1、MIL-PRF-1/588B m 9999906 2085523 LTB I INCHPOUND 1 MIL-PRF-11588B 29 Januarv 1999 SUPERSEDING 18 December 1974 MIL-E-1 /588A PERFORMANCE SPECIFICATION SHEET ELECTRON TUBE, CATHODE RAY TYPE NPlA This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. , T
2、he requirements for acquiring the electron tube described herein shall consist of this document and the latest issue of MIL-PRF-1. DESCRIPTION: Electrostatic deflection and focus. DIMENSIONS AND PIN CONNECTIONS: See figure i. ABSOLUTE-RATINGS: GENERAL: Qualification - Required. AMSC NIA lof5 DISTRIB
3、UTION STATEMENT A. Approved for public release; distribution is unlimited. FSC 5960 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-lE88B TABLE I. Testing and inspection. Inspection Qualification inspection Neck and bulb alignment (electrosta
4、tic types) Cathode illumination Deflection factor unifonnity Direct-interelectrode capacitance Pressure (implosion) Vibraon Base material insulating quality Conformance insDection. mrt 1 Voltage breakdown Voitage breakdown (electrostatic types) Gas “cross“ Bulb, screen and faceplate quality Light ou
5、tput Modulation spot position (electrostatic deflection) Spot displacement (leakage) Grid cutoff voltage Grid No.1 leakage current Anode No. 2 leakage current Method 5101 5216 5248 1331 1141 5111 1216 5201 5201 5206 5106 5221 5223 5231 5231 5241 5251 5251 Notes Conditions Control grid to all Cathode
6、 to all Dl to D2 D3 to D4 D1 to all D3 to all D1 to all, except D2 D2 to all, except D1 03 to all, except D4 D4 to all, except D3 Zone 5 (minimum) Light = 2 fL Light = 2 fL Symbol Diam - - Cgl Ck CI 02 C3D4 CDl CD3 CD1 CD2 CD3 CD4 _-_ Width - - Limits Max - 1.63 -_ - 11.0 7.5 2.0 2.0 12.5 13.0 12.0
7、I 2.0 10.0 9.0 _ 1 .o - - - - -. - 50 10 5 -90 _- - - Units See footnotes at end of table. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-PRF-1/5886 m 999990b 2085525 Ti0 D MIL-PRF-1/5888 TABLE I. Testina and Insaection -Continued. Inspection
8、 :onf omance isoection. Dart 2 ieater current ilectrode current mode 1) ilectrode current cathode) %ase alignment electrostatic types) ingle between traces deck and base alignment electrostatic types) #ray light emission conventional types) Jne width “A“ :electrostatic deflection) ine width “B“ ;ele
9、ctrostatic deflection) Focusing voltage at cutoff Focusing voltage (zero- Dias) Deflection factor 3eflection factor Heater-cathode leakage current Secureness of base, cap or inseri Base pin solder depth Permanence of rnarkina Conformance insDection. Dari 3 Life test Life-test end points: Line width
10、“A“ Line width “6“ Modulation dethod 1301 5201 5201 5101 5101 5101 5216 5226 5226 5246 5246 5248 5248 5251 1101 1111 1105 - 5226 5226 5223 Notes Conditions IC1 =o -ight = 2 fL t 3D4, pin No. 1 Light = 2 fL Light = 2 fL 1 D2 3D4 Group B; Light = 2 fL; t = 500 hours Light = 2 fL Light = 2 fL Light = 2
11、 fL Eb2 = 1,100 V dc; If Ibl Ik _- Angle - -_ width width Ebl Ebl DF DF - - - _- -e- Width Width AEC _- 0.50 0.65 50.0 - Units _- mrn mm V dc 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-l/588B TABLE I. Testing and inspection -Continued
12、. NOTES: - 1/ - 2/ This test to be performed at the conclusion of the holding period. The deflection plates shall be returned to anode No. 2 through a minimum of 2.5 megohm resistors. The light output shall be set at 2 fL. The high frequency scanning shall be applied to the deflecting plates nearest
13、 the screen and the amplitude shall be adjusted to give a line length of approximately 90 percent of the maximum tube diameter. The low frequency scanning amplitude shall be expanded to approximately 90 percent of the maximum tube diameter in the direction of high frequency scanning. Readjustment sh
14、all be made for best overall focus. The tubes shall be observed for deflection defocusing, astigmatism and spot ellipticity observable to the eye, as evidenced by fuzziness due to lack of sharpness of trace (usually around the edges), bow-tying (irregular widths of any line when observed at differen
15、t points) and bowing of trace other than that normally caused by curvature of the bulb. This test for focus is to be made in addition to the line width measurement. The same conditions shall be set up as described in a except that the connection of deflecting elements to the low and high frequency s
16、canning supplies shall be interchanged and the amplitudes adjusted to 90 percent of the maximum tube diameter in both directions without any adjustment of focus from a conditions. An examination for defocusing, astigmatism or spot ellipticity shall be made as in U. 3 4 Provided by IHSNot for ResaleN
17、o reproduction or networking permitted without license from IHS-,-,-NOTES: hh 1. The minimum useful screen radius shall not be less than .875 inches (22.23 rnm). 2. The base shall be a large wafer rnagnal 11-pin, with flared sleeve, (81.1-36) type or a small rnagnal 1 1-pin (B11-33) type. 3. The bul
18、b shall be a J16A type. 4. Reference dimensions are for infomation only and are not required for inspection purposes. FIGURE i. Outline drawina for electron tube Me 2APlA. Custodians: Amy - CR Navy - EC Air Force - 11 Preparing activity: (Project 5960-3472) DIA - CC Review activities: Navy - MC 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
