1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS ISO/IEC 18047-2:2012Information technology Radio frequency identificationdevice conformance testmethodsPart 2: Test methods for air interfacecommunications below 135 kHzBS ISO
2、/IEC 18047-2:2012 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of . It supersedes PDISO/IEC TR18047-2:2006 which is withdrawn.The UK participation in its preparation was entrusted to TechnicalCommittee IST/34, Automatic identification and data capturetechniques.A l
3、ist of organizations represented on this committee can beobtained on request to its secretary.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. The British Standards Institution 2012. Published by BSI StandardsLi
4、mited 2012ISBN 978 0 580 73296 6ICS 35.040Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 29 February 2012.Amendments issued since publicationDate Text affectedBS
5、ISO/IEC 18047-2:2012Reference numberISO/IEC 18047-2:2012(E)ISO/IEC 2012INTERNATIONAL STANDARD ISO/IEC18047-2First edition2012-01-15Information technology Radio frequency identification device conformance test methods Part 2: Test methods for air interface communications below 135 kHz Technologies de
6、 linformation Mthodes dessai de conformit du dispositif didentification de radiofrquence Partie 2: Mthodes dessai pour des communications dune interface dair moins de 135 kHz BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2012 All rights reserved. Unless otherwis
7、e specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright of
8、fice Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2012 All rights reservedBS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) ISO/IEC 2012 All rights reserved iiiContents Page Foreword . v Introd
9、uction vi 1 Scope 1 2 Normative references 1 3 Terms, definitions, symbols and abbreviated terms . 2 3.1 Terms and definitions . 2 3.2 Symbols 2 3.3 Abbreviated terms . 2 4 Conformance tests for ISO/IEC 18000-2 below 135 kHz . 3 4.1 General . 3 4.2 Default conditions applicable to the test methods 3
10、 4.2.1 Test environment . 3 4.2.2 Pre-conditioning 3 4.2.3 Default tolerance . 3 4.2.4 Spurious inductance . 3 4.2.5 Noise floor at test location . 3 4.2.6 Total measurement uncertainty . 3 4.3 Setup of test equipment for tag tests 4 4.3.1 Parameter definition 4 4.3.2 Test equipment configuration 4
11、4.4 Test methods for tags . 11 4.4.1 Tag Orientation 11 4.5 Test procedure for tags 11 4.5.1 Calibrating null compensation . 11 4.5.2 Minimum activating magnetic field strength in FDX mode . 13 4.5.3 Minimal activating magnetic field strength in HDX mode . 13 4.5.4 Level of tag response in FDX mode
12、14 4.5.5 Level of tag response in HDX mode 15 4.5.6 Tag waiting time for FDX mode 16 4.5.7 Tag waiting time for HDX mode . 16 4.6 Equipment for interrogator tests . 17 4.6.1 Tag Emulation Circuit . 17 4.7 Methods for interrogator tests . 17 4.7.1 Verification of reading . 17 4.7.2 Tag Orientation 17
13、 4.8 Test procedure for interrogator . 18 4.8.1 Modulation index and waveform 18 4.8.2 Power generation for FDX (informative) . 18 4.8.3 Power generation for HDX (informative) . 19 4.8.4 Response detection for FDX 19 4.8.5 Response detection for HDX 19 Annex A (normative) Design description of the t
14、ag emulation circuits 20 A.1 Reference air-cored antenna 20 A.2 FDX Tag Emulation Circuit . 20 A.2.1 General . 20 A.2.2 Set up trimming . 22 A.3 The HDX Tag Emulation Circuit . 22 A.3.1 General . 22 A.3.2 Working principle of the HDX Tag Emulation Circuit 23 BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:20
15、12(E) iv ISO/IEC 2012 All rights reservedA.3.3 Set up and trimming procedure for the HDX emulation 23 Annex B (informative) Program for the evaluation of the spectrum 25 Bibliography 29 BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) ISO/IEC 2012 All rights reserved vForeword ISO (the International O
16、rganization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the
17、 respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of inf
18、ormation technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prepare International Standards. Draft Internat
19、ional Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document m
20、ay be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. ISO/IEC 18047-2 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 31, Automatic identification and data capture techniques. This
21、 first edition of ISO/IEC 18047-2 cancels and replaces ISO/IEC TR 18047-2:2006, which has been technically revised. ISO/IEC 18047 consists of the following parts, under the general title Information technology Radio frequency identification device conformance test methods: Part 2: Test methods for a
22、ir interface communications below 135 kHz Part 3: Test methods for air interface communications at 13,56 MHz Technical Report Part 4: Test methods for air interface communications at 2,45 GHz Technical Report Part 6: Test methods for air interface communications at 860 MHz to 960 MHz Technical Repor
23、t Part 7: Test methods for active air interface communications at 433 MHz Technical Report BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) vi ISO/IEC 2012 All rights reservedIntroduction ISO/IEC 18000 defines the air interfaces for radio frequency identification (RFID) devices used in item management
24、 applications. ISO/IEC 18000-2 defines the air interface for these devices operating in frequencies below 135 kHz. The purpose of ISO/IEC 18047 is to provide test methods for conformance with the various parts of ISO/IEC 18000. Each part of ISO/IEC 18047 contains all measurements required to be made
25、 on a product in order to establish whether it conforms with the corresponding part of ISO/IEC 18000. For this part of ISO/IEC 18047, each interrogator needs to be assessed with tags of both type A (FDX) and type B (HDX), while each tag needs to be assessed either with type A (FDX) or type B (HDX).
26、It should be noted that measurement of tag and interrogator performance is covered by ISO/IEC 18046. BS ISO/IEC 18047-2:2012INTERNATIONAL STANDARD ISO/IEC 18047-2:2012(E) ISO/IEC 2012 All rights reserved 1Information technology Radio frequency identification device conformance test methods Part 2: T
27、est methods for air interface communications below 135 kHz 1 Scope This part of ISO/IEC 18047 defines test methods for determining the conformance of radio frequency identification (RFID) devices (tags and interrogators) for item management with the specifications given in ISO/IEC 18000-2, but does
28、not apply to the testing of conformity with regulatory or similar requirements. The test methods require only that the mandatory functions, and any optional functions which are implemented, be verified. This may, in appropriate circumstances, be supplemented by further, application-specific function
29、ality criteria that are not available in the general case. The interrogator and tag conformance parameters in this part of ISO/IEC 18047 are the following: mode-specific conformance parameters including nominal values and tolerances; parameters that apply directly affecting system functionality and
30、inter-operability. The following are not included in this part of ISO/IEC 18047: parameters that are already included in regulatory test requirements; high-level data encoding conformance test parameters (these are specified in ISO/IEC 15962). Unless otherwise specified, the tests in this part of IS
31、O/IEC 18047 are to be applied exclusively to RFID tags and interrogators defined in ISO/IEC 18000-2. Clause 4 describes all necessary conformance tests. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the ed
32、ition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 18000-2, Information technology Radio frequency identification for item management Part 2: Parameters for air interface communications below 135 kHz ISO/IEC 19762 (a
33、ll parts), Information technology Automatic identification and data capture (AIDC) techniques Harmonized vocabulary ISO/IEC Guide 98-3, Uncertainty of measurement Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) 2 ISO/IEC 2012 Al
34、l rights reserved3 Terms, definitions, symbols and abbreviated terms 3.1 Terms and definitions For the purposes of this document, the terms and definitions given in ISO/IEC 19762 and the following apply. 3.1.1 air-cored tag tag having an antenna which uses no material to modify the antenna inductanc
35、e 3.1.2 ferrite-cored tag tag having an antenna which uses ferrite to increase antenna inductance 3.1.3 level of tag response ability of the tag to send the information to the interrogator station 3.1.4 noise floor measure, usually in decibels, of the constant level of ambient environmental energy l
36、evel present within the frequency band of interest 3.2 Symbols For the purposes of this document, the symbols given in ISO/IEC 19762 apply. 3.3 Abbreviated terms For the purposes of this document, the abbreviated terms given in ISO/IEC 19762 and the following apply. AWG arbitrary waveform generator
37、CRC cyclic redundancy check FDX full duplex FSK frequency shift keying HDX half duplex HSC Helmholtz sense coil HTA Helmholtz transmitting antenna NRZ non return to zero PC computer suitable for the conformance testing requirements, e.g., personal computer RF radio frequency SC sense coil DUT device
38、 under test BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) ISO/IEC 2012 All rights reserved 34 Conformance tests for ISO/IEC 18000-2 below 135 kHz 4.1 General This part of ISO/IEC 18047 specifies a series of tests to determine the conformance of interrogators and tags. The results of these tests sha
39、ll be compared with the values of the parameters specified in ISO/IEC 18000-2 to determine whether the interrogator or tag under test conforms. ISO/IEC 18000-1 provides a general description of air interface parameters. A tag compliant to ISO/IEC 18000-2 shall support either type A (FDX) or type B (
40、HDX). An interrogator compliant to ISO/IEC 18000-2 shall support both type A (FDX) and type B (HDX). NOTE In case an interrogator or tags does not comply to the series of tests specified in this part of ISO/IEC 18047 due to the form factors of the antennas, it is recommended to amend this document t
41、o accommodate these new application requirements by providing new geometries for the measurement setups. 4.2 Default conditions applicable to the test methods 4.2.1 Test environment Unless otherwise specified, testing shall take place in an environment of temperature 23 C 3 C (73 F 5 F) and of non-c
42、ondensing relative humidity from 40 % to 60 %. 4.2.2 Pre-conditioning Where pre-conditioning is required by the test method, the identification tags to be tested shall be conditioned to the test environment for a period of 24 hours before testing. 4.2.3 Default tolerance Unless otherwise specified,
43、a default tolerance of 5 % shall be applied to the measured values specifying the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 4.2.4 Spurious inductance In order to ensure consistent results, resistors and capacitors
44、 in the test equipment should have negligible inductance. 4.2.5 Noise floor at test location It shall be 20 dB less than signal from the DUT within the frequency band of the test when measured according the applicable regulatory requirement for that band. Special attention has to be given to spuriou
45、s emissions, e.g., insufficiently shielded computer monitors. The electromagnetic test conditions of the measurements can be checked by performing the measurements with and without a tag in the field. 4.2.6 Total measurement uncertainty The total measurement uncertainty for each quantity determined
46、by these test methods shall be stated in the test report. NOTE Basic information is given in ISO/IEC Guide 98-3. BS ISO/IEC 18047-2:2012ISO/IEC 18047-2:2012(E) 4 ISO/IEC 2012 All rights reserved4.3 Setup of test equipment for tag tests 4.3.1 Parameter definition 4.3.1.1 Minimum tag activation magnet
47、ic field strength It should be noted that this value shall be determined in order to perform the following test measurements and the recorded value is not a conformance criterion. Once placed in a magnetic field strength and depending on antenna, chip and packaging design, each tag will be activated
48、. Full functionality is obtained when the tag is supplied with enough energy to transmit correctly the information stored in the chip memory. This measurement will determine the minimum value of the magnetic field strength required to obtain the full functionality of the tag. 4.3.1.2 Level of tag re
49、sponse For FDX mode: The values of the level of tag response depend on the magnetic field strength in which the tag is placed. To get the appropriate characterisation, the level of tag response shall be monitored over different magnetic field strengths and presented as the modulation characteristic. For HDX mode: The level of tag response is defined by the average value of the level of tag response values measured for the bit 1 and the bit 0. 4.3.2 Test equipment configurat
