1、Designation: F 2055 00Standard Test Method forSize and Squareness of Resilient Floor Tile by Dial GageMethod1This standard is issued under the fixed designation F 2055; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of la
2、st revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the determination of bothdimensions (length and width) and squareness of resilient floortile. T
3、his test method is intended for use with square tilesranging from a nominal 9 in. (226 mm) to 40 in. (1016 mm) indimension.1.2 The values stated in inch-pound units are to be regardedas the standard. The values given in parentheses are forinformation only.1.3 This standard does not purport to addres
4、s all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:F 141 Terminology
5、 Relating to Resilient Floor Coverings2F 536 Test Method for Size of Resilient Floor Tile by DialGage Method2F 540 Test Method for Squareness of Resilient Floor Tile byDial Gage Method23. Significance and Use3.1 Both dimension and squareness of resilient floor tile areimportant considerations, becau
6、se installed flooring may ex-hibit an objectionable appearance when either or both charac-teristics deviate from established tolerances. This test methodprovides a means of determining actual dimensions and square-ness by using a single apparatus and procedure. This testmethod may be used as a subst
7、itute for Test Methods F 536 andF 540, which allow for similar measurements on resilient floortile up to 12 in. (305 mm) in size.4. Apparatus4.1 The apparatus shall consist of four dial gages (refer-enced A through D in Fig. 1) and two reference index stripsmounted on a flat bedplate in a configurat
8、ion that, by rotationof the sample, allows the measurement of all four sides ofresilient tile samples (see Fig. 1). One edge of the bedplate iselevated to create a test surface which is offset or tilted 15 61 degrees from horizontal. This offset applies minimal pressureto the test specimen against t
9、he longer index strip to ensurerepeatable measurement. A reference plate representing targettile size and squareness is used to zero all dial gages (see Fig.2).4.2 Dial GagesThe four dial gages are mounted in guideslots that are machined into the bedplate to allow for measure-ment of various tile si
10、zes while remaining within 10% of thecorner of the tile edge (for the two corner gages and onesquareness gage) or within the central 10% of the tile edge (forthe center gage only). Dial gages may report measurementsusing either electrical or mechanical means, but they shall begraduated to read 0.001
11、 in. (0.02 mm) and have a stem travelgreater than 0.25 in. (6 mm). The contact foot of the dial-gagestem shall be flat 0.500.75 6 0.001 in. (12.719.1 mm 6 0.2mm) in diameter and exert a total force of not more than 3.0 60.1 ozf (0.83 6 0.003 N). Dial gages shall be securelypositioned so that when th
12、e reference plate is in place, thecontact foot is extended approximately 50% of its full travel.4.3 Index StripsThe apparatus contains 2 fixed indexstrips. A horizontal index strip shall be mounted parallel to andjust inside the lower edge of the bedplate. It shall be 1.5 6 0.1in. (38 6 3 mm) greate
13、r in length and a minimum of twice thethickness of the largest tile to be tested. A second index stripshall be mounted 90 6 10 s (1.57080 6 0.00005 rad.) to the1This test method is under the jurisdiction of ASTM Committee F06 on ResilientFloor Coverings and is the direct responsibility of Subcommitt
14、e F06.20 on TestMethodsProducts Construction/Materials.Current edition approved Sept. 10, 2000. Published November 2000.2Annual Book of ASTM Standards, Vol 15.04.FIG. 1 Tile Measurement Apparatus1Copyright ASTM, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, United States.horizontal index
15、strip. The lower end of this index strip shall be0.125 6 0.01 in. (3.1 6 0.25 mm) above the right end of thehorizontal index strip and is used to locate one corner of thesample tile.4.4 Reference PlateThe reference plate shall be made tothe target dimensions of the manufactured tile. The length andw
16、idth dimensions shall be within 6 0.001 in. (0.02 mm) of thespecified dimensions of the resilient tile. The reference plateshall contain at least two sides which are perpendicular to 906 10 s (1.57080 6 0.00005 rad.) to one another and are usedto set the squareness gage to zero.5. Specimens5.1 The s
17、pecimens shall consist of 5 full size tiles.6. Conditioning6.1 Condition the test specimens, reference plate, and appa-ratus a minimum of 24 h at 73.4 6 1.8F (23 6 1C) and 506 5% relative humidity. Tests shall be conducted in this sameenvironment. Samples shall be conditioned on a flat surfacesuch a
18、s a table or floor surface to ensure they will contact thebedplate uniformly during measurement.7. Procedure7.1 Place the appropriate reference plate onto the bedplatesurface and slide it firmly against the two index strips. Set eachof the four dial indicators to zero. Remove the reference plate.All
19、 dial indicators will now reflect their fully extended mea-surements. In the case of digital dial indicators, the display willindicate a negative number. In the case of mechanical dialindicators, the display will move counter-clockwise from zero.NOTE 1Dirt and foreign particles may collect along the
20、 upper face ofthe index strip and affect the zero setpoint. Use a small brush to maintainthe cleanliness of the index strip surfaces before and after each use.7.2 Measuring Size and SquarenessIdentify one edge ofthe sample tile as “Edge #1” by attaching a label to the face ofthe tile near that edge.
21、 Place the tile into the apparatus andcarefully move it into position such that it will depress all fourdial gages and is in firm contact with both index strips. Recordthe measurements on all four gages to the nearest 0.001 in.(0.02 mm).7.3 Remove the tile from the bedplate and rotate it 90 in thecl
22、ockwise direction. Repeat the process described in 7.2 andrecord the four gage readings. Repeat for each of the tworemaining sides.7.4 After all samples have been measured, place the refer-ence gage back on the bedplate to verify that no movement ofdial gages has occurred. A movement of greater than
23、 0.001 in.(0.02 mm) shall be cause to repeat the measurement process.8. Calculations8.1 Tile SizeRecord all measurements in the formatshown in Table 1. Measurements shall be recorded to thenearest 0.001 in. (0.02 mm) for all gages. The four rotationsprovide two measurements of the length and width a
24、t the centerand both edges of each of the tile specimens. Report thedimensions and squareness for each specimen using the for-mulas in 8.2.8.2 Perform the following calculations using Table 1 data todetermine length, width, and squareness deviations for thesample tile. The final report shall include
25、 tile size, test date, andlength, width, and squareness deviations.Length and Width Deviation Squareness DeviationLength Deviation, Left Side = (1A+3C)/2 Corner 1 = (D1)Length Deviation, Center = (1B+3B)/2 Corner 2 = (D2)Length Deviation, Right Side = (1C+3A)/2 Corner 3 = (D3)Width Deviation, Left S
26、ide = (2A+4C)/2 Corner 4 = (D4)Width Deviation, Center = (2B+4B)/2Width Deviation, Right Side = (2C+4A)/29. Report9.1 Report the dimensions and squareness for each speci-men using the formulas in 8.2.10. Precision and Bias10.1 PrecisionThe repeatability and reproducibility ofthis test method is in t
27、he process of being established.10.2 BiasThe bias of this test method is in the process ofbeing established.11. Keywords11.1 dial gage; resilient flooring; resilient tile; tileA: Tile Target Dimension 6 0.001 in. (0.02 mm)B: 90 6 10 s (1.57080 6 0.00005 rad.)FIG. 2 Reference PlateTABLE 1 Typical Mea
28、surement DataRotation No. Gage A Gage B Gage C Gage D1 0.002 0.003 0.002 0.0022 0.003 0.000 0.001 0.0033 0.004 0.001 0.003 0.0024 0.003 0.002 0.005 0.004F 20552The American Society for Testing and Materials takes no position respecting the validity of any patent rights asserted in connectionwith any
29、 item mentioned in this standard. Users of this standard are expressly advised that determination of the validity of any suchpatent rights, and the risk of infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical
30、 committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM Headquarters. Your comments will receive careful consideration at a meeting of
31、 the responsibletechnical committee, which you may attend. If you feel that your comments have not received a fair hearing you should make yourviews known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the above address or at610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website (www.astm.org).F 20553
