bibliography 28 Figure 1 Use of conducted power for LTE Mode selection 10 Figure A.1 Low, Middle, and High channel at 2 GHz band (Band 1) 14 Figure A.2 R
9、F conducted power vs. 10g SAR . 14 Figure A.3 1g SAR as a function of RF conducted power in various test conditions (dashed lines indicate y=a*x linear regressions) . 16 Table A.1 CV of 15 Table A.2 Maximum CV of found in Study 2 16 Table B.1 Maximum Power Reduction (MPR) for Power Class 3 18 Table
10、C.1 Test Configuration Table without MPR . 19 Table C.2 Test Configuration Table with MPR 19 Table E.1 Band 3 (1 710 MHz to 1 785 MHz) . 21 Table E.2 Band 7 (2 500 MHz to 2 570 MHz) . 24 Table E.3 Band 20 (832 MHz to 862 MHz) . 26 PD IEC/PAS 63083:2017IEC PAS 63083:2017 IEC 2017 3 INTERNATIONAL ELEC
11、TROTECHNICAL COMMISSION _ SPECIFIC ABSORPTION RATE (SAR) MEASUREMENT PROCEDURE FOR LONG TERM EVOLUTION (LTE) DEVICES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Commi
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22、 technical specification not fulfilling the requirements for a standard, but made available to the public. IEC PAS 63083 has been processed by IEC technical committee 106: Methods for the assessment of electric, magnetic and electromagnetic fields associated with human exposure. The text of this PAS
23、 is based on the following document: This PAS was approved for publication by the P-members of the committee concerned as indicated in the following document Draft PAS Report on voting 106/377/PAS 106/385/RVD This PAS shall remain valid for an initial maximum period of 3 years starting from the publ
24、ication date. The validity may be extended for a single period up to a maximum of 3 years, at the end of which it shall be published as another type of normative document, or shall be withdrawn. PD IEC/PAS 63083:2017 4 IEC PAS 63083:2017 IEC 2017 A bilingual version of this publication may be issued
25、 at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. PD IEC/PAS 63083:2017IEC PAS
26、 63083:2017 IEC 2017 5 INTRODUCTION LTE technology shows an added complexity over previously available radio schemes and in order to configure and test LTE devices, many signal parameters have to be taken into account. The combinations of parameters in a given frequency band can result in hundreds o
27、f LTE Modes and SAR test configurations. The main purpose of this protocol is to support the demonstration of DUT compliance with applicable exposure limits based on a reasonable number of SAR evaluations. PD IEC/PAS 63083:2017 6 IEC PAS 63083:2017 IEC 2017 SPECIFIC ABSORPTION RATE (SAR) MEASUREMENT
28、 PROCEDURE FOR LONG TERM EVOLUTION (LTE) DEVICES 1 Scope This Publicly Available Specification (PAS) applies to measurement procedures of Specific Absorption Rate (SAR) generated by devices with LTE (Long Term Evolution) technology specified by 3rd Generation Partnership Project (3GPP), Rel. 8 and 9
29、 1 where the devices are intended to be used with the radiating part in close proximity to the human head and body. This document supports both FDD and TDD modes. The objective of this document is to define the number of test conditions with respect to basic radio frequency aspects, i.e. channel ban
30、dwidths, number and offset of allocated resource blocks (RB), modulation, and maximum power reduction (MPR) for IEC 62209-1 and IEC 62209-2. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this doc
31、ument. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 62209-1:2016, Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields fr
32、om hand-held and body-mounted wireless communication devices Part 1: Devices used next to the ear (Frequency range of 300 MHz to 6 GHz) IEC 62209-2, Human exposure to radio frequency fields from hand-held and body-mounted wireless communication devices Human models, instrumentation, and procedures P
33、art 2: Procedure to determine the specific absorption rate (SAR) for wireless communication devices used in close proximity to the human body (frequency range of 30 MHz to 6 GHz) ETSI TR 121 905, Digital cellular telecommunications system (Phase 2+) (GSM); Universal Mobile Telecommunications System
34、(UMTS); LTE; Vocabulary for 3GPP Specifications 3 Terms and definitions For the purposes of this document, the terms and definitions given in ETSI TR 121 905 and the following apply. 3.1 LTE Mode specific operational characteristics of the DUT Note 1 to entry: LTE Mode is the combination of channel
35、frequency, channel bandwidth, modulation, number of resource blocks, the offset of the resource blocks within the bandwidth, and the MPR. 3.2 Device Position orientation and position of the DUT with respect to the phantom 3.3 Test Condition Test Condition refers to the combination of both the LTE Mo
36、de and Device Position PD IEC/PAS 63083:2017IEC PAS 63083:2017 IEC 2017 7 4 Symbols and abbreviated terms For the measurement procedures specified in this document, the symbols and abbreviated terms of IEC 62209-1 and IEC 62209-2 shall apply. 5 Protocol for SAR assessment 5.1 General LTE SAR testing
37、 considerations LTE technology shows an added complexity over previously available radio schemes. In order to configure and test LTE devices, many signal parameters have to be taken into account: frequency band, channel bandwidth (from 1.4 MHz to 20 MHz), modulation (QPSK and 16- QAM), number of res
38、ource blocks allocated, offset of the resource blocks within the channel bandwidth as well as MPR. The combinations of parameters in a given frequency band can result in hundreds of LTE Modes and SAR test configurations. In order to address this a specific protocol is necessary for SAR assessment of
39、 LTE devices. The main purpose of this protocol is to support demonstration of DUT compliance with applicable limits based on a reasonable number of SAR evaluations. For a given LTE Mode and Device Position (Test Condition), the peak spatial-average SAR is related to the maximum RF output power. As
40、a consequence, RF conducted power measurements can be used to quickly identify high SAR LTE Mode. SAR and RF conducted power are however not directly proportional because: i) RF conducted power is measured with a 50 Ohms load impedance; ii) the antenna impedance of a DUT is generally not 50 Ohms and
41、 varies over frequency; iii) the antenna impedance can be affected by Device Position and phantom coupling conditions. Because of this, a single SAR measurement using the LTE Mode with the highest measured maximum conducted output power in a frequency band may not be sufficient to demonstrate compli
42、ance unless the SAR value is significantly lower than the applicable compliance limit. In the following, the required Test Conditions are established by applying the protocol in 5.2. The LTE Test Conditions are measured according to the SAR measurement protocols in IEC 62209-1 for devices used next
43、to the ear and in IEC 62209-2 for hand-held and body- mounted devices. This document only specifies the procedures to identify the LTE Test Conditions that will most likely result in SAR levels closest to the highest and conservative SAR result obtained from an up-scaling procedure. For the above re
44、asons, studies on the relationship between RF conducted power and SAR were conducted by MT1 using handsets operating in Band 1, 4 and 17. The results in Annex A show that: QPSK modulation with 1 RB allocation generally produces the highest peak spatial- average SAR MPR does not apply in this case. P
45、eak spatial-average SAR has good correlation with the measured RF conducted output power. The relationship deviates from proportionality by less than 25 % (k = 2). For LTE Modes with maximum conducted power lower than 85 % of P max , where P maxis the highest measured maximum RF conducted output pow
46、er across all LTE Modes in the frequency band, it is highly unlikely that highest SAR results would be expected. 5.1.1 Description of LTE Mode selection Conducted power shall be measured for the largest channel bandwidth supported by the LTE Modes in each frequency band, using QPSK modulation with 1
47、 RB allocation. The required test channels shall be determined by 6.2.5 of IEC 62209-1:2016. If the number of required channels is 1, the 1 RB shall be allocated at offset = centre; if the number of required PD IEC/PAS 63083:2017 8 IEC PAS 63083:2017 IEC 2017 channels is 3, the 1 RB shall be allocat
48、ed at offset = 0, centre, and max within the channel bandwidth. If the number of required channels is 5, the 1 RB shall be allocated at offset = 0, centre, centre, centre and max within the channel bandwidth, respectively, for channels from lowest to highest. Other LTE Modes besides “QPSK modulation
49、 with 1 RB allocation” shall also be measured for the different channel bandwidth configurations using the modulations and RB allocations described in Table C.1 (without MPR) and C.2 (with MPR), which are specified by 3GPP for conformance testing. Conducted maximum output power shall be measured using the following test channel and RB offset configurations. When MPR does not apply, the configurations in Table C.1 are measured for the low and middle channels with RB offset = 0 and R
