1、BSI Standards PublicationDetermination of certain substances in electrotechnicalproductsPart 3-1: Screening Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometryBS EN 62321-3-1:2014The UK participation in its preparation was entrusted to TechnicalCommittee GEL/1
2、11, Electrotechnical environment committee.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards
3、 Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 71853 3ICS 13.020; 43.040.10Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 May 2014.Ame
4、ndments/corrigenda issued since publicationDate Text affectedNational forewordThis British Standard is the UK implementation of EN 62321-3-1:2014.It is identical to IEC 62321-3-1:2013.Together with BS EN 62321-1:2013, BS EN 62321-2:2014, BS EN 62321-3-2:2014, BS EN 62321-4:2014, BS EN 62321-5:2014,
5、BS EN 62321-7-1, BS EN62321-7-2 and BS EN 62321-8 it supersedes BS EN 62321:2009, which willbe withdrawn upon publication of all parts of the BS EN 62321 series.BRITISH STANDARDBS EN 62321-3-1:2014EUROPEAN STANDARD EN 62321-3-1 NORME EUROPENNE EUROPISCHE NORM April 2014 CENELEC European Committee fo
6、r Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels 2014 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC
7、 members. Ref. No. EN 62321-3-1:2014 E ICS 13.020; 43.040.10 Supersedes EN 62321:2009 (partially) English version Determination of certain substances in electrotechnical products - Part 3-1: Screening - Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry (IEC
8、62321-3-1:2013) Dtermination de certaines substances dans les produits lectrotechniques - Partie 3-1: Mthodes dessai - Plomb, du mercure, du cadmium, du chrome total et du brome total par la spectromtrie par fluorescence X (CEI 62321-3-1:2013) Verfahren zur Bestimmung von bestimmten Substanzen in Pr
9、odukten der Elektrotechnik - Teil 3-1: Screening - Blei, Quecksilber, Cadmium, Gesamtchrom und Gesamtbrom durch Rntgenfluoreszenz-Spektrometrie (IEC 62321-3-1:2013) This European Standard was approved by CENELEC on 2013-11-15. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulat
10、ions which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC mem
11、ber. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versio
12、ns. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
13、Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 62321-3-1:2014EN 62321-3-1:2014 - 2 - Foreword The text of document 111/298/FDIS, future edition 1 of IEC 62321-3-1, prepared by IEC/TC 111 “Environmental standardizat
14、ion for electrical and electronic products and systems“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62321-3-1:2014. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standa
15、rd or by endorsement (dop) 2014-10-25 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-11-15 EN 62321-3-1:2014 is a partial replacement of EN 62321:2009, forming a structural revision and generally replacing Clauses 6 and Annex D. Future parts
16、 in the EN 62321 series will gradually replace the corresponding clauses in EN 62321:2009. Until such time as all parts are published, however, EN 62321:2009 remains valid for those clauses not yet re-published as a separate part. Attention is drawn to the possibility that some of the elements of th
17、is document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62321-3-1:2013 was approved by CENELEC as a European Standard without any modification. BS EN
18、 62321-3-1:2014EN 62321-3-1:2014 - 2 - Foreword The text of document 111/298/FDIS, future edition 1 of IEC 62321-3-1, prepared by IEC/TC 111 “Environmental standardization for electrical and electronic products and systems“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN
19、 62321-3-1:2014. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-10-25 latest date by which the national standards conflicting with the document have to be withdrawn
20、 (dow) 2016-11-15 EN 62321-3-1:2014 is a partial replacement of EN 62321:2009, forming a structural revision and generally replacing Clauses 6 and Annex D. Future parts in the EN 62321 series will gradually replace the corresponding clauses in EN 62321:2009. Until such time as all parts are publishe
21、d, however, EN 62321:2009 remains valid for those clauses not yet re-published as a separate part. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such pa
22、tent rights. Endorsement notice The text of the International Standard IEC 62321-3-1:2013 was approved by CENELEC as a European Standard without any modification. BS EN 62321-3-1:2014- 3 - EN 62321-3-1:2014 Annex ZA (normative) Normative references to international publications with their correspond
23、ing European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any am
24、endments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 62321-1 - Determination of certain substances in electrotechnical products - Part 1: Introduction and overview EN
25、 62321-1 - IEC 62321-2 - Determination of certain substances in electrotechnical products - Part 2: Disassembly, disjunction and mechanical sample preparation EN 62321-2 - ISO/IEC Guide 98-1 - Uncertainty of measurement - Part 1: Introduction to the expression of uncertainty in measurement - - BS EN
26、 62321-3-1:2014 2 62321-3-1 IEC:2013 CONTENTS INTRODUCTION . 7 1 Scope . 8 2 Normative references . 10 3 Terms, definitions and abbreviations 10 4 Principle . 10 Overview . 10 4.1Principle of test . 11 4.2Explanatory comments 11 4.35 Apparatus, equipment and materials . 12 XRF spectrometer . 12 5.1M
27、aterials and tools 12 5.26 Reagents 12 7 Sampling 12 General . 12 7.1Non-destructive approach 12 7.2Destructive approach. 12 7.38 Test procedure . 13 General . 13 8.1Preparation of the spectrometer 13 8.2Test portion . 14 8.3Verification of spectrometer performance 14 8.4Tests . 15 8.5Calibration .
28、15 8.69 Calculations . 16 10 Precision 17 General . 17 10.1Lead 17 10.2Mercury . 17 10.3Cadmium . 17 10.4Chromium 18 10.5Bromine. 18 10.6Repeatability statement for five tested substances sorted by type of tested 10.7material . 18 General . 18 10.7.1Material: ABS (acrylonitrile butadiene styrene), a
29、s granules and 10.7.2plates 18 Material: PE (low density polyethtylene), as granules 19 10.7.3Material: PC/ABS (polycarbonate and ABS blend), as granules . 19 10.7.4Material: HIPS (high impact polystyrene) . 19 10.7.5Material: PVC (polyvinyl chloride), as granules 19 10.7.6Material: Polyolefin, as g
30、ranules 19 10.7.7Material: Crystal glass . 20 10.7.8Material: Glass 20 10.7.9Material: Lead-free solder, chips 20 10.7.10BS EN 62321-3-1:2014 2 62321-3-1 IEC:2013 CONTENTS INTRODUCTION . 7 1 Scope . 8 2 Normative references . 10 3 Terms, definitions and abbreviations 10 4 Principle . 10 Overview . 1
31、0 4.1Principle of test . 11 4.2Explanatory comments 11 4.35 Apparatus, equipment and materials . 12 XRF spectrometer . 12 5.1Materials and tools 12 5.26 Reagents 12 7 Sampling 12 General . 12 7.1Non-destructive approach 12 7.2Destructive approach. 12 7.38 Test procedure . 13 General . 13 8.1Preparat
32、ion of the spectrometer 13 8.2Test portion . 14 8.3Verification of spectrometer performance 14 8.4Tests . 15 8.5Calibration . 15 8.69 Calculations . 16 10 Precision 17 General . 17 10.1Lead 17 10.2Mercury . 17 10.3Cadmium . 17 10.4Chromium 18 10.5Bromine. 18 10.6Repeatability statement for five test
33、ed substances sorted by type of tested 10.7material . 18 General . 18 10.7.1Material: ABS (acrylonitrile butadiene styrene), as granules and 10.7.2plates 18 Material: PE (low density polyethtylene), as granules 19 10.7.3Material: PC/ABS (polycarbonate and ABS blend), as granules . 19 10.7.4Material:
34、 HIPS (high impact polystyrene) . 19 10.7.5Material: PVC (polyvinyl chloride), as granules 19 10.7.6Material: Polyolefin, as granules 19 10.7.7Material: Crystal glass . 20 10.7.8Material: Glass 20 10.7.9Material: Lead-free solder, chips 20 10.7.10BS EN 62321-3-1:201462321-3-1 IEC:2013 3 Material: Si
35、/Al Alloy, chips . 20 10.7.11Material: Aluminum casting alloy, chips . 20 10.7.12Material: PCB Printed circuit board ground to less than 250 m 20 10.7.13Reproducibility statement for five tested substances sorted by type of tested 10.8material . 20 General . 20 10.8.1Material: ABS (Acrylonitrile but
36、adiene styrene), as granules and 10.8.2plates 21 Material: PE (low density polyethtylene), as granules 21 10.8.3Material: PC/ABS (Polycarbonate and ABS blend), as granules . 21 10.8.4Material: HIPS (high impact polystyrene) . 21 10.8.5Material: PVC (polyvinyl chloride), as granules 22 10.8.6Material
37、: Polyolefin, as granules 22 10.8.7Material: Crystal glass . 22 10.8.8Material: Glass 22 10.8.9Material: Lead-free solder, chips 22 10.8.10Material: Si/Al alloy, chips . 22 10.8.11Material: Aluminum casting alloy, chips . 22 10.8.12Material: PCB Printed circuit board ground to less than 250 m 22 10.
38、8.1311 Quality control 23 Accuracy of calibration 23 11.1Control samples 23 11.212 Special cases . 23 13 Test report 23 Annex A (informative) Practical aspects of screening by X-ray fluorescence spectrometry (XRF) and interpretation of the results . 25 Annex B (informative) Practical examples of scr
39、eening with XRF . 31 Bibliography 40 Figure B.1 AC power cord, X-ray spectra of sampled sections . 32 Figure B.2 RS232 cable and its X-ray spectra 33 Figure B.3 Cell phone charger shown partially disassembled . 34 Figure B.4 PWB and cable of cell phone charger . 35 Figure B.5 Analysis of a single so
40、lder joint on a PWB 36 Figure B.6 Spectra and results obtained on printed circuit board with two collimators 36 Figure B.7 Examples of substance mapping on PWBs . 38 Figure B.8 SEM-EDX image of Pb free solder with small intrusions of Pb (size = 30 m) . 39 Table 1 Tested concentration ranges for lead
41、 in materials 8 Table 2 Tested concentration ranges for mercury in materials 9 Table 3 Tested concentration ranges for cadmium in materials . 9 Table 4 Tested concentration ranges for total chromium in materials 9 Table 5 Tested concentration ranges for total bromine in materials 9 Table 6 Recommend
42、ed X-ray lines for individual analytes 14 Table A.1 Effect of matrix composition on limits of detection of some controlled elements . 26 BS EN 62321-3-1:2014 4 62321-3-1 IEC:2013 Table A.2 Screening limits in mg/kg for regulated elements in various matrices . 27 Table A.3 Statistical data from IIS2
43、29 Table A.4 Statistical data from IIS4 30 Table B.1 Selection of samples for analysis of AC power cord . 32 Table B.2 Selection of samples (testing locations) for analysis after visual inspection Cell phone charger. 34 Table B.3 Results of XRF analysis at spots (1) and (2) as shown in Figure B.6 37
44、 BS EN 62321-3-1:2014 4 62321-3-1 IEC:2013 Table A.2 Screening limits in mg/kg for regulated elements in various matrices . 27 Table A.3 Statistical data from IIS2 29 Table A.4 Statistical data from IIS4 30 Table B.1 Selection of samples for analysis of AC power cord . 32 Table B.2 Selection of samp
45、les (testing locations) for analysis after visual inspection Cell phone charger. 34 Table B.3 Results of XRF analysis at spots (1) and (2) as shown in Figure B.6 37 BS EN 62321-3-1:201462321-3-1 IEC:2013 7 INTRODUCTION The widespread use of electrotechnical products has drawn increased attention to
46、their impact on the environment. In many countries this has resulted in the adaptation of regulations affecting wastes, substances and energy use of electrotechnical products. The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl ethers (PBDEs) in electrotechnical p
47、roducts, is a source of concern in current and proposed regional legislation. The purpose of the IEC 62321 series is therefore to provide test methods that will allow the electrotechnical industry to determine the levels of certain substances of concern in electrotechnical products on a consistent g
48、lobal basis. WARNING Persons using this International Standard should be familiar with normal laboratory practice. This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user to establish appropriate safety and health pr
49、actices and to ensure compliance with any national regulatory conditions. BS EN 62321-3-1:2014 8 62321-3-1 IEC:2013 DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS Part 3-1: Screening Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry 1 Scope Part 3-1 of IEC 62321 describes the screening analysis of five substances, specifically lead (Pb), mercury (Hg), cadmium (Cd), total chromium (Cr) and total bro
