1、 REVISIONS LTR DESCRIPTION DATE APPROVED A Add device type 02. - ro 04-07-08 R. MONNIN B Make changes to Electrostatic discharge section as specified under 1.3. - ro 05-03-04 R. MONNIN Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV B B PAGE 18 19 REV B B B B B B B B B B B B
2、 B B B B B REV STATUS OF PAGES PAGE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO 43218-3990 Original date of drawing YY MM DD CHECKED BY TOM HESS APPROVED BY RAYMOND MONNIN TITLE MICROCIRCUIT, DIGITAL-LINEAR, DIFFERENTIAL
3、BUS TRANSCEIVER, MONOLITHIC SILICON SIZE A CODE IDENT. NO. 16236 DWG NO. V62/03671 03-08-21 REV B PAGE 1 OF 19 AMSC N/A 5962-V031-05 .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO.
4、 16236 DWG NO. V62/03671 REV B PAGE 2 1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance differential bus transceiver microcircuit, with an operating temperature range of -40C to +125C for device type 01 and -55C to +125C for device type 02. 1.2 Vendor Item Dra
5、wing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item drawing establishes an administrative control number for identifying the item on the engineering documentation: V62/03671 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1)
6、(See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01 SN65LBC176AQ-EP Differential bus transceiver 02 SN65LBC176AM-EP Differential bus transceiver 1.2.2 Case outline(s). The case outlines are as specified herein. Outline letter Number of pins JEDEC PUB 95 Package styl
7、e X 8 MS-012 Plastic small outline 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacture: Finish designator Material A Hot solder dip B Tin-lead plate C Gold plate D Palladium E Gold flash palladium Z Other Provided by IHSNot for R
8、esaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 3 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.3 V to 6 V 2/ Voltage range at any bus terminal (A or B
9、) -10 V to 15 V Input voltage, (VI) (D, DE, R, or RE ) . -0.3 V to VCC+ 0.5 V Electrostatic discharge: A, B bus terminals and GND 400 V 3/ All A, B terminals 400 V 3/ Continuous total power dissipation (PD) . See dissipation rating table 4/ Storage temperature range (TSTG) -65C to 150C Lead temperat
10、ure 1.6 mm (1/16 inch) from case for 10 seconds . 260C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.75 V to 5.25 V Voltage at any bus terminal (separately or common mode), (VIor VIC) -7 V minimum and 12 V maximum High level input voltage (VIH) (output recessive) (D, DE, and R
11、E ) 2 V to VCCLow level input voltage (VIL) (output dominant) (D, DE, and RE ) . 0 V to 0.8 V Differential input voltage (VID) -12 V to 12 V 5/ 6/ High level output current (IOH): Driver . -60 mA minimum Receiver . -8 mA minimum Low level output current (IOL): Driver . 60 mA maximum Receiver . 8 mA
12、maximum Operating free-air temperature range (TA) : Device type 01 . -40C to +125C Device type 02 . -55C to +125C Case outline TA 25C Power rating Derating factor 7/ Above TA= 25C TA= 70C Power rating TA= 85C Power rating TA= 125C Power rating X 725 mW 5.8 mW/C 464 mW 377 mW 145 mW 1/ Stresses beyon
13、d those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “ recommended operating conditions” is not implied. Exposure to absolute-maximu
14、m-rated conditions for extended periods may affect device reliability. 2/ All voltage values, except differential I/O bus voltage, are with respect to network ground terminal. 3/ Tested in accordance with MIL-STD-883, test method 3015 (human body model). 4/ The maximum operating junction temperature
15、 is internally limited. Use the dissipation rating table to operate below this temperature. 5/ The algebraic convention, in which the least positive (most negative) limit is designed as minimum, is used in this data sheet. 6/ Differential input/output bus voltage is measured at the noninverting term
16、inal A with respect to the inverting terminal B. 7/ This is the inverse junction-to-ambient thermal resistance when the board is mounted and with no air flow. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, O
17、HIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 4 2. APPLICABLE DOCUMENTS JEDEC PUB 95 Registered and Standard Outlines for Semiconductor Devices (Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834 or online
18、 at http:/www.jedec.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, CAGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 Unit container. The unit c
19、ontainer shall be marked with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are as specified in 1.3, 1.4, and table I herein. 3.4 Design, construc
20、tion, and physical dimension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1. 3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2. 3.5.3 Logic diagram
21、. The logic diagram shall be as shown in figure 3. 3.5.4 Test circuits. The test circuits shall be as shown in figures 4 and 5. 3.5.5 Timing waveforms and test circuits. The timing waveforms and test circuits shall be as shown in figures 6, 7,and 8. Provided by IHSNot for ResaleNo reproduction or ne
22、tworking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 5 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/Temperature, TADevice type Min Max Unit Driver electrical charact
23、eristics section Input clamp voltage VIKII= -18 mA -40C to +125C 01 -1.5 V -55C to +125C 02 -1.5 Differential output voltage |VOD| IO= 0 -40C to +125C 01 1.5 6 V RL= 54 , see figure 4 0.9 6 Vtest= -7 V to 12 V, see figure 5 0.9 6 IO= 0 -55C to +125C 02 1.5 6 RL= 54 , see figure 4 0.9 6 Vtest= -7 V t
24、o 12 V, see figure 5 0.9 6 |VOD| See figure 4 and 5 -40C to +125C 01 -0.2 0.2 V Change in magnitude of differential output voltage -55C to +125C 02 -0.2 0.2 VOC(SS)See figure 4 -40C to +125C 01 1.8 3 V Steady state common mode output voltage -55C to +125C 02 1.8 3 VOC(SS)See figure 4 +25C 01 -0.2 0.
25、2 V Change in steady state common mode output voltage 02 -0.2 0.2 High impedance output current IOZSee receiver input currents under paragraph 1.4 -40C to +125C 01 -55C to +125C 02 IIHVI= 2 V -40C to +125C 01 -100 A High level enable input current -55C to +125C 02 -100 IILVI= 0.8 V -40C to +125C 01
26、-100 A Low level enable input current -55C to +125C 02 -100 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 6 TABLE
27、I. Electrical performance characteristics Continued. Limits Test Symbol Conditions 1/Temperature, TA Device type Min Max Unit Driver electrical characteristics section continued. Short circuit output current IOS-7 V VO 12 V -40C to +125C 01 -250 250 mA -55C to +125C 02 -250 250 Supply current ICCVI=
28、 0 or VCC, no load, receiver disabled and driver enabled -40C to +125C 01 9 mA VI= 0 or VCC, no load, receiver disabled and driver disabled 0.7 VI= 0 or VCC, no load, receiver enabled and driver enabled 15 VI= 0 or VCC, no load, receiver disabled and driver enabled -55C to +125C 02 9 VI= 0 or VCC, n
29、o load, receiver disabled and driver disabled 0.7 VI= 0 or VCC, no load, receiver enabled and driver enabled 15 Driver switching characteristics section tPLHRL= 54 , CL= 50 pF, -40C to +125C 01 2 12 ns Propagation delay time, low-to-high level output see figure 6 -55C to +125C 02 2 12 tPHLRL= 54 , C
30、L= 50 pF, -40C to +125C 01 2 12 ns Propagation delay time, high-to-low level output see figure 6 -55C to +125C 02 2 12 tsk(p)RL= 54 , CL= 50 pF, -40C to +125C 01 2 ns Pulse skew (tPLH tPHL) see figure 6 -55C to +125C 02 2 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or
31、 networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 7 TABLE I. Electrical performance characteristics continued. Limits Test Symbol Conditions 1/Temperature, TADevice type Min Max Unit Driver switc
32、hing characteristics section continued. trRL= 54 , CL= 50 pF, -40C to +125C 01 1.2 11 ns Differential output signal rise time see figure 6 -55C to +125C 02 1.2 11 tfRL= 54 , CL= 50 pF, -40C to +125C 01 1.2 11 ns Differential output signal fall time see figure 6 -55C to +125C 02 1.2 11 tPZHRL= 110 ,
33、see figure 6 -40C to +125C 01 22 ns Propagation delay time, high impedance to high level output -55C to +125C 02 22 tPZLRL= 110 , see figure 6 -40C to +125C 01 25 ns Propagation delay time, high impedance to low level output -55C to +125C 02 25 tPHZRL= 110 , see figure 6 -40C to +125C 01 22 ns Propa
34、gation delay time, high level to high impedance output -55C to +125C 02 22 tPLZRL= 110 , see figure 6 -40C to +125C 01 22 ns Propagation delay time, low level to high impedance output -55C to +125C 02 22 Receiver electrical characteristics section VIT+IO= -8 mA -40C to +125C 01 0.2 V Positive going
35、input threshold voltage -55C to +125C 02 0.2 VIT-IO= 8 mA -40C to +125C 01 -0.2 V Negative going input threshold voltage -55C to +125C 02 -0.2 VhysIO= 8 mA, VCC= 5 V 25C 01 50 typical mV Hysteresis voltage (VIT+- VIT-) 02 50 typical VIKII= -18 mA -40C to +125C 01 -1.5 V Enable input clamp voltage -5
36、5C to +125C 02 -1.5 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 8 TABLE I. Electrical performance characteristic
37、s continued. Limits Test Symbol Conditions 1/Temperature, TADevice type Min Max Unit Receiver electrical characteristics section - continued VOHVID= 200 mV, IOH= -8 mA, -40C to +125C 01 4 V High level output voltage see figure 7 -55C to +125C 02 4 VOLVID= 200 mV, IOH= 8 mA, -40C to +125C 01 0.8 V Lo
38、w level output voltage see figure 7 -55C to +125C 02 0.8 IOZVO= 0 to VCC-40C to +125C 01 -10 10 A High impedance state output current -55C to +125C 02 -10 10 Bus input current IIVIH= 12 V, VCC= 5 V, other input at 0 V -40C to +125C 01 1 mA VIH= 12 V, VCC= 0 V, other input at 0 V 1 VIH= -7 V, VCC= 5
39、V, other input at 0 V -0.8 VIH= -7 V, VCC= 0 V, other input at 0 V -0.8 VIH= 12 V, VCC= 5 V, other input at 0 V -55C to +125C 02 1 VIH= 12 V, VCC= 0 V, other input at 0 V 1 VIH= -7 V, VCC= 5 V, other input at 0 V -0.8 VIH= -7 V, VCC= 0 V, other input at 0 V -0.8 IIHVIH= 2 V -40C to +125C 01 -100 A H
40、igh level enable input current -55C to +125C 02 -100 IILVIH= 0.8 V -40C to +125C 01 -100 A Low level enable input current -55C to +125C 02 -100 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUM
41、BUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 9 TABLE I. Electrical performance characteristics Continued. Limits Test Symbol Conditions 1/Temperature, TA Device type Min Max Unit Receiver electrical characteristics section - continued Supply current ICCVI0 or VCC, no l
42、oad, receiver enabled and driver disabled -40C to +125C 01 7 mA VI0 or VCC, no load, receiver disabled and driver disabled 0.7 VI0 or VCC, no load, receiver enabled and driver enabled 15 VI0 or VCC, no load, receiver enabled and driver disabled -55C to +125C 02 7 VI0 or VCC, no load, receiver disabl
43、ed and driver disabled 0.7 VI0 or VCC, no load, receiver enabled and driver enabled 15 Receiver switching characteristics section tPLHVID= -1.5 V to 1.5 V, see figure 8 -40C to +125C 01 7 30 ns Propagation delay time, output -55C to +125C 02 7 30 tPHLVID= -1.5 V to 1.5 V, see figure 8 -40C to +125C
44、01 7 30 ns Propagation delay time, output -55C to +125C 02 7 30 tsk(p)VID= -1.5 V to 1.5 V, see figure 8 -40C to +125C 01 6 ns Pulse skew (tPHL tPLH) -55C to +125C 02 6 Rise time, output trSee figure 8 -40C to +125C 01 5 ns -55C to +125C 02 5 Fall time, output tfSee figure 8 -40C to +125C 01 5 ns -5
45、5C to +125C 02 5 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/03671 REV B PAGE 10 TABLE I. Electrical performance characteristics
46、continued. Limits Test Symbol Conditions 1/Temperature, TADevice type Min Max Unit Receiver switching characteristics section continued tPZHCL= 10 pF, see figure 8 -40C to +125C 01 50 ns Output enable time to high level -55C to +125C 02 50 tPZLCL= 10 pF, see figure 8 -40C to +125C 01 50 ns Output en
47、able time to low level -55C to +125C 02 50 tPHZCL= 10 pF, see figure 8 -40C to +125C 01 60 ns Output disable time to high level -55C to +125C 02 60 tPLZCL= 10 pF, see figure 8 -40C to +125C 01 40 ns Output disable time to low level -55C to +125C 02 40 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, pro
