1、BRITISH STANDARD BS CECC 75101:1984 Specification for Harmonized system of quality assessment for electronic components Example detail specification/Blank detail specification Two-part and edge socket connectors for printed board applicationBSCECC75101:1984 BSI 11-1999 ISBN 0 580 35950 8 Amendments
2、issued since publication Amd. No. Date CommentsBSCECC75101:1984 BSI 11-1999 i Contents Page National foreword ii Foreword iii Text of CECC 75101 1BSCECC75101:1984 ii BSI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Commi
3、ttee. It is identical with CENELEC Electronic Components Committee (CECC)75101“Example detail specification/Blank detail specification: Two-part and edge socket connectors for printed board application”. This Standard is a harmonized specification within the CECC system. Terminology and conventions.
4、 The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Attention is especially drawn to the following. The comma has been used as a dec
5、imal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross references. The British Standard which implements CECC00100is BS9000 “General requirements for a system for electronic components of assessed quality”. Scope. This Standard lists
6、 the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BSCECC75100. International Standard Corresponding British Standard CECC 75100:1984 BS CECC 75100:1984 Sectional specification: Two-part and edge socket connectors for printe
7、d board application (Identical) IEC 512 BS 5772 Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods IEC 512-2:1976 Part 2:1979 General examination, electrical continuity and contact resistance tests, insulation tests and voltage str
8、ess tests (Identical) IEC 512-2A:1980 Part 2:Supplement 1:1981 Test 4c (Identical) IEC 512-4:1976 Part 4:1979 Dynamic stress tests (Identical) IEC 512-6:1977 Part 6:1979 Climatic tests and soldering tests (Identical) IEC 512-6A:1980 Part 6:Supplement 1:1981 Test 11b (identical) IEC 512-7:1978 Part 7
9、:1981 Mechanical operating tests and sealing tests (Identical) IEC 512-8:1977 Part 8:1979 Connector tests (mechanical) and mechanical tests on contacts and terminations (Identical) IEC 512-8A:1980 Part 8:Supplement 1:1981 Tests 15f, 16c, 16d, and 16i (Identical) IEC 512-8B:1980 Part 8:Supplement 2:1
10、982 Tests 16g and 16h (Identical)BSCECC75101:1984 BSI 11-1999 iii Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000the latter shall take precedence except that the front page layout will be in accordance with BS9000Circu
11、lar Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This
12、document comprises a front cover, an inside front cover, pages i to iv, theCECC title page, pages ii to iv, pages1to9 and a backcover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover
13、.iv blankCECC75101:1984 ii BSI 11-1999 Contents Page Foreword iii 2 Type designation 2 3 Common features and isometric view 3 4 Dimensions 3 5 Gauges 3 6 Characteristics 3 7 Test schedule 3 8 Quality assessment procedures 6 9 Ordering information 9 Table 25 6 Table 26 7 Table 27 8 Table 28 9CECC7510
14、1:1984 BSI 11-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardisation (CENELEC) who wish to take part in a harmonised System for electronic components of assessed quality. The object of
15、the System is to facilitate international trade by the harmonisation of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognised Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted
16、 by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonised specifications for TWO PART AND EDGE SOCKET CONNECTORS FOR PRINTED BOARD APPLICATION. It s
17、hould be read in conjunction with document CECC00100: Basic Rules (1974). Preface This example detail specification/blank detail specification (EDS/BDS) was prepared by CECC WG25 “Low frequency connectors”. This EDS/BDS provides an example of how to prepare a detail specification in accordance with
18、CECC75100. The example covers a group of related two-part connectors for printed boards. The group extends from connectors having a full complement of contacts for low-voltage applications to connectors for relatively high voltages and currents having fewer contacts. All connectors have the same com
19、mon mounting features irrespective of their different application characteristics. The board-mounted connectors are provided with terminations suitable for printed boards in accordance with IEC326and using a grid of2,54mm (0,1in) as laid down in IEC97. The fixed connectors are provided either with s
20、older contacts or with wrap or crimp contacts. The terminations of the fixed connectors are located in such a way as to be suitable for use with mother boards using a grid as laid down in IECPublication97as well as for automatic wiring techniques. The text of this EDS/BDS was circulated to the CECC
21、for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. NOTEThis specification does not conform completely with the requirements of CECC00400. Document Date of Voting Report on the Voting CECC (Secretariat) 1381 October 1983 CECC
22、 (Secretariat) 1448iv blankCECC75101:1984 BSI 11-1999 1 CECC WG 25: LF CONNECTORS CECC 75101-XXX ISSUE 1 JANUARY 19XX Specification available from: (National AuthorizedInstitution or manufacturer) Page x of xx pages National Specification No: Date of issue: ELECTRONIC COMPONENTS OF ASSESSED QUALITY
23、DETAIL SPECIFICATION IN ACCORDANCE WITH CECC75100 (Issue 1) Sectional Specification. Two-part and Edge Socket Connectorsforprinted board application. See 4 for dimensions DETAIL SPECIFICATION for two-partconnectors for printedboards,for basic gridof2.54mm (0.1in) withcommonmounting, accordingtoIEC 6
24、03-2 (1980). The group of connectors extends fromhigh-density connectors for low-voltage applications to connectorsforrelatively high voltagesand currents havingfewercontacts. Performance Levels: 4 and 7 a Assessment Levels: C, H and F a The combinations of performancelevel and assessmentlevel cover
25、ed by thisdetail specification are7C,4Hand 4F. a See 7 and 8 Climatic category: 55/125/56 See 6.2 for electrical characteristics See 6.3 for mechanical characteristics Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200: Qu
26、alified Products List.CECC75101:1984 2 BSI 11-1999 2 Type designation Connectors, connector bodies, removable crimp-contacts, performance level and assessment level according to this specification shall be designated by the following system: Example: Connector style C, having 96male gold contacts wi
27、th solder terminations. Complete board-mounted connector for board up to 1,6mm (0,063in), with performance level 7and assessment levelC: CECC 75101-XXX-C096MS-C1A-7C.CECC75101:1984 BSI 11-1999 3 3 Common features and isometric view 3.1 Mounting dimensions, isometric view 3.2 Mating information 3.3 S
28、urvey of styles 4 Dimensions 4.1 General 4.2 Fixed connectors 4.3 Board-mounted connectors 4.4 Mating information 4.5 Accessories 4.6 Mounting information for fixed connectors 4.7 Mounting information for board-mounted connectors 5 Gauges 6 Characteristics 6.1 Climatic category 6.2 Electrical 6.3 Me
29、chanical 7 Test schedule 7.1 General This test schedule shows all tests and the order in which they shall be carried out as well as the requirements to be met. An “X” in the column “Requirements” of the following table indicates that the test or conditioning shall be applied. Unless otherwise specif
30、ied, mated sets of connectors shall be tested. Care shall be taken to keep a particular combination of connectors together during the complete test sequence, for example when unmating is necessary for a certain test, the same connectors as before shall be mated for the subsequent tests. In the follo
31、wing, a mated set of connectors is called a “specimen”. For a complete test sequence, 20specimens are necessary. For the measurements of contact resistance, the points of connection shall be as follows:CECC75101:1984 4 BSI 11-1999 7.2 All specimens shall be subjected to the following tests: NOTE“PL”
32、 denotes Performance Level.CECC75101:1984 BSI 11-1999 5 7.3 The specimens shall be divided into five groups. All connectors in each group shall undergo the tests specified for the relevant group. Group APCECC75101:1984 6 BSI 11-1999 8 Quality assessment procedures 8.1 Qualification approval testing
33、8.1.1 Method 1 Qualification approval will be granted after satisfactory completion of the qualification approval testing according to Table 25, evidence of which is the qualification approval test report. Table 25 8.1.2 Method 2 Qualification approval will be granted after satisfactory completion o
34、f the quality conformance inspection, evidence of which is the certified test report (RCE), including the following inspections: 1) lot-by-lot tests (see Table 26) on three consecutive inspection lots, and 2) periodic tests on all lots (see Table 28). Applicable to the combinations of performance le
35、vel and assessment level 7C, 4H and4F. Performance Level 4 and 7 Assessment Level C, H and F Test groupin 7 Test phasein 7 Destructive (D) Non-destructive (ND) Number of connectors to be tested Number of defectives permitted P P1-P5 (ND) 20 0 AP AP1-AP18 (D) 4 1 BP BP1-BP11 (D) 4 1 CP CP1-CP5 (D) 4
36、1 DP DP1-DP7 (D) 4 1 EP EP1-EP5 (D) 4 1 Total number of defectives permitted, all test groups together: 2CECC75101:1984 BSI 11-1999 7 8.2 Quality conformance inspection 8.2.1 Lot-by-lot tests Structurally similar connectors which may be aggregated into one inspection lot are: types B and C or typesD
37、, F and G. Table 26 Applicable to the combinations of performance level and assessment level7C,4H and4F.CECC75101:1984 8 BSI 11-1999 8.2.2 Periodic tests The periodic tests with complete test groups (inspection Groups C4and D) shall be carried out on specimens that have successfully passed tests P1
38、to P5and that have been taken from lots which have already satisfied the lot-by-lot tests (See8.2.1). The periodic tests with single test phases (inspection Groups C1, C2and C4) shall be carried out on specimens that have successfully passed the lot-by-lot tests (See8.2.1). Table 27 Applicable to th
39、e combinations of performance level and assessment level7C,4Hand4F. Inspection group Performance Level 4 and 7 Assessment Level C, H and F Test phasein 7 Test IEC 512 Test Periodicity, month No. of specimens No. of defectives C1 AP3.1 Solderability 12a 1 a 1 b C2 P3 Contact resistance 2a 3 4 1 C4 AP
40、3.2 AP4 Resistance to soldering heat Voltage proof 12d 4a 12 4 1 C4 BP1-BP11 Test Group BP 12 4 1 C4 CP1-CP5 Test Group CP 12 4 1 D AP1-AP18 Test Group AP 36 4 1 D DP1-DP7 Test Group DP 36 4 1 D EP1-EP5 Test Group EP 36 4 1 RCE information to be given: Results from inspection Groups C1, C2, C4 and D
41、 a 20 terminations or 1 connector b 1 defective terminationCECC75101:1984 BSI 11-1999 9 8.3 Delayed delivery, re-inspection Connectors stored for a period of more than36months after the release of the lot shall be tested prior to delivery according to Table 28. Once a lot has been satisfactorily re-
42、inspected the quality is assessed for a further36months. Table 28 Applicable to the combinations of performance level and assessment level7C, 4H and4F. 9 Ordering information For ordering connectors according to this detail specification use the type designation described in2.BS CECC 75101:1984 BSI
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