1、 MIL-M-38510/27B 18 April 2008 _ SUPERSEDING MIL-M-38510/27(USAF) 21 August 1972 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, TTL, LOW POWER, MULTIPLE NOR GATES, MONOLITHIC SILICON This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. The requiremen
2、ts for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic, silicon, TTL, low power, positive NOR logic gating microcircuits. Two product assurance classes and a choice of case o
3、utlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535 and as specified h
4、erein. 1.2.1 Device types. The device types are as follows: Device type Circuit 01 Quadruple, 2-input positive NOR gate 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as fol
5、lows: Outline letter Descriptive designator Terminals Package style A GDFP5-F14 or CDFP6-F14 14 Flat pack B GDFP4-F14 14 Flat pack C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack Comments, suggestions, or questions on this document should be addressed to: Commander, De
6、fense Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolardla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil. AMSC N/A FSC 5962
7、Inactive for new design after 6 October 1995. INCH-POUNDProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/27B 21.3 Absolute maximum ratings. Supply voltage range . 0 V dc to 7.0 V dc Input voltage range 0 V dc to 5.5 V dc Storage temperatur
8、e range . -65C to +150C Maximum power dissipation, PD1/ 4.2 mW dc Lead temperature (soldering 10 seconds) . 300C Thermal resistance, junction-to-case (JC) . (See MIL-STD-1835) Junction temperature (TJ) 175C 1.4 Recommended operating conditions. Supply voltage . 4.5 V dc minimum to 5.5 V dc maximum M
9、inimum high level input voltage 2.0 V dc Maximum low level input voltage . 0.7 V dc Normalized fanout (each output) 2/ 10 maximum Case operating temperature range (TC) . -55C to 125C 2. APPLICABLE DOCUMENT 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this
10、 specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified req
11、uirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise speci
12、fied, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard for Microelectron
13、ics. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence.
14、 Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption
15、has been obtained. _ 1/ Must withstand the added PDdue to short circuit condition (e.g. IOS) at one output for 5 seconds duration. 2/ Device will fanout in both high and low levels to the specified number of inputs of the same device type as that being tested. Provided by IHSNot for ResaleNo reprodu
16、ction or networking permitted without license from IHS-,-,-MIL-M-38510/27B 33. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manu
17、facturers list before contract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect
18、the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Logic diagram and terminal connections. The logic diagram and terminal connections shall be as
19、 specified on figure 1. 3.3.2 Truth table and logic equation. The truth table and logic equation shall be as specified on figure 2. 3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon r
20、equest. 3.3.4 Case outlines. Case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table 1 an
21、d apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.
22、7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 15 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall b
23、e in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-3853
24、5. 4.3 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives s
25、hall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or pr
26、eparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II, except inter
27、im electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/27B
28、4TABLE I. Electrical performance characteristics. Limits Units Test Symbol Conditions Min Max High level output voltage (except open collector output circuits) VOH VCC= 4.5 V, VIN= 0.7 V IOH= -100 A 1/ 2.4 - - - V Low level output voltage VOL VCC= 4.5 V, IOL= 2 mA VIN= 2.0 V for all inputs of gate u
29、nder test 2/ - - - 0.3 V High level input current IIH1 VCC= 5.5 V, VIN= 2.4 V 2/ - - - 10 A High level input current IIH2 VCC= 5.5 V, VIN= 5.5 V 2/ - - - 100 A Low level input current IIL VCC= 5.5 V, VIN= 0.3 V 1/ -60 -180 A Short circuit output current IOS VCC= 5.5 V 1/ 3/ -3 -15 mA High level supp
30、ly current per gate ICCH VCC= 5.5 V 2/ VIN= 0 V - - - 0.4 mA Low level supply current per gate ICCL VCC= 5.5 V 1/ VIN= 5.5 V - - - 0.65 mA Propagation delay time, high to low level tPHL 3 99 ns Propagation delay time, low to high level tPLH VCC= 5.0 V CL= 50 pF RL= 4 k 3 90 ns 1/ All unspecified inp
31、uts at 5.5 volts. 2/ All unspecified inputs grounded. 3/ Not more than one output should be shorted at one time. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/27B 5TABLE II. Electrical test requirements. Subgroups (see table III) MIL-PR
32、F-38535 Test requirement Class S Devices Class B Devices Interim electrical parameters 1 1 Final electrical test parameters 1*, 2, 3, 9, 1*, 2, 3, 9 Group A test requirements 1, 2, 3, 9, 10, 11 1, 2, 3, 9, Group B electrical test parameters when using the method 5005 QCI option 1, 2, 3 N/A Groups C
33、end point electrical parameters 1, 2, 3 1, 2, 3 Additional electrical subgroups for group C periodic inspections None 10, 11 Group D end point electrical parameters 1, 2, 3 1, 2, 3 *PDA applies to subgroup 1. 4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in
34、accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7 and
35、 8, shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in tab
36、le II herein. b. Subgroups 3 and 4 shall be added to the group C inspection requirements for class B devices and shall consist of the tests, conditions, and limits specified for subgroups 10 and 11 of group A. The sample size series number shall be 5 (45 devices accept on 0). c. The steady-state lif
37、e test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturers Technology Review Board (TRB) in
38、 accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D
39、inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical parameters shall be as specified in table II herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/27B 6Figure 1. Logic diagram an
40、d terminal connections. Truth table (each gate) Inputs Output A B Y H X L X H L L L H Positive logic: Y = BA +Figure 2. Truth table and logic equation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/27B 7NOTES: 1/ The generator has the f
41、ollowing characteristics: Vgen = 3.0 V, tTLH= tTHL 25 ns, tP= 1.0 s, PRR 500 kHz and ZOUT 50 . 2/ All diodes are 1N3064 or equivalent. 3/ CLincludes probe and jig capacitance. 4/ Each gate tested separately. FIGURE 3. Switching time test circuit. Provided by IHSNot for ResaleNo reproduction or netwo
42、rking permitted without license from IHS-,-,-TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated are open) Case A,B,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits Case C 2 3 1 14 4 5 6 10 8 9 7 11 12 13 Subgroup Symbol MIL- STD- 883 method Test No. 1A 1B 1Y VCC
43、2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y Meas. terminalMin Max Unit 1 TC = 25C “ “ “ “ “ “ VOL“ “ “ “ “ “ “ 3007 “ “ “ “ “ “ “ 1 2 3 4 5 6 7 8 2.0V GND “ “ “ “ “ “ GND 2.0V GND “ “ “ “ “ 2.0mA 2.0mA 4.5V “ “ “ “ “ “ “ 2.0mA 2.0mA GND “ 2.0V GND “ “ “ “ GND “ “ 2.0V GND “ “ “ 2.0mA 2.0mA GND “ “ “ 2.0V GND “ “
44、 GND “ “ “ “ 2.0V GND GND GND “ “ “ “ “ “ “ GND “ “ “ “ “ 2.0V GND GND “ “ “ “ “ “ 2.0V 2.0mA 2.0mA 1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y 0.3 “ “ “ “ “ “ “ V “ “ “ “ “ “ “ VOH“ “ “ 3006 “ “ “ 9 10 11 12 0.7V 5.5V “ “ 0.7V 5.5V “ “ -100A “ “ “ “ -100A5.5V 0.7V 5.5V 5.5V 5.5V 0.7V 5.5V 5.5V -100A5.5V “ 0.7V 5.5V 5.
45、5V “ 0.7V 5.5V “ “ “ “ 5.5V “ “ 0.7V 5.5V “ “ 0.7V -100A1Y 2Y 3Y 4Y 2.4 “ “ “ “ “ “ “ IOS“ “ “ 3011 “ “ “ 13 14 15 16 GND GND GND 5.5V “ “ “ GND GND GND GND GND GND “ “ “ “ GND GND GND 1Y 2Y 3Y 4Y -3.0 “ “ “ -15 “ “ “ mA “ “ “ IIH1“ “ “ “ “ “ “ 3010 “ “ “ “ “ “ “ 17 18 19 20 21 22 23 24 2.4V GND “ “
46、 “ “ “ “ GND 2.4V GND “ “ “ “ “ “ “ “ “ “ “ “ “ GND “ 2.4V GND “ “ “ “ GND “ “ 2.4V GND “ “ “ GND “ “ “ 2.4V GND “ “ GND “ “ “ “ 2.4V GND “ “ “ “ “ “ “ “ “ GND “ “ “ “ “ 2.4V GND GND “ “ “ “ “ “ 2.4V 1A1B 2A 2B 3A 3B 4A 4B 10 “ “ “ “ “ “ “ A “ “ “ “ “ “ “ IIH2“ “ “ “ “ “ “ “ “ “ “ “ “ “ “ 25 26 27 2
47、8 29 30 31 32 5.5V GND “ “ “ “ “ “ “ 5.5V GND “ “ “ “ “ “ “ “ “ “ “ “ “ “ “ 5.5V GND “ “ “ “ “ “ “ 5.5V GND “ “ “ “ “ “ “ 5.5VGND “ “ “ “ “ “ “ 5.5v GND “ “ “ “ “ “ “ “ “ “ “ “ “ “ “ 5.5V GND GND “ “ “ “ “ “ 5.5V 1A 1B 2A 2B 3A 3B 4A 4B 100 “ “ “ “ “ “ “ “ “ “ “ “ “ “ “ IIL“ “ “ “ “ “ “ 3009 “ “ “ “
48、 “ “ “ 33 34 35 36 37 38 39 40 0.3V 5.5V “ “ “ “ “ “ 5.5V 0.3V 5.5V “ “ “ “ “ “ “ “ “ “ “ “ “ 5.5V “ 0.3V 5.5V “ “ “ “ 5.5V “ “ 0.3V 5.5V “ “ “ 5.5V “ “ “ 0.3V 5.5V “ “ 5.5V “ “ “ “ 0.3V 5.5V “ “ “ “ “ “ “ “ “ 5.5V “ “ “ “ “ 0.3V 5.5V “ “ “ “ “ “ “ 0.3V 1A1B 2A 2B 3A 3B 4A 4B -0.06 “ “ “ “ “ “ “ -0.
49、18 “ “ “ “ “ “ “ mA “ “ “ “ “ “ “ ICCH 3005 41 GND GND “ GND GND GND GND “ GND GND VCC1.6 mA CCL 3005 42 5.5V GND “ 5.5V GND 5.5V GND “ 5.5V GND VCC2.6 mA 2 Same tests, terminal conditions and limits as subgroup 1, except TC= 125C 3 Same tests, terminal conditions and limits as subgroup 1, except TC= -55
