1、STD-EIA TIA-455-L35-ENGL 1997 m 3234b00 0580517 UT2 m TIALEIA ANSI/ TIA/ EIA-4 5 5- 13 5-19 9 6 Apwoved: December 27, 1996 STANDARD FOTP-135 Measurement of Connector Ferrule Inside and Outside Diameter Circular Runout TIMIA-455-135 _- JANUARY 1997 TELECOMMUNICATIONS INDUSTRY ASSOCIATION Copyright El
2、ectronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1977 NOTICE A/EA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufa
3、cturers and purchasers, facilitahg interchangeabiiity and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmem
4、ber of TIA/EIA from manufacturing or selling products not conforming to such Standards and Publicaions, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than WEIA members, whether the standard is to be used either domestidy or internationally. St
5、andards and Publications are adopted by TIA/= in accordance with the American National Standarcis Institute (ANSI) patent policy. By such action, “A does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publidon. This Standa
6、rd does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate .a-acy of better than or equal to 0.1 of the pass/fail criteria (traceable to NIST) for calibration. 3.
7、3 Measurement apparatus (method 2). Use a measurement apparatus with an optical microscope with magnification appropriate for the test, an apparatus for holding and rotating the specimen around an axis that is capable of changing the position of the specimen with regards to the rotation axis, and a
8、roundness measuring instrument with calibration traceable to NIST. 3.4 Measurement apparatus (method 3). Use a measurement apparatus with a V-groove alignment fixture, a height measurement instrument with a carbide stylus probe, and a means of rotating the specimen while holding it against the align
9、ment fixture. The resolution of the height measurement instrument shall be greater than one-tenth of the acceptance criterion specified in the detail specification. 4 Sampling and specimens - Unless otherwise specified in the Detail Specification, use an optical fiber connector ferrule for the test
10、specimen. The specimen may be part of an optical fiber connector at the time of measurement. Keep the specimen free from dirt or dust with a front surface polished sufficiently to allow delineation of the boundaries of the hole. NOTE: The specimen should be cleaned at some time before performing thi
11、s test procedure. 2 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 35 5 Procedure NOTE: Make sure that the specimen and the test apparatus are clean before making any measu
12、rements. Parts can be cleaned using an alcohol wipe and dried using compressed air. 5.1 Method 1 5.1.1 Place the linear standard under the microscope. Focus the microscope on the linear standard. Adjust the lines on the reticle (or TV monitor) to the spacing specified in the detail specification. 5.
13、1.2 Insert the specimen into the V-groove with the front surface toward the microscope and the specimen outer diameter against both sides of the V-groove. Move the holder-rotator into position to hold the specimen in the V-groove. 5.1.3 Focus the microscope on the front surface of the specimen and b
14、ring the hole edge to the center of the viewing area. Rotate the part and observe the position where the hole edge opposite the V-groove apex is closest to the V-groove apex. Position the first line of the reticle at this edge location (see figure 2). Completely rotate the specimen and observe if th
15、e hole edge passes the second line on the reticle. Small surface imperfections on the hole edge may be ignored provided that they do not extend into the hole or they do not subtend more than a IOo angle. 5.2 Method 2 5.2.1 Insert the specimen into the ferrule holder and position the microscope so as
16、 to view the specimen end surface. Adjust the ferrule holder until the axis of rotation of _- the specimen is at the center of the specimen hole. 5.2.2 Place the pick-up of the roundness measuring instrument against the specimen outer surface so as to measure the displacement of the outer diameter o
17、f the specimen as the specimen is rotated. 5.2.3 Completely rotate the specimen and record the maximum reading from the roundness gauge as C, and the minimum reading as C,. 5.3 Method 3 5.3.1 Insert the specimen into the alignment fixture with the ferrule front surface towards the height measuring i
18、nstrument and the specimen outer diameter against both sides of the V-groove. Move the specimen rotator into position to hold the specimen in the V-groove. 3 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without l
19、icense from IHS-,-,- STD-EIA TIA-455-L35-ENGL 1997 3234b0 0580522 4bT TlNEIA-455-135 5.3.2 insert the stylus probe into the ferrule to a depth that is sufficient to prevent defects at the edge of the hole from affecting the measurement results (0.04 to 0.06 mm usually is enough). The stylus should b
20、e held at a slight angle relative to the axis of the femle so that the measurement is from the chamfer at the tip of the stylus. Place the stylus against the inside wall of the ferrule closest to the apex of the alignment fixture so as to measure the displacement of the inner diameter of the specime
21、n as the specimen is rotated. 5.3.3 Completely rotate the specimen and record the maximum reading from the height measuring instrument as C, and the minimum reading as C,. 6 Calculations or interpretation of results 6.1 Method 1 If the hole edge extends past the second line (see figure 3) the specim
22、en fails the ferrule inside and outside diameter circular runout test. 6.2 Methods 2 and 3 The connector ferrule inside and ouide diameter circular runout is defined as the difference between C, and C,. 7 Documentation 7.1 All applications. Report the following information for each test: 7.1.1 Date
23、and title of the test. 7.1.2 Identification of procedure (FOTP No.). 7.1.3 Test specimen identification. 7.1.4 Method used (1, 2 or 3). 7.1.5 Pass/fail indication. c 4 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted
24、 without license from IHS-,-,-J TINEIA-455-135 7.2 United States Military. United States military applications require that the following information also be reported for each test. For other (nonmilitary) applications, this information need not be reported but shall be available for review upon req
25、uest: 7.2.1 Test personnel. 7.2.2 Brief description of the test apparatus and date of latest calibration. 8 Specification information The following information shall be specified in the Detail Specification: 8.1 Acceptance or failure criteria. 8.2 Test specimen to be tested. 8.3 Number of samples to
26、 be tested. 8.4 Reticle line separation required (Method 1). 5 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINElA-455-135 Eye or A- TV Camera MiCrOSCOpe - 200X Min Magnification Fron
27、t Holder/ Rotater Surface a Figure 1 - Test Apparatus (Method 1). _ 6 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-135 Reference Pokt Pasflail Limit Equivalent On Part Hole
28、Edge / Reticle Figure 2 - Reference point and location of reticle (Method I). 7 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINElA-455-135 PassFail Limit Equivalent On Part Figure 8
29、Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 35 - Annex A (informative) Comparison between this FOTP and IEC OR ITUIT requirements Al. IEC IEC project number 86B. 1.40 ad
30、dresses the measurement of ferrule concentricity. The proposed IEC procedure contains one other test method other than the methods proposed here. The other method involves an alternate approach for setting up the center axis of the ferrule hole as the reference point and measuring the deviations of
31、the ferrule outer diameter relative to that reference point. A2 ITUIT There are no known ITUR documents on this topic matter. 9 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINElA-455
32、-135 This page left blank. lo Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STDeEIA TIA-i55-135-ENGL 1997 323qb00 0580531 q72 D FOPT NUMBER 135 FOTP BACKGROUND DATA PROJECT NUMBER FOTP
33、 DATE BALLOT LEVEL U FO-Committee O SPStandardc 3367 4/20/96 Ballot Proposal AUTHOR ANDIOR PREFERRED CONTACT (Name, Address, Telephone): Gair D. Brown NSWCDD 17320 Dahlgren Road, Code 635 Dahlgren, VA 22448-51 O0 540-653-1 579 SUBCOMMITTEE ORIGIN OF THIS FOTP: SC: F0-6.3 CHAIRPERSON: Tom Ball FOTP S
34、OURCES (Reference documents and other sources used in preparation of this FOTP): Commercialiitary/Federal Test Methods: MlL-T-29504 IEC project number 866.1.40 Technical Articles: Other Source Material: PREVIOUS FOTP USAGE (References shown as appropriate): This FOTP represents: U A new conceptual m
35、ethod O Other than given below (see “Other Information) O verified in preliminary laboratory testing.* O not verified in any laboratory testing. Cl An established method O used with electrical/eledronic and other components, but not previously applied to Fiber Opbcs O used in laboratory and manufact
36、uring processes.*# 0 intended primarily for manufacturing level testing.# References: * Laboratories # Reoresentative Manufacturers When Used O validated in multiple laboratory use.* _- Hughes Kyocera Many years BACKGROUND SHEET PREPARED BY: O Indicated Author O Other, as shown: (Additional pages us
37、ed as necessary) I1 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-FOTP BAC KG RO U N D (Co ntin uedl I COMMENTS ON ACCURACY (OR POTENTIAL ACCURACY). REPEATABILITY, ETC. OF THE FOTP: (I
38、f Precision and Bias Statements are not included in the FOTP) Experience with this test indicates that the method is accurate for the intended purpose. STATUS - INTERNATIONAL FOTP COORDINATION: COMPARABLE IEC TEST O NONE O INCLUDED IN FOTP REFERENCES IEC PUBLICATION: project # 868.1.40 EDITION: DATE
39、: 07-1 0-92 PUBLICATION TITLE: Measurements of the concentricity of ferrules and of ferrules with fibre installed SECTION OR CLAUSE NO.: O IEC-RTM O IEC-ATM O NEITHER SECTION/CLAUSE TITLE: PROCEDURES PRODUCE EQUIVALENT RESULTS? O YES O NO O UNCERTAINDONT KNOW KEY DIFFERENCES, IEC VS FOTP: O DISCUSSE
40、D IN FOTP APPENDIX COMPARABLE CCITT TEST O NONE O INCLUDED IN FOTP REFERENCES CCITT PUBLICATION: EDITION: DATE: PUBLICATION TITLE: SECTION OR CLAUSE NO.: O ITU-RTM O ITU-ATM O NEITHER SECTION/CLAUSE TITLE: PROCEDURES PRODUCE EQUIVALENT RESULTS? O YES O NO O UNCERTAIN/DONT KNOW KEY DIFFERENCES, ITU V
41、S FOTP: O DISCUSSED IN FOTP APPENDIX List differences in concept, operating conditions, wavelengths, calculations, reporting requirement, omissions (in FOTP or in IEC or CCirr), etc. Use additional pages if necessary. OTHER INFORMATION POTENTIALLY PERTINENT FOR EVALUATION OF THIS FOTP: (Include summ
42、ary of changes made to revised FOTP, etc. Use additional pages if needed. (Additional pages used as necessary) 12 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,- STDmEIA TIA-455-135-ENGL 1777 3234b00 0580533 245 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
