1、BRITISH STANDARDBS EN 60512-16-1: 2008Connectors for electronic equipment Tests and measurements Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe damageICS 31.220.10g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g5
2、1g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 60512-16-1:2008This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 August 2008 BSI 2008ISBN 978 0 580 55906 8National forewordThis British Standard
3、is the UK implementation of EN 60512-16-1:2008. It is identical to IEC 60512-16-1:2008. The UK participation in its preparation was entrusted to Technical Committee EPL/48, Electromechanical components and mechanical structures for electronic equipment.A list of organizations represented on this com
4、mittee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments/corrigenda issued
5、since publicationDate CommentsEUROPEAN STANDARD EN 60512-16-1 NORME EUROPENNE EUROPISCHE NORM July 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassar
6、t 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-16-1:2008 E ICS 31.220.10 English version Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts an
7、d terminations - Test 16a: Probe damage (IEC 60512-16-1:2008) Connecteurs pour quipements lectroniques - Essais et mesures - Partie 16-1: Essais mcaniques des contacts et des sorties - Essai 16a: Endommagement par sonde dessai (CEI 60512-16-1:2008) Steckverbinder fr elektronische Einrichtungen - Mes
8、s- und Prfverfahren - Teil 16-1: Mechanische Prfungen an Kontakten und Anschlssen - Prfung 16a: Federung und berdehnungsschutz (IEC 60512-16-1:2008) This European Standard was approved by CENELEC on 2008-07-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipu
9、late the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standar
10、d exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national
11、 electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, S
12、witzerland and the United Kingdom. Foreword The text of document 48B/1877/FDIS, future edition 1 of IEC 60512-16-1, prepared by SC 48B, Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was ap
13、proved by CENELEC as EN 60512-16-1 on 2008-07-01. This standard is to be read in conjunction with EN 60512-1 and EN 60512-1-100 which explains the structure of the EN 60512 series. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of a
14、n identical national standard or by endorsement (dop) 2009-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2011-07-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60512-16-1:2008 was approved
15、by CENELEC as a European Standard without any modification. _ BS EN 60512-16-1:2008 2 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe damage 1 Scope and object This part of IEC 60512, when required by the detail spec
16、ification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to assess the effectiveness of the elastic system of contac
17、ts to resist damage from the insertion of a specified test probe. Although this test is intended for cylindrical contacts, the use for contacts with other geometries is not excluded. In which case, the detail specification should contain sufficient detail, given under the Clause 5 f), to enable the
18、test to be done. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512
19、-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-16-5, Connectors for electronic equipment Tests and measurements Part 16-5: Mechanical tests on contacts and terminations Test 16e: Gauge retention force (resilient co
20、ntacts)13 Preparations 3.1 Preparation of specimen The specimen shall consist of the female part of a connector with its terminations, and may be wired if so specified in the detail specification. If the design of the connector does not prevent the rotation of the contact in its cavity, means to ens
21、ure this shall be used. Any such means shall not affect the validity of the test. If this is not possible, the contact shall be installed in its insert, and or housing, in the manner specified in the detail specification. Any preconditioning given in the detail specification shall be applied. 3.2 Eq
22、uipment A test pin and handle, such as that shown in Figure 1, shall be provided. They shall conform to the following requirements. _ 1To be published. BS EN 60512-16-1:2008 3 a) Length A, shall be 0,75 times the minimum depth specified for the bore of the female contact under test. b) Diameter B, s
23、hall be equal to the nominal diameter of the male mating contact. c) Length L shall not be less than 10 A. d) Mass M shall be such that M L = the specified torque. The mass of the handle shall be taken into account in this calculation. e) The test pin shall have a hemispherical end. f) The test pin
24、shall be made from hardened steel and have a polished surface. g) The handle shall have a spherical radius at the point marked “fulcrum”. h) Either, an alternative test pin with length A reduced to 0,50 times the minimum depth specified for the bore of the contact under test, or a spacer, which repl
25、icates the fulcrum of the handle, to achieve the same effect, shall be provided. M centre of mass F fulcrum A length L length B diameter Figure 1 Test pin, handle and mass F “M” LA BIEC 813/08 BS EN 60512-16-1:2008 4 3.3 Mounting If mounting of the specimen is appropriate, it shall be as specified i
26、n the detail specification. 4 Test method 4.1 Procedure The axis of the contact shall be horizontal at all times during the test. The specified test probe shall be fully inserted. The connector under test shall then be slowly rotated through 360 such that test load is applied in all possible positio
27、ns. This forgoing procedure shall be repeated, either with the reduced length test pin, or the spacer specified in 3.2 h). Test IEC 60512-16-5, gauge retention force, shall then be carried out. 4.2 Measurements and requirements 4.2.1 Before testing Visual examination according to IEC 60512-1-1 shall
28、 be carried out. The gauge retention requirements defined in the relevant detail specification shall be met. 4.2.2 After testing The requirements of the detail specification for gauge retention shall be met. Visual examination according to IEC 60512-1-1 shall be carried out. Special attention shall
29、be given to elastic members within the contact under test. 5 Details to be specified When this test is required by a detail specification, the following shall be given therein: NOTE It is anticipated that the detail specification will contain sufficient detail to allow calculation required in 3.2 to
30、 be carried out. a) whether preconditioning required; b) wiring of the specimen; c) whether special mounting of the specimen is required; d) torque to be applied; e) gauge retention requirements; f) if the contact is not cylindrical, sufficient details of equipment procedure, and measurements, for t
31、he test to be done; g) any deviation from the standard test method. _ BS EN 60512-16-1:2008 5 Annex ZA(normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this documen
32、t. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publica
33、tion Year Title EN/HD Year IEC 60512-1-1 -1)Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination EN 60512-1-1 20022)IEC 60512-16-5 200X3)Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on
34、 contacts and terminations - Test 16e: Gauge retention force (resilient contacts) EN 60512-16-5 200X3)1)Undated reference. 2)Valid edition at date of issue. 3)To be published. BS EN 60512-16-1:2008 6 blankBS EN 60512-16-1: 2008BSI Group Headquarters389 Chiswick High Road,London W4 4AL, UKTel +44 (0)
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