DL T 660-2007 Test procedure for the viscosity of coal ash in high-temperature《煤灰高温黏度特性试验方法》.pdf

相关资源

DL 5210.1-2021 电力工程施工质量验收及评价规程 第1部分：土建工程.pdf

DL T 2595-2023 发电厂海水淡化工程运行和维护导则.pdf

DL T 991-2022 电力设备金属发射光谱分析技术导则（代替DL T 991-2006）.pdf

DL T 557-2021 高压线路绝缘子空气中冲击击穿试验定义、试验方法和判据.pdf

DL T 2590-2023 馈能装置接入配电网技术要求.pdf

DL T 2591-2023 垃圾发电厂垃圾储运系统运行规程.pdf

DL T 882-2022 火力发电厂金属专业名词术语.pdf

DL T 270-2022 钢弦式位移计.pdf

DL T 2589-2023 垃圾发电厂智能点巡检系统技术规范.pdf

DL T 2593-2023 可逆式抽水蓄能机组启动调试导则.pdf

猜你喜欢

DIN EN 60749-19-2011 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength (IEC 60749-19 2003 + A1 2010) German version EN 60749-19 2003 + A1 20.pdf

DIN EN 60749-2-2003 Semiconductor devices - Mechanical and climatic test methods - Part 2 Low air pressure (IEC 60749-2 2002) German version EN 60749-2 2002《半导体器件 机械和气候试验方法 第2部分 低气.pdf

DIN EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the co.pdf

DIN EN 60749-20-2010 Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering.pdf

DIN EN 60749-21-2012 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability (IEC 60749-21 2011) German version EN 60749-21 2011《半导体设备 机械和气候试验方法 第21部分 .pdf

DIN EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Part 22 Bond strength (IEC 60749-22 200 + Corr 1 2003) German version EN 60749-22 2003《半导体器件 机械和.pdf

DIN EN 60749-23-2011 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life (IEC 60749-23 2004 + A1 2011) German version EN 60749-23.pdf

DIN EN 60749-24-2004 Semiconductor devices - Mechanical and climatic test methods - Part 24 Accelerated moisture resistance - Unbiased HAST (IEC 60749-24 2004) German version EN 60.pdf

DIN EN 60749-25-2004 Semiconductor devices - Mechanical and climatic test methods - Part 25 Temperature cycling (IEC 60749-25 2003) German version EN 60749-25 2003《半导体器件 机械和气候试验方法 .pdf