1、Designation: E 1171 09Standard Test Methods forPhotovoltaic Modules in Cyclic Temperature and HumidityEnvironments1This standard is issued under the fixed designation E 1171; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year
2、 of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods provide procedures for stressingphotovoltaic modules in simulated temperature and humidityenvir
3、onments. Environmental testing is used to simulate agingof module materials on an accelerated basis.1.2 Three individual environmental test procedures are de-fined by these test methods: a thermal cycling procedure, ahumidity-freeze cycling procedure, and an extended durationdamp heat procedure. Ele
4、ctrical biasing is utilized during thethermal cycling procedure to simulate stresses that are knownto occur in field-deployed modules.1.3 These test methods define mounting methods for mod-ules undergoing environmental testing, and specify parametersthat must be recorded and reported.1.4 These test
5、methods do not establish pass or fail levels.The determination of acceptable or unacceptable results isbeyond the scope of these test methods.1.5 Any of the individual environmental tests may beperformed singly, or may be combined into a test sequencewith other environmental or non-environmental tes
6、ts, or both.Certain pre-conditioning tests such as annealing or lightsoaking may also be necessary or desirable as part of such asequence. The determination of any such sequencing andpre-conditioning is beyond the scope of this test method.1.6 These test procedures are limited in duration and there-
7、fore the results of these tests cannot be used to determinephotovoltaic module lifetimes.1.7 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.8 This standard does not purport to address all of thesafety concerns, if any, associ
8、ated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 772 Terminology Relating to Solar Energy ConversionE 1036
9、 Test Methods for Electrical Performance of Non-concentrator Terrestrial Photovoltaic Modules and ArraysUsing Reference CellsE 1328 Terminology Relating to Photovoltaic Solar EnergyConversionE 1462 Test Methods for Insulation Integrity and GroundPath Continuity of Photovoltaic ModulesE 1799 Practice
10、 for Visual Inspections of PhotovoltaicModules2.2 IEC Standards:3IEC 61215 Crystalline Silicon Terrestrial Photovoltaic (PV)Modules Design Qualification and Type ApprovalIEC 61646 Thin-Film Terrestrial Photovoltaic (PV) Mod-ules Design Qualification and Type Approval3. Terminology3.1 DefinitionsDefi
11、nitions of terms used in this standardmay be found in Terminology E 772 and in TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 module ground point, nthe terminal or lead identi-fied by the manufacturer as the grounding point of the module.4. Significance and Use4.1 The use
12、ful life of photovoltaic modules may depend ontheir ability to withstand repeated temperature cycling withvarying amounts of moisture in the air. These test methodsprovide procedures for simulating the effects of cyclic tem-perature and humidity environments. An extended durationdamp heat procedure
13、is provided to simulate the effects of longterm exposure to high humidity.1These test methods are under the jurisdiction of ASTM Committee E44 onSolar, Geothermal and Other Alternative Energy Sources and are the directresponsibility of Subcommittee E44.09 on Photovoltaic Electric Power Conversion.Cu
14、rrent edition approved April 1, 2009. Published April 2009. Originallyapproved in 1996. Last previous edition approved in 2004 as E 1171 04.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandardsvolume
15、 information, refer to the standards Document Summary page onthe ASTM website.3Available from International Electrotechnical Commission (IEC), 3 rue deVaremb, Case postale 131, CH-1211, Geneva 20, Switzerland, http:/www.iec.ch.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West C
16、onshohocken, PA 19428-2959, United States.4.2 The durations of the individual environmental tests arespecified by use of this test method; however, commonly useddurations are 50 and 200 thermal cycles, 10 humidity-freezecycles, and 1000 h of damp heat exposure, as specified bymodule qualification st
17、andards such as IEC 61215 andIEC 61646. Longer durations can also be specified for ex-tended duration module stress testing.4.3 MountingTest modules are mounted so that they areelectrically isolated from each other, and in such a manner toallow free air circulation around the front and back surfaces
18、 ofthe modules.4.4 Current Biasing:4.4.1 During the thermal cycling procedure, test modulesare operated without illumination and with a forward-biascurrent equal to the maximum power point current at standardreporting conditions (SRC, see Test Methods E 1036) flowingthrough the module circuitry.4.4.
19、2 The current biasing is intended to stress the moduleinterconnections and solder bonds in ways similar to those thatare believed to be responsible for fill-factor degradation infield-deployed modules.4.5 Effects of Test ProceduresData generated using thesetest methods may be used to evaluate and co
20、mpare the effectsof simulated environment on test specimens. These test meth-ods require determination of both visible effects and electricalperformance effects.4.5.1 Effects on modules may vary from none to significantchanges. Some physical changes in the module may be visiblewhen there are no appa
21、rent electrical changes in the module.Similarly, electrical changes may occur with no visible changesin the module.4.5.2 All conditions of measurement, effects of cycling, andany deviations from this test method must be described in thereport so that an assessment of their significance can be made.4
22、.6 SequencingIf these test methods are performed as partof a combined sequence with other environmental or non-environmental tests, the results of the final electrical tests (6.2)and visual inspection (6.3) determined at the end of one testmay be used as the initial electrical tests and visual inspe
23、ctionfor the next test; duplication of these tests is not necessaryunless so specified.5. Apparatus5.1 In addition to the apparatus required for Test MethodsE 1036 and E 1462 the following apparatus is required.5.2 Environmental Chamber(s)Achamber or chambers inwhich modules are mounted during the e
24、nvironmental tests.5.2.1 Air temperature throughout the working volume shallbe within 62C of that specified.5.2.2 Relative humidity shall be controlled within 65%ofthat specified. For temperatures below 80C, relative humiditycontrol is not required.5.2.3 Provisions for monitoring and recording the c
25、hambertemperature and relative humidity throughout the environmen-tal testing shall be provided.5.3 Temperature Measurement EquipmentAn instrumentor instruments used to measure module temperature during theenvironmental testing with a resolution of at least 0.1C, and atotal error of less than 62C of
26、 reading.5.3.1 Temperature sensors suitable for the test temperaturerange, such as thermocouples or thermistors, shall be attachedto the portions of the modules likely to exhibit the longestthermal time constant. For flat-plate modules, attach thesensors near the middle of the front or back surfaces
27、 of themodules.5.3.2 If more than one module of identical design andconstruction is tested simultaneously, it is not necessary tomonitor the temperature of all identical modules.5.4 Test FrameAframe inside the environmental chamberwhich supports the test modules during the test procedures.5.4.1 It i
28、s not required to mount the test modules at an anglesuch as when modules are installed as part of an array; theymay be mounted vertically to facilitate testing multiple mod-ules inside the environmental chamber.5.4.2 The test modules shall be mounted in a manner thatallows free air circulation aroun
29、d the modules.5.4.3 The test frame should be constructed such that corro-sion of the test frame during the environmental testing does notadversely affect the test modules.5.5 Current-Biasing Power SupplyA dc power supplycapable of operating a test module at a point on the darkforward current-voltage
30、 curve equal to the maximum powercurrent at SRC during the thermal cycling procedure.5.5.1 Provisions must be made for removing the current biaswhen the module temperature is less than 20C.5.5.2 The current biasing power supply should be capable ofsetting a voltage compliance limit equal to 1.25 tim
31、es theopen-circuit voltage at SRC to prevent over-voltage operationof the test modules at high temperatures.6. Procedure6.1 Sample Selection and Test SequenceAlthough thetemperature cycling, humidity-freeze cycling, and damp heatprocedures may be performed individually, the requirements ofany test s
32、equence (see 1.5 and 4.6) may determine the order inwhich the environmental tests are performed, and also mayimpose restrictions on which test modules are to be subjectedto individual procedures. The sequencing may also specifywhen modules undergo electrical testing (see 6.2) and visualinspections (
33、see 6.3).6.1.1 A typical combined thermal and humidity-freeze cy-cling sequence is illustrated in Fig. 1.6.2 Electrical TestsPerform the following electrical testsbefore and after each of the test procedures.6.2.1 Electrical PerformanceMeasure and record theelectrical performance of each module. A s
34、uitable method fornonconcentrator modules is Test Methods E 1036.6.2.2 Ground Path ContinuityTest any module with agrounding terminal identified by the module manufacturer todetermine the maximum resistance between the groundingterminal or lead and any accessible conductive part using theground path
35、 continuity test of Test Methods E 1462.6.2.3 Dielectric Voltage WithstandSubject each module toa test of the dielectric voltage withstand test of Test MethodsE 1462.6.2.3.1 The test voltage shall be equivalent to twice thespecified maximum system voltage (typically open-circuitE1171092voltage at 0C
36、 cell temperature) plus 1000 V. If the maximumsystem voltage is less than 30 V, employ a dc test voltage of500 V.6.3 Visual InspectionVisually inspect each module beforeand after each of the environmental test procedures to deter-mine the presence or absence of anomalies or defects accordingto Pract
37、ice E 1799.6.4 InstrumentationAttach one or more temperature sen-sors to the exterior of the module following the requirements of5.3.6.5 Thermal Cycling Procedure:6.5.1 Mount the test modules inside the environmentalchamber according to the requirements of 5.4.6.5.2 Connect the test modules to the c
38、urrent-biasing powersupply and verify that the biasing is interrupted when themodule temperature is less than 20C.6.5.3 Subject the module to a 40C to +85C thermalcycling test in accordance with the profile shown in Fig. 2 andthe following requirements.6.5.3.1 The temperature shall vary approximatel
39、y linearlywith time at a rate not exceeding 100C/h and with a period notgreater than 6 h per cycle (from ambient to 40C to +85C toambient).6.5.3.2 Because the current biasing will dissipate heat in thetest module, the temperature profile of the environmentalchamber may need to be adjusted to prevent
40、 exceeding themaximum module temperature of Fig. 2.6.5.3.3 Relative humidity in the chamber shall not exceed50 % when temperatures are above 25C.6.5.3.4 Minimum holding time at the temperature extremesshall be 0.5 h.6.5.4 Continue the thermal cycling until the required num-ber of cycles is completed
41、.6.5.4.1 The temperature cycling may be interrupted and thechamber be opened for optional visual or electrical retest, orboth, during the time the module temperature is at 25 6 5C.Such interruptions are typically done at 50-cycle intervals.6.5.5 Disconnect the current-biasing power supply and re-mov
42、e the modules from the environmental chamber.6.6 Humidity-Freeze Cycle Procedure:6.6.1 Mount the test modules inside the environmentalchamber according to the requirements of 5.4.6.6.2 Subject the modules to a humidity-freeze cycling testin accordance with the profile shown in Fig. 3.6.6.3 Continue
43、the humidity-freeze cycling until the re-quired number of cycles is completed.6.6.4 Remove the modules from he environmental chamber.6.7 Damp Heat Exposure Procedure:6.7.1 Mount the test modules inside the environmentalchamber according to the requirements of 5.4.6.7.2 Raise the chamber air temperat
44、ure to 85 6 2C andthe relative humidity to 85 6 5%.6.7.3 Continue the exposure until the required number ofhours is attained.6.7.4 Remove the modules from the environmental cham-ber.6.7.5 Perform the post-exposure dielectric voltage with-stand test (see 6.2.3) within 3 6 1 h after the modules arerem
45、oved from the chamber. To satisfy this requirement, theexposure duration may be increased by a maximum of 60 h.FIG. 1 Typical Environmental Test SequenceFIG. 2 One Thermal Cycle FIG. 3 One Humidity-Freeze CycleE11710937. Report7.1 In addition to the reporting requirements of Test Meth-ods E 1036 and
46、 E 1462, and Practice E 1799, report as aminimum the following data and information:7.1.1 Module manufacturer and complete test specimenidentification.7.1.2 Description of module construction.7.1.3 Aline drawing or photograph of the modules showingthe orientation during exposure and the location of
47、temperaturesensors.7.1.4 Description of electrical measurement equipment (in-cluding continuity and insulation integrity apparatus), andmeasurement conditions or parameters.7.1.5 A brief description of the chamber used, the exactnumber of cycles performed, and the number of hours of dampheat exposur
48、e.7.1.6 Any deviations from this test method such as inter-ruptions in the test cycle.7.1.7 Any interruptions in the current biasing during ther-mal cycling caused by open circuits in the module circuitry.8. Precision and Bias8.1 The environmental exposures described by this testmethod do not produc
49、e numeric results that would be subject toASTM procedures for evaluating the precision and bias of thistest method. However, the precision and bias of the electricalperformance measurements, when performed in accordancewith Test Methods E 1036 and E 1462, are subject to theprovisions of those test methods.9. Keywords9.1 damp heat exposure; environmental testing; humidity-freeze cycling; modules; photovoltaics; solar energy; thermalcyclingASTM International takes no position respecting the validity of any patent rights asserted in connection wit
