1、BRITISH STANDARD BS EN ISO 12085:1997 Incorporating Geometric Product Specification (GPS) Surface texture: Profile method Motif parameters ICS 17.040.20corrigendum June 1998 ; 25.220.20BS EN ISO 12085:1997 This British Standard published under the authority of the Standards Board and comes into effe
2、ct on 15 March 1997 Amendments/corrigenda issued since publication Amd. No. Date Comments 9951 May 1998 National foreword This British Standard is the UK implementation of EN ISO 12085:199 is identical with ISO 12085:1996, incorporating corrigendum June 1998. the text by tags. Text altered by ISO co
3、rrigendum June 1998 is indicated in The UK participation in its preparation was entrusted to Technical Committee MTE/27, Properties and metrology of surfaces. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to inclu
4、de all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard cannot confer immunity from legal obligations. The start and finish of text introduced or altered by corrigendum is indicated in the text by . BSI 2009 ISBN 978 0 580
5、65219 6 as BS EN ISO 12085:1998 This amendment renumbers BS ISO 12085:1996 Implementation of ISO corrigendum June 1998 7. It 31 July 2009was and BS publication date aligned with the CEN standardEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN ISO 12085 December 1997 ICS 17.040.20 Descriptors: Se
6、e ISO document English version Geometrical product specification (GPS) Surface texture: Profile method Motif parameters (ISO 12085:1996) Spcification gomtrique des produits (GPS) Etat de surface: Mthode du profil Paramtres lis aux motifs (ISO 12085:1996) Geometrische Produktspezifikationen (GPS) Obe
7、rflchenbeschaffenheit: Tastschnittverfahren Motifkenngren (ISO 12085:1996) This European Standard was approved by CEN on 2 November 1997. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a nationa
8、l standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CEN member. This European Standard exists in three official versions (English, French, German). A version in any o
9、ther language made by translation under the responsibility of a CEN member into its own language and notified to the Central Secretariat has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany,
10、 Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CEN European Committee for Standardization Comit Europen de Normalisation Europisches Komitee fr Normung Central Secretariat: rue de Stassart 36, B-1050 Brussels 1997 CEN All r
11、ights of exploitation in any form any by any means reserved worldwide for CEN national Members. Ref. No. EN ISO 12085:1997 EN I S O 1 2 0 8 5 : 1 9 9 7 BSI 05-1999 Foreword The text of the International Standard from Technical Committee ISO/TC 57 “Metrology and properties of surfaces” of the Interna
12、tional Organization for Standardization (ISO) has been taken over as a European Standard by Technical Committee CEN/TC 290 “Dimensional and geometrical product specification and verification”, the secretariat of which is held by DIN. This European Standard shall be given the status of a national sta
13、ndard, either by publication of an identical text or by endorsement, at the latest by June 1998, and conflicting national standards shall be withdrawn at the latest by June 1998. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bo
14、und to implement this European Standard: Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom. Endorsement notice The text of the International Standard ISO 1
15、2085:1996 has been approved by CEN as a European Standard without any modification. BS EBS EN ISO 12085:1997 ii B S I 0 5 - 1 9 9 9 Contents Page Introduction 1 1 Scope 1 2 Normative references 1 3 Definitions 1 3.1 General definitions 1 3.2 Parameter definitions 4 4 Theoretically exact operator of
16、the motif method 5 4.1 General 5 4.2 Conventional limits of motifs 5 4.3 Depth discrimination 5 4.4 Identification of roughness and waviness motifs through the combination of motifs 7 4.5 Procedure for parameter calculation 9 5 Measuring conditions of parameters 11 5.1 Convention concerning traversi
17、ng the primary profile 11 5.2 Recommended measurement conditions 11 5.3 Profile quantization step 11 5.4 Rule for acceptance 11 5.5 Use of motifs method for analysis of multiprocess surfaces 11 5.6 Indications on the drawings 11 Annex A (normative) Calculation method for combination of motifs 12 Ann
18、ex B (informative) Relation between motif parameters and function of surfaces 14 Annex C (informative) Relation to the GPS matrix model 14 Annex D (informative) Bibliography 15 Figure 1 Local peak of profile 2 Figure 2 Local valley of profile 2 Figure 3 Roughness motif 3 Figure 4 Upper envelope line
19、 3 Figure 5 Waviness motif 3 Figure 6 Roughness parameters 4 Figure 7 Waviness parameters 5 Figure 8 Conventional limits of motifs 6 Figure 9 Depth discrimination 6 Figure 10 Discrimination based on maximum depth 7 Figure 11 Combination of motifs 8 Figure 12 Illustration of procedure for parameter c
20、alculation 10 Figure A.1 Combination of motifs 13 Figure C.1 15 Table 1 11 Table B.1 14BS EN ISO 12085:1997 BSI 05-1999 1 Introduction This International Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences l
21、inks 2, 3 and 4 of the surface texture chain of standards on roughness profile and waviness profile. For more detailed information of the relation of this International Standard to other GPS standards, see Annex C. The approach described in this International Standard facilitates the determining rou
22、ghness and waviness parameters from the primary profile by finding those motifs which characterize the surface under consideration. This method is independent of any profile filter and results in parameters which are based on the depth and spacing of the motifs. These parameters, which are complemen
23、tary to those defined in ISO 4287, can be used to describe the functional properties of workpieces as indicated in Annex B. 1 Scope This International Standard defines terms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator an
24、d measuring conditions. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to
25、agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. ISO 1302:1992, Technical drawings Method of indic
26、ating surface texture. ISO 3274:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments. definitions and parameters of surface texture. ISO 4288:1996, Geometrical Product Specifications (GPS) Surface texture: Profile meth
27、od Rules and procedures for the assessment of surface texture. 3 Definitions For the purposes of this International Standard the following definitions apply. 3.1 General definitions 3.1.1 surface profile (see ISO 4287.) 3.1.2 primary profile (see ISO 3274.) 3.1.3 local peak of profile a part of a pr
28、ofile between two adjacent minima of the profile (see Figure 1) 3.1.4 local valley of profile a part of a profile between two adjacent maxima of the profile (see Figure 2) ISO 4287: 1997 , Geometrical Product Specifications (GPS) Surface texture: Profile method Terms, BS EN ISO 12085:1997 2 BSI 05-1
29、999 3.1.5 motif a portion of the primary profile between the highest points of two local peaks of the profile, which are not necessarily adjacent a motif is characterized by (see Figure 3 and Figure 5): its length, AR ior AW i , measured parallel to the general direction of the profile; its two dept
30、hs, H jand H j + 1 , or Hw jand Hw j+ 1 , measured perpendicular to the general direction of the primary profile; its T characteristic, that is the smallest depth between the two depths. 3.1.6 roughness motif motif derived by using the ideal operator with limit value A (see Figure 3) NOTE 1 By this
31、definition, a roughness motif has a length AR ismaller than or equal to A. 3.1.7 upper envelope line of the primary profile (waviness profile) straight lines joining the highest points of peaks of the primary profile, after conventional discrimination of peaks (see Figure 4) 3.1.8 waviness motif mot
32、if derived on the upper envelope line by using the ideal operator with limit value B (see Figure 5) Figure 1 Local peak of profile Figure 2 Local valley of profileBS EN ISO 12085:1997 BSI 05-1999 3 Figure 3 Roughness motif Figure 4 Upper envelope line Figure 5 Waviness motifBS EN ISO 12085:1997 4 BS
33、I 05-1999 3.2 Parameter definitions 3.2.1 mean spacing of roughness motifs, AR the arithmetical mean value of the lengths AR iof roughness motifs, within the evaluation length (see Figure 6), i.e. where n is the number of roughness motifs (equal to the number of AR ivalues) 3.2.2 mean depth of rough
34、ness motifs, R the arithmetical mean value of the depths H jof roughness motifs, within the evaluation length (see Figure 6), i.e. where m is the number of H jvalues NOTE 2 The number of H jvalues is twice the number of AR ivalues (m= 2 n). 3.2.3 maximum depth of profile irregularity, Rx the largest
35、 depth, H j , within the evaluation length EXAMPLE on Figure 6: Rx = H 3 3.2.4 mean spacing of waviness motifs, AW the arithmetical mean value of the lengths AW iof waviness motifs, within the evaluation length (see Figure 7), i.e. where n is the number of waviness motifs (equal to the number of AW
36、ivalues) Figure 6 Roughness parametersBS EN ISO 12085:1997 BSI 05-1999 5 3.2.5 mean depth of waviness motifs, W the arithmetical mean value of the depths Hw jof waviness motifs, within the evaluation length (see Figure 7), i.e. where m is the number of Hw jvalues NOTE 3 The number of Hw jvalues is t
37、wice the number of AW ivalues (m= 2 n). 3.2.6 maximum depth of waviness, Wx the largest depth Hw j , within the evaluation length (see Figure 7) 3.2.7 total depth of waviness, Wte the distance, measured in a direction perpendicular to the general direction of the primary profile, between the highest
38、 point and the lowest point of the upper envelope line of the primary profile (see Figure 7) 4 Theoretically exact operator of the motif method 4.1 General This clause describes the identification conditions of motifs (length and depth discrimination) and presents the process for calculating roughne
39、ss and waviness parameters. 4.2 Conventional limits of motifs The recommended values for limits A and B as described in Figure 8 are given under clause 5. 4.3 Depth discrimination The depth discrimination applies to the primary profile for the assessment of surface roughness. 4.3.1 Discrimination ba
40、sed on minimum depth Divide the primary profile into sections of width A/2, and take the height of each rectangle. The local peaks taken into account are those whose depth is larger than 5 % of the mean height of these rectangles (see Figure 9). Figure 7 Waviness parametersBS EN ISO 12085:1997 6 BSI
41、 05-1999 4.3.2 Discrimination based on maximum depth For the roughness motifs the depths of which are H j , the value (mean value of H j ) and BH j(standard deviation) are calculated. Any depth of local peak or valley the value of which is larger than BH j , is levelled equal to the H value (see Fig
42、ure 10). NOTE 4 If the distribution of H jis Gaussian this condition concerns 5 % of the peaks and valleys. This discrimination obviates the risk of high isolated peaks interfering with the envelope line. Figure 8 Conventional limits of motifs Figure 9 Depth discrimination H j H H j 1 6 5 , + =BS EN
43、 ISO 12085:1997 BSI 05-1999 7 4.4 Identification of roughness and waviness motifs through the combination of motifs (These four conditions are related to Figure 11.) In Figure 11, R stands for roughness and W for waviness. I Envelope condition The first condition retains peaks, which are higher than
44、 one of the adjacent peaks. II Length condition The second condition limits the length of motif to the A value (conventional limit between roughness and waviness) or the B value (conventional limit between waviness and residual form), as defined in 4.2 and 5.2. III Enlargement condition The third co
45、ndition eliminates the smallest peaks, by trying to find the largest motif possible. It does not allow the combining of two motifs into one motif, longer than the two original ones, if it results in a motif the T characteristic of which is smaller than one of the two original motifs. (It eliminates
46、small peaks which are inserted between large peaks.) IV Similar depth condition The fourth condition limits combination of motifs with similar depths, particularly for periodical surfaces. (It avoids eliminating peaks the depth of which is similar to adjacent peaks.) The combination algorithm shall
47、be applied until no further combination can be accomplished. Figure 10 Discrimination based on maximum depthBS EN ISO 12085:1997 8 BSI 05-1999 Figure 11 Combination of motifsBS EN ISO 12085:1997 BSI 05-1999 9 4.5 Procedure for parameter calculationBS EN ISO 12085:1997 10 BSI 05-1999 Figure 12 Illust
48、ration of procedure for parameter calculationBS EN ISO 12085:1997 BSI 05-1999 11 5 Measuring conditions of parameters 5.1 Convention concerning traversing the primary profile In order to calculate waviness parameters, the primary profile shall be measured relative to a reference guide (see ISO 3274)
49、. 5.2 Recommended measurement conditions The recommended measurement conditions (see ISO 3274) are stated in Table 1. Table 1 5.3 Profile quantization step The parameters covered by this standard are only valid if the primary profile contains a minimum of 150 vertical quantization steps. 5.4 Rule for acceptance The 16 % rule given in ISO 4288 applies for motif parameters. 5.5 Use of motifs method for analysis of multiprocess surfaces The corrected uppe
