1、BSI Standards PublicationElectromagnetic compatibility (EMC)Part 4-6: Testing and measurement techniques Immunity to conducted disturbances, induced by radio-frequency fieldsBS EN 61000-4-6:2014National forewordThis British Standard is the UK implementation of EN 61000-4-6:2014. It is identical to I
2、EC 61000-4-6:2013. It supersedes BS EN 61000-4-6:2009 which will be withdrawn on 27 November 2016.The UK participation in its preparation was entrusted by Technical Com-mittee GEL/210, EMC - Policy committee, to Subcommittee GEL/210/12, EMC basic, generic and low frequency phenomena Standardization.
3、A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standard
4、s Limited 2014ISBN 978 0 580 69973 3ICS 33.100.20Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 28 February 2014.Amendments/corrigenda issued since publicationDat
5、e Text affectedBRITISH STANDARDBS EN 61000-4-6:2014EUROPEAN STANDARD EN 61000-4-6 NORME EUROPENNE EUROPISCHE NORM February 2014 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC
6、 Management Centre: Avenue Marnix 17, B - 1000 Brussels 2014 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-6:2014 E ICS 33.100.20 Supersedes EN 61000-4-6:2009 English version Electromagnetic compatibility (EMC) - Part 4-
7、6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields (IEC 61000-4-6:2013) Compatibilit lectromagntique (CEM) - Partie 4-6: Techniques dessai et de mesure - Immunit aux perturbations conduites, induites par les champs radiolectriques (CEI 61000
8、-4-6:2013) Elektromagnetische Vertrglichkeit (EMV) - Teil 4-6: Prf- und Messverfahren - Strfestigkeit gegen leitungsgefhrte Strgren, induziert durch hochfrequente Felder (IEC 61000-4-6:2013) This European Standard was approved by CENELEC on 2013-11-27. CENELEC members are bound to comply with the CE
9、N/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Ce
10、ntre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same sta
11、tus as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuani
12、a, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 61000-4-6:2014EN 61000-4-6:2014 - 2 - Foreword The text of document 77B/691/FDIS, future edition 4 of IEC 61000-4-6, prepared by SC 77B “High
13、 frequency phenomena” of IEC/TC 77 “Electromagnetic compatibility“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61000-4-6:2014. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical nati
14、onal standard or by endorsement (dop) 2014-08-27 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-11-27 This document supersedes EN 61000-4-6:2009. EN 61000-4-6:2014 includes the following significant technical changes with respect to EN 61000
15、-4-6:2009: a) use of the CDNs; b) calibration of the clamps; c) reorganization of Clause 7 on test setup and injection methods; d) Annex A which is now dedicated to EM and decoupling clamps; e) Annex G which now addresses the measurement uncertainty of the voltage test level; f) informative Annexes
16、H, I and J which are new. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IE
17、C 61000-4-6:2013 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61000-4-3 NOTE Harmonised as EN 61000-4-3. CISPR 16-1-2 NOTE Harmonised as EN 55016-1-2. CISPR 16
18、-1-4 NOTE Harmonised as EN 55016-1-4. CISPR 20 NOTE Harmonised as EN 55020. BS EN 61000-4-6:2014- 3 - EN 61000-4-6:2014 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively
19、 referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common m
20、odifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60050 (Series) - International Electrotechnical Vocabulary (IEV) - - BS EN 61000-4-6:2014 2 61000-4-6 IEC:2013 CONTENTS INTRODUCTION . 7 1 Scope 8 2 Normative references 8 3 Terms and definitions 8 4
21、General . 10 5 Test levels . 12 6 Test equipment and level adjustment procedures 13 Test generator . 13 6.1Coupling and decoupling devices . 15 6.2General 15 6.2.1Coupling/decoupling networks (CDNs) 18 6.2.2Clamp injection devices 20 6.2.3Direct injection devices . 22 6.2.4Decoupling networks 22 6.2
22、.5Verification of the common mode impedance at the EUT port of coupling 6.3and decoupling devices 23 General 23 6.3.1Insertion loss of the 150 to 50 adapters . 23 6.3.2Setting of the test generator . 25 6.4General 25 6.4.1Setting of the output level at the EUT port of the coupling 6.4.2device . 26 7
23、 Test setup and injection methods 28 Test setup 28 7.1EUT comprising a single unit 28 7.2EUT comprising several units . 29 7.3Rules for selecting injection methods and test points . 30 7.4General 30 7.4.1Injection method . 30 7.4.2Ports to be tested . 31 7.4.3CDN injection application . 32 7.5Clamp
24、injection application when the common mode impedance 7.6requirements can be met 33 Clamp injection application when the common mode impedance 7.7requirements cannot be met . 35 Direct injection application . 35 7.88 Test procedure 36 9 Evaluation of the test results . 37 10 Test report . 37 Annex A
25、(normative) EM and decoupling clamps 39 Annex B (informative) Selection criteria for the frequency range of application 49 Annex C (informative) Guide for selecting test levels . 51 Annex D (informative) Information on coupling and decoupling networks . 52 Annex E (informative) Information for the t
26、est generator specification 57 Annex F (informative) Test setup for large EUTs 58 BS EN 61000-4-6:201461000-4-6 IEC:2013 3 Annex G (informative) Measurement uncertainty of the voltage test level . 61 Annex H (informative) Measurement of AE impedance . 72 Annex I (informative) Port to port injection
27、. 76 Annex J (informative) Amplifier compression and non-linearity . 78 Bibliography 83 Figure 1 Immunity test to RF conducted disturbances 12 Figure 2 Open circuit waveforms at the EUT port of a coupling device for test level 1 . 13 Figure 3 Test generator setup 15 Figure 4 Principle of coupling an
28、d decoupling 18 Figure 5 Principle of coupling and decoupling according to the clamp injection method . 20 Figure 6 Example of circuit for level setting setup in a 150 test jig 21 Figure 7 Example circuit for evaluating the performance of the current clamp 22 Figure 8 Details of setups and component
29、s to verify the essential characteristics of coupling and decoupling devices and the 150 to 50 adapters . 25 Figure 9 Setup for level setting 27 Figure 10 Example of test setup with a single unit EUT (top view) 29 Figure 11 Example of a test setup with a multi-unit EUT (top view) 30 Figure 12 Rules
30、for selecting the injection method . 31 Figure 13 Immunity test to 2-port EUT (when only one CDN can be used) 33 Figure 14 General principle of a test setup using clamp injection devices 34 Figure 15 Example of the test unit locations on the ground plane when using injection clamps (top view) 35 Fig
31、ure A.1 Example: Construction details of the EM clamp . 40 Figure A.2 Example: Concept of the EM clamp 41 Figure A.3 Dimension of a reference plane 42 Figure A.4 Test jig . 42 Figure A.5 Test jig with inserted clamp . 42 Figure A.6 Impedance / decoupling factor measurement setup . 43 Figure A.7 Typi
32、cal examples for clamp impedance, 3 typical clamps 44 Figure A.8 Typical examples for decoupling factors, 3 typical clamps . 45 Figure A.9 Normalization setup for coupling factor measurement . 45 Figure A.10 S21coupling factor measurement setup 46 Figure A.11 Typical examples for coupling factor, 3
33、typical clamps 46 Figure A.12 Decoupling clamp characterization measurement setup . 47 Figure A.13 Typical examples for the decoupling clamp impedance . 47 Figure A.14 Typical examples for decoupling factors 48 Figure B.1 Start frequency as function of cable length and equipment size 50 Figure D.1 E
34、xample of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5) . 53 Figure D.2 Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used with unscreened supply (mains) lines (see 6.2.2.2) . 53 Figure D.3 Example of a simplified diagram for the circuit of
35、CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4) . 54 BS EN 61000-4-6:2014 4 61000-4-6 IEC:2013 Figure D.4 Example of a simplified diagram for the circuit of a CDN-T2, used with an unscreened balanced pair (see 6.2.2.3) 54 Figure D.5 Example of a simplified diagram of the circuit of a CDN
36、-T4 used with unscreened balanced pairs (see 6.2.2.3) 55 Figure D.6 Example of a simplified diagram of the circuit of a CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4) . 55 Figure D.7 Example of a simplified diagram of the circuit of a CDN-T8 used with unscreened balanced pairs (see 6.2.
37、2.3) 56 Figure F.1 Example of large EUT test setup with elevated horizontal reference ground plane . 59 Figure F.2 Example of large EUT test setup with vertical reference ground plane . 60 Figure G.1 Example of influences upon voltage test level using CDN . 62 Figure G.2 Example of influences upon v
38、oltage test level using EM clamp . 62 Figure G.3 Example of influences upon voltage test level using current clamp . 63 Figure G.4 Example of influences upon voltage test level using direct injection 63 Figure G.5 Circuit for level setting setup 64 Figure H.1 Impedance measurement using a voltmeter
39、73 Figure H.2 Impedance measurement using a current probe 74 Figure I.1 Example of setup, port-port injection 77 Figure J.1 Amplifier linearity measurement setup . 80 Figure J.2 Linearity characteristic 81 Figure J.3 Measurement setup for modulation depth 81 Figure J.4 Spectrum of AM modulated signa
40、l . 82 Table 1 Test levels . 13 Table 2 Characteristics of the test generator 14 Table 3 Main parameter of the combination of the coupling and decoupling device . 15 Table 4 Usage of CDNs . 18 Table B.1 Main parameter of the combination of the coupling and decoupling device when the frequency range
41、of test is extended above 80 MHz 49 Table E.1 Required power amplifier output power to obtain a test level of 10 V 57 Table G.1 CDN level setting process 65 Table G.2 CDN test process 65 Table G.3 EM clamp level setting process 67 Table G.4 EM clamp test process . 67 Table G.5 Current clamp level se
42、tting process . 68 Table G.6 Current clamp test process 69 Table G.7 Direct injection level setting process 70 Table G.8 Direct injection test process . 70 Table H.1 Impedance requirements for the AE . 72 Table H.2 Derived voltage division ratios for AE impedance measurements . 73 Table H.3 Derived
43、voltage ratios for AE impedance measurements 74 BS EN 61000-4-6:201461000-4-6 IEC:2013 7 INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environm
44、ent Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techni
45、ques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards or as technical specifications or technical repor
46、ts, some of which have already been published as sections. Others will be published with the part number followed by a dash and a second number identifying the subdivision (example: IEC 61000-6-1). This part is an international standard which gives immunity requirements and test procedures related t
47、o conducted disturbances induced by radio-frequency fields. BS EN 61000-4-6:2014 8 61000-4-6 IEC:2013 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-6: Testing and measurement techniques Immunity to conducted disturbances, induced by radio-frequency fields 1 Scope This part of IEC 61000 relates to the c
48、onducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least one conducting wire and/or cable (such as mains supply, signal line
49、or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. NOTE 1 Test methods are defined in this part of IEC 61000 to assess the effect that conducted disturbing signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these conducted disturbances are no
