1、IEEE Std C62.41.2-2002IEEE StandardsC62.41.2TMIEEE Recommended Practice onCharacterization of Surges inLow-Voltage (1000 V and Less)AC Power CircuitsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USA11 April 2003IEEE Power Engineering
2、SocietySponsored by theSurge Protective Devices CommitteeIEEE StandardsPrint: SH95031PDF: SS95031Recognized as anAmerican National Standard (ANSI) 62.41.22002 (1000 ) 10 2003 11 2002 , .3 , , 100165997, 2002 , . . 11 2003. . , .: 073813393-0 95031: 073813394-9 95031 , , .IEEE thanks the Internationa
3、l Electrotechnical Commission (IEC) for permission to reproduce informationfrom its International Standards, Technical Reports, and Technical Specifications: IEC 61312-1:1995Figure A.1 and Figure A.2; IEC 61643-1:1998Figure A.3; IEC 61312.3:2000FigureA.4. All suchextracts are copyright of IEC, Genev
4、a, Switzerland. All rights reserved. Further information on the IEC isavailable from www.iec.ch. IEC has no responsibility for the placement and context in which the extractsand contents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracytherein.: 62.41.12002
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21、r conducting inquiries into the legal validity orscope of those patents that are brought to its attention. 2003 . .This introduction is not part of IEEE Std C62.41.2-2002, IEEE Recommended Practice on Characterization of Surges inLow-Voltage (1000 V and Less) AC Power Circuits.This recommended pract
22、ice is the result of 20 years of evolution from the initial 1980 document, IEEEStd 587, IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits, which promptly became IEEEStd C62.41 with the same title. The guide was updated in 1991 as IEEE Std C62.41-1991, IEEERecommended Practice on Surge V
23、oltages in Low-Voltage AC Power Circuits, reflecting new data on thesurge environment and experience in the use (and misuse) of the original guide. The purpose of thedocument was and still is to provide information on the surge environment and offer recommendations tointerested parties involved in d
24、eveloping test and application standards related to surge protective devices(SPDs) as well as recommendations to equipment designers and users.The 1980 version, based on data available up to 1979, proposed two novel concepts: a) The reduction of a complex database to two representative surges: a new
25、 “Ring Wave” featuring adecaying 100 kHz oscillation, and the combination of the classical, well-accepted 1.2/50 s voltagewaveform and 8/20 s current waveform into a “Combination Wave” to be delivered by a surgegenerator having a well-defined open-circuit voltage and short-circuit current.b) The con
26、cept that location categories could be defined within an installation where surge voltagesimpinging upon the service entrance of an installation or generated within an installation wouldpropagate, unabated, in the branch circuits, while the associated currents, impeded by (mostly) theinductance of t
27、he conductors, would be reduced from the service entrance to the end of long branchcircuits.The 1991 version, based on additional data as well as experience in the use of the 1980 guide, maintained theconcepts of the location categories and the recommendation of representative surge waveforms. The t
28、woseminal surges, Ring Wave and Combination Wave, were designated as “standard surge-testing waveforms,”and three new “additional surge-testing waveforms” were added to the “menu.” Meanwhile, a companiondocument, IEEE Std C62.45-1992, IEEE Guide on Surge Testing for Equipment Connected to Low-Voltag
29、e AC Power Circuits, was developed, outlining procedures for error-free application of the waveformsdefined by IEEE Std C62.41-1991 while enhancing operator safety.The perceived need to justify the expansion of the two-only waveforms to a menu of five led to the growth inthe document volume, from th
30、e 25-page IEEE Std 587-1980 to the 111-page IEEE Std C62.41-1991.Additional data collected toward an update of the 1991 version (which was reaffirmed in 1996) would haveincreased further the volume of the document. Instead, a new approach was selected: to create a “Trilogy”by separating the informat
31、ion into three distinct documents, making their use more reader-friendly whilemaintaining the credibility of the recommendations: A guide on the surge environment in low-voltage ac power circuits, including a broad database (IEEEStd C62.41.1-2002) A recommended practice on characterization of surges
32、 in low-voltage ac power circuits (the presentdocument) A recommended practice on surge testing for equipment connected to low-voltage ac power circuits(IEEE Std C62.45-2002)In this manner, interested parties will have a faster, simpler access to the recommendations for selectingrepresentative surge
33、s relevant to their needs. A comprehensive database will be available for parties desiringto gain a deeper understanding of the surge environment and an up-to-date set of recommendations on surgetesting procedures. 2003 . . At the time this recommended practice was completed, the Working Group on Su
34、rge Characterization onLow-Voltage Circuits had the following membership:Hans Steinhoff, ChairJames Funke, Co-ChairRaymond Hill, SecretaryFranois D. Martzloff, Technical EditorOther individuals who contributed review and comments in developing this recommended practice areThe following members of th
35、e balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. Richard BentingerWilliam Bush Ernie Gallo Andrea Turner Haa Jim Harrison Michael Hopkins Deborah Jennings-ConnerPhilip J. JonesWilhem H. Kapp Joseph L. Koepfinger Richard OdenbergAlan W. R
36、ebeckMichael StringfellowS. Frank Waterer Don WordenP. P. BarkerJ. BirklB. ConnatserT. R. ConradC. DhoogeD. Dorr H. E. FoelkerG. L. GoeddeW. GoldbachP. Hasse G. KohnT. S. KeyD. LaceyJ. Levine A. Mansoor D. MessinaR. W. NorthropK. O. PhippsJ. B. PoseyV. A. Rakov A. RousseauS. G. Whisenant W. J. Zisch
37、ankRichard BentingerJames CaseChrys ChrysanthouBryan R. ColeBill CurryDouglas C. DawsonE. P. DickClifford C. ErvenErnie GalloGary GoeddeJim HarrisonSteven P. HensleyDavid W. JacksonPhilip J. JonesWilhelm H. KappJoseph L. KoepfingerBenny H. LeeCarl E. LindquistWilliam A. MaguireFranois D. MartzloffNi
38、gel P. McQuinGary L. MichelRichard OdenbergJoseph C. OsterhoutMichael ParentePercy E. PoolR. V. RebbapragadaAlan W. RebeckTim E. RoysterMark S. SimonHans SteinhoffAntony J. SurteesDonald B. TurnerS. Frank WatererJames W. WilsonJonathan J. WoodworthDonald M. Worden 2003 . .At the time when this docum
39、ent was sent to ballot, the Accredited Standards Committee on Surge Arresters,C62, had the following members:Joseph L. Keepfinger, ChairS. Choinski, SecretaryVacant, NEMA Co-SecretaryNaeem Ahmad, IEEE Co-SecretaryOrganization Represented Name of RepresentativeElectric Light 1.4. . 1 . 2 . 3 . 4 62.41.12002.1 5 . 6 . 7 , . 8 . . , , . . , 6
