1、 MIL-PRF-19500/679C 13 September 2013 SUPERSEDING MIL-PRF-19500/679B 12 December 2007 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, TYPE 1N6844U3, JAN, JANTX, JANTXV, AND JANS This specification is approved for use by all Departments and Agencies of the Department o
2、f Defense. The requirements for acquiring the product described herein shall consist of this specification sheet and MIL-PRF-19500. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for silicon, Schottky power rectifier diodes for use in high frequency switching applications
3、. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. 1.2 Physical dimensions. See figure 1 (U3). 1.3 Maximum ratings. Unless otherwise specified, TC= +25C. Column 1 Column 2 Column 3 Column 4 Column 5 Column 6 Column 7 Type VRWMIO (1) TC = +125C IFSMtp=
4、 8.3 ms, TC= +25C RJCTSTGVF2= 50 mV (pk); IR1= 100 percent from the initial value or 25 uA whichever is greater. Subgroup 2, of table I herein excluding thermal impedance; VF2and IR1; VF2= 50 mV (pk); IR1= 100 percent from the initial value or 25 uA whichever is greater. * (1) Shall be performed any
5、time after temperature cycling, screen 3a. JANTX and JANTXV levels do not need to be repeated in screening requirements. (2) Surge shall precede thermal impedance. 4.3.1 Power burn-in conditions. Burn-in conditions are as follows: Method 1038 of MIL-STD-750, test condition A. TJ= +125C; VR= 80 V dc.
6、 4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method 3101 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tMD(and VCwhere appropriate). Measurement delay time (tMD) = 70 s max. See table III, group E, subgroup 4 here
7、in. 4.3.3 Peak reverse energy test. The peak reverse energy test is to be performed using the circuit as shown on figure 4 or equivalent. The Schottky rectifier under test must be capable of absorbing the reverse energy, as follows: IRM= 1 A, VRSM= 100 V minimum, L = 100 H. (See figure 4 herein.) Pr
8、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 5 4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500. 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with append
9、ix E, table E-V of MIL-PRF-19500, and table I herein. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table II herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgr
10、oup testing in tables E-VIA (JANS) and E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and as follows. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2, forward voltage test (VF1) and reverse leakage test (IR1) herein. Delta measurements shall be in accordance wit
11、h table II herein. 4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500. Subgroup Method Condition B4 1037 TC= +85C, IF= 2 A minimum for 2,000 cycles. B5 1038 Condition A, VR= 80 V dc, TJ= +125C minimum, t = 240 hours minimum; (heat sinking allowed). B6 4081 Limit for thermal resistance i
12、s 2.0C/W. 4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Subgroup Method Condition B3 1037 TC= +85C minimum, IF= 2 A minimum for 2,000 cycles. * 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgrou
13、p testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2, forward voltage test (VF1) and reverse leakage test (IR1) herein. Delta measurements shall be in accordance with table II herein. Subgroup Method Condition C2 2036 Not app
14、licable. * C5 4081 Limit for thermal resistance is 2.0C/W. C6 1037 TC = +85C, minimum, IF= 2 A minimum for 6,000 cycles. 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the tests and conditions specified for subgroup testing in table E-IX of MIL-PRF-19500, and tabl
15、e III herein. Delta measurements shall be in accordance with table II herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows. 4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750. Pro
16、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 6 * TABLE I. Group A inspection. Inspection 1/ MIL-STD-750 Symbol Limits Unit Method Conditions Min Max Subgroup 1 Visual and mechanical examination 2071 Subgroup 2 Thermal impedance 2/
17、3101 See 4.3.2 ZJXC/W Forward voltage 4011 Pulsed test (see 4.5.1) IF= 5 A (pk) IF= 15 A (pk) IF= 20 A (pk) VF1 VF2 VF30.70 0.90 1.00 V V V Reverse current 4016 VR= 100 V, DC method IR10.100 mA dc Subgroup 3 High temperature operation: TC= +125 C Forward voltage Pulsed test (see 4.5.1) IF= 5 A (pk)
18、IF= 15 A (pk) VF4 VF5 0.58 0.72 V V Reverse current 4016 VR= 100 V, DC method IR215.0 mA Low temperature operation: TC= -55C Forward voltage 4011 Pulsed test (see 4.5.1) IF= 5 A (pk) VF6 0.85 V Subgroup 4 Junction capacitance 4001 VR= 5 V dc, f = 1 MHz, VSIG= 50 mV (p-p) CJ600 pF Subgroup 5 Not appl
19、icable See footnotes at end of table. * Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 7 * TABLE I. Group A inspection Continued. Inspection 1/ MIL-STD-750 Symbol Limits Unit Method Conditions Min Max Subgroup 6 Surge 4066 See col
20、umn 4 of 1.3, ten surges each leg, 1 min between surges, (see 4.5.1) Electrical measurements See table I, subgroup 2 herein Subgroup 7 Dielectric withstanding voltage 1016 VR= 500 V dc; all leads shorted; measure from leads to case DWV 10 A Scope display evaluation 4023 Stable only Electrical measur
21、ements See table I, subgroup 2 herein. 1/ For sampling plan, see MIL-PRF-19500. * 2/ This test required for the following end-point measurements only: Group B, subgroups 3 and 5 (JANS). Group B, subgroups 2 and 3 (JAN, JANTX, and JANTXV). Group C, subgroup 2 and 6. Group E, subgroup 1. Provided by I
22、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 8 TABLE II. Groups B, C and E delta requirements. 1/ 2/ 3/ 4/ 5/ Step Inspection MIL-STD-750 Symbol Limits Unit Method Conditions Min Max 1. Forward voltage 4011 IF= 15 A (pk) pulsed (see 4.5.1) V
23、F250 mV dc from initial reading. 2. Reverse current 4016 Vr = 100 V IR1100 percent from initial reading or 25uA whichever is greater. 3. Thermal impedance 3101 See 4.3.2 ZJX1/ The electrical measurements for table E-VIA (JANS) of MIL-PRF-19500 are as follows: a. Subgroup 4, see table II herein, step
24、s 1, 2, and 3. b. Subgroup 5, see table II herein, steps 1 and 2. 2/ The electrical measurements for table E-VIB (JAN, JANTX and JANTXV) of MIL-PRF-19500 are as follows: a. Subgroup 2, see table II herein, steps 1 and 2. b. Subgroup 3, see table II herein, steps 1, 2, and 3. c. Subgroup 6, see table
25、 II herein, steps 1 and 2. 3/ The electrical measurements for table E-VII of MIL-PRF-19500 are as follows: a. Subgroups 2 and 3, see table II herein, steps 1 and 2 for all levels. b. Subgroup 6, see table II herein, steps 1, 2, and 3 for all levels. 4/ Devices which exceed the table I limits for thi
26、s test shall not be accepted. 5/ The electrical measurements for table E-IX of MIL-PRF-19500 are as follows: a. Subgroup 1, see table III herein, steps 1, 2, and 3. b. Subgroup 2, see table III herein, steps 1 and 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
27、e from IHS-,-,-MIL-PRF-19500/679C 9 TABLE III. Group E inspection (all quality levels) for qualification and requalification only. Inspection MIL-STD-750 Qualification Method Conditions Subgroup 1 n = 45, c = 0 Temperature cycling (air to air) 1051 Test condition G, 500 cycles, -55C to +150C Hermeti
28、c seal 1071 Electrical measurements See table I, subgroup 2 and table II Subgroup 2 n = 45, c = 0 Life test 1048 t = 1,000 hours, TJ = +125C, VR= 80 percent rated voltage (see 1.3, column 2 herein) Electrical measurements See table I subgroup 2 and table II Subgroup 3 n = 5, c = 0 Surge 4066 Conditi
29、on A, TA= +25C IFSM= 250 A, 10 surges of 8.3 ms superimposed on IO. VR= 0; IO= 10 A pk half sine wave, continuous Electrical measurements See table I, subgroup 2 Subgroup 4 Thermal impedance curves See MIL-PRF-19500 Provided by IHSNot for ResaleNo reproduction or networking permitted without license
30、 from IHS-,-,-MIL-PRF-19500/679C 10 FIGURE 2. Temperature-current derating curve. TEMPERATURE-CURRENT DERATING CURVE 1N6844U3 SQUAREWAVE OPERATION 50% DUTY CYCLE TC(C) (CASE) RJC= 2.0C/W Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/6
31、79C 11 FIGURE 3. Thermal impedance. 0.010.101.0010.000.00001 0.0001 0.001 0.01 0.1 1t1, RECTANGULAR PULSE DURATION (Se c)ThermalImpedance -Zthjc (C/W)Single Pulse(Thermal Resistance)D=0.1D=0.2D=0.3D=0.4D=0.5Notes: 1. Duty factor D = t 1/t2 2. Peak TJ= Pdm x ZJC+TC Provided by IHSNot for ResaleNo rep
32、roduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 12 Input pulse Rin= 50 ohms, 1 watt VG= 10 Volts, RS= 0.1 ohms, 1 watt ZG= 50 ohms L = 100H P.W. 30 s Duty cycle 1 percent, T = IRF250/2N6766 or equivalent Procedure: 1. With S open, adjust pulse width to test current
33、of 1 amp across RS. 2. Close S, verify test current with current sense. 3. Read peak output voltage (see 4.3.3). FIGURE 4. Peak reverse energy test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 13 5. PACKAGING 5.1 Packag
34、ing. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging require
35、ments. Packaging requirements are maintained by the Inventory Control Points packaging activities within the Military Service or Defense Agency, or within the Military Services system commands. Packaging data retrieval is available from the managing Military Departments or Defense Agencys automated
36、packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. The notes specified in MIL-PRF-19500 are applicable to this specification.) 6.1 Intended us
37、e. Semiconductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of this specification. b. Packaging requ
38、irements (see 5.1). c. Lead finish (see 3.4.1). d. Product assurance level and type designator. * 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers
39、 List (QML 19500) whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in ord
40、er that they may be eligible to be awarded contracts or orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DLA Land and Maritime, ATTN: VQE, P.O. Box 3990, Columbus, OH 43218-3990 or e-mail vqe.chiefdla.mil. An online listi
41、ng of products qualified to this specification may be found in the Qualified Products Database (QPD) at https:/assist.dla.mil. 6.4 Cross reference substitution list. A PIN for PIN replacement table follows and these devices are directly interchangeable. The 1N6844U3 is directly substitutable for the
42、 1N6844 and is the preferred part number. Non-preferred PIN Preferred PIN 15LJQ100 1N6844 1N6844U3 JANS, JANTXV, JANTX, JAN1N6844U3 JANS, JANTXV, JANTX, JAN1N6844U3 JANS, JANTXV, JANTX, JAN1N6844U3 6.5 Changes from previous issue. The margins of this specification are marked with asterisks to indica
43、te where changes from the previous issue were made. This was done as a convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespec
44、tive of the marginal notations and relationship to the last previous issue. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/679C 14 Custodians: Preparing activity: Army - CR DLA - CC Navy - EC Air Force - 85 (Project 5961-2013-029) NASA
45、 - NA DLA - CC Review activities: Army - MI Air Force - 99 * NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at https:/assist.dla.mil/. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
