1、BRITISH STANDARD BS9940-04.01: 1984 QC400401 IEC115-6-1: 1983 Specification for Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification: Fixed resistor networks with individually measurable resistors all of equal va
2、lue and equal dissipation Assessment level EBS9940-04.01:1984 BSI01-2000 ISBN 0 580 34153 4 Amendments issued since publication Amd. No. Date CommentsBS9940-04.01:1984 BSI 01-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting (to be
3、 inserted) 2 1.2 Dimensions, ratings and characteristics 2 1.3 Related documents 3 1.4 Marking 3 1.5 Ordering information 3 1.6 Certified records of released lots 3 1.7 Additional information (not for inspection purposes) 3 1.8 Additional or increased severities or requirements to those specified in
4、 the generic and/or sectional specification 3 Section 2. Inspection requirements 2.1 Procedures 3 Table I 2 Table II 4BS9940-04.01:1984 ii BSI 01-2000 National foreword This Part of this BritishStandard has been prepared under the direction of the Electronic Components Standards Committee. It is ide
5、ntical with IEC Publication115-6-1 (QC400401): “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation. Assessment level E” published by the International Electrotechnical C
6、ommission (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a BritishStandard without deviation. Some terminol
7、ogy and certain conventions are not identical with those used in BritishStandards. Cross-references. The BritishStandard harmonized with IECQ001001 and001002 is BS9000 “General requirements for a system for electronic components of assessed quality”. In adopting the IEC text as a National Standard i
8、t has been noted that there is an omission from boxes2 and4 of the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IEC TC40 Secretariat and the specification number has been inserted where necessary in this stand
9、ard. Scope This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS9940-04. Detail specification layout In the event of conflict between the requirements of this specification and the provisions of BS E9000,
10、the latter shall take precedence except that the front page layout will be in accordance with BS9000 Circular Letter No.15 dated October1980. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applic
11、ation. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding BritishStandard IEC63:1963 BS2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equip
12、ment (Technically equivalent) IEC115-1:1982 (QC400000:1982) BS9940: Fixed resistors for use in electronic equipment Part0:1983 Generic specification (Identical) IEC115-6:1983 (QC400400) BS9940: Fixed resistors for use in electronic equipment Part04:1984 Sectional specification: Fixed resistor networ
13、ks with individually measurable resistors (Identical) IEC410:1973 BS6001:1972: BS6001: Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to7 and a back cover. This s
14、tandard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-04.01:1984 BSI 01-2000 1 INTRODUCTION Blank detail specification A blank detail specification is a supplementary document to the Sect
15、ional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of de
16、tail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on page 2 correspond to the following information which shall be inserted in the position indicated. Identification of the detail specification Identification of
17、the resistor network 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the natio
18、nal system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. 5 A short description of the type of resistor network. 6 Electrical circuit showing all resistors and connections contained in the network. Terminal pin numbers
19、 shall be shown. Alternatively, this drawing may be given in an appendix to the detail specification. 7 Information on typical construction (when applicable). NOTEWhen the resistor network is not designed for use in printed board applications, this shall be clearly stated in the detail specification
20、 in this position. 8 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 9 Application or group of applicatio
21、ns covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping
22、of the tests does not change. 10 Reference data on the most important properties, to allow comparison between the various resistor network types.BS9940-04.01:1984 2 BSI 01-2000 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication115-6
23、.) 1.2 Dimensions, ratings and characteristics Table I 1 IEC115-6-1-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITYIN ACCORDANCE WITH: IEC115-6-1 4 3 FIXED RESISTOR NETWORKS WITH INDIVIDUALLY MEASURABLE RESISTORS, ALL OF EQUAL VALUE AND EQUAL DISSIPATION 5 Outline drawing: (see Table I) (. . . angle
24、 projection) 8 6 Insulated/non-insulated 7 (Other shapes are permitted within the dimensions given) Assessment level(s): E 9 Stability class: . . . % Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 10 Style Rated element d
25、issipation at70 C (W) Rated network dissipation at70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage between elements (if applicable) (V) Dimensions All dimensions are in millimetres or inches and millimetres.BS9940-04.01:1984 BSI 01-2000 3 1.2.1 Derating Resistors covered b
26、y this specification are derated according to the following curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and packing shall be in accordance with the re
27、quirements of IEC Publication115-6, Sub-clause1.5. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.5 Ordering information Orders for resistor networks covered by this specification shall contain, in clear or in coded form, the followi
28、ng minimum information: a) Rated element resistance. b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Addi
29、tional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be i
30、n accordance with the Sectional Specification, IEC Publication115-6, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection, the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Spec
31、ification. NOTEWhen drying is called for, Procedure I of Sub-clause4.3 of the Generic Specification, IEC Publication115-1, shall be used. Resistance range a . . . to . . . Tolerances on rated resistance . . . . . .% Climatic category / Low air pressure 8.5kPa(85mbar) Stability class . . .% Limits fo
32、r change of resistance: for long-term tests (. . . %R+. . . 7) for short-term tests (. . . %R+. . . 7) Temperature coefficient : . . . 10 6 / C a The preferred values are those of the E-series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors. Generic Specification: IEC Pub
33、lication115-1(1982): Fixed Resistors for use in Electronic Equipment, Part1: Generic Specification. Sectional Specification: IEC Publication115-6(1983): Part6: Sectional Specification: Fixed Resistor Networks with Individually Measurable Resistors.BS9940-04.01:1984 4 BSI 01-2000 Table II NOTE 1Sub-c
34、lause numbers of tests and performance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which shall be selected from the Table I and Table II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected
35、 from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p n c D ND =periodicity (in months) =sample size =acceptance criterion (permitted number of defectives) = destructive =non-destructive IL AQL =inspection level =acceptable quality level IEC Pub
36、lication410 Sub-clause number and Test (see Note1) D or ND Conditions of test (see Note1) IL AQL Performance requirements (see Note1) (see Note2) Group A Inspection (lot-by-lot) Sub-group A1 4.4.1 Visual examination ND S-4 1.0% As in4.4.1 Legible marking and as specified in1.4 of this specification
37、Sub-group A2 4.4.2 Dimensions (gauging) 4.5 Resistance ND S-4 1.0% As specified in Table I of this specification As in4.5.2 Group B Inspection (lot-by-lot) Sub-group B1 4.7 Voltage proof (insulated networks only) ND Method: . . . S-3 1.0 % No breakdown or flashover Sub-group B2 4.17 Solderability D
38、Without ageing Method: . . . S-3 2.5% Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . . . s, as applicable 4.19 Rapid change of temperature A =Lower category temperature B =Upper category temperature Visual examination Resistance
39、 No visible damage %Ru ( . . .%R+. . . 7) Sub-group B3 4.8.4.2 Temperature coefficient of resistance ND This test is applicable only when a temperature coefficient of resistance of less than 50 10 6 / C is claimed. One cycle of20 C to70 C to20 C only S-3 2.5% : . . .10 6 / C BS9940-04.01:1984 BSI 01
40、-2000 5Table II Sub-clause number and Test (see Note1) D or ND Conditions of test (see Note1) Sample size and criterion of acceptability (see Note3) Performance requirements (see Note1) p n c Group C Inspection (periodic) Sub-group C1A Half of the sample of Sub-group C1 4.16 Robustness of terminatio
41、ns 4.18 Resistance to soldering heat 4.8 Variation of resistancewith temperature 4.13 Overload D See2.3.9 of the sectional specification Visual examination Resistance Method: . . . Visual examination Resistance Lower category temperature/20 C 20 C/upper category temperature See2.3.4 of the sectional
42、 specification Visual examination Resistance 3 5 No visible damage %Ru (. . .%R+. . .7) No visible damage Legible marking %Ru (. . .%R+. . .7) u . . .% or : . . .10 6 / C u . . .% or : . . .10 6 / C No visible damage Legible marking %Ru (. . .%R+. . .7) Sub-group C1B Other half of the sample of Sub-
43、group C1 4.19 Rapid change of temperature 4.22 Vibration D A =Lower category temperature B =Upper category temperature Visual examination Resistance Method of mounting: see1.1 of this specification Procedure B4 Frequency range:10Hz to500Hz Amplitude:0.75mm or acceleration98m/s 2(whichever is the les
44、s severe) Total duration:6h Visual examination Resistance 3 5 No visible damage %Ru (. . .%R+. . .7) No visible damage %R u (. . .%R+. . .7) %R R - %R R -BS9940-04.01:1984 6 BSI 01-2000 Table II Sub-clause number and Test (see Note1) D or ND Conditions of test (see Note1) Sample size and criterion o
45、f acceptability (see Note3) Performance requirements (see Note1) p n c Sub-group C1 Combined sample of specimens of Sub-groups C1A and C1B 4.23 Climatic sequence Dry heat Damp heat, cyclic, Test Db, first cycle Cold Low air pressure Damp heat, cyclic, Test Db, remaining cycles D 8.5kPa(85mbar) Visua
46、l examination Resistance Insulation resistance between resistor elements (if applicable), see also2.3.6 of the sectional specification Voltage proof between resistor elements (if applicable), seealso2.3.7 of the sectional specification 3 10 1 No visible damage Legible marking %Ru (. . .%R+. . .7) RW
47、 1G7 No breakdown or flashover Sub-group C2 4.25.1 Endurance at70 C D See also2.3.5 of the sectional specification Duration:1000h Examination at48h,500h and1000h: Visual examination Resistance Examination at1000h: Insulation resistance between resistor elements (if applicable), see2.3.6 of the secti
48、onal specification 3 5 1 No visible damage %Ru (. . .%R+. . .7) RW 1G7 The test on one sample, each year, shall be extended to8000h Examination at2000h,4000h and8000h: Resistance 12 5 %Ru (. . .%R+. . .7) (The results obtained are for information only)BS9940-04.01:1984 BSI 01-2000 7 Table II Sub-cla
49、use number and Test (see Note1) D or ND Conditions of test (see Note1) Sample size and criterion of acceptability (see Note3) Performance requirements (see Note1) p n c Group D Inspection (periodic) Sub-group D1 4.24 Damp heat, steady state D See also2.3.8 of the sectional specification Visual examination Resistance Insulation resistance between resistor elements (if applicable), see also2.3.6 of the sectional specification
