DLA QPL-5498-QPD-2011 Accumulators Hydraulic Cylindrical 3000 PSI Aircraft.pdf

上传人:arrownail386 文档编号:698067 上传时间:2019-01-02 格式:PDF 页数:2 大小:13.50KB
下载 相关 举报
DLA QPL-5498-QPD-2011 Accumulators Hydraulic Cylindrical 3000 PSI Aircraft.pdf_第1页
第1页 / 共2页
DLA QPL-5498-QPD-2011 Accumulators Hydraulic Cylindrical 3000 PSI Aircraft.pdf_第2页
第2页 / 共2页
亲,该文档总共2页,全部预览完了,如果喜欢就下载吧!
资源描述

1、QPL-54982011-11-08QUALIFIED PRODUCT LISTOFPRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATIONMIL-DTL-5498Accumulators, Hydraulic, Cylindrical 3000 PSI, AircraftThis list has been prepared for use by or for the Government in the acquisition of products covered by the subject specification and such lis

2、ting is not intended to and does not connote endorsement of the product by the Department of Defense. All products listed herein have been qualified under the requirements for the product as specified in the latest effective issue of the applicable specification. This list is subject to change witho

3、ut notice; revision or amendment of this list will be issued as necessary. The listing of a product does not release the contractor from compliance with the specification requirements.THE ACTIVITY RESPONSIBLE FOR THIS QUALIFICATION DATASET IS THE DEFENSE SUPPLY CENTER RICHMOND, ATTN: DSCR-VEB, 8000

4、JEFFERSON DAVIS HIGHWAY, RICHMOND, VA 23297-5616.GOVERNMENT DESIGNATION MANUFACTURER DESIGNATION TEST REFERENCE CAGE CODESupplier TypeCertified StatusStop ShipM5498-1 (FORMERLY MS28700-1) 1356-583314 Report, AML 22029/60, Dtd 6 July 1960; Report, NAMC-AML 22194/62, Dtd 5 January 196293835 M GREEN NM

5、5498-1 (FORMERLY MS28700-1) 08-8421-010 Tactair report, QTR 08 8424 010, Dtd 9/18/2007; Tactair package documenting transfer from York Indudtries, Dtd Oct. 20, 200570236 M GREEN NM5498-2 (FORMERLY MS28700-2) 08-8422-010 Tactair report, QTR 08 8424 010, Dtd 9/18/2007; Tactait package documenting tran

6、sfer from York Indudtries, Dtd Oct. 20, 200570236 M GREEN NM5498-2 (FORMERLY MS28700-2) 1356-583315 Report, AML 22029/60, Dtd 6 July 1960; Report, NAMC-AML 22194/62, Dtd 5 January 196293835 M GREEN NM5498-3 (FORMERLY MS28700-3) 1356-583316 Report, AML 22029/60, Dtd 6 July 1960; Report, NAMC-AML 2219

7、4/62, Dtd 5 January 196293835 M GREEN NM5498-4 (FORMERLY MS28700-4) 1356-583317 Report, AML 22029/60, Dtd 6 July 1960; Report, NAMC-AML 22194/62, Dtd 5 January 196293835 M GREEN NM5498-5 (FORMERLY MS28700-5) 1356-583318 Report, AML 22029/60, Dtd 6 July 1960; Report, NAMC-AML 22194/62, Dtd 5 January

8、196293835 M GREEN NM5498-6 (FORMERLY MS28700-6)M5498-7 (FORMERLY MS28700-7)QPL-54981 of 2Source: QPD at https:/assist.daps.dla.mil - QPL Date: 2011-11-08QPLs are subject to change on a daily basesProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Manufa

9、cturer/Supplier InformationCAGE CODE: 70236TACTAIR FLUID CONTROLS, INC. 4806 W TAFT RD LIVERPOOL NY 13088-4810 USACAGE CODE: 93835PARKER-HANNIFIN CORPORATION HYDRAULIC SYSTEMS DIVISION2220 PALMER AVE KALAMAZOO MI 49001-4122 USAhttp:/ 2 of 2Source: QPD at https:/assist.daps.dla.mil - QPL Date: 2011-11-08QPLs are subject to change on a daily basesProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

展开阅读全文
相关资源
猜你喜欢
  • BS EN 62047-1-2016 Semiconductor devices Micro-electromechanical devices Terms and definitions《半导体装置 微型电机装置 术语和定义》.pdf BS EN 62047-1-2016 Semiconductor devices Micro-electromechanical devices Terms and definitions《半导体装置 微型电机装置 术语和定义》.pdf
  • BS EN 62047-10-2011 Semiconductor devices Micro-electromechanical devices Micro-pillar compression test for MEMS materials《半导体装置 微电子机械装置 MEMS材料的微型柱压缩试验》.pdf BS EN 62047-10-2011 Semiconductor devices Micro-electromechanical devices Micro-pillar compression test for MEMS materials《半导体装置 微电子机械装置 MEMS材料的微型柱压缩试验》.pdf
  • BS EN 62047-11-2013 Semiconductor devices Micro-electromechanical devices Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromecha.pdf BS EN 62047-11-2013 Semiconductor devices Micro-electromechanical devices Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromecha.pdf
  • BS EN 62047-12-2011 Semiconductor devices Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures《半导体装置 微型.pdf BS EN 62047-12-2011 Semiconductor devices Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures《半导体装置 微型.pdf
  • BS EN 62047-13-2012 Semiconductor devices Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures《半导体设备 微型机电装置 MEMS结构用测量.pdf BS EN 62047-13-2012 Semiconductor devices Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures《半导体设备 微型机电装置 MEMS结构用测量.pdf
  • BS EN 62047-14-2012 Semiconductor devices Micro-electromechanical devices Forming limit measuring method of metallic film materials《半导体装置 微型电机装置 金属薄膜材料的成形极限测量方法》.pdf BS EN 62047-14-2012 Semiconductor devices Micro-electromechanical devices Forming limit measuring method of metallic film materials《半导体装置 微型电机装置 金属薄膜材料的成形极限测量方法》.pdf
  • BS EN 62047-15-2015 Semiconductor devices Micro-electromechanical devices Test method of bonding strength between PDMS and glass《半导体器件 微型机电装置 PDMS和玻璃之间的粘结强度的试验方法》.pdf BS EN 62047-15-2015 Semiconductor devices Micro-electromechanical devices Test method of bonding strength between PDMS and glass《半导体器件 微型机电装置 PDMS和玻璃之间的粘结强度的试验方法》.pdf
  • BS EN 62047-16-2015 Semiconductor devices Micro-electromechanical devices Test methods for determining residual stresses of MEMS films Wafer curvature and cantilever beam deflectio.pdf BS EN 62047-16-2015 Semiconductor devices Micro-electromechanical devices Test methods for determining residual stresses of MEMS films Wafer curvature and cantilever beam deflectio.pdf
  • BS EN 62047-17-2015 Semiconductor devices Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films《半导体器件 微型机电装置 用于测量薄膜力学性能的胀形试验方法》.pdf BS EN 62047-17-2015 Semiconductor devices Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films《半导体器件 微型机电装置 用于测量薄膜力学性能的胀形试验方法》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1