1、 NOT MEASUREMENT SENSITIVE MIL-STD-690D w/ CHANGE 1 20 May 2013 SUPERSEDING MIL-STD-690D 10 June 2005 DEPARTMENT OF DEFENSE STANDARD PRACTICE FAILURE RATE SAMPLING PLANS AND PROCEDURES AMSC N/A AREA SESS Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
2、,-MIL-STD-690D w/ CHANGE 1 FOREWORD 1. This Department of Defense standard is approved for use by all Departments and Agencies of the Department of Defense. * 2. Comments, suggestions, or questions on this document should be addressed to: DLA Land and Maritime, ATTN: VAT, Post Office Box 3990, Colum
3、bus, Ohio 43218-3990 or by email resistordla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.dla.mil. * 3. Much of the basic procedure outlined herein is based upon the efforts of the Quality
4、 Assurance Practices Committee of the TechAmerica. Their assistance, as well as those of other industry and military services activities, is herewith acknowledged. ii Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 SUMMARY OF
5、 CHANGE 1 MODIFICATIONS 1. Foreward change “DSCC” to “DLA Land and Maritime”; also ASSIST online web site has been changed to “https:/assist.dla.mil”. 2. Foreward; change “Electronic Industries Association” to “TechAmerica”. 3. Paragraph 2.2.1; changed the URL for the ASSIST quicksearch web site and
6、 office name. 4. Paragraph 2.3; changed to include the words “Unless otherwise noted herein or in the contract”. 5. Paragraph 3.1a; change paragraph definition. 6. Paragraph 3.1p (2) a; added definition. 7. Table I; add “U” and “V” Failure Rate (FR) levels. 8. Table II; add “U” and “V” FR levels. 9.
7、 Table III; note; add “U” and “V” FR levels and delete “other than”. 10. Paragraph 5.2.1d; add “U” and “V” FR levels. 11. Paragraph 5.2.2; add “U” and “V” FR levels. 12. Paragraph 5.3d; add “U” and “V” FR levels. 13. Table IV; add “U” and “V” FR levels. 14. Table V, note; add “U” and “V” FR levels.
8、15. Paragraph 5.3.4; add “U” and “V” FR levels. 16. Paragraph 5.3.4.1; delete “the sublotting plan is reviewed to determine if the sub-lot numbers were exceeded”. 17. Paragraph 5.3.4.3; add “V” FR level. 18. Table VII; add “U” and “V” FR levels. 19. Paragraph 5.4.3b; replace “predestinated” with “pr
9、edesignated”. 20. Paragraph 6.2; add “U” and “V” FR levels. 21. Paragraph 6.5; change paragraph. 22. Paragraph A.2.2.1; changed the URL for the ASSIST quicksearch web site and office name. 23. Paragraph A.2.3; changed to include the words “Unless otherwise noted herein or in the contract”. 24. Parag
10、raph A.3.4f; add “U” and “V” FR levels. 25. Table A-II, Table A-III, Table A-IV, Table A-V, Table A-VI, Table A-VII, Table A-VIII, Table A-IX, Table A-X, Table A-XI, and Table A-XII; add “U” and “V” FR levels. 26. Concluding material, change ASSIST online web site to https:/assist.dla.mil, and updat
11、ed custodians and review activities codes. iii Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 27. The following modifications to MIL-STD-790G have been made: PARAGRAPH Foreword Foreword 2.2.1 2.3 3.1a 3.1p (2) a Table I Tabl
12、e II Table III 5.2.1d 5.2.2 5.3d Table IV Table V 5.3.4 5.3.4.1 5.3.4.3 Table VII 5.4.3b 6.2 6.5 A.2.2.1 A.2.3 A.3.4f Table A-II Table A-III Table A-IV Table A-V Table A-VI Table A-VII Table A-VIII Table A-IX Table A-X Table A-XI Table A-XII Concluding material MODIFICATION Changed Changed Changed C
13、hanged Changed Added Added Added Added Added Added Added Added Added Deleted Added Added Replaced Added Changed Changed Changed Added Added Changed Changed Changed Changed Changed Changed Changed Changed Changed Changed Changed Updated iv Provided by IHSNot for ResaleNo reproduction or networking pe
14、rmitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 CONTENTS PARAGRAPH PAGE 1. SCOPE 1 1.1 Purpose 1 1.2 Application 1 1.3 Method of reference 1 2. APPLICABLE DOCUMENTS 2 2.1 General 2 2.2 Government documents 2 2.2.1 Specifications, standards, and handbooks 2 2.3 Order of precedence 2 3.
15、DEFINITIONS 3 3.1 Reliability terms 3 4. GENERAL REQUIREMENTS 5 4.1 FR levels 5 4.1.1 FR level determination 5 4.1.2 Qualification approval for higher FR levels 5 4.1.3 Supplying to higher FR levels 5 4.1.4 FR marking 5 4.1.4.1 FR marking upgrading 6 4.2 Failure criteria 6 4.3 FR test records 6 4.4
16、Exemption of data 6 4.5 FR qualification procedures 6 4.6 Lot conformance FR inspection procedure (when specified) 7 4.7 Disposition of sample units 7 5. DETAILED REQUIREMENTS 11 5.1 Procedure I, “Qualification at the initial level” 11 5.1.1 Applicable data 11 5.1.2 FR sampling plans (FRSP) 11 5.1.2
17、.1 True failure rates for FRSP-60 and FRSP-90 12 5.1.3 Failure FR test 12 5.1.4 Failure to qualify 12 5.1.5 Details to be specified 12 5.2 Procedure II, “Extension of qualification to lower FR levels” 13 5.2.1 Applicable data 13 5.2.2 Extend and limitation of coverage 13 5.2.3 Details to be specifie
18、d 13 5.2.4 Extension of failure rate (optional) 14 5.3 Procedure III, “Maintenance of FR level qualification” 14 5.3.1 Applicable data 15 5.3.2 FR sampling plans 15 5.3.3 Failure to maintain FR level qualification (see 4.3) 17 v Provided by IHSNot for ResaleNo reproduction or networking permitted wi
19、thout license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 CONTENTS PARAGRAPH PAGE 5.3.4 Sublotting failure rate maintenance procedure, failure rates R and S (optional) 17 5.3.4.1 Failure to meet overall “C” number 18 5.3.4.2 Overall “C” number not exceeded 18 5.3.4.3 Example of sublot calculation 18 5.3.5
20、 Details to be specified 18 5.4 Procedure IV, Lot conformance FR inspection” 19 5.4.1 Sampling plans 19 5.4.2 Extended FR tests 19 5.4.3 Action in case of failure 19 5.4.4 Details to be specified 20 5.5 Procedure for truncation of life test data 20 6. NOTES 21 6.1 FR level conversion 21 6.2 Computat
21、ion of the unit-hour requirement 21 6.3 Computation of the true failure rate 21 6.4 Subject term (key word) listing 21 6.5 Changes from previous issue 22 APPENDIX A A.1 SCOPE 28 A.1.1 Scope 28 A.2 APPLICABLE DOCUMENTS 28 A.2.1 General 28 A.2.2 Government documents 28 A.2.2.1 Specifications, standard
22、s, and handbooks 28 A.2.3 Order of precedence 28 A.3 QUALIFICATION 28 A.3.1 Qualification at the initial FR level 28 A.3.2 Extension of qualification to lower FR levels 28 A.3.3 Maintenance of FR level qualification 29 A.3.4 Verification of qualification 29 A.4 LOT CONFORMANCE FR INSPECTION (WHEN SP
23、ECIFIED) 29 A.4.1 Sampling plan 29 A.5 GENERAL 29 A.5.1 Failure criteria 29 A.5.2 Duration of failure rate test 30 A.5.3 Screening tests 30 A.5.4 Accelerated FR tests and acceleration factors 30 A.6 FR QUALIFICATION DATA 30 A.6.1 Expanding FR sampling plan 30 A.7 APPLICATION INFORMATION 30 A.7.1 Rel
24、iability data 30 vi Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 CONTENTS PARAGRAPH PAGE FIGURES 1. Examples of FR test records 7 2. Examples of maintenance of FR level record 10 TABLES I. FRSP-60 11 II. FRSP-90 11 III. Tr
25、ue failure rate for FRSP-60 and FRSP-90 (prepared for 1%/1,000 hr FR level) 12 IV. FRSP-10 16 V. True failure rate for FRSP-10 (prepared for 1 percent per 1,000 hours FR level) 16 VI. Example of sublot calculation plan 18 VII. Lot conformance FR plan 19 VIII. Cumulative Poisson probabilities 22 A-I.
26、 FR qualification data in unit hours (based on exponential distribution computed at 1%/1,000 hr) 31 A-II. True failure rates for C = 0 (level M) 32 A-III. True failure rates for C = 1 (level M) 32 A-IV. True failure rates for C = 2 (level M) 33 A-V. True failure rates for C = 3 (level M) 33 A-VI. Tr
27、ue failure rates for C = 4 (level M) 34 A-VII. True failure rates for C = 5 (level M) 34 A-VIII. True failure rates for C = 6 (level M) 35 A-IX. True failure rates for C = 7 (level M) 35 A-X. True failure rates for C = 8 (level M) 36 A-XI. True failure rates for C = 9 (level M) 36 A-XII. True failur
28、e rates for C = 10 (level M) 37 CONCLUDING MATERIAL 38 viiProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 1 1. SCOPE 1.1 Purpose. This standard provides procedures for failure rate (FR) qualification, sampling plans for estab
29、lishing and maintaining FR levels at selected confidence levels, and lot conformance inspection procedures associated with FR testing for the purpose of direct reference in appropriate military electronic parts established reliability (ER) specifications. Figures and tables throughout this standard
30、are based on exponential distribution. Weibull distribution will be acceptable in certain components such as capacitors. Use of Weibull distribution for any component must be approved by the qualifying activity. This standard also provides guidance to specification writers in the use of this standar
31、d (see appendix A) and references material for users of ER parts. 1.2 Application. This standard is applicable for reference in electronic parts ER specifications when the following conditions exist: a. Electronic parts are essentially the same design and are manufactured under essentially continuou
32、s production; the production process is established and controlled in accordance with MIL-STD-790. b. The part design and manufacturing processes produce a product whose failure rate can reasonably be assumed to be constant with time over its intended life (i.e., an exponential distribution of failu
33、res per unit time). c. The qualifying activity administers this standard to provide the consumer with assurance that the qualified FR level is being maintained by a given manufacturer, since these procedures in themselves are not sufficient to assure the qualified FR level. 1.3 Method of reference.
34、This standard can be referenced in ER specifications by specifying the following procedures: a. Procedure I, “Qualification at the initial FR level” (see 5.1). b. Procedure II, “Extension of qualification to lower FR levels” (see 5.2). c. Procedure III, “Maintenance of FR level qualification” (see 5
35、.3). d. Procedure IV, “Lot conformance FR inspection” (when specified) (see 5.4). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-690D w/ CHANGE 1 2 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in se
36、ction 3, 4, or 5 of this standard. This section does not include documents cited in other sections of this standard or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all
37、 specified requirements documents cited in section 3, 4, or 5 of this standard, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein
38、. Unless otherwise specified, the issues of these documents are cited in the solicitation or contract. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-790 - Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications. *
39、(Copies of these documents are available online at http:/quicksearch.dla.mil or from the DLA Documents Services, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) * 2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of
40、this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by IHSNot for ResaleNo reproduction or networking permitted without license
41、 from IHS-,-,-MIL-STD-690D w/ CHANGE 1 3 3. DEFINITIONS 3.1 Reliability terms. The definitions of all reliability terms used herein are as follows: * a. Burn-in (pre-conditioning). Process of subjecting components to conditions (temperature extreme, power input extremes, etc.) with the intent to eit
42、her stabilize performance or significantly reduce latent defects. b. Confidence level. This term denotes the probability of disqualifying a product when the true failure rate of the product is at the failure rate specified for qualification. c. Corrective action. A documented design, process, proced
43、ure, or materials change implemented and validated to correct the cause of failure or design deficiency. d. Derating. (1) Using an item in such a way that applied stresses are below rated values. (2) The lowering of the rating of an item in one stress field to allow an increase in another stress fie
44、ld. e. Established reliability. A quantitative maximum failure rate demonstrated under controlled conditions specified in a Department of Defense specification and usually expressed as percent failures per thousand hours of test. f. Failure. The event or inoperable state, in which any item, or part
45、of an item does not, or would not, perform as previously specified. g. Failure analysis. Subsequent to a failure, the logical systematic examination of an item, its construction, application, and documentation to identify the failure made and determine the failure mechanism and its basic course. h.
46、Failure rate (FR) level. This term denotes the maximum percentage of failures (per 1,000 unit hours) based on a specified confidence level. i. Failure rate (FR) test. This term denotes the test required to accumulate data from which a failure rate is calculated and is used synonymously with the stan
47、dard specification term “life test”. j. Higher FR level. This term is a relative description of a FR level associated with a higher number of failures per unit time. k. Inspection lot. A group of electronic parts offered for inspection at one time and in combinations authorized by the applicable ER
48、specifications. l. Lower FR level. This term is a relative description of a FR level associated with a fewer number of failures per unit time. m. Mean time to failure (MTTF). A basic measure of reliability for non-repairable items: the total number of life units of an item divided by the total number of failures within that population, during a particular measurement interval under stated conditions. n. Predicted. That which is expected at some future time, postulated on analysis of past experience and tests. o. Qualifyi
