1、INCITS Technical Reportfor Information Technology Fibre Channel Methodologies for Jitter andSignal Quality Specification(FC-MJSQ)INCITS TR-35-2004INCITS TR-35-2004-iiINCITS TR-35-2004INCITS Technical Reportfor Information Technology Fibre Channel Methodologies for Jitter andSignal Quality Specificat
2、ion(FC-MJSQ)AbstractThis technical report enhances the jitter and signal specifications found in the Fibre Channel Physical layer standards and in the technical report Methodologies for Jitter Specification (MJS). It provides extended definitions and test methodologies to enable more effective execu
3、tion of specifications relating to the phase timing features of high speed serial signals. A generalization of jitter concepts to include events that occur at other than the nominal receiver detection threshold provides a stronger coupling between the jitter measured in a signal and the errors produ
4、ced by the receiver of the signal. The meth-odologies described use a structured approach to describe the tests that recognize the contributions from test fixtures, instrumentation and calibration schemes to the reported values. Although this report uses 1.0625 GBd for some examples it is intended t
5、o be fully applicable to speeds well in excess of the exist-ing 4.25 GBd jitter specifications in FC-PI-n.Published byAmerican National Standards Institute25 West 43rd Street, New York, New York 10036Copyright 2004 by Information Technology Industry Council (ITI)All rights reserved.No part of this p
6、ublication may be reproduced in anyform, in an electronic retrieval system or otherwise, without prior written permission of the publisher.Printed in the United States of AmericaINCITS Technical Report SeriesThis Technical Report is one in a series produced by the International Committeefor Informat
7、ion Technology Standards (INCITS). The secretariat for INCITS is heldby the Information Technology Industry Council (ITI), 1250 Eye Street, NW, Suite200, Washington, DC 2005.As a by-product of the standards development process and the resources ofknowledge devoted to it, INCITS from time to time pro
8、duces Technical Reports.Such Technical Reports are not standards, nor are they intended to be used assuch.INCITS Technical Reports are produced in some cases to disseminate thetechnical and logical concepts reflected in standards already published or underdevelopment. In other cases, they derive fro
9、m studies in areas where it is foundpremature to develop a standard due to a still changing technology, orinappropriate to develop a rigorous standard due to the existence of a number ofviable options, the choice of which depends on the users particular requirements.These Technical Reports, thus, pr
10、ovide guidelines, the use of which can result ingreater consistency and coherence of information processing systems.When the draft Technical Report is completed, the Technical Committee approvalprocess is the same as for a draft standard. Processing by INCITS is also similarto that for a draft stand
11、ard.PatentStatementCAUTION: The developers of this Technical Report have requested that holdersof patents that may be required for the implementation of the standard, disclosesuch patents to the publisher. However, neither the developers nor the publisherhave undertaken a patent search in order to i
12、dentify which, if any, patents mayapply to this Technical Report. As of the date of publication of this Technical Report and following calls for theidentification of patents that may be required for the implementation of theTechnical Report, no such claims have been made. No further patent search is
13、conducted by the developer or the publisher in respect to any Technical Report itprocesses. No representation is made or implied that licenses are not required toavoid infringement in the use of this Technical Report.iContentsPageForeword .xviIntroduction .xxi1 Scope 12 References 22.1 General . 22.
14、2 Approved references . 22.3 References under development 32.4 Informative references 33 Definitions and conventions 53.1 Overview . 53.2 Conventions 53.3 Keywords 53.4 Acronyms 63.5 Definitions . 74 Background for MJSQ . 144.1 Overview . 144.2 Relationship to SONET and receiver tolerance requiremen
15、ts 144.3 Relationship to earlier FC standards . 154.4 Traditional measurement methodology risks 165 Jitter overview . 185.1 Serial transmissions 185.2 Jitter output context . 185.3 Jitter tolerance context 195.4 Jitter assumptions summary . 195.5 FC-0 and MJS(-1) interface overview . 205.6 Fibre cha
16、nnel physical architecture 216 Jitter fundamentals 256.1 Purpose of addressing all important signal levels . 256.2 Essential properties of signals 256.2.1 Introduction . 256.2.2 Signal amplitude vs. signal level . 256.2.3 Time, timing reference and jitter timing reference . 266.2.4 Considerations wh
17、en using hardware basedjitter timing references . 266.2.5 Jitter and noise relationship 266.2.6 Rising edges and falling edges 26iiPage6.3 Number of events per bit-period . 286.4 Statistical distribution at a specific signal level . 296.5 Basic relationships within statistical jitter distributions 2
18、96.5.1 Overview . 296.5.2 Description of mathematical model . 326.5.3 Relationship between jitter and BER for random jitter distributions . 336.5.4 Effects of changing the standard deviation for Gaussian PDFs . 356.5.5 Common mistakes relating to statistical properties of measurements . 356.5.6 Addi
19、tion of deterministic jitter 366.6 Jitter eye mask methodology for signal quality specification 396.7 Signal measurements vs. jitter eye mask signal quality specifications . 416.8 Jitter timing reference at different signal levels during data acquisition 426.9 Example of a 2-dimensional jitter measu
20、rement . 426.10 Jitter timing reference frequency response requirements . 436.10.1 Overview . 436.10.2 Performance specification for a hardware implementation of a Golden PLL 496.11 Jitter frequency concepts 526.12 Jitter output measurement methodologies 536.12.1 Time domain 536.12.2 Frequency domai
21、n . 536.13 Effects of varying jitter distributions on BER . 536.14 Methodology for jitter and signal quality specification for “processed” signals . 546.14.1 Background . 546.14.2 Link components that contain compensation properties (equalization) 546.14.2.1 Compensation. 546.14.2.2 Transmitter comp
22、ensation 556.14.2.3 Interconnect compensation. 566.14.2.4 Receiver compensation 566.15 Determination of compliance 576.16 Extremely stressful data patterns and scrambling 587 Jitter causes and jitter distribution 597.1 Jitter contribution elements . 597.2 Jitter distribution 607.2.1 Basic types - bo
23、unded and unbounded, correlated and uncorrelated 607.2.2 Unbounded (definition, concept, quantitative description) 607.2.3 Bounded (definition, concept, quantitative description) 60iiiPage7.2.3.1 Overview . 607.2.3.2 Duty cycle distortion (correlated) 617.2.3.3 Data dependent (correlated) . 617.2.3.
24、3.1 Overview . 617.2.3.3.2 Dispersion induced jitter 617.2.3.3.3 Reflection induced jitter. 627.2.3.3.4 Baseline wander induced jitter 627.2.3.3.5 High probability DDJ . 627.2.3.3.6 Low probability DDJ 627.2.3.4 Uncorrelated DJ . 627.2.3.4.1 Overview . 627.2.3.4.2 Power supply noise . 627.2.3.4.3 Cr
25、osstalk / external noise 627.2.3.4.4 Applied sinusoidal . 637.2.4 Residual jitter and variance record 637.2.5 Summary of jitter taxonomy 638 Calculation of jitter compliance values (level 1) 658.1 Overview - separation of jitter components . 658.2 Examples comparing level 1 DJ with peak to peak DJ .
26、 668.3 Methodology details for calculating level 1 DJ and level 1 TJ . 699 Basic data forms, analysis, and separation of jitter components 709.1 Overview . 709.1.1 Introduction . 709.1.2 Basic data forms . 709.1.3 Data analysis methods 709.1.4 Summary of overview 709.1.5 Organization of the document
27、 relating to material introduced in clause 9 739.2 Best fit of tails of histograms . 739.2.1 Introduction . 739.2.2 Tail fit jitter analysis method example . 749.2.2.1 Jitter separation through tail fit 749.2.2.2 Tail fit accuracy . 769.2.2.3 Tail fit application in serial data communication 769.2.2
28、.4 DJ and RJ measurement (level 2). 789.2.2.5 Level 1 CDF measurement . 789.3 Frequency spectrum method 7910 Signal quality measurement methodologies . 8010.1 Overview . 8010.1.1 Non-jitter properties of signal quality . 8010.1.2 Overview of jitter related signal quality measurement methods 8010.1.3
29、 Accuracy and verification considerations 8110.1.3.1 Accuracy . 8110.1.3.2 Verification 8110.1.3.2.1 Overview . 8110.1.3.2.2 BERT method 81ivPage10.1.3.2.3 Calibrated signal source method 8210.1.4 Summary of signal quality measurement methods . 8210.2 Equivalent time oscilloscope methods 8710.2.1 In
30、troduction . 8710.2.2 Equivalent time sampling 8710.2.2.1 Overview. 8710.2.2.2 Asychronous equivalent time sampling 8810.2.2.3 Sequential equivalent time sampling 8910.2.3 Waveform eye mask measurements 8910.2.4 Repeated pattern measurement using an equivalent time oscilloscope 9110.3 Enhanced equiv
31、alent time oscilloscope 9210.3.1 Overview . 9210.3.2 Signal edge models 9310.3.3 Periodic jitter frequency analysis beyond the Nyquist rate . 9310.3.4 General process for extracting the CDF . 9310.3.4.1 Overview. 9310.3.4.2 Correlated Jitter 9410.3.4.3 Uncorrelated Jitter 9410.3.4.4 Aggregate Determ
32、inistic Jitter (DJ). 9510.3.5 Level 1 CDF output . 9510.4 BERT scan 9610.4.1 Basic BERT scan 9610.4.2 Alternate combined process to extract level 1 DJ and TJ . 9710.4.3 BERT eye contour measurements 9810.4.4 BERT with reference channel . 9910.5 Time interval analysis . 10010.5.1 Introduction . 10010
33、.5.2 Jitter measurements with a “bit clock” (level 1) . 10110.5.3 Jitter measurements with a “pattern marker” (level 1) 10310.5.4 Jitter measurements with no clock and no marker (level 2) 10710.5.4.1 Overview. 10710.5.4.2 TIA data reduction procedure . 10910.5.4.3 Total jitter calculation 11010.5.4.
34、4 Data dependent jitter measurement (level 2) 11110.5.5 Power density spectrum of jitter (level 2) 11210.6 Real time oscilloscope methods . 11510.6.1 Overview . 11510.6.2 Clock recovery and waveform eye diagram 11610.6.3 Spectrum approach to jitter measurements 11710.6.3.1 Overview. 11710.6.3.2 RJ/D
35、J analysis (level 2) 11810.6.3.3 Analyzing DJ components (level 2) 11810.6.3.4 Obtaining the jitter eye opening 11910.6.3.5 Deterministic jitter and total jitter (level 1). 12010.6.3.6 Jitter eye diagram . 12010.6.4 Jitter noise floor of RT scope oscilloscope waveform data . 12011 Jitter / signal to
36、lerance measurement methodologies 121vPage11.1 Overview . 12111.2 Jitter tolerance test methodologies . 12311.2.1 Overview . 12311.2.2 General methodology 12311.2.3 Sinusoidal jitter modulation . 12411.2.4 Jitter / signal tolerance sources . 12511.2.4.1 Overview . 12511.2.4.2 Optical jitter / signal
37、 tolerance source example. 12611.2.4.3 Electrical jitter / signal tolerance source example . 12711.2.5 Calibration of a jitter tolerance signal source 12711.2.6 Direct time synthesis . 12911.2.7 BER measurements 12912 Example use of jitter specification methodology for FC-PI-n 13012.1 Overview . 130
38、12.2 Dependence on signal properties other than jitter output at the average signal level 13012.3 Jitter output budget and jitter tolerance budget . 13112.3.1 Overview . 13112.3.2 Example jitter output budget tables . 13212.3.3 Jitter tolerance specification 13213 Practical measurements 13413.1 Leve
39、l 1 and level 2 measurements . 13413.2 System considerations 13413.3 Component considerations . 13513.4 Instrumentation considerations . 13613.4.1 General . 13613.4.2 FC compliant . 13613.4.3 Non-FC compliant . 13613.5 Reference standards / calibration considerations . 13613.6 Test fixture compensat
40、ion and calibration issues . 13713.6.1 Overview . 13713.6.2 Compensating and non-compensating test fixtures 13713.6.3 Detection and correction of test fixture degradation effects 13813.6.4 Correction for golden test fixture effects . 13813.6.5 Connector type adapters . 13813.7 Data output format con
41、siderations . 13914 Detailed implementation examples . 14014.1 TIA for optical gamma T at switching threshold for FC Ports 14014.1.1 Overview of measurement and strategy . 14014.1.2 Test fixtures and measurement equipment . 14114.1.3 Option 1 - optical TIA no clock, no marker 14214.1.3.1 Option 1 ov
42、erview . 14214.1.3.2 Option 1 test fixture . 14214.1.3.3 Option 1 measurement equipment 142viPage14.1.3.4 Option 1 calibration. 14414.1.3.5 Option 1 measurement procedure 14414.1.3.6 Option 1 data output format 14514.1.3.7 Option 1 acceptable values 14614.1.4 Option 2 - TIA with Golden PLL bit clock
43、 14714.1.4.1 Option 2 overview . 14714.1.4.2 Option 2 test fixture. 14714.1.4.3 Option 2 measurement equipment . 14714.1.4.4 Option 2 calibration procedure 14714.1.4.5 Option 2 measurement procedure 14714.1.5 Option 2 data output format 14814.1.5.1 Option 2 acceptable values 15114.1.6 Option 3 - TIA
44、 with arming on bit sequence 15114.1.6.1 Option 3 overview . 15114.1.6.2 Option 3 test fixture. 15214.1.6.3 Option 3 measurement equipment . 15214.1.6.4 Option 3 calibration procedure 15214.1.6.5 Option 3 measurement procedure 15214.1.6.6 Option 3 data output format 15314.1.6.7 Option 3 acceptable v
45、alues 15414.2 Electrical Gamma T using a real time oscilloscope 15514.2.1 Overview . 15514.2.2 Test Fixture and termination . 15514.2.3 Measurement Equipment 15614.2.4 Measurement Procedure 15614.2.5 Measurement Results . 15814.3 Optical and electrical Gamma T using a jitter optimized sampling oscil
46、loscope 15914.3.1 Overview . 15914.3.2 Measurement configuration 15914.3.3 Measurement Equipment 16114.3.4 Measurement procedure . 16114.3.5 Measurement results 16214.3.5.1 Electrical Gamma T results at 2.125 Gb/s 16214.3.5.2 Optical Gamma T results at 10.51875 Gb/s . 16414.4 BERT Delta R signal tol
47、erance . 16514.4.1 Overview . 16514.4.2 Measurement configuration for signal calibration . 16514.4.3 Calibration test fixtures . 16614.4.4 Signal calibration procedure . 16614.4.4.1 Initial DDJ calibration 16614.4.4.2 Initial RJ calibration. 16614.4.4.3 SJ (sine jitter) calibration 16714.4.4.4 Final
48、 DJ and TJ calibration . 16714.4.4.5 Eye amplitude calibration 16814.4.4.6 Add SJ 16814.4.5 Signal tolerance testing 16914.4.6 Data output format 16914.4.7 Acceptable values . 169viiPageAnnexesA Test bit sequences 170A.1 Test bit sequence characteristics . 170A.1.1 Introduction . 170A.1.2 Low freque
49、ncy pattern . 170A.1.3 Low transition density patterns 172A.1.3.1 Overview . 172A.1.3.2 Half-rate and quarter-rate square patterns 173A.1.3.3 Ten contiguous runs of 3 . 174A.1.4 Composite patterns . 175A.2 Compliant jitter test bit sequences . 175A.2.1 Introduction . 175A.2.2 Random test bit sequence 176A.2.2.1 Overview . 176A.2.2.2 Background - Fibre Channel frame . 176A.2.2.3 Original RPAT . 177A.2.2.4 Compliant RPAT (CRPAT) 177A.2.3 Compliant receive jitter test bit sequences 181A.2.3.1 Overview . 181A.2.3.2 Receive jitter tolerance pattern - JTPAT .
