1、 TIA-1183-A (Revision of TIA-1183) March 2017Measurement Methods and Test Fixtures for Balun-less Measurements of Balanced Components and Systems ANSI/TIA-1183-A-2017 APPROVED: MARCH 28, 2017 NOTICE TIA Engineering Standards and Publications are designed to serve the public interest through eliminat
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23、OULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. ANSI/TIA-1183-A i Measurement methods and test fixtures for balun-less measurements of balanced components and systems FOREWORD . iv Introduction 1 1 Scope 2 2 Normative references 2 3 Definition of terms, acronyms and abbreviations, and units o
24、f measure 2 3.1 General 2 3.2 Definitions 2 3.3 Acronyms and abbreviations . 3 3.4 Units of measure . 3 3.5 Variables 3 4 General 4 5 Test configurations 4 5.1 Test configurations specifications . 5 6 Fixtures and setup . 10 6.1 Switching and interconnecting coaxial cable requirements 11 6.2 Test fi
25、xture interface performance 12 6.3 Overall test setup performance before calibration 14 7 Port terminations . 14 7.1 Active port network analyzer terminations 15 7.2 Active port resistor terminations 15 7.3 Inactive port resistor terminations . 15 7.4 Calibration reference loads . 15 7.5 Termination
26、 resistor selection . 15 7.5.1 Termination resistor impedance tolerance 16 7.5.2 Load terminations used for calibration 17 7.5.2.1 50 reference load measurement procedure 17 7.5.3 Reference loads for calibration . 17 7.5.4 Calibration kit definitions . 17 7.6 Active port far end termination performa
27、nce . 17 7.7 Inactive port termination performance . 18 8 Calibration and accuracy . 18 8.1 General 18 8.2 Reference loads for calibration . 19 8.3 Overall test system accuracy after calibration. 19 9 Procedures for determining test system performance parameters . 19 9.1 General 19 9.2 Residual FEXT
28、 loss . 19 9.3 Application of calibration standards 20 10 Test fixture Interface description . 22 10.1 Fixture dimensions 22 Annex A (normative)- Performance requirements for test fixtures to 1000 MHz . 26 A.1 Test fixture interface performance. . 26 A.2 Overall Test setup accuracy. . 27 Annex B (in
29、formative)- Derivation of mixed mode parameters from four port S parameter measurements 28 Annex C (informative)- Impedance transformation calculations . 31 Annex D (informative) Cabling standards and termination impedances for differential cabling systems 35 Annex E (informative) Port identificatio
30、n and nomenclature 37 ANSI/TIA-1183-A ii Annex F (informative) De-embedding balunless 16 port test fixtures. . 42 F.1 Four port fixture method. General calibration approach . 42 F.1.1 Four port fixture method. Pre-characterization of probing devices 44 F.1.2 Four port fixture method. Determination o
31、f fixture matrices 45 F.1.3 Four port fixture method. Cascading de-embedding matrices. 46 F.2 Sixteen port fixture method. General calibration approach . 47 F.2.1 Sixteen port fixture method. Determining fixture matrices . 47 F.2.2 Sixteen port fixture method. Cascading de-embedding matrices 47 F.3
32、Characterizing the probing fixture . 48 F.4 Characterizing a 4-port fixture . 50 F.4.1 Determination of SAA, SBB, SAB and SBA, . 50 F.4.2 Determination of SCC SAC and SCA . 50 F.4.3 Determination of SDD SBD and SDB . 51 F.4.4 Determination of SDA, SAD, SBC, SCB, SCD and SDC . 51 F.5 Characterizing a
33、 16-port fixture . 52 F.5.1 Additional FEXT coupling elements of the 16 port fixture matrix . 52 F.5.2 Additional NEXT coupling elements of the 16 port matrix . 52 F.5.3 Additional reciprocal NEXT coupling elements of the 16-port matrix 53 F.6 RF simulation software consideration. 54 F.6.1 Port mapp
34、ing of fixtures in a back-to-back configuration. 55 F.6.2 Performing 16 Port S to T transformations 57 F.6.3 Performing 16 Port T to S transformations 58 F.7 Conversion from single-ended to mixed mode using mathematical baluns 59 Annex G (informative) - Example test fixture assemblies for up to 1.0
35、GHz . 62 G.1 Example legacy test fixture assemblies for testing only to 1.0 GHz. 62 Annex H (informative) - Bibliography . 63 LIST OF TABLES Table 1 - Switch performance recommendations 11 Table 2 - Test fixture performance 13 Table 3 - Overall test setup performance before calibration . 14 Table 4
36、- Calibration termination performance 17 Table 5 Active port far end termination performance . 18 Table 6 - Inactive port far end termination performance . 18 Table 7 - Overall test setup accuracy after calibration 19 Table A.1 - Test fixture interface performance 26 Table A.2 - Overall test setup a
37、ccuracy 27 Table F.1 - Reciprocal relationships in a 16 port matrix 53 Table F.2 - Test fixture port re-mapping for back-to-back through calibrations 55 Table F.3 - Balun conversion S16P port identification 61 LIST OF FIGURES Figure 1 - Test system diagram for four port network analyzer . 6 Figure 2
38、 - Laboratory test configuration for cable and channel insertion loss, return loss, TCL, TCTL, and propagation delay. . 7 Figure 3 - Laboratory test configuration for NEXT loss between two pairs of a four-pair DUT . 8 Figure 4 - Laboratory two port test configuration for return loss and TCL (LCL) me
39、asurements. 9 Figure 5 - Laboratory test configuration for FEXT loss between two pairs of a DUT. . 10 Figure 6 - Insertion loss measurement of low loss devices. 11 Figure 7 - Example of a four-port test setup with test fixtures and programmable switching 12 ANSI/TIA-1183-A iii Figure 8 - Example chi
40、p resistor performance guide. 16 Figure 9 - Example chip resistor terminations using 0603 chip resistors 16 Figure 10 - Open calibration 20 Figure 11 - Short calibration 21 Figure 12 - Load calibration . 21 Figure 13 - Thru calibration configuration 21 Figure 14 - Example pin and socket interface di
41、mension . 22 Figure 15 - Example DUT interface dimensions 23 Figure 16 - Example test fixture exploded assembly . 24 Figure 17 - Example test fixture assembly 24 Figure 18 - Example termination of individually shielded pair cable . 25 Figure B.1 - Voltage and current on balanced DUT with respect to
42、a ground plane . 28 Figure B.2 - Voltage and current conversion by two mathematical transformers . 29 Figure D.1 - Example cable types . 36 Figure D.2 - Four-pair DUT port numbering 37 Figure E.1 - Example S-parameter notation for two ports . 37 Figure E.2 - Four-pair DUT port numbering 37 Figure E.
43、3 - Mapping 16 port network to mixed mode network . 39 Figure E.4 - T568A pin/pair mapping 40 Figure E.5 - T568B pin/pair mapping 40 Figure F.1 - Unprocessed measurement includes test fixtures and DUT . 43 Figure F.2 - De-embedding matrices cascaded to unprocessed 16-port matrix . 44 Figure F.3 - An
44、 example of probing devices (rigid SMA cable is modified). 45 Figure F.4 - Using probing devices to interface ports C and D to measure FWDx and REVx 45 Figure F.5 - Diagram of 4-port measuring fixture and 2-port probing fixture . 48 Figure F.6 - Diagram of four port probing fixture . 49 Figure F.7 -
45、 Notation of 4-port measurement fixture FWD1 50 Figure F.8 - First Setup for Characterization of a 4-Port Measurement Fixture . 50 Figure F.9 - Second setup for characterization of a 4-port measurement fixture 51 Figure F.10 - Third setup for characterization of a 4-port measurement fixture 51 Figur
46、e F.11 - Fourth setup for characterization of a 4-port measurement fixture . 51 Figure F.12 - Cascading using RF simulation application (comparable to Figure F.2) . 54 Figure F.13 - Adding ideal baluns to extract mixed mode parameters 54 Figure F.14 - Port numbering of near and far end test fixtures
47、 . 55 Figure F.15 - Balun schematic . 59 Figure F.16 - Illustration for cascading de-embedding matrices and ideal baluns 61 Figure G.1 - SMA example test fixture exploded assembly 62 ANSI/TIA-1183-A iv FOREWORD (This foreword is not a part of this Standard.) This project was initiated to provide imp
48、roved methods to measure additional cabling performance parameters in permanent links and channels of category 8 and better cabling and components, primarily balance parameters and common mode parameters. The standard describes a general measurement method for balanced cabling parameters without the
49、 need for balun transformers in the measurement path. The scope of the project includes measurement frequencies up to 2.0 GHz, test system requirements to ensure accuracy, and also general testing guidelines. This standard is a revision of ANSI/TIA 1183 incorporating ANSI/TIA 1183-1. This Standard was developed by TIA Subcommittee TR-42.7. Approval of this Standard This Standard was approved by TIA Sub-Committee TR-42.7, TIA Engineering Committee TR-42, and the American National Standards Institute (ANSI). ANSI/TIA reviews standards every 5 years. At that time, standards are reaffi
