1、BRITISH STANDARD BS EN 190106:1994 Incorporating Amendment Nos.1 and2 Specification for Harmonized system of quality assessment for electronic components Family specification TTL advanced low power SCHOTTKY digital integrated circuits Series54ALS,74ALS The European Standard EN190106:1994 has the sta
2、tus of a British StandardBSEN190106:1994 BSI 11-1999 ISBN 0 580 08604 6 Amendments issued since publication Amd. No. Date of issue Comments 8118 February 1994 8372 September 1994 Indicated by a sideline in the marginBSEN190106:1994 BSI 11-1999 i Contents Page National foreword ii Foreword 2 Foreword
3、 iii Text of CECC 90106 1 Publications referred to Inside back coverBSEN190106:1994 ii BSI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)90106:
4、1987 “Harmonized system of quality assessment for electronic components. Family specification:TTL advanced low power SCHOTTKY digital integrated circuits”. This standard is a harmonized specification within the CECC System. This standard supersedes BSCECC90106:1984 which is withdrawn. In1994 the CEN
5、ELEC Electronic Components Committee (CECC) accepted CECC90106:1987 with Amendment1 as European Standard EN190106:1994. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain
6、conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standa
7、rd which implements CECC00100 is BS9000:“General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the provisions of IEC747, IEC748 and IEC7
8、49, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BSCECC90100 in any
9、detail specification for these devices. Detail specification layout. The front page layout of detail specifications released to BSCECC family or blank detail specifications will be in accordance with BS9000 Circular letter No.15. International Standards a Corresponding British Standards IEC 68-2-30:
10、1980 BS2011 Basic environmental testing procedures Part2.1 Db:1981 Test Db and guidance. Damp heatcyclic (12+12 hour cycle) (Identical) CECC90000:1985 BSCECC90000:1985 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. (Identical
11、) CECC90100:1986 BSCECC90100:1986 Harmonized system of quality assessment of electronic components. Sectional specification: digital monolithic integrated circuits. (Identical) a Undated in text.BSEN190106:1994 BSI 11-1999 iii A British Standard does not purport to include all the necessary provisio
12、ns of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, theENtitle page, pag
13、e 2, the CECC title page, pages ii to iv, pages1 to 8, aninside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankEUROPEAN STANDARD NORME EUROPENNE
14、 EUROPISCHE NORM EN190106 May 1994 UDC Supersedes CECC 90106 Issue 2:1987 Descriptors: Quality, electronic components, TTL advanced low power Schottky digital integrated circuits English version Family specification: TTL advanced low power SCHOTTKY digital integratedcircuits Series54ALS,74ALS Spcifi
15、cation de famille: Circuitsintgrslogiques TTL Schottkyavance faible consommation Sries54ALS, 74ALS Familienspezifikation: DigitaleintegrierteTTLAdvanced LowPowerSchottky-Schaltungen Serien54ALS, 74ALS This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on8 May19
16、94. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained
17、on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to t
18、he CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and U
19、nitedKingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnisc
20、he Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1994 Copyright reserved to CENELEC members Ref. No. EN190106:1994 EEN190106:1994 BSI 11-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrote
21、chnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by t
22、he grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECCWG9, “Integrated Circuits”. The text of the draft based on docume
23、nt CECC90106 Issue 2:1987 (withA1) was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3543 it was approved by CECC as EN190106 on8May1994. The following dates were fixed: latest date of announcement of the
24、ENat national level (doa) 1994-09-01 latest date of publication of an identical national standard a (dop) 1995-03-01 latest date of withdrawal of conflicting national standards a (dow) 1996-03-01 a National Standard (excluding National implementation of IECQ Specifications)EN190106:1994 ii BSI 11-19
25、99 Contents Page Foreword iii 1 Limiting conditions of use for the family 2 2 Recommended operating conditions and associated characteristics for thefamily 2 3 Test methods and procedures 3 4 Inspection requirements 7 Figure 1 Diagram for switching parameters 4 Figure 2 Signal waveform at the input
26、of the component under test 4EN190106:1994 BSI 11-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components
27、 of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced u
28、nder the System are thereby accepted by all member countries without further testing. This specification his been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for TTL ADVANCED LOW POWER SCHOTTK
29、Y DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal,
30、 Spain, Sweden, Switzerland, and the UnitedKingdom. Preface This Family Detail Specification was prepared by CECCWG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC747: Semiconductor devices: Discret
31、e devices and integrated circuits, IEC748: Semiconductor devices: Integrated circuits, IEC749: Semiconductor devices: Mechanical and climatic test methods. It contains general information on TTL Advanced Low Power Schottky digital integrated circuits and defines the common characteristics for this f
32、amily of integrated circuits. Together with the device type detail specification (DS) of a component usually prepared nationally, this family detail specification forms a complete detail specification. The text of this second Issue consists of the text of CECC90106 Issue1(1984) amended in accordance
33、 with the ratified new material introduced by the following document. In accordance with the decision of the CECC Management Committee this specification is published initially in French and English. The German text will follow as soon as it has been prepared. Effective date This second Issue of CEC
34、C90106 shall become effective for all new qualification approvals on1 April1987. Issue1 will continue to remain effective to cover all past approvals. Document Date of Voting Report on the Voting CECC (Secretariat) 1968 September 1986 CECC (Secretariat) 2010iv blankEN190106:1994 BSI 11-1999 1 CECC 9
35、0106 ISSUE 2 1987 Page 1 Total number of pages:8 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: CECC 90000: Generic specification for Monolithic integrated circuits (GS) CECC 90100: Sectional specification for Digital monolithic integrated circuit (SS) OUTLINE AND DIMENSIONS (See DS f
36、or the specific type) FAMILY DETAIL SPECIFICATION FOR TTL ADVANCED LOW POWER SCHOTTKY DIGITAL INTEGRATED CIRCUITS Series 54 ALS, 74 ALS TERMINAL CONNECTIONS (See DS for the specific type) NOTEThis family detail specification shall be completed by a DS in accordance with this specification covering o
37、ne or more specific types of circuits. TYPICAL CONSTRUCTION: Silicon monolithic bipolar integrated circuits, cavity/non-cavity packages. ASSESSMENT LEVELS: P, Y, L CONTENTS 54 ALS, 74 ALS 1 LIMITING CONDITIONS OF USE FOR THE FAMILY 2 RECOMMENDED OPERATING CONDITIONS AND ASSOCIATED CHARACTERISTICS FO
38、R THE FAMILY 3 TEST METHODS AND PROCEDURES 4 INSPECTION REQUIREMENTS Information about manufacturers who have components qualified to a detail specification written in accordance with this family detail specification is available in the current CECC00200: Qualified Products List.EN190106:1994 2 BSI
39、11-1999 1 Limiting conditions of use for the family (Not for inspection purposes) 1.1 Maximum continuous supply voltage 1.2 Maximum input voltages 1.2.1 Max. input voltage 1.2.2 Max. input voltage between multiple emitter transistor inputs V II: +5,5V 1.3 Minimum and maximum operating ambient temper
40、atures 1.4 Minimum and maximum storage temperatures 2 Recommended operating conditions and associated characteristics for the family (Not for inspection purposes) (See also relevant DS) These conditions apply to the total operating temperature range, unless otherwise prescribed. 2.1 Positive supply
41、voltage V CC : 4,5 to 5,5V 2.2 Most negative low level input voltage at an input current I IK= 18mA V IKB : 1,5V 2.3 Minimum low level input voltage V ILB : 0V 2.4 Maximum low level input voltage V ILA: 0,8V 2.5 Minimum high level input voltage V IHB: 2V 2.6 Maximum high level input voltage V CC :0,
42、5V +7,0V V I : 0,5V +7,0V T amb ( C) 54 ALS 74 ALS min. 55 0 max. +125 +70 T stg : 65 C min. +150 C max. (unless otherwise specified in the DS) V IHA : 5,5V 7,0V (for inputs which are not I/O Ports) EN190106:1994 BSI 11-1999 3 2.7 Load factors 2.7.1 Unit load current 1) At low level voltage: 0,1mA 2
43、) At high level voltage: 20A 2.7.2 Input load factor (fan-in) 2.7.3 Output loading capability (fan-out) 2.8 Most positive low level output voltage at an output current of0.1mA the higher output loading capability (unless otherwise prescribed in the DS) V OLA : 0,4V 2.9 Most negative high level outpu
44、t voltage at an output current of20A the higher output loading capability 2.10 Most positive high level output voltage V OHA : 5,5V 2.11 DC noise margin at low level (V ILA V OLA ) V NL : 0,4V 2.12 DC noise margin at high level (V OHB V IHB ) 3 Test methods and procedures 3.1 Dynamic characteristics
45、 Unless otherwise prescribed in the relevant DS, the following dynamic measurement conditions are applicable. 1) At low level input voltage (see DS for the relevant input) 2) At high level input voltage 1) At low level output voltage (see DS for the relevant output) 2) At high level output voltage V
46、 OHB : 2,5V (standard outputs) 2,4V (buffer outputs) 2 V (bus driver outputs) V NH : 0,5V (standard outputs) 0,4V (buffer outputs) 0 V (bus driver outputs) EN190106:1994 4 BSI 11-1999 3.1.1 General diagram Measurements of dynamic characteristics are performed in accordance with the general diagram o
47、f Figure 1. 3.1.2 Pulse generator and driving circuit The following conditions shall be met: output impedance of pulse generator: 507 10% impedance of the driving circuit cable from the generator, including the test equipment: 507 10% Signal applied to the inputs of the component under test (seeFigu
48、re 2). Low level input voltage: 0,3V 0,1V High level input voltage: 3,5V 0,2V Rise time of the input signal: t r =2ns 0,2ns (measured from10% to90% of the step amplitude) Fall time of the input signal: t f =2ns 0.2ns (measured from90% to10% of the step amplitude) Pulse width: t W =0,5s Pulse repetit
49、ion frequency:u1MHz Inputs (according to the test to be performed, see relevant DS) Z L= Load circuit: according to the output configuration given in the DS, the load circuit diagram A, B or C shown below (see3.1.4) is applicable. NOTE 1The inductances of the connections and of the components used, and the impedance of the continuous sources shall be so low as to make the error negligible. NOTE 2One or more pulse generators may be used according to the measurement to be performed. Figure 1
