1、Designation: E 1036 02 (Reapproved 2007)Standard Test Methods forElectrical Performance of Nonconcentrator TerrestrialPhotovoltaic Modules and Arrays Using Reference Cells1This standard is issued under the fixed designation E 1036; the number immediately following the designation indicates the year
2、oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover the electrical performance ofph
3、otovoltaic modules and arrays under natural or simulatedsunlight using a calibrated reference cell.1.2 Measurements under a variety of conditions are al-lowed; results are reported under a select set of reportingconditions (RC) to facilitate comparison of results.1.3 These test methods apply only to
4、 nonconcentrator ter-restrial modules and arrays.1.4 The performance parameters determined by these testmethods apply only at the time of the test, and imply no past orfuture performance level.1.5 There is no similar or equivalent ISO standard.1.6 This standard does not purport to address all of the
5、safety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 691 Practice for Conductin
6、g an Interlaboratory Study toDetermine the Precision of a Test MethodE 772 Terminology Relating to Solar Energy ConversionE 927 Specification for Solar Simulation for PhotovoltaicTestingE 941 Test Method for Calibration of Reference Pyranom-eters With Axis Tilted by the Shading Method3E 948 Test Met
7、hod for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated SunlightE 973 Test Method for Determination of the Spectral Mis-match Parameter Between a Photovoltaic Device and aPhotovoltaic Reference CellE 1021 Test Method for Spectral Responsivity Measure-ments of Phot
8、ovoltaic DevicesE 1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal Irradiation3E 1040 Specification for Physical Characteristics of Non-concentrator Terrestrial Photovoltaic Reference CellsE 1125 Test Method for Calibration of Primary Non-
9、Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE 1328 Terminology Relating to Photovoltaic Solar EnergyConversionE 1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsG 159 Test Method for Evaluation of Stress Crack Resis-tance of
10、 Polyolefin Geomembranes Using Notched Con-stant Tensile Load Test33. Terminology3.1 DefinitionsDefinitions of terms used in these testmethods may be found in Terminology E 772 and TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 nominal operating cell temperature, NOCT, nt
11、hetemperature of a solar cell inside a module operating at anambient temperature of 20C, an irradiance of 800 Wm2, andan average wind speed of 1 ms1.3.2.2 reporting conditions, RC, nthe device temperature,total irradiance, and reference spectral irradiance conditionsthat module or array performance
12、data are corrected to.3.3 Symbols:3.3.1 The following symbols and units are used in these testmethods:artemperature coefficient of reference cell ISC,C1,acurrent temperature coefficient of device under test,C1,b(E)voltage temperature function of device under test,C1,Ccalibration constant of referenc
13、e cell, Am2W1,C8adjusted calibration constant of reference cell,Am2W1,1These test methods are under the jurisdiction of ASTM Committee E44 onSolar, Geothermal and Other Alternative Energy Sources and are the directresponsibility of Subcommittee E44.09 on Photovoltaic Electric Power Conversion.Curren
14、t edition approved Nov. 1, 2007. Published November 2007. Originallyapproved in 1985. Last previous edition approved in 2002 as E 1036 02.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume
15、information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.CfNOCT Correction factor,C,d(T)voltage irradiance correction function of device undertest, dimens
16、ionless,DTNOCT cell-ambient temperature difference, C,Eirradiance, Wm2,Eoirradiance at RC, Wm2,FFfill factor, dimensionless,Icurrent, A,Impcurrent at maximum power, A,Iocurrent at RC, A,Irshort-circuit current of reference cell, A,Iscshort-circuit current, A,Mspectral mismatch parameter, dimensionle
17、ss,Pelectrical power, W,Pmmaximum power, W,Ttemperature, C,Taambient temperature, C,Tctemperature of cell in module, C,Totemperature at RC, C,Trtemperature of reference cell, C,nwind speed, ms1,Vvoltage, V,Vmpvoltage at maximum power, V,Vovoltage at RC, V, andVocopen-circuit voltage, V.4. Summary of
18、 Test Methods4.1 Measurement of the performance of a photovoltaicmodule or array illuminated by a light source consists ofdetermining at least the following electrical characteristics:short-circuit current, open-circuit voltage, maximum power,and voltage at maximum power.4.2 These parameters are der
19、ived by applying the procedurein Section 8 to a set of current-voltage data pairs (I-V data)recorded with the test module or array operating in thepower-producing quadrant.4.3 Testing the performance of a photovoltaic device in-volves the use of a calibrated photovoltaic reference cell todetermine t
20、he total irradiance.4.3.1 The reference cell is chosen according to the spectraldistribution of the irradiance under which it was calibrated, forexample, the direct normal or global spectrum. These spectraare defined by Tables G 159 . The reference cell thereforedetermines to which spectrum the test
21、 module or array perfor-mance is referred.4.3.2 The reference cell must match the device under testsuch that the spectral mismatch parameter is 1.00 6 0.05, asdetermined in accordance with Test Method E 973.4.3.3 Recommended physical characteristics of referencecells are described in Specification E
22、 1040.4.4 The spectral response of the module or array is usuallytaken to be that of a representative cell from the module orarray tested in accordance with Test Method E 1021. Therepresentative cell should be packaged such that the opticalproperties of the module or array packaging and the represen
23、-tative cell package are similar.4.5 The tests are performed using either natural or simulatedsunlight. Solar simulation requirements are stated in Specifi-cation E 927.4.5.1 If a pulsed solar simulator is used as a light source, thetransient responses of the module or array and the referencecell mu
24、st be compatible with the test equipment.4.6 The data from the measurements are translated to a setof reporting conditions (see 5.3) selected by the user of thesetest methods. The actual test conditions, the test data (ifavailable), and the translated data are then reported.5. Significance and Use5.
25、1 It is the intent of these procedures to provide recognizedmethods for testing and reporting the electrical performance ofphotovoltaic modules and arrays.5.2 The test results may be used for comparison of differentmodules or arrays among a group of similar items that might beencountered in testing
26、a group of modules or arrays from asingle source. They also may be used to compare diversedesigns, such as products from different manufacturers. Re-peated measurements of the same module or array may be usedfor the study of changes in device performance.5.3 Measurements may be made over a range of
27、testconditions. The measurement data are numerically translated(see Section 8) from the test conditions to SRC, to nominaloperating conditions, or to optional user-specified reportingconditions. The SRC are defined in Table 1.5.4 These test methods are based on two requirements.5.4.1 First, the refe
28、rence cell is selected so that its spectralresponse is considered to be close to the module or array to betested.5.4.2 Second, the spectral response of a representative celland the spectral distribution of the irradiance source must beknown. The calibration constant of the reference cell is thencorr
29、ected to account for the difference between the actual andthe reference spectral irradiance distributions using the spectralmismatch parameter, which is defined in Test Method E 973.5.5 Terrestrial reference cells are calibrated with respect toa reference spectral irradiance distribution, for exampl
30、e, TablesG 159.5.6 A reference cell made and calibrated as described in 4.3will indicate the total irradiance incident on a module or arraywhose spectral response is close to that of the reference cell.5.7 With the performance data determined in accordancewith these test methods, it becomes possible
31、 to predict moduleor array performance from measurements under any test lightsource in terms of any reference spectral irradiance distribu-tion.5.8 These test methods are valid for the range of tempera-ture and irradiance conditions over which the correction factors(defined inAnnexA2) were determine
32、d. Devices for which thecorrection factors cannot be determined or are unavailable willhave to be measured at temperature and irradiance conditionsas close to the desired reporting conditions as possible.TABLE 1 Reporting ConditionsTotal Irradiance,Wm2SpectralIrradianceDeviceTemperature,CStandard re
33、porting conditions 1000 G 159 25Nominal operating conditions 800 . NOCTE 1036 02 (2007)26. Apparatus6.1 Photovoltaic Reference CellA calibrated referencecell is used to determine the total irradiance during theelectrical performance measurement.6.1.1 The reference cell shall be matched in its spectr
34、alresponse to a representative cell of the test module or arraysuch that the spectral mismatch parameter as determined byTest Method E 973 is 1.00 6 0.05.6.1.2 Specification E 1040 provides recommended physicalcharacteristics of reference cells.6.1.3 Reference cells may be calibrated in accordance w
35、ithTest Methods E 1039, E 1125, or E 1362, as appropriate for aparticular application.6.1.4 A current measurement instrument (see 6.7) shall beused to determine the Iscof the reference cell when illuminatedwith the light source (see 6.4).6.2 Test Fixture The device to be tested is mounted on atest f
36、ixture that facilitates temperature measurement and four-wire current-voltage measurements (Kelvin probe, see 6.3).The design of the test fixture shall prevent any increase ordecrease of the device output due to reflections or shadowing.Arrays installed in the field shall be tested as installed. See
37、7.2.3 for additional restrictions and reporting requirements.6.3 Kelvin ProbeAn arrangement of contacts that consistsof two pairs of wires attached to the two output terminals of thedevice under test. One pair of wires is used to conduct thecurrent flowing through the device, and the other pair is u
38、sed tomeasure the voltage across the device. A schematic diagram ofan I-V measurement using a Kelvin Probe is given in Fig. 1 ofTest Method E 948.6.4 Light Source The light source shall be either naturalsunlight or a solar simulator providing Class A, B, or Csimulation as specified in Specification
39、E 927.6.5 Temperature Measurement EquipmentThe instrumentor instruments used to measure the temperature of both thereference cell and the device under test shall have a resolutionof at least 0.1C, and shall have a total error of less than 61Cof reading.6.5.1 Temperature sensors, such as thermocouple
40、s or ther-mistors, suitable for the test temperature range shall beattached in a manner that allows measurement of the devicetemperature. Because module and array temperatures can varyspacially under continuous illumination, multiple sensors dis-tributed over the device should be used, and the resul
41、tsaveraged to obtain the device temperature.6.5.2 When testing modules or arrays for which directmeasurement of the cell temperature inside the package is notfeasible, sensors can be attached to the rear side of the devices.The error due to temperature gradients will depend on thethermal characteris
42、tics of the packaging, especially undercontinuous illumination. Modules with glass back sheets willhave higher gradients than modules with thin polymer backs,for example.6.6 Variable Load An electronic load, such as a variableresistor, a programmable power supply, or a capacitive sweepcircuit, used
43、to operate the device to be tested at differentpoints along its I-V characteristic.6.6.1 The variable load should be capable of operating thedevice to be tested at an I-V point where the voltage is within1%ofVocin the power-producing quadrant.6.6.2 The variable load should be capable of operating th
44、edevice to be tested at an I-V point where the current is within1%ofIscin the power-producing quadrant.6.6.3 The variable load should allow the device outputpower (the product of device current and device voltage) to bevaried in increments as small as 0.2 % of the maximum power.6.6.4 The electrical
45、response time of the variable loadshould be fast enough to sweep the required range of I-Voperating points during the measurement period. It is possiblethat the response time of the device under test may limit howfast the range of I-V points can be swept, especially whenpulsed simulators are used. F
46、or these cases, it may be necessaryto make multiple measurements over smaller portions of theI-V curve to obtain the entire recommended range.6.7 Current Measurement EquipmentThe instrument orinstruments used to measure the current through the deviceunder test and the Iscof the reference cell shall
47、have aresolution of at least 0.02 % of the maximum current encoun-tered, and shall have a total error of less than 0.1 % of themaximum current encountered.6.8 Voltage Measurement EquipmentThe instrument orinstruments used to measure the voltage across the deviceunder test shall have a resolution of
48、at least 0.02 % of themaximum voltage encountered, and shall have a total error ofless than 0.1 % of the maximum voltage encountered.7. Procedures7.1 Momentary Illumination Technique:7.1.1 This technique is valid for use with pulsed solarsimulators, shuttered continuous solar simulators, or shuttere
49、dsunlight. For testing under continuous illumination see 7.2.7.1.2 Determine the spectral mismatch parameter, M, usingTest Method E 973.7.1.3 Mount the reference cell and the device to be tested inthe test fixture coplanar within 62, and normal to theillumination source within 610. If an array or module cannotbe aligned to within 610, the solar angle of incidence, thedevice orientation and its tilt angle must be reported with thedata.7.1.4 Connect the four-wire Kelvin probe to the module orarray output terminals.7.1.
