1、Designation: F219 96 (Reapproved 2018)Standard Test Methods of TestingFine Round and Flat Wire for Electron Devices and Lamps1This standard is issued under the fixed designation F219; the number immediately following the designation indicates the year of originaladoption or, in the case of revision,
2、 the year of last revision. A number in parentheses indicates the year of last reapproval. A superscriptepsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover the testing of fine wire, flat orround, approximately 0.010 in. (0.25 mm) and sm
3、aller indiameter or thickness, used in electronic devices and lamps.1.2 The values stated in inch-pound units are to be regardedas standard. The values given in parentheses are mathematicalconversions to SI units that are provided for information onlyand are not considered standard.1.3 This standard
4、 does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety, health, and environmental practices and deter-mine the applicability of regulatory limitations prior to use.1.4 This interna
5、tional standard was developed in accor-dance with internationally recognized principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recom-mendations issued by the World Trade Organization TechnicalBarriers to Trade (TBT) Com
6、mittee.2. Referenced Documents2.1 ASTM Standards:2B63 Test Method for Resistivity of Metallically ConductingResistance and Contact MaterialsD374 Test Methods for Thickness of Solid Electrical Insu-lation (Metric) D0374_D0374MF16 Test Methods for Measuring Diameter or Thickness ofWire and Ribbon for
7、Electronic Devices and LampsF205 Test Method for Measuring Diameter of Fine Wire byWeighingF289 Specification for Molybdenum Wire and Rod forElectronic Applications3. Test Specimens3.1 The number of spools per shipment to be checked shallbe agreed upon by the producer and consumer. Three testspecime
8、ns from each spool to be tested shall be taken for thepurpose of each of the tests covered by these methods, exceptSection 4, where one specimen per shipment shall be submit-ted. These specimens shall be selected sufficiently far fromeither end of the spool of wire to be free from kinks, bends, andd
9、istortion. With the exceptions mentioned in 3.2, the specimensshall be taken from points in the length of the wire separated byat least 1 ft (305 mm).3.2 For the edgewise curvature test, straightness test, andtension tests the specimens shall be taken from points in thelength of the wire separated b
10、y at least 3 ft (0.9 m).4. Chemical Analysis4.1 In case of disagreement between producer and consumerchemical analysis of the material shall be made in accordancewith the methods of the American Society for Testing andMaterials for the respective materials when such methods ofanalysis are available.
11、 When ASTM test methods are notavailable, the analytical procedures shall be agreed upon by theproducer and the consumer.5. Dimensions5.1 Procedure A for Round WireDetermine the weight-size of round wire in accordance with Test Method F205.5.2 Procedure B for Round WireAs an alternative method,the d
12、iameter of wire over 0.005 in. (0.13 mm) may bedetermined in accordance with Test Methods D374.5.3 Procedure for Flat Wire:5.3.1 Determine the dimensions of flat wire in accordancewith 5.1 in conjunction with width as measured in accordancewith 5.2, or if agreed upon by the manufacturer and thepurch
13、aser, any dimension exceeding 0.005 in. may be deter-mined in accordance with 5.2 alone.5.3.2 In determining the width of flat wire, form a flatwiseloop loosely with the ends held between the fingers. The minoraxis of the loop shall be12 to34 of the diameter of themicrometer jaws. Measure the width
14、of the ribbon with thecurve loop perpendicular to the micrometer jaws. Take care notto distort the ribbon or bend it out of the correct plane duringmeasurement.1These test methods are under the jurisdiction of ASTM Committee F01 onElectronics and are the direct responsibility of Subcommittee F01.03
15、on MetallicMaterials, Wire Bonding, and Flip Chip.Current edition approved March 1, 2018. Published April 2018. Originallyapproved in 1947. Last previous edition approved in 2013 as F219 96 (2013).DOI: 10.1520/F0219-96R18.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontac
16、t ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis international standar
17、d was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.15.4 In c
18、ase of disagreement between producer andconsumer, Test Methods F16 shall be used as the refereemethod.5.5 ReportThe report shall include the average weight ofwire or ribbon in mg/200 mm to three significant figures. Theaverage measurements for diameter, width, or thickness shallbe reported to the ne
19、arest 0.0001 in. (0.002 mm).6. Out-of-Roundness6.1 ProcedureMeasure out-of-roundness on round wireover 0.005 in. (0.13 mm) in diameter in accordance withSections 3 and 4 of Test Methods D374. For wire 0.005 in. orless in diameter the same method shall apply except a benchtype micrometer reading to 0
20、.0001 in. (0.002 mm) shall beused. Make the measurements by exploring a plane of crosssection of the test specimen to determine both minimum andmaximum values of diameter at the cross section. Take care tohave the specimen straight so that its normal curvature will notinfluence readings.6.2 Calculat
21、ionCalculate out-of-roundness as follows:Out 2 of 2 roundness, percent 5 A 2 B!/A# 3100where:A = maximum diameter of the cross section, in. (or mm),andB = minimum diameter of the cross section, in. (or mm).6.3 ReportThe report shall include the average of thethree determinations of out-of-roundness
22、reported to the near-est 1 percent.7. Edgewise Curvature of Ribbon7.1 ProcedureLay a specimen 200 mm in length on a flatglass plate. Lay a second glass plate over the ribbon to ensureits lying flat with no edgewise bending. Place in lined graph,which consists of parallel lines spaced 1.0 mm apart an
23、d isnumbered 50 mm above and below the zero line, under theglass plates. Manipulate the plates over the graph so that theends of the ribbon coincide with the zero line. Measure theextreme depth of chord.7.2 ReportThe report shall include the maximum depth ofchord reported to the nearest 0.5 mm.8. St
24、raightness of Straightened Round Wire8.1 ProcedureHold a specimen 200 mm in length parallelto and 2 to 3 in. (51 to 76 mm) above a glass plate and allowit to fall freely onto the glass plate. Take extreme care not tostretch or distort the wire with too much tension. Manipulatethe glass plate over th
25、e graph described in 7.1 so that the endsof the wire coincide with the zero line. Measure the maximumdeviation from the zero line. Also measure the distance fromend to end.8.2 ReportThe report shall include the maximum devia-tion from the zero line and the apparent length of the wire tothe nearest m
26、illimetre. The readings shall be expressed as: Xmm deviation/X mm (For example, if the maximum deviationwere 25 mm and the apparent length were 165 mm, theexpression would be 25 mm deviation/165 mm).9. Tension Test9.1 ApparatusAny standard testing machine that appliesthe load at a constant rate of t
27、raverse or a machine calibratedin terms of a constant rate of traverse shall be satisfactory. Thecapacity of the testing machine shall be such that all specimensfail at greater than 40 percent of the capacity of the machine.The clamps used shall be such that there will be no slipping of,or damage to
28、, the test specimen.9.2 ProcedureDetermine the tensile strength, yieldstrength, and elongation at room temperature. The gage lengthof the specimen shall be 10 in. (254 mm). The initial loadapplied to the specimen before making the test shall besufficient to keep the wire straight. The rate of traver
29、se shall be1 in./min (25.4 mm/min). The yield strength shall be defined asthe stress at which the specimen exhibits an elongation of 1 %.If the specimen breaks within 0.5 in. (12.7 mm) of the clamps,repeat the test.9.3 The report shall include the averages of at least threedeterminations each of the
30、 tensile strength and yield strength3expressed in gf/(mg/200 mm) or in kgf/cm, and the percentageof elongation in 10 in. (254 mm).NOTE 1Conversion factors are as follows:gf/mg/200 mm! 5 psi 30.003515/psi 5 F/W 3284.5 3kgf/cm25 psi 30.0703psi 5 kgf/cm2314.22where:F = breaking load, gf, = density of m
31、aterial, g/cm3, andW = weight of material, mg/200 mm (see 5.1).10. Electrical Resistivity10.1 ProcedureDetermine the electrical resistance of wireand ribbon at room temperature in accordance with TestMethod B63. The electrical resistivity shall then be calculatedin accordance with 10.2. This test sh
32、all be applicable to smallersizes by omitting 5.1.3 of Test Method B63.10.2 CalculationThe electrical resistivity at 25 C may beexpressed either in terms of cmil/ft, cm, or as mg/200mmft, calculated (Note 2) as follows: 5 1.640 3/ft 3mg/200 mm!/g/cm3!c5 9.868 3/ft 3mg/200 mm!/g/cm3!w5 /ft 3mg/200 mm
33、where: = resistivity, cm at 25 C,c= resistivity, cmil/ft at 25 C, and2= resistivity, mg/200 mmft at 25 C.NOTE 2The following illustrates the derivation of the equations forcalculating weight resistivities:Using known values of:R = resistance, / ft, at 25 C,W = weight, mg/200 mm, and = density, g/cm3
34、.3For an explanation of units used, see Specification F289.F219 96 (2018)2LetA = cross section of wire, cm2, andL = length of wire, cm.ThenW/1000 5 LA 5 20AorA 5 W/20,000Let = resistivity, cm,c= resistivity in cmil/ft, andw= resistivity in -mg/200 mmft.Then 5 RA/L 5 1.640 3/ft 3mg/200 mm!/g/cm3!c5 9
35、.868 3/ft 3mg/200 mm!/g/cm3!or 5 0.1662 c5 1.640 w/c5 6.015 5 9.868 w/w5 0.6096 5 0.10134 c10.3 ReportThe report shall include the following:10.3.1 Identification of test specimen,10.3.2 Kind of material,10.3.3 Temperature of surrounding medium,10.3.4 Length of specimen used,10.3.5 Method of obtaini
36、ng cross-sectional area:10.3.5.1 If by micrometer, a record of all micrometerreadings, including average values and calculated cross-sectional area.10.3.5.2 If by weighing, a record of length, mass anddensity determinations and calculated cross-sectional area.10.3.6 Method of measuring resistance,10
37、.3.7 Value of resistance,10.3.8 Calculated value of electrical resistivity, and10.3.9 Previous mechanical and thermal treatments. (sincethe resistivity of a material usually depends upon them, theseshall be stated whenever the information is available.)11. Keywords11.1 electrical resistance; electro
38、n devices; lamps; roundand flat wire; tensile testingASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent ri
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41、g you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard ma
42、y be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the Copyright Clearance Center, 222Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http:/ 96 (2018)3
