1、AMSC N/A FSC 5910 MIL-PRF-83421E 6 December 2010 SUPERSEDING MIL-PRF-83421D 2 May 2006 PERFORMANCE SPECIFICATION CAPACITORS, FIXED, METALLIZED, PLASTIC FILM DIELECTRIC, (DC, AC, OR DC AND AC), HERMETICALLY SEALED IN METAL CASES OR CERAMIC CASES, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR Thi
2、s specification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for established reliability (ER), metallized plastic film dielectric, fixed capacitors, hermetically sealed in metal or ceramic cas
3、es. Capacitors covered by this specification have failure rate levels (FRL) established in accordance with MIL-STD-690. The reliability for each level is identified by a symbol in accordance with table I. These FRLs are established at a 90 percent confidence level and maintained at a 10 percent prod
4、ucers risk and, unless otherwise specified (see 3.1), are based on life tests performed at maximum rated voltage at maximum rated temperature. Unless otherwise specified (see 3.1), an acceleration factor of 5:1 has been used to relate life-test data obtained at 140 percent of rated voltage at maximu
5、m rated temperature, to rated voltage at maximum rated temperature (see 6.1). A part per million (PPM) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control (SPC) techniques are required in the manu
6、facturing process to minimize variation in production of capacitors supplied to the requirements of this specification. 1.2 Classification. Capacitors covered by this specification are classified by the style, as specified (see 3.1). 1.2.1 Part or Identifying Number (PIN). Capacitors specified herei
7、n (see 3.1) are identified by a PIN which consists of the basic number of the performance specification and a series of coded characters. The coded characters provide information concerning the capacitors temperature coefficient, specification sheet number, capacitance value, capacitance tolerance,
8、voltage, case code, termination finish, and failure rate level. The PIN is in the following form: 1.2.1.1 Dash. Use “-“ for standard product or “H” for random vibration option. M83421/ 01 - 1 123 M Performance specification number Specification sheet number (1.2.1.1) Single digit designating style N
9、onsignificant dash number FRL (1.2.1.2) INCH-POUNDComments, suggestions, or questions on this document should be addressed to DLA Land and Maritime, ATTN: VAT, Post Office Box 3990, Columbus, OH 43218-3990, or emailed to CapacitorFilterdla.mil. Since contact information can change, you may want to v
10、erify the currency of this address information using the ASSIST Online database at https:/assist.daps.dla.mil. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-83421E 2 1.2.1.2 Failure rate level (FRL). The FRL is identified by a single letter
11、 as shown in table I. TABLE I. FRL. Symbol FRL (percent per 1,000 hours) M 1.0 P 0.1 R 0.01 S 0.001 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of th
12、is specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this specification, whether or not t
13、hey are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation
14、or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-83421/1 - Capacitors, Fixed, Metallized Plastic Film, Dielectric, DC and AC, Hermetically Sealed in Metal Cases, Established Reliability, Styles CRH01, CRH02, CRH03, CRH04, CRH05, CRH06, CRH07, CRH08, CRH09, and CRH00. MIL-PRF-83421/2 - Capac
15、itors, Fixed, Metallized Plastic Film, Dielectric, (DC, AC, or DC and AC), Hermetically Sealed in Metal Cases, Established Reliability, Styles CRH11, CRH12, and CRH13 (Insulated). MIL-PRF-83421/6 - Capacitors, Fixed, Metallized Plastic Film Dielectric, DC and AC, Hermetically Sealed in Metal Cases,
16、Established Reliability, Styles CRH31, CRH32, CRH33, CRH34, and CRH35. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods Standard Electronic and Electrical Component Parts. MIL-STD-690 - Failure Rate Sampling Plans and Procedures. MIL-STD-790 - Standard Practice for Established Reliability
17、and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications. MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are availabl
18、e online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise s
19、pecified, the issues of these documents are those cited in the solicitation or contract. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-83421E 3 AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) ASTM D92 - Standard Test Method for Flash and
20、Fire Points by Cleveland Open Cup. (DoD adopted). (Copies of this document is available from http:/www.astm.org or American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959.) ELECTRONIC INDUSTRIES ALLIANCE (EIA) EIA-554-1 - Assessment of Average Outgoing Qua
21、lity Levels in Parts Per Million (PPM). (DoD adopted). EIA-557 - Statistical Process Control Systems. (DoD adopted). (Copies of these documents are available from http:/ or Global Engineering Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood CO 80112-5776.) 2.4 Order of
22、precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for related specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable l
23、aws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Specification sheets6.2. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheets. In the event of any conflict between requirements of this specific
24、ation and the specification sheets, the latter shall govern (see ). 3.2 Qualification4.2. Capacitors furnished under this specification shall be products which are authorized by the qualifying activity for listing on the applicable qualified products list (QPL) before contract award. In addition, th
25、e manufacturer shall obtain certification from the qualifying activity that the QPL system requirements of 3.3 and have been met and are being maintained. Authorized distributors that are approved to MIL-STD-790 distributor requirements by the QPL manufacturers are listed in the QPL. 3.3 QPL systemM
26、IL-STD-690. The manufacturer shall establish and maintain a QPL system for parts covered by this specification. Requirements for this system are specified in and MIL-STD-790. In addition, the manufacturer shall establish a Statistical Process Control (SPC) and Part Per Million (PPM) system which mee
27、ts the requirements of 3.3.1 and 3.3.2, respectively. The following MIL-STD-790 exception is allowed: a. Under “Description of production processes and controls“, the procedure for identification of each production lot shall include only “the manufacturer shall as a minimum be able to identify the t
28、ime period during which the final production operation was performed on each item of product prior to final test. The date or lot code marked on each part shall be identified to a production lot.“ b. “Traceability“ of materials shall not apply. 3.3.1 SPC system MIL-STD-790. As part of the overall QP
29、L system, the manufacturer shall establish a SPC system which meets the requirements of EIA-557. Typical manufacturing processes for application of a SPC include pre-assembly, assembly, encapsulation, and packaging. 3.3.2 PPM system MIL-STD-790. As part of the overall QPL system, the manufacturer sh
30、all establish a PPM system for assessing the average outgoing quality of lots in accordance with EIA-554-1. Data exclusion, in accordance with EIA-554-1, may be used with approval of the qualifying activity. The PPM system shall identify the PPM rate at the end of each month and shall be based on a
31、six month moving average. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-83421E 4 3.4 Material. The material shall be as specified herein. However, when a definite material is not specified, a material shall be used which will enable the cap
32、acitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the finished product. 3.4.1 Impregnant. The impregnant shall be chemically inactive with respect to the capacitor element a
33、nd the case. The impregnant, either in the state of original application or as a result of having aged, shall have no adverse effect on the performance of the capacitor. For liquid-impregnated capacitors, the same material shall be used for impregnating as is used for filling. 3.4.2 Metals. Metals s
34、hall be of a corrosion-resistant type or shall be plated or treated to resist corrosion. Silver plating shall not be used in any external portions of these capacitors. 3.4.2.1 Dissimilar metals. Where dissimilar metals are used in intimate contact with each other, provision shall be made to provide
35、protection against electrolysis and corrosion. The use of dissimilar metals in contact, which may tend toward active electrolytic corrosion (particularly brass, copper, or steel used in contact with aluminum or aluminum alloy), shall not be acceptable. However, metal plating or metal spraying of dis
36、similar metals to base metals to provide similar or suitable abutting surfaces will be permitted (for example, the spraying of copper on aluminum for soldering operations will be permitted). The use of dissimilar metals separated by insulating material will also be permitted. 3.4.3 Pure tin6.7. The
37、use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see ). Lead-free, tin alloy high temperature solders m
38、ay be used where high temperature solder is necessary with the approval of the qualifying activity. The tin content of lead-free high temperature solders shall not exceed 97 percent, by mass. 3.5 Interface and physical dimension requirements3.1. Capacitors and retainers shall meet the interface and
39、physical dimensions specified (see ). 3.5.1 Case 3.1. Each capacitor shall be enclosed in a hermetically-sealed case (see ) which will protect the capacitor element from moisture, impregnant or filling compound leakage, and mechanical damage under all test conditions specified herein. 3.5.2 Sleeving
40、. The sleeving material shall not soften, creep, or shrink to a point where any part of the cylindrical portion of the case is left uncovered at any test temperature specified herein. The sleeving shall not obscure the part marking. 3.5.3 Leads 3.19. Leads shall be solderable and meet the requiremen
41、ts of . 3.5.3.1 Solder dip (retinning) leadsappendix A. Only the manufacturer (or his authorized category B or C distributor) may solder dip/retin the leads of product supplied to this specification provided the solder dip process (see ) has been approved by the qualifying activity. 3.6 Burn-in (whe
42、n specified, see 3.1). When tested as specified in 4.7.2, capacitors shall withstand the exposure to high temperature and voltage without visible damage. 3.7 Dielectric absorption (when specified, see 3.1). When measured as specified in 4.7.3, the dielectric absorption shall not exceed the value spe
43、cified. 3.8 Thermal shock 4.7.4. When tested as specified in , capacitors shall withstand the extremes of high and low temperatures without visible damage. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-83421E 5 3.9 Seal. 3.9.1 Liquid-impreg
44、nated or solid-impregnated capacitors 4.7.5. When capacitors are tested as specified in , there shall be no evidence of leakage of impregnant or repetitive bubbling. 3.9.2 Liquid-filled capacitors 4.7.5. When capacitors are tested as specified in , there shall be no evidence of liquid leakage. 3.10
45、Dielectric withstanding voltage 4.7.6. When tested as specified in , capacitors shall be capable of withstanding the potentials specified (see 3.1) without permanent damage, open-circuiting or short-circuiting. 3.11 Insulation resistance 4.7.7. When capacitors are tested as specified in , the follow
46、ing shall apply. 3.11.1 Terminal to terminal 4.7.7. When measured as specified in b(1), the insulation resistance shall be not less than the values specified (see 3.1). 3.11.2 Terminals to case (when case is not a terminal) 4.7.7. When measured as specified in b(2), the insulation resistance between
47、 terminals and case shall be not less than the value specified (see 3.1). 3.12 Capacitance 4.7.8. When measured as specified in , the capacitance shall be within the applicable tolerance specified (see 3.1). 3.13 Dissipation factor 4.7.9. When measured as specified in , the dissipation factor shall
48、not exceed the value specified (see 3.1). 3.14 Equivalent series resistance (ESR) (applicable to styles CRH11, CRH12, and CRH13)4.7.10. When measured as specified in , the ESR (in ohms) shall not exceed the value specified (see 3.1). 3.15 Barometric pressure (reduced) for qualification only 4.7.11.
49、When tested as specified in , capacitors shall withstand the specified potential (see 3.1) without visible damage, external flashover, open-circuiting or short-circuiting. 3.16 Vibration, high frequency and random 4.7.12. When capacitors are tested as specified in , there shall be no evidence of mechanical damage, intermittent contacts of 0.5 millisecond (ms) or greater duration, open-circuiting or short-circuiting. 3.17 Salt atmosphere (corrosion) 4.7.13. Whe
