1、W 1974499 O54102 O29 W - OVE-CECC 30 301- 056 1 OVE-CECC 30 301-056 sterrechischer Verband fr Elektrotechnik (UVE) 1.Eschenbachgasse 9 A-1010 VIENNA Ref.No. 2222 132/133 Specification also available from: Osterr.Philips Industrie GmbH Bauelementewerk Ebentaler Strae 140 A-9020 Klagenfurt Electronic
2、components of assessed quality in accordance with: UVE-CECC 30 O00 OVE-CECC 30 360 Outline drawing: see Table I First angle projection (other shapes are permitted within the dimensions given) !+F- Circuit diagram: A case Information on the availability of COI OVE-CECC 30 301- O56 1 1st Edition, 1988
3、 page 1 of 16 ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON- SOLID ELECTROLYTE Typical construction: Polar Cylindrical Metallic case Insulated Axial wire terminations Quick reference data: Rated Capacitance (CR) range 4,7 to 470F Cap.tolerance +50/-10% Rated voltage (UR ) range 10 to 385V Climatic cat.
4、40/085/56 _ Assessment level: E Application grade: long life 50001 onents qualified to thi5 detail specification is given in the Qualified Products List (QPL) (CECC O0 200) -1- R3-HI-fflK 279.10 KDR 562362fA I- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECC
5、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-1974499 0054103 Tb5 M + case size Dimensions in mm reference Dmax2) Lmaxz) d lmi n1) 19 31 19 038 31 19 31 26 27 +O, 08 -0,05 4 6,Q 5 895 6 10,5 7 10,5 i OVE-CECC 30 301-056 SECTION ONE - GENERAL D ATA 1. 1.1 1.2 1.3
6、GENERAL DATA 1) For taped versions, the requirements of publication IEC 286-1 are to be applied 2) Including insulation sleeve RECOMMENDED METHOD OF MOUNTING (for vibration and sh oc$ testinn) The capacitors are to be clamped by their wire leads at a distance of 6 mm k 1 mm to their case. PATINGS AN
7、D CHARACTERISTICS Application grade long life, 5000h Capacitance range see Table II A Tolerance on rated capacitance +50/-10% Rated voltage range Category voltage = Rated voltage Category temperature range see Table II A -40 to +85“C -2- Copyright CENELEC Electronic Components Committee Provided by
8、IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- L974499 0054304 9TL Rated . 10 16 25 40 voltage(V) UVE-CECC 30 -301-056 63 100 200 385 Rated temperature Rated (WF) capacit. Climatic category case size reference Rated ripple current Tange
9、nt of loss angle Leakage current (after 5 min) Impedance Maximum allowable reverse voltage Table II A Values of capacitance and of voltage related to case sizes +85”C 40/085/56 see Table II B see Table II B see Table II B see Table II B 2v -3- Copyright CENELEC Electronic Components Committee Provid
10、ed by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-OVE-CECC 30 301-056 CR UR max . max . max. r.m.5. Tangent of Impedance ripple curr. at 20C and at 20C and at 85C and loss angle (QI (mA) * (MF) (V) 100 Hz 100 kHz 100 Hz 470 10 0,18 0,
11、34 380 47 0,15 2,6 92 68 0 ,.15 1,8 105 100 0,15 112 130 Table II B: Tangent of loss angle, impedance, rated ripple current and leakage current max . leakage curr. (MA) after 5min UR at 20C 32 735 11 14 150 16 0,15 0,8 2 20 0,15 0,55 3 30 0,15 0,36 22 0,13 4,1 33 0113 217 68 25 0,13 113 150 0,13 0,6
12、 220 O, 13 0,41 15 o, 10 510 33 0,lO 2,3 47 0110 1,6 68 0,lO 111 100 0,lO 0,75 150 o, 10 015 - - 40 - I 1 *) not for inspection purposes 180 18 240 25 300 36 I 60 595 80 8.3 130 14 220 27 3 10 37 55 6 95 12 110 15 160 20 200 28 300 40 -4- Copyright CENELEC Electronic Components Committee Provided by
13、 IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-m L974499 0054106 774 OVE-CECC 30 301-056 Table II B: Tangent of loss angle, impedance, rated ripple current and leakage current P CR (Ga) 497 6, E 10 15 22 33 47 68 41 i 61 E 10 15 22 33 4
14、7 41 10 L 41 max. r.m.s. ripple curr. (mA) * at 85C and 100 He max . leakage curr. (U) after 5min UR at 20C max . Tangent of loss angle at 20C and 100 nz max . Impedance (Q) at 20C an( 100 kHz 12 38 3 0,07 493 0,07 43 0,07 5,5 62 3,7 76 O,7 92 12 16 130 0,07 112 160 0,07 200 0,81 916 0,06 56 618 10
15、0,06 0,06 0106 - 67 13 17 0106 210 120 160 24 0,06 0,06 32 0196 210 40 o, 10 19 20( 38! c_ 0,lO 9 63 15 43 0,lO *) not for inspection purposes -5- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without li
16、cense from IHS-,-,-1974499 0054107 600 =VE-CECC 30 301-056 1.4 RELATED DOCUMENTS Generic specification Sectional specification CECC 30 O00 CECC 30 300 1.5 MARKING 1.5.1 The following marking information shall be given on the capacitor; coding of information in accordance with IEC-62 is permitted: -
17、Rated capacitance - Rated voltage - Polarity, - Tolerance on rated capacitance - Rated temperature - Date of manufacture - Reference to the grade (abbreviation L.L. permitted) - Manufacturers name or trade mark - Manufacturers series designation and factory or origin 1.5.2 The package containing the
18、 capacitors shall be clearly marked with the following information: - Rated capacitance - Tolerance on rated capacitance - Rated voltage - Case size reference - Climatic category - Manufacturers name and/or trademark - Manufacturers type number and factory or origin - National number and CECC-number
19、 of this detail specification 1.5.3 Any additional marking shall be so applied, that no confusion can arise. -6- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-m 1974499 00541
20、0B 547 m I Table 2B Table 4 Sub-group C3 Sub-clause 4.13 c OVE-CECC 30 301-056 Tangent of loss angle Ripple current Endurance test duration: 5000 h 1.6 ORDERING INFORMATION When ordering components to this specification, the following information shall be given: - National number of this detail spec
21、ification (Remark: The corresponding PHILIPS specifications can be found under the series number 2222 132 . for I 1OOV or 2222 133 . for 1OOV respectively). - Rated capacitance - Rated voltage - Case size reference 1.7 CERTIFIED TEST RECORDS OF RELEASED LOTS Not required. 1.8 ADDITIONAL INFORMATION
22、None. 1.9 ADDITIONAL OR INCREASED SEVERITIES OR REG! UIREME NTS TO THOSF; SPECIFIED IN THE GENERIC AND/OR SECTIONAL SPECIFICATION Table 3 Table Group/Sub-group Clause/Sub-clause additional and/or more severe requirement -7- Copyright CENELEC Electronic Components Committee Provided by IHS under lice
23、nse with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I. 2, INSPECTION REQUIREMENTS 2 1 PROCEDURES 2.1.1 For Qualification Approval the procedure shall be in accordance with 3.4 of CECC 30 300, Issue 2 at present CECC(Secretariat)i859. 2,l.Z For Quality conf
24、ormance Inspection the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of CECC 30 300, Issue 2 at present CECC(Secretariat) 18591, Notes to Tables 4A and 4B: Note 1: Clause numbers of tests and performance requ
25、ire- ments refer to CECC 30 300, Issue 2 at present CECC (Sec.)18591. Levels (AQL) are selected from IEC 410. Note 2: Inspection Levels (IL) and Acceptable Quality Note 3: In Tables 4A and 4B: P = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = d
26、estructive ND = non-destructive Note 4: This sub-group is considered ND provided that the requirements of sub-group Al and A2 are satisfied. -8- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without lice
27、nse from IHS-,-,-lause number nd test 1) - s4 ub-group Al .2 Visual examination No visual damag and no leakage of electrolyte 42 times the limit in Tabl.2 IAC/Cl510 % of value measured in 4.17.1 41,2 times the limit in Tabl.2 - - lub-group A2 I. 3.1 Leakage curr ent 1.3.2 Capacitance 1.3.3 Tangent o
28、f loss angle I. 3.4 Impedance Sub-group El +.6 Solderabilit: see Note 4 4.17 4.17. Storage at high temperature Ini t ia1 measurement measurement 4.17.3 Final I Sable 4A Lct-by-lot inspection (Group A and B) Ccnditions of test (1) rotective resistance: 7100 V: 1000n g 100 v: loon requency: 100 Hz req
29、uency : 100 Hz requency:As in Table 2E lethod: Ta 1 remperature: 85 C Duration: 96 54 h Recovery: 16 h min. Ca pac i tan ce Visual examination Leakage current Capacitance Tangent of loss angle (i), (2) and (4) : see Notes on page 8 -9- II - s3 - !,5 Performance requirements (1) As in 4.2 Legible mar
30、king snd as specified in 1.5 of this specification As specified in Table 1 of this specification As in Table 2B Within specifiec tolerance As in Table 2B As in Table 2B Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networkin
31、g permitted without license from IHS-,-,-rn 1974499 0054111 o31 rn L AGL % Clame nimber arc test (i) Tke capacitcirs shall be measure at each teEperature step. Step 1: 20 C Impedance (at 100 Iiz) Stec 2: -40 “C kpedance (at same frequency ES Step 1; Sub-moL;p B2 4.19 Characteris- tics at high and lo
32、w tem- pera ture - s3 295 erformacce 8equiren;en ts i; :or Use as 3eference value iatio with -espect to value in Step 1. (1) and (2): see Notes on page 8 - 10 - f 82-ll-M 279-10 KOR 5625/82/A Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo re
33、production or networking permitted without license from IHS-,-,-= l1974499 0054332 T8 :lause number and test (1) SUb-groUp C1A 1.1 Dimensions (detail) t.4 Robustness of terminations Q.4.1 Initial 11.5 Resistance to 4.5.2 Final measurement soldering heat measurements 4.7.1 Initial 4.7.3 Intermediate
34、measurement inspection 4.8 Vibration Takle 4B Perioaic tests Zonitions of test (Li lisual examination 40 pre-drying 4ethods: Ual, Ub, Uc Zapaci tance rest Tb 3ethod: 1 B lisual examination Zapacitance r = -40 OC r = 85 c ?ive cycles Jurat ion t = 30 Ein Fecovery: 16 h Capacitance A B 1 Visual examin
35、ation Method of mounting see 1.1 of this specification Procedure B4 Frequency range: 10 to 500Hz Amplitude: +0,75 mm 01 acceleration 98 m/s2 (whichever is the les: severe) Total duration: 3x2 h (1) and (3): see Notes on page 8 - 11 - . ;ample size : criterion If accepta- iility (3) n 9 - .8 C 1 I I
36、I 1 I I I I I I I I I 1 I i I I I I r i i 1 I 1 1 I -1 1 I I i I I I I I I I I I I I I I I ?erf ormance -equ irement s :i Ls specified in able 1 and 2A )f this specific. Io visible damage JO visible damage Aegible marking 6,CClS 5 I of ralue measurea in +.4.1 _-_-_-_-_ No visible damagt and no leaka
37、ge 01 electrolyte 82-Hi-FttK279-10 KOR 562W82:A Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I- :lause number ind test 1) 1.8.2 Final measurements 1.10 Shock 1.10.2 Final me
38、asurements 1.11.2 Canp heat, cyclic, test Cb, first cycle ii.11.3 Cold 4.11.4(3) Inter- mediate inspectioi 4.11.5 Damp heat, cyclic, test Db, rema in i ng cycles Table 4B continued onditions of test i) isual examination apaci tance ethod of mounting:see .1 of this specific. cceleration: 490 m/s2 ura
39、tion of pu1se:llms isual examination apacitance emperature: 5 “C uration: 16 h emperature: -40 C luration: 2 h isual examination (1) and (3): see Notes on page 8 - 12 - 82-iil-fflK 279-10 KDR 5625182lA ampie size criterion f accepta- ility (3) C - i I i I I I I I I I I I I ! I I I I ! l I I t i erfo
40、rmance equirements 1) o visible damage nd no leakage of lectrolyte egible marking alue measured in .7.1 4c/clr 5 5 of o visible damage nd no leakage of lectroiyte alue measured in .7.1 /CIS 5 % of I- h JO breakdown, Plashover, harm- ful deformation if case or leakage of rlec troly te Copyright CENEL
41、EC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3974499 0054114 840 = lause nurcber nd test 1) .11.7 Final ueasurements ub-group C2 .12 Damp neat, .12.1 Initial .12.2 Final steady state measu
42、rement measurements Sub-group C3 4.13 Ehdurance 4.13.1 Initial measurement Table 4B continued :onaitiorx of test 1) risual examinat ion ,eakage current :apaci tance ?angent of loss angle Zapeci tance ilisual examination Leakage current Capacitance Tangent of loss angle Impedance Insulation resistanc
43、e of the external insulation Voltage proof of the external insulation *) +) Duration: 5000 h Ambient temperature: 85 C Applied voltage: UR Recovery: 16 h min. Capacitance mple size cr i ter ion accepta- .lity (3) Performance requirements (1) No visible damage ana no leakage of electrolyte As in Tabl
44、e 2B value meausred in 4.5.2 or 4.10.2, as applicable L 1,2 times limit in Table 2B Ibc/cl- 10 % of - No visible damage and no leakage of electrolyte Legible =king As in Table 2B IAC/ClC 10 % of value measured ir 4.12.1 100 MR - - No breakdown or flashover 1 *) See sub-clause 1.9 +) Intermediate mea
45、surement and provisional approval after 2000 h (1) and (3): see Notes on page 8 - 13 - Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Lause nunber id test L) .13.3 Final measu
46、rements ;ub-group C4A 1.14 Surge 4.14.1 Initial measurement Table 4B conticued :cr,itions of test 1) risual exarcination ,eakage current :apaci tance rangent of loss angle Impeaance Insulation resistance of the external insiilation Voltage proof of the external insulation Number of cycles: 1001 Temp
47、erature: 85 C Charge voltage: l,15xUR for l,lOxUR for ,UR 315 V Duration of charge:3C Duration of discharge 5 min 30 s Recovery: 1 to 2 h Capacitance UR 5 315 V, (1) and (3): see Notes on page 8 - 14 - .mple size cri ter i on accepta- lity (3) erf orriance .equirenents :i) JO visible damage ma rio l
48、eakage of Zlectrolyte .egi ble marking Ls in Table 2B iAC/C I compared to ralues measured in 4.13.1: JO 1 tage I UR5160 +15 I- 1604U, * 10 L i,3 times limit In Table 2B f. 2 tices the limit in Table 21 - 7 100 Mn Wo breakdown or flashover Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3974499 0054LLb bL3 ;onditions of test .i I ,lause nurcber nd test 1) .,14.3 Final Keasur
