ASTM E973-2005a Standard Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a Photovoltaic Reference Cell《测量光电装置与光电参比电池之间光谱不协调参数的标准试.pdf

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1、Designation: E 973 05aStandard Test Method forDetermination of the Spectral Mismatch Parameter Betweena Photovoltaic Device and a Photovoltaic Reference Cell1This standard is issued under the fixed designation E 973; the number immediately following the designation indicates the year oforiginal adop

2、tion or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers a procedure for the determina-tion of a spectra

3、l mismatch parameter used in performancetesting of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of theerror, introduced in the testing of a photovoltaic device, causedby mismatch between the spectral responses of the photovol-taic device and the photovoltaic reference cell,

4、as well asmismatch between the test light source and the referencespectral irradiance distribution to which the photovoltaic ref-erence cell was calibrated. Examples of reference spectralirradiance distributions are Tables E 490 or G 173.1.3 The spectral mismatch parameter can be used to correctphot

5、ovoltaic performance data for spectral mismatch error.1.4 This test method is intended for use with linear photo-voltaic devices.1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish

6、 appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 490 Solar Constant and Air Mass Zero Solar SpectralIrradiance TablesE 772 Terminology Relating to Solar Energy ConversionE 948 Test Method fo

7、r Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated SunlightE 1021 Test Methods for Measuring Spectral Response ofPhotovoltaic CellsE 1036 Test Methods for Electrical Performance of Non-Concentrator Terrestrial Photovoltaic Modules and Arraysusing Reference CellsE 1

8、039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal IrradiationE 1125 Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE 1328 Terminology Relating to Photovoltaic Solar E

9、nergyConversionE 1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsG 138 Test Method for Calibration of a SpectroradiometerUsing a Standard Source of IrradianceG 173 Tables for Reference Solar Spectral Irradiances:Direct Normal and Hemispherical on 37 Tilted S

10、urfaceSI 10 Standard for Use of the International System of Units(SI): The Modern Metric System3. Terminology3.1 DefinitionsDefinitions of terms used in this testmethod may be found in Terminology E 772 and TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 test light source,

11、 na source of illumination whosespectral irradiance will be used for the spectral mismatchcalculation.3.3 SymbolsThe following symbols and units are used inthis test method:Mspectral mismatch parameter,emeasurement error in short-circuit current,lwavelength, m or nm,1This test method is under the ju

12、risdiction of ASTM Committee E44 on Solar,Geothermal, and OtherAlternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved September 1, 2005. Published October 2005. Originallyapproved in 1983. Last previous edi

13、tion approved in 2005 as E 973 05.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM Internation

14、al, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.Rr(l)spectral response of reference cell, AW1,Rt(l)spectral response of photovoltaic device, AW1,Eirradiance, Wm2,E (l)spectral irradiance, Wm2m1or Wm2nm1,andEo(l)reference spectral irradiance, Wm2m1orWm2nm1.NOTE

15、 1Following normal SI rules for compound units (see PracticeSI 10), the units for spectral irradiance, the derivative of irradiance withrespect to wavelength dE/d (l), would be Wm3. However, to avoidpossible confusion with a volumetric power density unit and for conve-nience in numerical calculation

16、s, it is common practice to separate thewavelength in the compound unit. This compound unit is also used inTables G 173 .4. Summary of Test Method4.1 Determination of the spectral mismatch parameter Mrequires the spectral response characteristics of the photovol-taic device and the spectral irradian

17、ce distribution of the testlight source, along with the spectral response and the referencespectral irradiance distribution used for the reference cellcalibration.4.2 Because all four spectral quantities appear in both thenumerator and the denominator in the calculation of thespectral mismatch param

18、eter (see 8.1), multiplicative calibra-tion errors cancel, and therefore only relative quantities areneeded, although absolute spectral quantities may be used ifavailable.5. Significance and Use5.1 The calculated error in the photovoltaic device currentdetermined from the spectral mismatch parameter

19、 can be usedto determine if a measurement will be within specified limitsbefore the actual measurement is performed.5.2 The spectral mismatch parameter also provides a meansof correcting the error in the measured device current due tospectral mismatch.5.2.1 The spectral mismatch parameter is formula

20、ted as thefractional error in the short-circuit current due to spectraldifferences.3,45.2.2 Error due to spectral mismatch can be corrected bydividing the measured photovoltaic cell current by M,aprocedure used in Test Methods E 948 and E 10366. Apparatus6.1 In addition to the apparatus required by

21、Test MethodsE 1021, the following apparatus is required.6.1.1 Spectral Irradiance Measurement InstrumentAspectroradiometer, defined in Test Method G 138, calibratedaccording to Test Method G 138.6.1.1.1 The wavelength resolution shall be no greater than10 nm.6.1.1.2 The wavelength pass-bandwidth sha

22、ll be no greaterthan 6 nm.6.1.1.3 The wavelength range shall be wide enough toinclude the spectral response of the photovoltaic device and thephotovoltaic reference cell.6.1.1.4 The spectral irradiance measurement instrumentmust be able to scan the required wavelength range in a timeperiod short eno

23、ugh such that the spectral irradiance at anywavelength does not vary more than6 5 % during the entirescan.7. Procedure7.1 Determine the spectral response Rt(l) of the photovol-taic device using Test Methods E 1021.7.2 Obtain the spectral response Rr(l) of the photovoltaicreference cell.NOTE 2Test Me

24、thods E 1039, E 1125, and E 1362 require the spectralresponse to be provided as part of the reference cell calibration certificate.7.3 Measure the spectral irradiance E (l) of the test lightsource, using the spectral irradiance measurement instrument(see 6.1.1).7.4 Obtain the reference spectral irra

25、diance distributionEo(l) that corresponds to the calibration of the photovoltaicreference cell, such as Tables E 490 or G 173.8. Calculation of Results8.1 Calculate the spectral mismatch parameter with:3,4M 5*l2l1El!Rtl!dl*l4l3El!Rrl!dl3*l4l3Eol!Rrl!dl*l2l1Eol!Rtl!dl(1)using a suitable numerical int

26、egration scheme such as thosedescribed in Tables G 173.8.1.1 The wavelength integration limits l1 and l2 shallcorrespond to the spectral response limits of the photovoltaicdevice.8.1.2 The wavelength integration limits l3 and l4 shallcorrespond to the spectral response limits of the photovoltaicrefe

27、rence cell.8.2 Calculate the measurement error due to spectral mis-match using:e5|M 2 1|(2)9. Precision and Bias9.1 PrecisionImprecision in the spectral irradiance andthe spectral response measurements will introduce errors in thecalculated spectral mismatch parameter.9.1.1 It is not practicable to

28、specify the precision of thespectral mismatch test method using results of an interlabora-tory study, because such a study would require circulating atleast six stable test light sources between all participatinglaboratories.9.1.2 Monte-Carlo perturbation simulations5using precisionerrors as large a

29、s 5 % in the spectral measurements have shown3Seaman, C., “Calibration of Solar Cells by the Reference Cell MethodTheSpectral Mismatch Problem,” Solar Energy, Vol 29, 1982, pp. 291298.4Osterwald, C. R., “Translation of Device Performance Measurements toReference Conditions,” Solar Cells, Vol 18, 198

30、6, pp. 269279.5Emery, K. A., Osterwald, C. R., and Wells, C. V., “Uncertainty Analysis ofPhotovoltaic Efficiency Measurements,” Proceedings of the 19th IEEE Photovolta-ics Specialists Conference1987 , pp. 153159, Institute of Electrical and Elec-tronics Engineers, New York, NY, 1987.E 973 05a2that t

31、he imprecision associated with the calculated spectralmismatch parameter is no more than 1 %.9.1.3 Table 1 lists estimated maximum limits of imprecisionthat may be associated with spectral measurements at any onewavelength.9.2 BiasBias associated with the spectral measurementsused in the spectral mi

32、smatch calculation can be either inde-pendent of wavelength or can vary with wavelength.9.2.1 Numerical calculations using wavelength-independentbias errors of 2 % added to the spectral quantities show theerror introduced in the spectral mismatch parameter to be lessthan 1 %.9.2.2 Estimates of maxim

33、um bias that may be associatedwith the spectral measurements are listed in Table 2. Theselimits are listed for guidance only and in actual practice willdepend on the calibration of the spectral measurements.10. Keywords10.1 cell; mismatch; photovoltaic; reference; solar; spectral;testingASTM Interna

34、tional takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely th

35、eir own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should

36、 be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standa

37、rds, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-83

38、2-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org).TABLE 1 Estimated Limits of Imprecision in SpectralMeasurementsSource of Imprecision Estimated Limit, %Spectral response measurement 2.0Spectral irradiance measurement 5.0TABLE 2 Estimated Limits of Bias in Spectral MeasurementsSource of Bias Estimated Limit, %Spectral response measurement 3.0Spectral irradiance measurement 5.0E 973 05a3

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